2013 Q4 Reliability Quarterly Report Overview

QUARTERLY RELIABILITY MONITOR
REPORT
Q4, Oct. ~ Dec. 2013
Prepared by MPSCD Reliability Engineering
The Future of Analog IC Technology®
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
INDEX
1.0 INTRODUCTION ......................................................................................2
1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2
1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3
3.0 PROCESS RELIABILITY MONITORING DATA ......................................4
3.1 BCM12B Process Technology ................................................................................................................................................ 4
3.2 BCM12S Process Technology ................................................................................................................................................ 6
3.3 BCM35 Process Technology ................................................................................................................................................... 9
3.4 BCM05 Process Technology ................................................................................................................................................ 11
3.5 BCM18 Process Technology ................................................................................................................................................ 12
4.0 PACKAGE RELIABILITY MONITORING DATA ....................................13
4.1 QFN .................................................................................................................................................................................................. 13
4.2 SOIC ................................................................................................................................................................................................ 27
4.3 MSOP .............................................................................................................................................................................................. 35
4.4 TSOT ............................................................................................................................................................................................... 39
4.5 TSSOP ............................................................................................................................................................................................ 44
4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 47
4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 72
4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 73
The Future of Analog IC Technology®
-1-
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
1.0 INTRODUCTION
This report summarizes the reliability testing results for MPS products as of Q4 2013.
1.1 SHORT TERM RELIBILITY MONITORING
The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product
reliability performance.
Stress Test Name
Test Condition
Duration
JEDEC
EARLY LIFE
125°C, Vccmax
48 ~168 hrs
JESD22-A108
Convection Reflow
260°C
3 times
JESD22-A113
Temperature Cycle
Cond C:-65℃ ~ 150℃
100~200Cycles
JESD22-A104
Autoclave
121°C /100%RH
48~96 hrs
JESD22-A102
1.2 LONG TERM RELIBILITY MONITORING
The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to
provide the data necessary to calculate the steady state failure rates of products.
Stress Test Name
Test Condition
Duration
JEDEC
HTOL
125°C, Vccmax
1000 hrs
JESD22-A108
HTSL
150°C
1000 hrs
JESD22-A103
Precondition
/
/
JESD22-A113
Autoclave
121°C /100%RH
168 hrs
JESD22-A102
Temperature Cycle
Cond C:-65°C ~ 150°C
1000 Cycles
JESD22-A104
85°C, 85% R.H., VDD
1000 hrs
JESD22-A101
130°C, 85% R.H., VDD
96 hrs
JESD22-A110
Temperature Humidity Bias
(THB)
High Accelerated Stress Test
(HAST)
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS
The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon
accelerated stress data. The units for FIT are failures per Billion device hours.
( χ / 2) *10
2
FITRate =
9
stress * device hours
The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL
is accelerated by temperature and by voltage. The total number of failures in stress determines the
chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number
of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses
the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g.
55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is
AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal
Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0).
The Future of Analog IC Technology®
-3-
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
3.0 PROCESS RELIABILITY MONITORING DATA
3.1 BCM12B Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2359DJ-LF-JC
B9955700
1325
10-09-13
80
168
0
MP2119DQ
D580887.7B
1333
12-16-13
79
168
0
MP2359DJ
D681274.7H-C
1339
12-26-13
80
168
0
MP2359DJ
D681274.7M-C
1339
12-26-13
80
168
0
MP2359DJ
D681274.7L-C
1339
12-26-13
80
168
0
MP8352DL
D672140.9BT
N/A
12-03-13
83
168
0
HFC0100HS
A989919.7
1123
12-26-13
80
168
0
MPQ2451DT
CB72222.1A-MPQ
1325
10-30-13
77
96
0
MPQ4459DQT
D472666.7-MPQ
1325
10-08-13
78
96
0
MPQ4560DQ
D672096.7B-MPQ
1334
10-30-13
78
96
0
MPQ4456GQT
D672006.9-MPQ
1336
10-15-13
77
96
0
MPQ4560DQ
D772237.7A-MPQ
1336
10-30-13
77
96
0
MP4459DQT
D672022.7-MPQ
1337
10-23-13
76
96
0
MPQ4560DQ
D772237.7-MPQ
1342
11-06-13
78
96
0
MPQ2016DD-AEC1
D272470.8C-MPQ
1319
11-15-13
80
96
0
MPQ2016DD-AEC1
D272470.8B-MPQ
1337
11-06-13
80
96
0
MPQ4560DQ
D772284.7B-MPQ
1342
11-11-13
77
96
0
MP4459DQT
D672020.7-MPQ
1342
12-05-13
78
96
0
MPQ4560DQ
D872353.7-MPQ
1344
11-27-13
77
96
0
MP7731DF
D472809.9-MPQ
1344
12-10-13
80
96
0
MPQ2483DQ-AEC1
D772322.9A-MPQ
1342
12-19-13
80
96
0
MP1411DH
C788171.7
1337
10-15-13
80
48
0
MP1530DQ
D681286.7
1342
11-06-13
80
48
0
MP1482DN
D580664.7
1339
11-06-13
80
48
0
MP1411DH
C788170.7
1341
11-06-13
80
48
0
MP1482DN
D480272.9
1324
11-06-13
80
48
0
MP2105DK
D289889.7
1341
11-15-13
80
48
0
MP1482DN
D681206.7
1344
11-15-13
80
48
0
MP1530DQ
D580779.7
1343
11-08-13
80
48
0
MP1482DN
D681164.7
1344
11-15-13
80
48
0
MP1411DH
C788172.7
1342
11-15-13
80
48
0
The Future of Analog IC Technology®
-4-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1411DH
C787896.1A
1334
11-15-13
80
48
0
MP1482DN
D681208.7
1344
11-20-13
80
48
0
MP1484EN
D580920.7
1342
11-08-13
80
48
0
MP1482DN
D681207.7
1344
11-20-13
80
48
0
MP1411DH
C888316.7
1344
11-20-13
80
48
0
MP1482DN
D681209.7
1344
11-27-13
80
48
0
MP1411DH
C888315.7
1344
11-27-13
80
48
0
MP3302DJ
D480506.9A
1346
11-29-13
80
48
0
MP1423DN
D380019.9A
1347
11-29-13
80
48
0
MP1482DN
C586744.7
1309
12-02-13
80
48
0
MP1484EN
D681129.7
1346
12-12-13
80
48
0
MP2105DK
CC89304.9
1329
12-19-13
80
48
0
MP1482DN
D480347.7
1347
12-20-13
80
48
0
MP3302DJ
D480506.9B
1347
12-26-13
80
48
0
MP1484EN
D580606.7
1349
12-31-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4566GD-AEC1
EP289800
1309
10-09-13
80
0
MPQ4566GD-AEC1
EP289803
1309
10-09-13
80
0
MPQ1530DQ-AEC1
FA342746
1319
10-09-13
80
0
MPQ1530DQ-AEC1
FA342746B
1330
10-09-13
80
0
MPQ2016DD-AEC1
FA292055A
1303
10-24-13
80
0
MPQ2016DD-AEC1
FA282055B
1315
10-24-13
80
0
MPQ1530DQ-AEC1
EP310600
1328
11-01-13
80
0
MPQ1530DQ-AEC1
EP310600
1328
11-01-13
80
0
MPQ2016DD-AEC1
FA322470
1319
11-01-13
80
0
MPQ2908GF
EP245105
1237
12-16-13
80
0
Total
0
BCM12B
#fail
#device hours
Accel Factor
FIT Rate
0
800000
348
3.5
The Future of Analog IC Technology®
-5-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2489DQ-AEC1
B9398200
1301
10-12-13
50
0
MPQ2489DQ-AEC1
B965700
1303
10-12-13
50
0
MPQ2489DQ-AEC1
B9677100
1309
10-12-13
50
0
MPQ4566GD-AEC1
EP289800
1309
10-09-13
50
0
MPQ1530DQ-AEC1
FA342746B
1330
10-09-13
50
0
MP2359DJ
B9955700
1325
10-09-13
50
0
MPQ2016DD-AEC1
FA292055A
1303
10-24-13
50
0
MPQ2016DD-AEC1
FA282055B
1315
10-24-13
50
0
MP1412DH
C586768.7
1329
10-24-13
50
0
MPQ1530DQ-AEC1
EP280900
1248
12-25-13
50
0
MPQ1530DQ-AEC1
EP280901
1250
12-25-13
50
0
MPQ1530DQ-AEC1
C988670
1247
12-25-13
50
0
MP2209DL
D681438.9
1334
12-16-13
50
0
MP2119DQ
D580887.7B
1333
12-16-13
50
0
MPQ2489DQ-AEC1
FA362058
1330
12-18-13
50
0
MP2359DJ
D681274.7H-C
1339
12-26-13
50
0
MP2359DJ
D681274.7M-C
1339
12-26-13
50
0
MP2359DJ
D681274.7L-C
1339
12-26-13
50
0
MP2360DG
C687683.7AL
1342
12-31-13
50
0
MP2360DG
C687683.7AM
1342
12-31-13
50
0
MP2360DG
C687683.7AH
1342
12-31-13
50
0
Total
FA No.
0
3.2 BCM12S Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP3388DR
HL2643
1247
10-09-13
80
168
0
MP3388DR
HL264302
1247
10-09-13
50
168
0
MP3391EF
CB72193.1
1324
10-09-13
80
168
0
MP28252EL
C549800.7
1313
10-17-13
80
168
0
The Future of Analog IC Technology®
-6-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP28252EL
C74E863.9M
1313
10-17-13
80
168
0
MP28256EL
CA88787.9
1319
11-13-13
50
168
0
MP28256EL
C988583.9
1324
11-13-13
50
168
0
MP3426DL
CB72166.8B
1318
11-19-13
50
168
0
MP3426DL
D472745.1
1325
11-19-13
50
168
0
MP3388DR
C587059.7D
1333
12-16-13
80
168
0
MP8904DD
H7S055L
1341
12-31-13
80
168
0
MP8904DD
H7S055M
1341
12-31-13
80
168
0
MP8904DD
H7S055H
1341
12-31-13
80
168
0
MPQ2459GJ
CB82866.8-MPQ
1310
10-23-13
80
96
0
MPQ28261DL
B782399.9BY
1336
10-23-13
78
96
0
MPQ28261DL
D781503.9Y
1336
10-23-13
79
96
0
MPQ4470GL
D783173.8A-MPQ
1336
10-15-13
79
96
0
MPQ28261DL
D881895.9Y
1338
10-15-13
79
96
0
MPQ4568GQ
CB82838.1A-PSC
1338
11-21-13
80
96
0
MPQ28261DL
B782399.1CY
1338
10-30-13
78
96
0
MPQ28261DL
D881893.9Y
1338
10-30-13
78
96
0
MPQ9361DJ
CB89176.7B-MPQ
1338
10-23-13
80
96
0
MPQ28261DL
D881894.9Y
1339
11-06-13
78
96
0
MPQ28261DL
D881950.9Y
1339
11-11-13
78
96
0
MPQ4568GQ
CB82838.1R-MPQ
1331
11-27-13
80
96
0
MPQ28261DL
D881948.9Y
1340
11-15-13
78
96
0
MPQ4470GL-AEC1
D881951.8B-MPQ
1345
12-05-13
80
96
0
MPQ4470GL-AEC1
D781489.8A-MPQ
1342
12-10-13
80
96
0
MPQ4470AGL
D882058.8C-MPQ
1345
12-26-13
80
96
0
MP1495DJ
D54U590.8
1336
10-08-13
79
48
0
MP1495DJ
D54T499.8Y
1337
10-23-13
80
48
0
MP6002DN
9685967.7
1334
10-15-13
75
48
0
MP1495DJ
D54U587.8A
1337
10-30-13
80
48
0
MP1495DJ
D54U393.8A
1337
10-30-13
80
48
0
MP1495DJ
D54U393.8
1337
11-06-13
80
48
0
MP1495DJ
D34R027.8Y
1338
11-27-13
80
48
0
MP1495DJ
D54U591.8Y
1340
11-27-13
80
48
0
MP1495DJ
D34R031.8Y
1338
11-27-13
80
48
0
MP1495DJ
D54U592.8Y
1340
11-29-13
80
48
0
MP1495DJ
D64W257.8Y
1345
12-05-13
80
48
0
Total
0
The Future of Analog IC Technology®
-7-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
C486546.9AQ
1230
10-30-13
78
0
MP3388DR
HL264301
1247
10-09-13
80
0
MP6923GS
FA292054BA
1304
10-29-13
87
0
MP3389EF
E0077900
1325
11-12-13
82
0
MP4050GS
EP294804
1310
12-26-13
86
0
MPQ3426DL-AEC1
FA222153C
1308
12-16-13
80
0
MPQ3426DL-AEC1
D472744.9
1327
12-16-13
80
0
MPQ3426DL-AEC1
CB72166.8B
1318
12-16-13
80
0
MP170GS
EP315711
1334
12-20-13
85
0
MP3389EF
C345925.9
1217
12-31-13
83
0
Total
FA No.
0
BCM12S
#fail
#device hours
Accel Factor
FIT Rate
0
821000
348
3.4
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGN
FA222077C2
1321
10-09-13
50
0
MP6922AGN
FA222077C3
1325
10-09-13
50
0
MP1496DJ
CC4M447.8AQ
1314
10-09-13
47
0
MP1496DJ
D14N454.8
1318
10-09-13
47
0
MP28259DD
D189507.8
1318
10-09-13
47
0
MP28259DD
D189648.8A
1321
10-09-13
47
0
MP3391EF
CB72193.1
1324
10-09-13
50
0
MP1494DJ
D34Q676.8AY
1328
10-12-13
50
0
MP28252EL
C549800.7
1313
10-17-13
50
0
MP28252EL
C74E863.9M
1313
10-17-13
50
0
MP28251GD
CB72281.8Q
1310
10-29-13
50
0
MP1494DJ
D34R029.8
1331
11-01-13
50
0
MP1494DJ
D34R029.8A
1331
11-01-13
50
0
MP1494DJ
D34R029.8B
1331
11-01-13
50
0
MPQ4570GF
FA272913
1310
11-01-13
50
0
MP8606DL
BA72823.8A1
1307
11-13-13
50
0
MP8606DL
BA72823.8A2
1307
11-13-13
50
0
MP28256EL
CA88787.9
1319
11-13-13
47
0
MP28256EL
C988583.9
1324
11-13-13
50
0
*
The Future of Analog IC Technology®
-8-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP3426DL
CB72166.8B
1318
11-19-13
47
0
MP3426DL
D472745.1
1325
11-19-13
47
0
MP4012DS
C782699.1B
1324
11-14-13
50
0
MP6922AGSE
FA342660
1336
11-25-13
50
0
MP4050GJ
EP294803
1312
12-26-13
50
0
MP4050GS
EP294804
1310
12-26-13
50
0
MPQ3426DL-AEC1
FA222153C
1308
12-16-13
50
0
MPQ3426DL-AEC1
D472744.9
1327
12-16-13
50
0
MPQ3426DL-AEC1
CB72166.8B
1318
12-16-13
50
0
MP6922AGSE
FA342661
1338
12-03-13
50
0
MP8736DL
B993710010
1338
12-20-13
50
0
MP8736DL
B993710011
1338
12-20-13
50
0
MP8736DL
B993710013
1339
12-20-13
50
0
MP8736DL
B993710014
1339
12-20-13
50
0
MP170GS-CU10
EP315711
1334
12-20-13
55
0
MP3388DR
C587059.7D
1333
12-16-13
50
0
MP65151DJ
D380167.9D
1328
12-16-13
50
0
MP6922AGSE
FA342661
1340
12-17-13
50
0
MP3384LGQ
C882755.1ABL
1341
12-31-13
50
0
MP3384LGQ
C882755.1ABM
1341
12-31-13
50
0
MP3384LGQ
C882755.1ABH
1341
12-31-13
50
0
MP8904DD
H7S055L
1341
12-31-13
50
0
MP8904DD
H7S055M
1341
12-31-13
50
0
MP8904DD
H7S055H
1341
12-31-13
50
0
Total
FA No.
0
3.3 BCM35 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2617AGL
D44S427.8
1325
10-09-13
50
168
0
MP2617AGL
D143347.8C
1319
10-09-13
50
168
0
MP1470GJ
CB4K470.8
1305
10-16-13
50
168
0
MP1470GJ
CB4K472.8
1307
10-16-13
50
168
0
MP5010ADQ
D54T592.8AAQ
1329
11-01-13
80
168
0
The Future of Analog IC Technology®
-9-
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2625GL
D54U700.8
1339
12-31-13
50
168
0
MP2625GL
D54U526.8
1337
12-31-13
50
168
0
MP5010ADQ
D34R696.1
1327
11-06-13
50
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP1470GJ
HP278109
1229
11-20-13
84
0
MP6509GF
HP3532
1321
12-20-13
84
0
MP2161GJ
H81332
1337
12-20-13
80
0
MP7751GF
HP345009
1336
12-25-13
80
0
0
0
Total
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
328000
348
8.4
FA No.
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP8845GC
HP2883
1311
10-12-13
50
0
MP8845BGC
HP2883
1303
10-12-13
50
0
MP2617AGL
D44S427.8
1325
10-09-13
47
0
MP2617AGL
D143347.8C
1319
10-09-13
47
0
MP3394SGS
D54T477.8A
139
10-09-13
50
0
MP1470GJ
CB4K470.8
1305
10-16-13
47
0
MP1470GJ
CB4K472.8
1307
10-16-13
47
0
MP5010ADQ
D54T592.8AAQ
1329
11-01-13
50
0
MP2316DG
HP309301
1319
12-20-13
50
0
MP3394SGS
D24Q167.9
1315
12-31-13
47
0
MP3394SGS
D24Q169.9
1316
12-31-13
47
0
MP6508GR
HP3532
1321
12-20-13
50
0
MP6509GF
HP3532
1321
12-20-13
50
0
MP5505GL
D24Q213.8
1330
12-31-13
47
0
MP5505GL
D34Q513.8
1335
12-31-13
47
0
MP2625GL
D54U700.8
1339
12-31-13
48
0
MP2625GL
D54U526.8
1337
12-31-13
47
0
MP6508GR
HP353202
1339
12-20-13
50
0
MP6509GF
HP353206
1339
12-20-13
50
0
The Future of Analog IC Technology®
- 10 -
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP1494SGJ
HP3434
1333
12-20-13
50
0
MP6508GR
HP353202
1343
12-17-13
50
0
MP6509GF
HP353206
1343
12-26-13
50
0
Total
FA No.
0
3.4 BCM05 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,HHNEC
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ20056GJ-AEC1
FA2X2125A
1250
12-03-13
77
0
MPQ20055GJ-AEC1
FA2X2125
1252
12-03-13
77
0
0
0
Total
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
144000
348
19
FA No.
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP3120DJ
D272478.1AT
1315
11-01-13
49
0
MP3120DJ
D272478.1CT
1324
11-01-13
47
0
MPQ20055DD-AEC1
FA2X2125B
1301
12-03-13
50
0
MPQ20055GJ-AEC1
FA2X2125
1252
12-03-13
50
0
MPQ20051DQ-AEC
C772915.1
1302
12-03-13
50
0
MPM3830GQV
FA282942B
1339
12-20-13
50
0
Total
0
The Future of Analog IC Technology®
- 11 -
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
3.5 BCM18 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
SMIC
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
HP3318
1311
10-09-13
80
0
NB677GQ
HP3573
1331
10-12-13
80
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
160000
348
15.3
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
HP3318
1311
10-09-13
50
0
NB677GQ
HP3573
1331
10-12-13
50
0
NB676GQ
HP3563
1331
12-20-13
50
0
Total
0
The Future of Analog IC Technology®
- 12 -
FA No.
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.0 PACKAGE RELIABILITY MONITORING DATA
4.1 QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
QFN2*2
ASAT
QFN2*2
UCD
QFN2*3
ASAT
QFN2*3
UCD
QFN3*3
ASAT
QFN3*3
UCD
QFN3*4
ASAT
QFN3*4
UCD
QFN4*4
ASAT
QFN4*4
UCD
QFN4*5
ASAT
QFN5*5
UCD
QFN5*5
ASAT
QFN7*7
UCD
QFN5*6
UTAC
UCD
QFN6*6
JCET
QFN2*2
UCD
QFN7*7
JCET
QFN4*4
QFN3*3
4.1.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
1230
10-30-13
160
0
MPQ2489DQ-AEC1
1301
10-12-13
292
0
MPQ2489DQ-AEC1
1303
10-12-13
292
0
MPQ2489DQ-AEC1
1309
10-12-13
300
0
MPQ4566GD-AEC1
1309
10-09-13
302
0
MPQ4566GD-AEC1
1309
10-09-13
100
0
MPQ1530DQ-AEC1
1319
10-09-13
110
0
MPQ1530DQ-AEC1
1319
10-09-13
205
0
MPQ1530DQ-AEC1
1330
10-09-13
300
0
MPQ2016DD-AEC1
1303
10-24-13
300
0
MPQ2016DD-AEC1
1315
10-24-13
324
0
MP3425DL
1240
10-17-13
300
0
MPQ1530DQ-AEC1
1328
11-01-13
210
0
MP5010ADQ
1329
11-01-13
200
0
MPQ2489DQ-AEC1
1330
10-17-13
205
0
MPQ1530DQ-AEC1
1326
11-01-13
208
0
MPQ1530DQ-AEC1
1248
12-25-13
280
0
MPQ1530DQ-AEC1
1250
12-25-13
280
0
MPQ1530DQ-AEC1
1247
12-25-13
280
0
MPQ1530DQ-AEC1
1317
12-20-13
200
0
MPQ20055DD-AEC1 1301
12-03-13
360
0
FA NO.
The Future of Analog IC Technology®
- 13 -
MONOLITHIC POWER SYSTEMS
Q4
Device
D/C
MPQ20051DQ-AEC1 1302
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
12-03-13
360
0
MPQ3426DL-AEC1
1308
12-16-13
302
0
MPQ2489DQ-AEC1
1301
12-31-13
210
0
MPQ2489DQ-AEC1
1303
12-31-13
210
0
MPQ2489DQ-AEC1
1309
12-31-13
210
0
MPQ4566GD-33-AEC 1309
12-26-13
384
0
MP6508GR
1321
12-20-13
300
0
MPQ1530DQ-AEC1
1328
12-25-13
95
0
MPQ1530DQ-AEC1
1326
12-25-13
95
0
MPQ1530DQ-AEC1
1330
12-25-13
95
0
MPQ1530DQ-AEC1
1319
12-25-13
95
0
MPQ1530DQ-AEC1
1248
12-25-13
200
0
MPQ1530DQ-AEC1
1250
12-25-13
200
0
MPQ1530DQ-AEC1
1247
12-25-13
200
0
MPQ3426DL-AEC1
1327
12-16-13
302
0
MPQ3426DL-AEC1
1318
12-16-13
302
0
MPQ2489DQ-AEC1
1330
12-18-13
100
0
MP2626GR
1322
12-05-13
100
0
MP6508GR
1339
12-20-13
300
0
MP6508GR
1343
12-17-13
300
0
MP62551DGT
1330
12-05-13
102
0
MP3384LGQ
1341
12-31-13
225
0
MP3384LGQ
1341
12-31-13
225
0
MP3384LGQ
1341
12-31-13
225
0
MP8904DD
1341
12-31-13
200
0
MP8904DD
1341
12-31-13
200
0
MP8904DD
1341
12-31-13
200
0
MP2360DG
1342
12-31-13
200
0
MP2360DG
1342
12-31-13
200
0
MP2360DG
1342
12-31-13
200
0
MP6508GR
1348
12-26-13
100
0
MP5010ADQ
1327
11-06-13
50
0
MP5010BDQ
1330
10-15-13
50
0
MP5010BDQ
1330
10-15-13
50
0
MP5010ADQ
1327
11-06-13
50
0
MP2633GR
1343
12-10-13
50
0
MP5010ADQ
1340
12-10-13
50
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 14 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
SAT picture of QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.1.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Close
Date
Sample
Size
# of
Fail
MPQ2489DQ-AEC1 1301
10-12-13
84
0
1000
MPQ2489DQ-AEC1 1303
10-12-13
84
0
1000
MPQ2489DQ-AEC1 1309
10-12-13
94
0
1000
MPQ4566GD-AEC1 1309
10-09-13
94
0
1000
MPQ1530DQ-AEC1 1319
10-09-13
97
0
1000
MPQ1530DQ-AEC1 1330
10-09-13
94
0
1000
Device
D/C
FA NO.
# of
cycle
MP28252EL
1313
10-17-13
50
0
1000
MP28252EL
1313
10-17-13
50
0
1000
MPQ2016DD-AEC1 1303
10-24-13
84
0
1000
MPQ2016DD-AEC1 1315
10-24-13
94
0
1000
MP3425DL
1240
10-17-13
97
0
1000
MP5010ADQ
1329
11-01-13
97
0
1000
MP28256EL
1319
11-13-13
47
0
1000
MP28256EL
1324
11-13-13
49
0
1000
MP3426DL
1318
11-19-13
46
0
1000
MP3426DL
1325
11-19-13
46
0
1000
MPQ1530DQ-AEC1 1248
12-25-13
84
0
1000
MPQ1530DQ-AEC1 1250
12-25-13
84
0
1000
MPQ1530DQ-AEC1 1247
12-25-13
84
0
1000
MPQ20055DD-AEC1 1301
12-03-13
84
0
1000
MPQ20051DQ-AEC
1302
12-03-13
84
0
1000
MPQ3426DL-AEC1 1308
12-16-13
94
0
1000
The Future of Analog IC Technology®
- 15 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6508GR
1321
12-20-13
94
0
1000
MPQ3426DL-AEC1 1327
12-16-13
94
0
1000
MPQ3426DL-AEC1 1318
FA NO.
# of
cycle
12-16-13
93
0
1000
MP2209DL
1334
12-16-13
94
0
1000
MP2119DQ
1333
12-16-13
97
0
1000
MPQ2489DQ-AEC1 1330
12-18-13
94
0
1000
MP3388DR
1333
12-16-13
97
0
1000
MP6508GR
1339
12-20-13
94
0
1000
MP6508GR
1343
12-17-13
94
0
1000
MP3384LGQ
1341
12-31-13
96
0
1000
MP3384LGQ
1341
12-31-13
97
0
1000
MP3384LGQ
1341
12-31-13
96
0
1000
MP8904DD
1341
12-31-13
97
0
1000
MP8904DD
1341
12-31-13
97
0
1000
MP8904DD
1341
12-31-13
97
0
1000
MP2360DG
1342
12-31-13
97
0
1000
MP2360DG
1342
12-31-13
97
0
1000
MP2360DG
1342
12-31-13
97
0
1000
MP5010ADQ
1327
11-06-13
50
0
100
MP26058DQ
1331
10-23-13
50
0
100
MP5010BDQ
1330
10-15-13
50
0
100
MPQ4459DQT
1325
10-08-13
50
0
100
MPQ4560DQ
1334
10-30-13
50
0
100
MP2635GR
1336
10-09-13
50
0
100
MP5010BDQ
1330
10-15-13
50
0
100
MP5010BDQ
1330
10-24-13
50
0
100
MP2633GR
1336
10-09-13
50
0
100
MP5010BDQ
1330
10-24-13
50
0
100
MP5010BDQ
1330
10-24-13
50
0
100
MP5010BDQ
1331
10-24-13
50
0
100
MP5010ADQ
1327
11-06-13
50
0
100
MPQ2128DG-AEC1 1324
10-08-13
50
0
100
10-09-13
50
0
100
MP2633GR
1336
MP3426DL
1333
10-08-13
50
0
100
MP1907GQ
1325
10-08-13
50
0
100
MPQ28261DL
1336
10-23-13
50
0
100
MP2635GR
1335
10-09-13
50
0
100
MPQ28261DL
1336
10-23-13
50
0
100
MP2633GR
1335
10-09-13
50
0
100
MP2633GR
1338
10-09-13
50
0
100
MP2633GR
1336
10-09-13
50
0
100
MP28256EL
1337
11-06-13
50
0
100
The Future of Analog IC Technology®
- 16 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ28261DL
1338
10-15-13
50
0
100
MPQ4456GQT
1336
10-15-13
50
0
100
MPQ4568GQ
1338
11-21-13
50
0
100
MP2633GR
1337
10-15-13
50
0
100
MP2633GR
1338
10-15-13
50
0
100
MP8642DU
1334
10-15-13
50
0
100
MP8049SDU
1332
10-15-13
50
0
100
MPQ28261DL
1338
10-30-13
50
0
100
MP2633GR
1338
10-15-13
50
0
100
MPQ28261DL
1338
10-30-13
50
0
100
MPQ4558DQ-AEC1 1338
10-15-13
50
0
100
FA NO.
# of
cycle
MP28253EL-C323
1338
10-15-13
50
0
100
MP62550DGT
1339
10-15-13
50
0
100
PQ20056GG-18-AEC 1337
10-15-13
50
0
100
10-23-13
50
0
100
MP2633GR
1338
MP2633GR
1338
10-23-13
50
0
100
MP5010BDQ
1338
10-24-13
50
0
100
MP2633GR
1338
10-23-13
50
0
100
MP1720DQ-3
1337
10-23-13
50
0
100
MP2633GR
1338
10-23-13
50
0
100
MPQ4560DQ
1336
10-30-13
50
0
100
MP2633GR
1338
10-30-13
50
0
100
MP5010BDQ
1339
10-23-13
50
0
100
MPQ28261DL
1339
11-06-13
50
0
100
MP2303DQ
1341
10-23-13
50
0
100
MP4459DQT
1337
10-23-13
50
0
100
MP2633GR
1338
10-30-13
50
0
100
MP5410EQ
1338
10-30-13
50
0
100
NB600CQ
1339
10-30-13
50
0
100
MP28256EL
1339
10-30-13
50
0
100
MP5010BDQ
1339
10-30-13
50
0
100
MP2633GR
1341
10-30-13
50
0
100
MP2012DQ
1339
10-30-13
50
0
100
MP2633GR
1335
10-30-13
50
0
100
MP3388DR
1333
10-30-13
50
0
100
MP5010BDQ
1340
10-30-13
50
0
100
MPQ28261DL
1339
11-11-13
50
0
100
MP2633GR
1341
10-30-13
50
0
100
MP2633GR
1342
10-30-13
50
0
100
MP2633GR
1341
10-30-13
50
0
100
MP2633GR
1342
10-30-13
50
0
100
MP3388DR-C414
1341
10-30-13
50
0
100
The Future of Analog IC Technology®
- 17 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5010BDQ
1339
10-30-13
50
0
100
MP8904DD
1339
11-06-13
50
0
100
FA NO.
# of
cycle
MP1530DQ
1342
11-06-13
50
0
100
MP5010BDQ
1341
11-06-13
50
0
100
MPQ4560DQ
1342
11-06-13
50
0
100
MP2633GR
1341
11-06-13
50
0
100
MP2633GR
1342
11-06-13
50
0
100
MP5010BDQ
1340
11-06-13
50
0
100
MPQ2016DD-AEC1 1319
11-15-13
50
0
100
MPQ2016DD-AEC1 1337
11-06-13
50
0
100
11-15-13
50
0
100
MP2633GR
1343
MPQ6400DG-33-AEC 1342
11-15-13
50
0
100
MP2633GR
1343
11-06-13
50
0
100
MPQ4568GQ
1331
11-27-13
50
0
100
MPQ28261DL
1340
11-15-13
50
0
100
MP2633GR
1343
11-06-13
50
0
100
MP5010BDQ
1340
11-06-13
50
0
100
MP1530DQ
1343
11-08-13
50
0
100
MP2633GR
1342
11-06-13
50
0
100
MPQ4560DQ
1342
11-11-13
50
0
100
MP62041DQFU-1
1339
11-15-13
50
0
100
MPQ4561DQ-AEC1 1339
11-15-13
50
0
100
MP2633GR
1343
11-15-13
50
0
100
NB600CQ
1344
11-15-13
50
0
100
MP4459DQT
1342
12-05-13
50
0
100
MP3388DR-C414
1345
11-15-13
50
0
100
MP2607DL
1336
11-15-13
50
0
100
MP5010BDQ
1341
11-08-13
50
0
100
MP28256EL
1342
11-08-13
50
0
100
MP2633GR
1343
11-08-13
50
0
100
MP2005DD
1344
11-20-13
50
0
100
MP8352DL
1340
11-08-13
50
0
100
MP5010BDQ
1343
11-08-13
50
0
100
MP5010BDQ
1342
11-08-13
50
0
100
MP1907GQ
1342
11-08-13
50
0
100
MP2136EG
1341
11-08-13
50
0
100
MP2633GR
1343
11-15-13
50
0
100
MP4561DQ-C227
1341
11-15-13
50
0
100
MP2633GR
1343
12-10-13
50
0
100
MP28114DG
1303
11-20-13
50
0
100
MPQ4560DQ
1344
11-27-13
50
0
100
MP8726EL
1345
11-20-13
50
0
100
The Future of Analog IC Technology®
- 18 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28114DG
1343
11-20-13
50
0
100
MP28256EL
1345
11-20-13
50
0
100
FA NO.
# of
cycle
MP5010SDQ
1339
11-20-13
50
0
100
MP5010DQ-C347
1341
12-05-13
50
0
100
MP28253EL
1347
12-05-13
50
0
100
MP2101DQ
1344
11-21-13
50
0
100
MP28252EL
1345
11-21-13
50
0
100
MP2633GR
1343
11-21-13
50
0
100
MP26123DR
1344
11-21-13
50
0
100
MP28253EL
1344
11-21-13
50
0
100
MP2633GR
1343
11-21-13
50
0
100
MP28119EG-1.0
1345
11-21-13
50
0
100
MP8904DD
1343
11-21-13
50
0
100
MP5010DQ
1346
11-21-13
50
0
100
MP8904DD
1343
11-21-13
50
0
100
MP8125DR
1345
11-27-13
50
0
100
PQ20056GG-33-AEC 1345
11-27-13
50
0
100
MP1907GQ
1341
12-05-13
50
0
100
MP2303DQ
1344
11-27-13
50
0
100
MP28114DG
1345
11-27-13
50
0
100
MP8726EL
1344
11-27-13
50
0
100
PQ20056GG-33-AEC 1321
11-27-13
50
0
100
MP2012DQ
1346
11-29-13
50
0
100
MP28252EL
1343
11-29-13
50
0
100
MP5010ADQ
1340
12-10-13
50
0
100
MP2633GR
1343
11-29-13
50
0
100
MP28252EL
1345
12-02-13
50
0
100
MP28256EL
1346
12-02-13
50
0
100
MPQ4558DQ-AEC1 1344
12-05-13
50
0
100
MP5010DQ
1347
12-05-13
50
0
100
MP28253EL-C323
1347
12-05-13
50
0
100
MP5000DQ
1346
12-05-13
50
0
100
MP26123DR
1346
12-12-13
50
0
100
MP28128DQ
1340
12-05-13
50
0
100
MP5010BDQ
1346
12-05-13
50
0
100
MP3388DR-C414
1347
12-05-13
50
0
100
MP28254EL
1347
12-10-13
50
0
100
MP3388SGR
1346
12-10-13
50
0
100
MP24893DQ
1347
12-10-13
50
0
100
MP5010BDQ
1346
12-10-13
50
0
100
MP3209DGU
1312
12-10-13
50
0
100
MP28114DG
1347
12-10-13
50
0
100
The Future of Analog IC Technology®
- 19 -
MONOLITHIC POWER SYSTEMS
Q4
Device
D/C
PQ20056GG-18-AEC 1347
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
12-10-13
50
0
100
FA NO.
# of
cycle
MP28252EL
1347
12-10-13
50
0
100
MP5010BDQ
1346
12-10-13
50
0
100
MP2633GR
1344
12-12-13
50
0
100
NB634EL
1341
12-12-13
50
0
100
MP28128DQ
1345
12-12-13
50
0
100
MP28253EL
1349
12-12-13
50
0
100
MP2633GR
1344
12-12-13
50
0
100
MP2452DD
1348
12-12-13
50
0
100
MPQ2483DQ-AEC1 1342
12-19-13
45
0
100
MP4459DQT
1348
12-18-13
50
0
100
MP2633AGR
1344
12-18-13
50
0
100
MP2136EG
1346
12-18-13
50
0
100
MP2136EG
1346
12-18-13
50
0
100
MP3430HQ
1345
12-18-13
50
0
100
MP8049SDU-C533
1348
12-18-13
50
0
100
MP3388DR-C414
1349
12-18-13
50
0
100
MP28115DQ
1348
12-18-13
50
0
100
MP4350DQ
1348
12-18-13
50
0
100
MP2633GR
1343
12-19-13
50
0
100
MP28256EL
1349
12-20-13
50
0
100
MP26123DR
1349
12-19-13
50
0
100
MP2635GR
1321
12-19-13
50
0
100
MP1517DR
1349
12-19-13
50
0
100
MP28252EL
1349
12-26-13
50
0
100
MP28256EL
1349
12-26-13
50
0
100
MP8126DR
1348
12-26-13
50
0
100
MP2107DQ
1343
12-26-13
50
0
100
MP3388DR-C414
1350
12-26-13
50
0
100
MPQ2128DG-AEC1 1341
12-26-13
50
0
100
MP1907GQ
1351
12-26-13
50
0
100
MP2633AGR
1328
12-26-13
50
0
100
MP2635GR
1324
12-26-13
50
0
100
NB634EL
1349
12-26-13
50
0
100
MP5000SDQ
1340
12-26-13
50
0
100
NB600CQ
1349
12-31-13
50
0
100
MP5010BDQ
1350
12-31-13
50
0
100
MP2633GR
1350
12-31-13
50
0
100
MP2005DD
1350
12-31-13
50
0
100
MP2607DL
1349
12-31-13
50
0
100
Total
0
The Future of Analog IC Technology®
- 20 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.1.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
FA NO.
# of hrs
1230
10-30-13
80
0
168
MPQ2489DQ-AEC1 1301
10-12-13
87
0
168
MPQ2489DQ-AEC1 1303
10-12-13
87
0
168
MPQ2489DQ-AEC1 1309
10-12-13
100
0
168
MPQ4566GD-AEC1 1309
10-09-13
97
0
168
MPQ1530DQ-AEC1 1319
10-09-13
97
0
168
MPQ1530DQ-AEC1 1330
10-09-13
97
0
168
MP28252EL
1313
10-17-13
50
0
168
MP28252EL
1313
10-17-13
50
0
168
MPQ2016DD-AEC1 1303
10-24-13
85
0
168
MPQ2016DD-AEC1 1315
10-24-13
97
0
168
1240
10-17-13
97
0
168
MPQ1530DQ-AEC1 1328
11-01-13
99
0
168
MP3425DL
1329
11-01-13
97
0
168
MPQ2489DQ-AEC1 1330
MP5010ADQ
10-17-13
93
0
168
MPQ1530DQ-AEC1 1326
11-01-13
98
0
168
MP28256EL
1319
11-13-13
47
0
168
MP28256EL
1324
11-13-13
50
0
168
MP3426DL
1318
11-19-13
47
0
168
MP3426DL
1325
11-19-13
47
0
168
MPQ1530DQ-AEC1 1317
12-25-13
100
0
168
MPQ1530DQ-AEC1 1317
12-20-13
97
0
168
MPQ20055DD-AEC1 1301
12-03-13
87
0
168
MPQ20051DQ-AEC
1302
12-03-13
87
0
168
MPQ3426DL-AEC1 1308
12-16-13
96
0
168
1321
12-20-13
96
0
168
MPQ3426DL-AEC1 1327
12-16-13
97
0
168
MPQ3426DL-AEC1 1318
12-16-13
97
0
168
MP6508GR
MP2209DL
1334
12-16-13
97
0
168
MP2119DQ
1333
12-16-13
97
0
168
MP3388DR
1333
12-16-13
97
0
168
MP6508GR
1339
12-20-13
97
0
168
MP6508GR
1343
12-17-13
97
0
168
MP3384LGQ
1341
12-31-13
97
0
168
MP3384LGQ
1341
12-31-13
97
0
168
MP3384LGQ
1341
12-31-13
97
0
168
MP8904DD
1341
12-31-13
97
0
168
MP8904DD
1341
12-31-13
97
0
168
The Future of Analog IC Technology®
- 21 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8904DD
1341
12-31-13
97
0
168
MP5010ADQ
1327
11-06-13
50
0
48
FA NO.
# of hrs
MP26058DQ
1331
10-23-13
50
0
48
MP5010BDQ
1330
10-15-13
50
0
48
MPQ4459DQT
1325
10-08-13
50
0
48
MPQ4560DQ
1334
10-30-13
50
0
48
MP2635GR
1336
10-09-13
50
0
48
MP5010BDQ
1330
10-15-13
50
0
48
MP5010BDQ
1330
10-24-13
50
0
48
MP2633GR
1336
10-09-13
50
0
48
MP5010BDQ
1330
10-24-13
50
0
48
MP5010BDQ
1330
10-24-13
50
0
48
MP5010BDQ
1331
10-24-13
50
0
48
MP5010ADQ
1327
11-06-13
50
0
48
MPQ2128DG-AEC1 1324
10-08-13
50
0
48
MP2633GR
1336
10-09-13
50
0
48
MP3426DL
1333
10-08-13
50
0
48
MP1907GQ
1325
10-08-13
50
0
48
MPQ28261DL
1336
10-23-13
50
0
48
MP2635GR
1335
10-09-13
50
0
48
MPQ28261DL
1336
10-23-13
50
0
48
MP2633GR
1335
10-09-13
50
0
48
MP2633GR
1338
10-09-13
50
0
48
MP2633GR
1336
10-09-13
50
0
48
MP28256EL
1337
11-06-13
50
0
48
MPQ28261DL
1338
10-15-13
50
0
48
MPQ4456GQT
1336
10-15-13
50
0
48
MPQ4568GQ
1338
11-21-13
50
0
48
MP2633GR
1337
10-15-13
50
0
48
MP2633GR
1338
10-15-13
50
0
48
MP8642DU
1334
10-15-13
50
0
48
MP8049SDU
1332
10-15-13
50
0
48
MPQ28261DL
1338
10-30-13
50
0
48
MP2633GR
1338
10-15-13
50
0
48
MPQ28261DL
1338
10-30-13
50
0
48
MPQ4558DQ-AEC1 1338
10-15-13
50
0
48
50
0
48
MP28253EL-C323
1338
10-15-13
MP62550DGT
1339
10-15-13
50
0
48
PQ20056GG-18-AEC 1337
10-15-13
50
0
48
MP2633GR
1338
10-23-13
50
0
48
MP2633GR
1338
10-23-13
50
0
48
MP5010BDQ
1338
10-24-13
50
0
48
The Future of Analog IC Technology®
- 22 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2633GR
1338
10-23-13
50
0
48
MP1720DQ-3
1337
10-23-13
50
0
48
FA NO.
# of hrs
MP2633GR
1338
10-23-13
50
0
48
MPQ4560DQ
1336
10-30-13
50
0
48
MP2633GR
1338
10-30-13
50
0
48
MP5010BDQ
1339
10-23-13
50
0
48
MPQ28261DL
1339
11-06-13
50
0
48
MP2303DQ
1341
10-23-13
50
0
48
MP4459DQT
1337
10-23-13
50
0
48
MP2633GR
1338
10-30-13
50
0
48
MP5410EQ
1338
10-30-13
50
0
48
NB600CQ
1339
10-30-13
50
0
48
MP28256EL
1339
10-30-13
50
0
48
MP5010BDQ
1339
10-30-13
50
0
48
MP2633GR
1341
10-30-13
50
0
48
MP2012DQ
1339
10-30-13
50
0
48
MP2633GR
1335
10-30-13
50
0
48
MP3388DR
1333
10-30-13
50
0
48
MP5010BDQ
1340
10-30-13
50
0
48
MPQ28261DL
1339
11-11-13
50
0
48
MP2633GR
1341
10-30-13
48
0
48
MP2633GR
1342
10-30-13
50
0
48
MP2633GR
1341
10-30-13
50
0
48
MP2633GR
1342
10-30-13
50
0
48
MP3388DR-C414
1341
10-30-13
50
0
48
MP5010BDQ
1339
10-30-13
50
0
48
MP8904DD
1339
11-06-13
50
0
48
MP1530DQ
1342
11-06-13
50
0
48
MP5010BDQ
1341
11-06-13
50
0
48
MPQ4560DQ
1342
11-06-13
50
0
48
MP2633GR
1341
11-06-13
50
0
48
MP2633GR
1342
11-06-13
50
0
48
MP5010BDQ
1340
11-06-13
50
0
48
MPQ2016DD-AEC1 1319
11-15-13
50
0
48
MPQ2016DD-AEC1 1337
11-06-13
50
0
48
1343
11-15-13
50
0
48
MPQ6400DG-33-AEC 1342
11-15-13
50
0
48
MP2633GR
MP2633GR
1343
11-06-13
50
0
48
MPQ4568GQ
1331
11-27-13
50
0
48
MPQ28261DL
1340
11-15-13
50
0
48
MP2633GR
1343
11-06-13
50
0
48
MP5010BDQ
1340
11-06-13
50
0
48
The Future of Analog IC Technology®
- 23 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1530DQ
1343
11-08-13
50
0
48
MP2633GR
1342
11-06-13
50
0
48
MPQ4560DQ
1342
11-11-13
50
0
48
MP62041DQFU-1
1339
11-15-13
50
0
48
MPQ4561DQ-AEC1 1339
11-15-13
50
0
48
FA NO.
# of hrs
MP2633GR
1343
11-15-13
50
0
48
NB600CQ
1344
11-15-13
50
0
48
MP4459DQT
1342
12-05-13
50
0
48
MP3388DR-C414
1345
11-15-13
50
0
48
MP2607DL
1336
11-15-13
50
0
48
MP5010BDQ
1341
11-08-13
50
0
48
MP28256EL
1342
11-08-13
50
0
48
MP2633GR
1343
11-08-13
50
0
48
MP2005DD
1344
11-20-13
50
0
48
MP8352DL
1340
11-08-13
50
0
48
MP5010BDQ
1343
11-08-13
50
0
48
MP5010BDQ
1342
11-08-13
50
0
48
MP1907GQ
1342
11-08-13
50
0
48
MP2136EG
1341
11-08-13
50
0
48
MP2633GR
1343
11-15-13
50
0
48
MP4561DQ-C227
1341
11-15-13
50
0
48
MP2633GR
1343
12-10-13
0
48
MP28114DG
1303
11-20-13
50
0
48
MPQ4560DQ
1344
11-27-13
50
0
48
MP8726EL
1345
11-20-13
50
0
48
MP28114DG
1343
11-20-13
50
0
48
MP28256EL
1345
11-20-13
50
0
48
MP5010SDQ
1339
11-20-13
50
0
48
MP5010DQ-C347
1341
12-05-13
50
0
48
MP28253EL
1347
12-05-13
50
0
48
MP2101DQ
1344
11-21-13
50
0
48
MP28252EL
1345
11-21-13
50
0
48
MP2633GR
1343
11-21-13
50
0
48
MP26123DR
1344
11-21-13
50
0
48
MP28253EL
1344
11-21-13
50
0
48
MP2633GR
1343
11-21-13
50
0
48
MP28119EG-1.0
1345
11-21-13
50
0
48
MP8904DD
1343
11-21-13
50
0
48
MP5010DQ
1346
11-21-13
50
0
48
MP8904DD
1343
11-21-13
50
0
48
MP8125DR
1345
11-27-13
50
0
48
PQ20056GG-33-AEC 1345
11-27-13
50
0
48
The Future of Analog IC Technology®
- 24 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1907GQ
1341
12-05-13
50
0
48
MP2303DQ
1344
11-27-13
50
0
48
FA NO.
# of hrs
MP28114DG
1345
11-27-13
50
0
48
MP8726EL
1344
11-27-13
50
0
48
PQ20056GG-33-AEC 1321
11-27-13
50
0
48
MP2012DQ
1346
11-29-13
50
0
48
MP28252EL
1343
11-29-13
50
0
48
MP5010ADQ
1340
12-10-13
50
0
48
MP2633GR
1343
11-29-13
50
0
48
MP28252EL
1345
12-02-13
50
0
48
MP28256EL
1346
12-02-13
50
0
48
MPQ4558DQ-AEC1 1344
12-05-13
50
0
48
MP5010DQ
1347
12-05-13
50
0
48
MP28253EL-C323
1347
12-05-13
50
0
48
MP5000DQ
1346
12-05-13
50
0
48
MP26123DR
1346
12-12-13
50
0
48
MP28128DQ
1340
12-05-13
50
0
48
MP5010BDQ
1346
12-05-13
50
0
48
MP3388DR-C414
1347
12-05-13
50
0
48
MP28254EL
1347
12-10-13
50
0
48
MP3388SGR
1346
12-10-13
50
0
48
MP24893DQ
1347
12-10-13
50
0
48
MP5010BDQ
1346
12-10-13
50
0
48
MP3209DGU
1312
12-10-13
50
0
48
MP28114DG
1347
12-10-13
50
0
48
PQ20056GG-18-AEC 1347
12-10-13
50
0
48
MP28252EL
1347
12-10-13
50
0
48
MP5010BDQ
1346
12-10-13
50
0
48
MP2633GR
1344
12-12-13
50
0
48
NB634EL
1341
12-12-13
50
0
48
MP28128DQ
1345
12-12-13
50
0
48
MP28253EL
1349
12-12-13
50
0
48
MP2633GR
1344
12-12-13
50
0
48
MP2452DD
1348
12-12-13
50
0
48
MPQ2483DQ-AEC1 1342
12-19-13
50
0
48
MP4459DQT
1348
12-18-13
50
0
48
MP2633AGR
1344
12-18-13
50
0
48
MP2136EG
1346
12-18-13
50
0
48
MP2136EG
1346
12-18-13
50
0
48
MP3430HQ
1345
12-18-13
50
0
48
MP8049SDU-C533
1348
12-18-13
50
0
48
MP3388DR-C414
1349
12-18-13
50
0
48
The Future of Analog IC Technology®
- 25 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28115DQ
1348
12-18-13
50
MP4350DQ
1348
12-18-13
50
0
48
FA NO.
# of hrs
MP2633GR
1343
12-19-13
50
0
48
MP28256EL
1349
12-20-13
50
0
48
MP26123DR
1349
12-19-13
50
0
48
MP2635GR
1321
12-19-13
50
0
48
MP1517DR
1349
12-19-13
50
0
48
MP28252EL
1349
12-26-13
50
0
48
MP28256EL
1349
12-26-13
50
0
48
MP8126DR
1348
12-26-13
50
0
48
MP2107DQ
1343
12-26-13
50
0
48
MP3388DR-C414
1350
12-26-13
50
0
48
MPQ2128DG-AEC1 1341
12-26-13
50
0
48
MP1907GQ
1351
12-26-13
50
0
48
MP2633AGR
1328
12-26-13
50
0
48
MP2635GR
1324
12-26-13
50
0
48
NB634EL
1349
12-26-13
50
0
48
MP5000SDQ
1340
12-26-13
50
0
48
NB600CQ
1349
12-31-13
50
0
48
MP5010BDQ
1350
12-31-13
50
0
48
MP2633GR
1350
12-31-13
50
0
48
MP2005DD
1350
12-31-13
50
0
48
MP2607DL
1349
12-31-13
50
0
48
Total
0
4.1.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4566GD-AEC1
1309
10-09-13
75
0
MPQ1530DQ-AEC1
1319
10-09-13
85
0
MPQ1530DQ-AEC1
1330
10-09-13
85
0
MP2013GQ
1331
10-09-13
101
0
MP28252EL
1313
10-17-13
50
0
MP28252EL
1313
10-17-13
50
0
MPQ2016DD-AEC1
1303
10-24-13
78
0
MPQ2016DD-AEC1
1315
10-24-13
78
0
MP3425DL
1240
10-17-13
89
0
MPQ1530DQ-AEC1
1328
11-01-13
85
0
MP28256EL
1319
11-13-13
50
0
FA NO.
The Future of Analog IC Technology®
- 26 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28256EL
1324
11-13-13
49
0
MP3426DL
1318
11-19-13
50
0
MP3426DL
1325
11-19-13
50
0
MPQ1530DQ-AEC1
1317
12-25-13
101
0
MPQ1530DQ-AEC1
1317
12-20-13
85
0
MPQ20055DD-AEC1 1301
12-03-13
90
0
MPQ20051DQ-AEC1 1302
12-03-13
90
0
101
0
MPQ3426DL-AEC1
1308
12-16-13
MP6508GR
1321
12-20-13
80
0
MPQ3426DL-AEC1
1327
12-16-13
100
0
MPQ3426DL-AEC1
1318
12-16-13
101
0
MP2626GR
1322
12-05-13
100
0
MP6508GR
1339
12-20-13
80
0
MP6508GR
1343
12-17-13
80
0
MP62551DGT
1330
12-05-13
102
0
MP3388SGR
1346
12-26-13
100
0
MP6508GR
1348
12-26-13
80
0
Total
FA NO.
0
4.2 SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
SOIC8
ANST
SOIC14
UCD
SOIC8-EP
ANST
SOIC16
ANST
SOIC8-7
ANST
SOIC20
ANST
SOIC8
ANST
SOIC28
ANST
SOIC8-EP
UTAC
SOIC8
UTAC
SOIC8-EP
JCET
SOIC8
JCET
SOIC8-EP
JCET
SOIC16
ASE-KS
SOIC8-EP
ASE-KS
SOIC8
4.2.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGN
1321
10-09-13
200
0
MP6922AGN
1325
10-09-13
200
0
MP3394SGS
139
10-09-13
200
0
FA NO.
The Future of Analog IC Technology®
- 27 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6923GS
1304
10-29-13
110
0
MP4012DS
1324
11-14-13
300
0
MP6922AGSE
1336
11-25-13
300
0
MP4012DS
1324
11-14-13
102
0
MP24830HS
1309
12-26-13
300
0
MP4050GS
1310
12-26-13
402
0
MP3394SGS
1315
12-31-13
50
0
MP3394SGS
1316
12-31-13
50
0
MP24830HS
1309
12-26-13
100
0
MPQ5040GS
1319
12-25-13
200
0
MP6922AGSE
1338
12-03-13
300
0
MP170GS-CU10
1334
12-20-13
410
0
MP6922AGSE
1340
12-17-13
300
0
MP3394SGS
1315
12-03-13
80
0
MP3394SGS
1341
12-18-13
50
0
Total
FA NO.
0
SAT picture of SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.2.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGN
1321
10-09-13
94
0
1000
MP6922AGN
1325
10-09-13
94
0
1000
FA NO.
# of
cycle
MP3394SGS
139
10-09-13
94
0
1000
MP4012DS
1324
11-14-13
94
0
1000
MP6922AGSE
1336
11-25-13
94
0
1000
MP24830HS
1309
12-26-13
94
0
1000
MP4050GS
1310
12-26-13
94
0
1000
The Future of Analog IC Technology®
- 28 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3394SGS
1315
12-31-13
47
0
1000
MP3394SGS
1316
12-31-13
47
0
1000
FA NO.
# of
cycle
MPQ5040GS
1319
12-25-13
94
0
1000
MP6922AGSE
1338
12-03-13
94
0
1000
MP170GS
1334
12-20-13
97
0
1000
MP6922AGSE
1340
12-17-13
94
0
1000
MP3394SGS
1333
10-08-13
50
0
100
MP3394SGS
1332
10-08-13
50
0
100
MP4012DS
1334
10-08-13
50
0
100
MPQ4462DN-AEC1
1334
10-08-13
50
0
100
MPQ4559DN
1335
10-08-13
50
0
100
MP3394SGY
1328
10-08-13
50
0
100
MP3394SGY
1328
10-08-13
50
0
100
MP3394SGY
1321
10-08-13
50
0
100
MP3399EY
1320
10-08-13
50
0
100
MP3388EY
1316
10-30-13
50
0
100
MP3389EY
1311
10-08-13
50
0
100
MP3399EY
1310
10-08-13
50
0
100
MP3391EY
1304
10-08-13
50
0
100
MP2396ES-C296
1337
10-08-13
50
0
100
MP2301ENE
1336
10-08-13
50
0
100
MP020-5GS
1337
10-08-13
50
0
100
MP3394SGS
1332
10-08-13
50
0
100
MP1584EN-C461
1336
10-08-13
50
0
100
MP2307DN
1325
10-08-13
50
0
100
MP2497GN-A
1322
10-08-13
50
0
100
MP020-5GS
1336
10-24-13
50
0
100
MP020-5GS
1337
10-24-13
50
0
100
MP4021GS-A
1325
10-08-13
50
0
100
MP020-5GS
1337
10-24-13
50
0
100
MP4034GS
1337
10-15-13
50
0
100
MP2303ADN-C249
1335
10-15-13
50
0
100
MP3394SGS
1332
10-15-13
50
0
100
MP8706EN
1325
10-15-13
50
0
100
MP1582EN
1337
10-15-13
50
0
100
HF81GS
1336
12-10-13
50
0
100
MP020-5GS
1337
10-24-13
50
0
100
MP8706EN
1325
10-15-13
50
0
100
MP2403DN
1338
10-15-13
50
0
100
MP6002DN
1334
10-15-13
50
0
100
MP2380DN
1339
10-23-13
50
0
100
MP2467DN-C478
1331
10-23-13
50
0
100
The Future of Analog IC Technology®
- 29 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP200DS
1331
10-23-13
50
0
100
MP24830HS-C470
1338
10-30-13
50
0
100
FA NO.
# of
cycle
MP3394SGS
1338
10-30-13
50
0
100
MP2303ADN
1341
10-30-13
50
0
100
MP2374DS
1339
10-30-13
50
0
100
MP62340DS-1
1336
10-30-13
50
0
100
MP4030AGS
1335
10-30-13
50
0
100
MP44010HS
1339
10-30-13
50
0
100
MP2307DN
1326
10-30-13
50
0
100
MP3394ES
1336
10-30-13
50
0
100
MP9415EN
1339
10-30-13
50
0
100
MP3394ES
1336
10-30-13
50
0
100
MP1482DN
1339
11-06-13
50
0
100
MP3394ES-C462
1337
11-06-13
50
0
100
MP2403DN-C535
1340
11-06-13
50
0
100
MP020-5GS
1336
11-06-13
50
0
100
MP111DS
1341
11-06-13
50
0
100
MP020-5GS
1336
11-06-13
50
0
100
MP1482DN
1324
11-06-13
50
0
100
MP020-5GS
1339
11-06-13
50
0
100
MP6001DN
1335
11-06-13
50
0
100
MP4030GS
1342
11-06-13
50
0
100
MP2307DN
1326
11-15-13
50
0
100
MP8705EN
1308
11-15-13
50
0
100
MP1482DN
1344
11-15-13
50
0
100
MP2307DN
1325
11-06-13
50
0
100
MP1593DN-C218
1342
11-06-13
50
0
100
MP1482DN
1344
11-15-13
50
0
100
DAS09
1343
11-15-13
50
0
100
MP1593DN
1344
11-15-13
50
0
100
MP1482DN
1344
11-20-13
50
0
100
MP3394SGS
1339
11-20-13
50
0
100
MP3394SGS
1341
11-08-13
50
0
100
HF81GS
1331
12-18-13
50
0
100
MP020-5GS
1339
11-08-13
50
0
100
HF81GS
1342
12-20-13
50
0
100
MP1484EN
1342
11-08-13
50
0
100
MP8706EN
1340
11-08-13
50
0
100
MP3394SGS
1338
11-11-13
50
0
100
DAS09
1339
11-15-13
50
0
100
MP1484EN
1342
11-20-13
50
0
100
MP1482DN
1344
11-20-13
50
0
100
The Future of Analog IC Technology®
- 30 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1410ES
1344
11-20-13
50
0
100
MP2307DN
1342
11-20-13
50
0
100
MP44010HS
1344
11-20-13
50
0
100
MP100GN
1314
11-20-13
50
0
100
MP8001DS
1342
11-21-13
50
0
100
MP1432DN
1340
11-21-13
50
0
100
MP2403DN
1335
11-21-13
50
0
100
FA NO.
# of
cycle
CM500GS
1316
11-21-13
50
0
100
MP6001DN
1315
11-21-13
50
0
100
MP2489DN-C504
1344
11-21-13
50
0
100
MP020-5GS
1344
11-21-13
50
0
100
MP3394SGS
1341
12-18-13
50
0
100
MP1482DN
1344
11-27-13
50
0
100
MP6920DN
1345
11-21-13
50
0
100
MP3398GS
1336
11-27-13
50
0
100
MP1591DN
1342
11-27-13
50
0
100
CM500GS
1345
11-27-13
50
0
100
MP6205DN
1343
11-27-13
50
0
100
MP1582EN
1345
11-27-13
50
0
100
MP1593DN
1346
11-27-13
50
0
100
MP1484EN
1325
11-29-13
50
0
100
MP3398GS
1336
11-29-13
50
0
100
MP2307DN
1343
11-29-13
50
0
100
MP1423DN
1347
11-29-13
50
0
100
MP1482DN
1346
11-29-13
50
0
100
MP111DS
1346
12-05-13
50
0
100
MP3394SGS
1341
12-05-13
50
0
100
MP3398GS
1338
12-05-13
50
0
100
MP111DS
1346
12-05-13
50
0
100
MP1482DN
1309
12-02-13
50
0
100
MP020-5GS
1345
12-12-13
50
0
100
MP2482DN
1347
12-05-13
50
0
100
CM3406DS
1347
12-05-13
50
0
100
MP4012DS
1334
12-05-13
50
0
100
MP4559DN
1341
12-10-13
50
0
100
DAS09
1343
12-12-13
50
0
100
MP4030GS
1347
12-12-13
50
0
100
MP1484EN-C166
1326
12-12-13
50
0
100
MP2565DN
1343
12-12-13
50
0
100
MP2303ADN
1348
12-12-13
50
0
100
MP9415EN
1346
12-12-13
50
0
100
MP1484EN-C166
1328
12-12-13
50
0
100
The Future of Analog IC Technology®
- 31 -
MONOLITHIC POWER SYSTEMS
Q4
Device
D/C
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
MP1484EN
1346
12-12-13
50
0
100
MP2403DN
1346
12-12-13
50
0
100
MP38894DN
1335
12-12-13
50
0
100
MP4030GS
1347
12-12-13
50
0
100
MP1484EN-C166
1348
12-18-13
50
0
100
MP2489DN-C489
1348
12-18-13
50
0
100
MP8709EN
1348
12-18-13
50
0
100
MP1591DN
1347
12-18-13
50
0
100
MP8706EN
1348
12-18-13
50
0
100
MP24943DN
1343
12-18-13
50
0
100
MP2307DN
1345
12-18-13
50
0
100
MP2303DN
1348
12-18-13
50
0
100
MP62351ES
1339
12-19-13
50
0
100
MP1593DN-C218
1347
12-19-13
50
0
100
MP24830HS-C470
1346
12-19-13
50
0
100
MP1482DN-C165
1309
12-19-13
50
0
100
MP6001DN
1348
12-20-13
50
0
100
MP4689DN
1350
12-20-13
50
0
100
MP1482DN
1347
12-20-13
50
0
100
MP111DS
1348
12-20-13
50
0
100
MP1482DS-C165
1350
12-26-13
50
0
100
MP3394ES
1341
12-26-13
50
0
100
MP1484EN-C166
1347
12-26-13
50
0
100
MP4030GS
1349
12-26-13
50
0
100
DAS09
1347
12-26-13
50
0
100
MP2374DS
1347
12-31-13
50
0
100
MP3394SGS
1346
12-31-13
50
0
100
MP4030GS
1349
12-31-13
50
0
100
MP1484EN
1349
12-31-13
50
0
100
MP201DS
1348
12-31-13
50
0
100
MP1423DN
1348
12-31-13
50
0
100
Total
0
4.2.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGN
1321
10-09-13
97
0
168
MP6922AGN
1325
10-09-13
97
0
168
MP3394SGS
139
10-09-13
97
0
168
MP4012DS
1324
11-14-13
97
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 32 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGSE
1336
11-25-13
97
0
168
MP24830HS
1309
12-26-13
97
0
168
FA NO.
# of hrs
MP4050GS
1310
12-26-13
97
0
168
MP3394SGS
1315
12-31-13
47
0
168
MP3394SGS
1316
12-31-13
47
0
168
MPQ5040GS
1319
12-25-13
97
0
168
MP6922AGSE
1338
12-03-13
97
0
168
MP170GS
1334
12-20-13
96
0
168
MP6922AGSE
1340
12-17-13
97
0
168
MP3394SGS
1333
10-08-13
50
0
48
MP3394SGS
1332
10-08-13
50
0
48
MP4012DS
1334
10-08-13
50
0
48
MPQ4462DN-AEC1
1334
10-08-13
50
0
48
MPQ4559DN
1335
10-08-13
50
0
48
MP3394SGY
1328
10-08-13
50
0
48
MP3394SGY
1328
10-08-13
50
0
48
MP3394SGY
1321
10-08-13
50
0
48
MP3399EY
1320
10-08-13
50
0
48
MP3388EY
1316
10-30-13
50
0
48
MP3389EY
1311
10-08-13
50
0
48
MP3399EY
1310
10-08-13
50
0
48
MP3391EY
1304
10-08-13
50
0
48
MP2396ES-C296
1337
10-08-13
50
0
48
MP2301ENE
1336
10-08-13
50
0
48
MP020-5GS
1337
10-08-13
50
0
48
MP3394SGS
1332
10-08-13
50
0
48
MP1584EN-C461
1336
10-08-13
50
0
48
MP2307DN
1325
10-08-13
50
0
48
MP2497GN-A
1322
10-08-13
50
0
48
MP020-5GS
1336
10-24-13
50
0
48
MP020-5GS
1337
10-24-13
50
0
48
MP4021GS-A
1325
10-08-13
50
0
48
MP020-5GS
1337
10-24-13
50
0
48
MP4034GS
1337
10-15-13
50
0
48
MP2303ADN-C249
1335
10-15-13
50
0
48
MP3394SGS
1332
10-15-13
50
0
48
MP8706EN
1325
10-15-13
50
0
48
MP1582EN
1337
10-15-13
50
0
48
HF81GS
1336
12-10-13
50
0
48
MP020-5GS
1337
10-24-13
50
0
48
MP8706EN
1325
10-15-13
50
0
48
MP2403DN
1338
10-15-13
50
0
48
The Future of Analog IC Technology®
- 33 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6002DN
1334
10-15-13
50
0
48
MP2380DN
1339
10-23-13
50
0
48
MP2467DN-C478
1331
10-23-13
50
0
48
MP200DS
1331
10-23-13
50
0
48
MP24830HS-C470
1338
10-30-13
50
0
48
MP3394SGS
1338
10-30-13
50
0
48
MP2303ADN
1341
10-30-13
50
0
48
FA NO.
# of hrs
MP2374DS
1339
10-30-13
50
0
48
MP62340DS-1
1336
10-30-13
50
0
48
MP4030AGS
1335
10-30-13
50
0
48
MP44010HS
1339
10-30-13
50
0
48
MP2307DN
1326
10-30-13
50
0
48
MP3394ES
1336
10-30-13
50
0
48
MP9415EN
1339
10-30-13
50
0
48
MP3394ES
1336
10-30-13
50
0
48
MP1482DN
1339
11-06-13
50
0
48
MP3394ES-C462
1337
11-06-13
50
0
48
MP2403DN-C535
1340
11-06-13
50
0
48
MP020-5GS
1336
11-06-13
50
0
48
MP111DS
1341
11-06-13
50
0
48
MP020-5GS
1336
11-06-13
50
0
48
MP1482DN
1324
11-06-13
50
0
48
MP020-5GS
1339
11-06-13
50
0
48
MP6001DN
1335
11-06-13
50
0
48
MP4030GS
1342
11-06-13
50
0
48
MP2307DN
1326
11-15-13
50
0
48
MP8705EN
1308
11-15-13
50
0
48
MP1482DN
1344
11-15-13
50
0
48
MP2307DN
1325
11-06-13
50
0
48
MP1593DN-C218
1342
11-06-13
50
0
48
MP1482DN
1344
11-15-13
50
0
48
DAS09
1343
11-15-13
50
0
48
MP1593DN
1344
11-15-13
50
0
48
MP1482DN
1344
11-20-13
50
0
48
MP3394SGS
1339
11-20-13
50
0
48
MP3394SGS
1341
11-08-13
50
0
48
HF81GS
1331
12-18-13
50
0
48
MP020-5GS
1339
11-08-13
50
0
48
HF81GS
1342
12-20-13
50
0
48
MP1484EN
1342
11-08-13
50
0
48
MP8706EN
1340
11-08-13
50
0
48
MP3394SGS
1338
11-11-13
50
0
48
The Future of Analog IC Technology®
- 34 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
DAS09
1339
11-15-13
50
0
48
MP1484EN
1342
11-20-13
50
0
48
MP1482DN
1344
11-20-13
50
0
48
MP1410ES
1344
11-20-13
50
0
48
MP2307DN
1342
11-20-13
50
0
48
MP44010HS
1344
11-20-13
50
0
48
MP100GN
1314
11-20-13
50
0
48
FA NO.
# of hrs
MP8001DS
1342
11-21-13
50
0
48
MP1432DN
1340
11-21-13
49
0
48
MP2403DN
1335
11-21-13
46
0
48
CM500GS
1316
11-21-13
50
0
48
MP6001DN
1315
11-21-13
50
0
48
MP2489DN-C504
1344
11-21-13
50
0
48
MP020-5GS
1344
11-21-13
50
0
48
MP1482DN
1344
11-27-13
50
0
48
MP6920DN
1345
11-21-13
50
0
48
MP3398GS
1336
11-27-13
50
0
48
MP1591DN
1342
11-27-13
50
0
48
CM500GS
1345
11-27-13
50
0
48
MP6205DN
1343
11-27-13
50
0
48
MP1582EN
1345
11-27-13
50
0
48
MP1593DN
1346
11-27-13
50
0
48
MP1484EN
1325
11-29-13
50
0
48
MP3398GS
1336
11-29-13
50
0
48
MP2307DN
1343
11-29-13
50
0
48
MP1423DN
1347
11-29-13
50
0
48
MP1482DN
1346
11-29-13
50
0
48
MP111DS
1346
12-05-13
50
0
48
MP3394SGS
1341
12-05-13
50
0
48
MP3398GS
1338
12-05-13
50
0
48
MP111DS
1346
12-05-13
50
0
48
MP020-5GS
1345
12-12-13
50
0
48
MP2482DN
1347
12-05-13
50
0
48
CM3406DS
1347
12-05-13
50
0
48
MP4012DS
1334
12-05-13
50
0
48
MP4559DN
1341
12-10-13
50
0
48
DAS09
1343
12-12-13
50
0
48
MP4030GS
1347
12-12-13
50
0
48
MP1484EN-C166
1326
12-12-13
50
0
48
MP2565DN
1343
12-12-13
50
0
48
MP2303ADN
1348
12-12-13
50
0
48
MP9415EN
1346
12-12-13
50
0
48
The Future of Analog IC Technology®
- 35 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1484EN-C166
1328
12-12-13
50
0
48
MP1484EN
1346
12-12-13
50
0
48
MP2403DN
1346
12-12-13
50
0
48
MP38894DN
1335
12-12-13
50
0
48
FA NO.
# of hrs
MP4030GS
1347
12-12-13
50
0
48
MP1484EN-C166
1348
12-18-13
50
0
48
MP2489DN-C489
1348
12-18-13
50
0
48
MP8709EN
1348
12-18-13
50
0
48
MP1591DN
1347
12-18-13
50
0
48
MP8706EN
1348
12-18-13
50
0
48
MP24943DN
1343
12-18-13
50
0
48
MP2307DN
1345
12-18-13
50
0
48
MP2303DN
1348
12-18-13
50
0
48
MP62351ES
1339
12-19-13
50
0
48
MP1593DN-C218
1347
12-19-13
50
0
48
MP24830HS-C470
1346
12-19-13
50
0
48
MP1482DN-C165
1309
12-19-13
50
0
48
MP6001DN
1348
12-20-13
50
0
48
MP4689DN
1350
12-20-13
50
0
48
MP1482DN
1347
12-20-13
50
0
48
MP111DS
1348
12-20-13
50
0
48
MP1482DS-C165
1350
12-26-13
50
0
48
MP3394ES
1341
12-26-13
50
0
48
MP1484EN-C166
1347
12-26-13
50
0
48
MP4030GS
1349
12-26-13
50
0
48
DAS09
1347
12-26-13
50
0
48
MP2374DS
1347
12-31-13
50
0
48
MP3394SGS
1346
12-31-13
50
0
48
MP4030GS
1349
12-31-13
50
0
48
MP1484EN
1349
12-31-13
50
0
48
MP201DS
1348
12-31-13
50
0
48
MP1423DN
1348
12-31-13
50
0
48
Total
0
4.2.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGSE
1336
11-25-13
80
0
MP4012DS
1324
11-14-13
80
0
MP4050GS
1310
12-26-13
80
0
FA NO.
The Future of Analog IC Technology®
- 36 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3394SGS
1316
12-31-13
50
0
MP24830HS
1309
12-26-13
80
0
MP6922AGSE
1338
12-03-13
80
0
MP170GS
1334
12-20-13
80
0
MP6922AGSE
1340
12-17-13
80
0
MP3394SGS
1315
12-03-13
80
0
Total
FA NO.
0
4.3 MSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
MSOP8
ANST
MSOP8-EP
UCD
MSOP10-EP
ANST
MSOP10
UCD
MSOP10
ANST
MSOP10-EP
ANST
MSOP8
4.3.1 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1329
10-24-13
94
0
1000
MP1542DK
1337
10-15-13
50
0
100
MP1411DH
1337
10-15-13
50
0
100
FA NO.
# of
cycle
MP2361DK
1340
10-23-13
50
0
100
MP2905EK
1334
10-30-13
50
0
100
MP1411DH
1341
11-06-13
50
0
100
MP2105DK
1341
11-15-13
50
0
100
MP1411DH
1342
11-15-13
50
0
100
MP1411DH
1334
11-15-13
50
0
100
MP1412DH
1340
11-20-13
50
0
100
MP1411DH
1344
11-20-13
50
0
100
MP1411DH
1344
11-27-13
50
0
100
MP1412DH
1340
12-05-13
50
0
100
MP1542DK
1343
12-05-13
50
0
100
MP1412DH
1343
12-05-13
50
0
100
MP1412DH
1343
12-05-13
50
0
100
MP1542DK
1345
12-10-13
50
0
100
MP1412DH
1344
12-10-13
50
0
100
MP20073DH
1345
12-12-13
50
0
100
The Future of Analog IC Technology®
- 37 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2270DH
1346
12-18-13
50
0
100
MP2481DH
1348
12-18-13
50
0
100
MP20075DH
1346
12-26-13
50
0
100
MP2105DK
1329
12-19-13
50
0
100
MP6211DH
1342
12-19-13
50
0
100
MP1542DK
1348
12-31-13
50
0
100
Total
FA NO.
# of
cycle
0
4.3.2Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1322
07-01-13
50
0
48
MP1412DH
1329
10-24-13
96
0
48
MP1542DK
1337
10-15-13
50
0
48
MP1411DH
1337
10-15-13
50
0
48
FA NO.
# of hrs
MP2361DK
1340
10-23-13
50
0
48
MP2905EK
1334
10-30-13
50
0
48
MP1411DH
1341
11-06-13
50
0
48
MP2105DK
1341
11-15-13
50
0
48
MP1411DH
1342
11-15-13
50
0
48
MP1411DH
1334
11-15-13
50
0
48
MP1412DH
1340
11-20-13
50
0
48
MP1411DH
1344
11-20-13
50
0
48
MP1411DH
1344
11-27-13
50
0
48
MP1412DH
1340
12-05-13
50
0
48
MP1542DK
1343
12-05-13
50
0
48
MP1412DH
1343
12-05-13
50
0
48
MP1412DH
1343
12-05-13
50
0
48
MP1542DK
1345
12-10-13
50
0
48
MP1412DH
1344
12-10-13
50
0
48
MP20073DH
1345
12-12-13
50
0
48
MP2270DH
1346
12-18-13
50
0
48
MP2481DH
1348
12-18-13
50
0
48
MP20075DH
1346
12-26-13
50
0
48
MP2105DK
1329
12-19-13
50
0
48
MP6211DH
1342
12-19-13
50
0
48
MP1542DK
1348
12-31-13
50
0
48
Total
0
The Future of Analog IC Technology®
- 38 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.4 TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
TSOT23-5
JCET
TSOT23-5
ASNT
TSOT23-6
JCET
TSOT23-6
ASNT
TSOT23-8
JCET
TSOT23-8
4.4.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3410DJ
1315
10-09-13
205
0
MP2359DJ
1325
10-09-13
200
0
MPQ20056GJ-AEC1 1250
12-03-13
360
0
MPQ20055GJ-AEC1 1252
12-03-13
360
0
MP65151DJ
1328
12-16-13
200
0
MP2359DJ
1339
12-26-13
200
0
MP2359DJ
1339
12-26-13
200
0
MP2359DJ
1339
12-26-13
200
0
Total
FA NO.
0
SAT picture of TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.4.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2359DJ
1325
10-09-13
97
0
1000
MP3120DJ
1315
11-01-13
47
0
1000
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 39 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3120DJ
1324
11-01-13
49
0
1000
MPQ20056GJ-AEC1
1250
12-03-13
84
0
1000
MPQ20055GJ-AEC1
1252
12-03-13
84
0
1000
MP65151DJ
1328
12-16-13
93
0
1000
MP2359DJ
1339
12-26-13
97
0
1000
MP2359DJ
1339
12-26-13
97
0
1000
MP2359DJ
1339
12-26-13
97
0
1000
FA NO.
# of
cycle
MPQ2459GJ
1310
10-23-13
50
0
100
MPQ2451DT
1325
10-30-13
50
0
100
MPQ2451GT-33-AEC
1323
11-05-13
50
0
100
MP2451DT
1333
10-08-13
50
0
100
MP2370DJ
1332
10-08-13
50
0
100
MP2451DT
1333
10-15-13
50
0
100
MP2601EJ
1335
10-15-13
50
0
100
MP62055EJ
1330
10-23-13
50
0
100
MP3217DJ
1337
10-23-13
50
0
100
MPQ9361DJ
1338
10-23-13
50
0
100
MP2451DT
1331
10-23-13
50
0
100
MP3216DJ
1339
10-23-13
50
0
100
MP2359DJ
1337
10-23-13
50
0
100
MP2359DT
1338
10-30-13
50
0
100
MP2451DT
1336
10-30-13
50
0
100
MP2459GJ
1338
10-30-13
50
0
100
MP1469GJ
1338
10-30-13
50
0
100
MP62055EJ
1330
10-30-13
50
0
100
MP62055EJ
1338
10-30-13
50
0
100
MP62055EJ
1331
10-30-13
50
0
100
MP62055EJ
1334
11-06-13
50
0
100
MP62055EJ
1342
11-06-13
50
0
100
MP62055EJ
1341
11-06-13
50
0
100
MP1469GJ
1339
11-06-13
50
0
100
MP6400DJ-01
1340
11-15-13
50
0
100
MP3217DJ
1339
11-15-13
50
0
100
MP62055EJ
1342
11-06-13
50
0
100
MP62055EJ
1342
11-06-13
50
0
100
MP62055EJ
1342
11-08-13
50
0
100
MP62055EJ
1342
11-08-13
50
0
100
MP62055EJ
1342
11-08-13
50
0
100
MP3217DJ
1341
11-11-13
50
0
100
MP2451DT
1342
11-20-13
50
0
100
MP26085DJ
1341
11-20-13
50
0
100
MP8802DJ-3.3
1337
11-21-13
50
0
100
The Future of Analog IC Technology®
- 40 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP62551DJ
1338
11-21-13
50
0
100
MP2259DJ
1343
11-27-13
50
0
100
MP62055EJ
1344
11-27-13
50
0
100
MP2105DJ
1344
11-27-13
50
0
100
MP3302DJ
1346
11-29-13
50
0
100
MP3217DJ
1341
11-29-13
50
0
100
MP2357DJ
1343
11-29-13
50
0
100
MP2359DJ
1342
12-05-13
50
0
100
MP6400DJ-01
1346
12-05-13
50
0
100
FA NO.
# of
cycle
MP3205DJ
1346
12-05-13
50
0
100
MP62055EJ
1342
12-05-13
50
0
100
MP62055EJ
1342
12-05-13
50
0
100
MP65150DJ
1344
12-12-13
50
0
100
MP62055EJ
1346
12-12-13
50
0
100
MP2000DJ-ADJ
1347
12-12-13
50
0
100
MP6400DJ-33
1328
12-12-13
50
0
100
MP65151DJ
1348
12-18-13
50
0
100
MPQ20056GJ-33-AEC 1346
12-18-13
50
0
100
MP3217DJ
1342
12-19-13
50
0
100
MP62055EJ
1344
12-19-13
50
0
100
MP3202DJ
1349
12-20-13
50
0
100
MP1540DJ
1347
12-19-13
50
0
100
MP6400DJ-01
1347
12-26-13
50
0
100
MP3302DJ
1347
12-26-13
50
0
100
MP3120DJ
1348
12-26-13
50
0
100
MP3217DJ
1342
12-26-13
50
0
100
MP2104DJ
1349
12-26-13
50
0
100
MP2370DJ
1350
12-31-13
50
0
100
MP4050GJ
1349
12-31-13
50
0
100
MP2104DJ
1349
12-31-13
50
0
100
MP2259DJ
1348
12-31-13
50
0
100
MP62055EJ
1349
12-31-13
50
0
100
Total
0
4.4.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3410DJ
1315
10-09-13
97
0
168
MP2359DJ
1325
10-09-13
97
0
168
MP3120DJ
1315
11-01-13
47
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 41 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3120DJ
1324
11-01-13
49
0
168
MPQ20056GJ-AEC1 1250
12-03-13
87
0
168
MPQ20055GJ-AEC1 1252
FA NO.
# of hrs
12-03-13
87
0
168
MP65151DJ
1328
12-16-13
97
0
168
MPQ2459GJ
1310
10-23-13
50
0
48
MPQ2451DT
1325
10-30-13
50
0
48
MPQ2451GT-33-AEC
1323
11-05-13
50
0
48
MP2451DT
1333
10-08-13
50
0
48
MP2370DJ
1332
10-08-13
50
0
48
MP2451DT
1333
10-15-13
50
0
48
MP2601EJ
1335
10-15-13
50
0
48
MP62055EJ
1330
10-23-13
50
0
48
MP3217DJ
1337
10-23-13
50
0
48
MPQ9361DJ
1338
10-23-13
50
0
48
MP2451DT
1331
10-23-13
50
0
48
MP3216DJ
1339
10-23-13
50
0
48
MP2359DJ
1337
10-23-13
50
0
48
MP2359DT
1338
10-30-13
50
0
48
MP2451DT
1336
10-30-13
50
0
48
MP2459GJ
1338
10-30-13
50
0
48
MP1469GJ
1338
10-30-13
50
0
48
MP62055EJ
1330
10-30-13
50
0
48
MP62055EJ
1338
10-30-13
50
0
48
MP62055EJ
1331
10-30-13
50
0
48
MP62055EJ
1334
11-06-13
50
0
48
MP62055EJ
1342
11-06-13
50
0
48
MP62055EJ
1341
11-06-13
50
0
48
MP1469GJ
1339
11-06-13
50
0
48
MP6400DJ-01
1340
11-15-13
50
0
48
MP3217DJ
1339
11-15-13
50
0
48
MP62055EJ
1342
11-06-13
50
0
48
MP62055EJ
1342
11-06-13
50
0
48
MP62055EJ
1342
11-08-13
50
0
48
MP62055EJ
1342
11-08-13
50
0
48
MP62055EJ
1342
11-08-13
50
0
48
MP3217DJ
1341
11-11-13
50
0
48
MP2451DT
1342
11-20-13
50
0
48
MP26085DJ
1341
11-20-13
50
0
48
MP8802DJ-3.3
1337
11-21-13
50
0
48
MP62551DJ
1338
11-21-13
50
0
48
MP2259DJ
1343
11-27-13
50
0
48
MP62055EJ
1344
11-27-13
50
0
48
The Future of Analog IC Technology®
- 42 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2105DJ
1344
11-27-13
50
0
48
MP3302DJ
1346
11-29-13
50
0
48
MP3217DJ
1341
11-29-13
50
0
48
MP2357DJ
1343
11-29-13
50
0
48
MP2359DJ
1342
12-05-13
50
0
48
FA NO.
# of hrs
MP6400DJ-01
1346
12-05-13
50
0
48
MP3205DJ
1346
12-05-13
50
0
48
MP62055EJ
1342
12-05-13
50
0
48
MP62055EJ
1342
12-05-13
50
0
48
MP65150DJ
1344
12-12-13
50
0
48
MP62055EJ
1346
12-12-13
50
0
48
MP2000DJ-ADJ
1347
12-12-13
50
0
48
MP6400DJ-33
1328
12-12-13
50
0
48
MP65151DJ
1348
12-18-13
50
0
48
MPQ20056GJ-33-AEC 1346
12-18-13
50
0
48
MP3217DJ
1342
12-19-13
50
0
48
MP62055EJ
1344
12-19-13
50
0
48
MP3202DJ
1349
12-20-13
50
0
48
MP1540DJ
1347
12-19-13
50
0
48
MP6400DJ-01
1347
12-26-13
50
0
48
MP3302DJ
1347
12-26-13
50
0
48
MP3120DJ
1348
12-26-13
50
0
48
MP3217DJ
1342
12-26-13
50
0
48
MP2104DJ
1349
12-26-13
50
0
48
MP2370DJ
1350
12-31-13
50
0
48
MP4050GJ
1349
12-31-13
50
0
48
MP2104DJ
1349
12-31-13
50
0
48
MP2259DJ
1348
12-31-13
50
0
48
MP62055EJ
1349
12-31-13
50
0
48
Total
0
4.4.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3410DJ
1315
10-09-13
99
0
MP3120DJ
1315
11-01-13
47
0
MP3120DJ
1324
11-01-13
45
0
MPQ20056GJ-AEC1 1250
12-03-13
90
0
MPQ20055GJ-AEC1 1252
12-03-13
90
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 43 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.5 TSSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
TSSOP20
ASNT
TSSOP16-EP
UCD
TSSOP20-EP
ASNT
TSSOP20
ASNT
TSSOP8
ASNT
TSSOP20-EP
ASNT
TSSOP14
ASNT
TSSOP24
ASNT
TSSOP16
ASNT
TSSOP28
ASNT
TSSOP28-EP
JCET
TSSOP8
4.5.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3391EF
1324
10-09-13
200
0
MPQ4570GF
1335
11-14-13
100
0
MPQ2908GF
1237
12-16-13
100
0
MPQ2908GF
1237
12-16-13
100
0
MP6509GF
1321
12-20-13
273
0
MP7751GF
1336
12-25-13
180
0
MP6509GF
1339
12-20-13
300
0
MP6509GF
1343
12-26-13
300
0
MP3397EF
1346
12-16-13
100
0
Total
FA NO.
0
SAT picture of TSSOP
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 44 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.5.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
MP3391EF
1324
10-09-13
97
0
1000
MP6509GF
1321
12-20-13
84
0
1000
MP7751GF
1336
12-25-13
80
0
1000
MP6509GF
1339
12-20-13
94
0
1000
MP6509GF
1343
12-26-13
94
0
1000
MP6507GF
1333
10-09-13
50
0
100
MP3389EF-C355
1336
10-08-13
50
0
100
MP1026EF
1333
10-09-13
50
0
100
MP3389EF
1331
10-30-13
50
0
100
MP6507GF
1335
11-06-13
50
0
100
MP6505DM
1339
11-15-13
50
0
100
MP8126DF
1339
11-15-13
50
0
100
MP6507GF
1343
11-20-13
50
0
100
MP6507GF
1343
11-21-13
50
0
100
MP8042DF
1345
11-29-13
50
0
100
MP6507GF
1344
11-29-13
50
0
100
MP3399EF
1345
12-05-13
50
0
100
MP3389EF
1342
12-05-13
50
0
100
MP1531DM
1346
12-05-13
50
0
100
MP3389EF
1345
12-10-13
50
0
100
MP7731DF
1344
12-10-13
50
0
100
MP6505DM
1344
12-20-13
50
0
100
MP3391EF
1347
12-19-13
50
0
100
MP7748DF
1345
12-20-13
50
0
100
MP3389EF
1346
12-26-13
50
0
100
MP3389EF
1342
12-26-13
50
0
100
MP8126DF
1345
12-26-13
50
0
100
MP8126DF
1347
12-31-13
50
0
100
MP3389EF
1348
12-31-13
50
0
100
MP3391EF
1347
12-31-13
50
0
100
Total
0
4.5.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3391EF
1324
10-09-13
97
0
168
MPQ2908GF
1237
12-16-13
97
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 45 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6509GF
1321
12-20-13
87
0
168
MP7751GF
1336
12-25-13
80
0
168
MP6509GF
1339
12-20-13
97
0
168
MP6509GF
1343
12-26-13
97
0
168
MP6507GF
1333
10-09-13
50
0
48
MP3389EF-C355
1336
10-08-13
50
0
48
MP1026EF
1333
10-09-13
50
0
48
MP3389EF
1331
10-30-13
50
0
48
MP6507GF
1335
11-06-13
50
0
48
MP6505DM
1339
11-15-13
50
0
48
MP8126DF
1339
11-15-13
50
0
48
MP6507GF
1343
11-20-13
50
0
48
MP6507GF
1343
11-21-13
50
0
48
MP8042DF
1345
11-29-13
50
0
48
MP6507GF
1344
11-29-13
50
0
MP3399EF
1345
12-05-13
50
0
48
MP3389EF
1342
12-05-13
50
0
48
MP1531DM
1346
12-05-13
50
0
48
FA NO.
# of hrs
MP7731DF
1344
12-10-13
50
0
48
MP6505DM
1344
12-20-13
50
0
48
MP3391EF
1347
12-19-13
50
0
48
MP7748DF
1345
12-20-13
50
0
48
MP3389EF
1346
12-26-13
50
0
48
MP3389EF
1342
12-26-13
50
0
48
MP8126DF
1345
12-26-13
50
0
48
MP8126DF
1347
12-31-13
50
0
48
MP3389EF
1348
12-31-13
50
0
48
MP3391EF
1347
12-31-13
50
0
48
Total
0
4.5.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4570GF
1335
11-14-13
78
0
MP6509GF
1321
12-20-13
78
0
MP6509GF
1339
12-20-13
78
0
MP6509GF
1343
12-26-13
78
0
MP3397EF
1346
12-16-13
78
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 46 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.6 FLIP CHIP-QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
FCQFN1*1.5
UTAC
FCQFN2*2
UCD
FCQFN1.5*2
UTAC
FCQFN2*3
UCD
FCQFN2*2
UTAC
FCQFN3*3
UCD
FCQFN2*3
UTAC
FCQFN3*4
UCD
FCQFN3*3
UTAC
FCQFN4*4
UCD
FCQFN3*4
UTAC
FCQFN4*5
UCD
FCQFN3*5
UTAC
FCQFN4*6
UCD
FCQFN4*4
UTAC
FCQFN5*5
UCD
FCQFN4*5
UTAC
FCQFN5*6
UCD
FCQFN4*6
UTAC
FCQFN6*6
4.6.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1311
10-09-13
203
0
NB675GL
1311
10-09-13
102
0
MP28251GD
1330
10-08-13
302
0
NB677GQ
1331
10-12-13
400
0
MP9151GD
1248
11-01-13
360
0
MP28251GD
1310
10-29-13
300
0
MP5506GL
1212
10-17-13
94
0
MP5018GD
1338
11-06-13
300
0
MP5506GL
1330
11-21-13
110
0
MPM3830GQV
1335
11-14-13
200
0
MP5505GL
1252
12-17-13
180
0
MP2316DG
1319
12-20-13
413
0
NB676GQ
1331
12-20-13
400
0
MPM3830GQV
1339
12-20-13
400
0
MP2158GQH
1330
12-20-13
48
0
MP8868GL
1333
12-20-13
50
0
MP2316DG
1338
12-05-13
100
0
MP28251GD
1339
12-05-13
173
0
MP28251GD
1339
12-05-13
200
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 47 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
SAT picture of FLIP CHIP-QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.6.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
NB675GL
1311
10-09-13
94
0
1000
MP2617AGL
1325
10-09-13
47
0
1000
MP2617AGL
1319
10-09-13
47
0
1000
MP28259DD
1318
10-09-13
46
0
1000
MP28259DD
1321
10-09-13
46
0
1000
MP28251GD
1330
10-08-13
94
0
1000
NB677GQ
1331
10-12-13
94
0
1000
MP9151GD
1248
11-01-13
84
0
1000
MP28251GD
1310
10-29-13
94
0
1000
MP8606DL
1307
11-13-13
50
0
1000
MP8606DL
1307
11-13-13
50
0
1000
MPM3830GQV
1335
11-14-13
94
0
1000
MP2316DG
1319
12-20-13
94
0
1000
NB676GQ
1331
12-20-13
94
0
1000
MPM3830GQV
1339
12-20-13
94
0
1000
MP5505GL
1330
12-31-13
47
0
1000
MP5505GL
1335
12-31-13
47
0
1000
MP2625GL
1339
12-31-13
47
0
1000
MP2625GL
1337
12-31-13
47
0
1000
MP28251GD
1303
10-08-13
50
0
100
MP28251GD
1302
10-08-13
50
0
100
MP28251GD
1301
10-08-13
50
0
100
The Future of Analog IC Technology®
- 48 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1250
10-08-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
11-06-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1304
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1311
10-08-13
50
0
100
MP28251GD
1306
10-08-13
50
0
100
MP28251GD
1306
11-13-13
50
0
100
MP28251GD
1311
10-30-13
50
0
100
MP28251GD
1309
11-13-13
50
0
100
MP28251GD
1311
11-13-13
50
0
100
MP28251GD
1306
11-13-13
50
0
100
MP28251GD
1311
11-13-13
50
0
100
MP28251GD
1310
11-13-13
50
0
100
MP28251GD
1311
11-13-13
50
0
100
MP28251GD
1310
11-13-13
50
0
100
MP28251GD
1311
11-13-13
50
0
100
MP28251GD
1306
11-13-13
50
0
100
MP28251GD
1310
11-13-13
50
0
100
MP28251GD
1312
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 49 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1315
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP2617GL
1320
11-29-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP2617GL
1322
11-29-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
MP2617GL
1320
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 50 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1317
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1316
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1318
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1320
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1328
10-08-13
50
0
100
MP28251GD
1328
10-08-13
50
0
100
MP28251GD
1322
11-13-13
50
0
100
MP28251GD
1321
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP28251GD
1319
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1325
10-09-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 51 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1330
10-09-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1330
10-09-13
50
0
100
MP28251GD
1330
11-13-13
50
0
100
MP2617AGL
1331
10-09-13
50
0
100
MP28251GD
1330
11-13-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1331
10-09-13
50
0
100
MP28251GD
1329
11-27-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
12-10-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1329
12-10-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1331
12-31-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP28251GD
1331
11-13-13
50
0
100
MP28251GD
1331
11-13-13
50
0
100
MP28251GD
1331
11-13-13
50
0
100
MP28251GD
1331
11-13-13
50
0
100
MP28251GD
1330
11-13-13
50
0
100
MP28251GD
1331
11-13-13
50
0
100
MP2617AGL
1332
10-09-13
50
0
100
FA NO.
# of
cycle
MP2617AGL
1333
10-09-13
50
0
100
MP28251GD
1329
11-13-13
50
0
100
MP2617AGL
1334
10-09-13
50
0
100
MP2617AGL
1334
10-09-13
50
0
100
MP2617AGL
1335
10-09-13
50
0
100
MP5506GL
1336
10-09-13
50
0
100
MP8762GL
1336
10-08-13
50
0
100
NB671LGQ
1336
10-08-13
50
0
100
MP8736DL
1337
10-09-13
50
0
100
MP2617GL
1334
10-08-13
50
0
100
NB671LGQ
1336
10-08-13
50
0
100
NB671AGQ
1337
10-08-13
50
0
100
MP2162GQH
1336
10-08-13
50
0
100
NB6381DL
1324
10-08-13
50
0
100
MP2617GL
1337
10-08-13
50
0
100
NB671GQ
1307
10-08-13
50
0
100
MP28258DD-C471
1337
10-08-13
50
0
100
MP2617AGL
1336
10-08-13
50
0
100
The Future of Analog IC Technology®
- 52 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB638DL
1335
10-08-13
50
0
100
MPQ4470GL
1336
10-15-13
50
0
100
MP2617GL
1336
10-08-13
50
0
100
MP8736DL
1337
10-08-13
50
0
100
MP2625GL
1336
10-08-13
50
0
100
MP2130DG
1333
10-08-13
50
0
100
NB671LGQ
1336
10-08-13
50
0
100
FA NO.
# of
cycle
NB671GQ
1326
10-08-13
50
0
100
MP2139DD
1329
10-08-13
50
0
100
MPQ8632GL-10
1336
10-08-13
50
0
100
MP2617AGL
1337
10-08-13
50
0
100
MP2130DG
1333
10-08-13
50
0
100
NB671GQ
1326
10-08-13
50
0
100
MP8620DQK
1337
10-08-13
50
0
100
MP8620DQK
1323
10-08-13
50
0
100
MP8620DQK
1338
10-08-13
50
0
100
MP9180DG
1338
10-08-13
50
0
100
MP4470GL
1338
10-08-13
50
0
100
MP2130DG
1332
10-08-13
50
0
100
MP2130DG
1334
10-08-13
50
0
100
MP8051DQU
1207
10-15-13
50
0
100
NB670AGQ
1338
10-15-13
50
0
100
MP2617GL
1338
10-15-13
50
0
100
MP8736DL
1337
10-15-13
50
0
100
MP2617GL
1338
10-15-13
50
0
100
MP9180DG
1338
10-15-13
50
0
100
NB671LGQ
1336
10-15-13
50
0
100
MPQ8632GL-8
1338
10-15-13
50
0
100
NB670AGQ
1338
10-15-13
50
0
100
MP2617AGL
1337
10-15-13
50
0
100
MP9180DG
1338
10-15-13
50
0
100
MP2130DG
1333
10-15-13
50
0
100
MP8736DL
1337
10-15-13
50
0
100
MP2617AGL
1337
10-15-13
50
0
100
MPQ8632GLE-6
1313
10-15-13
50
0
100
MP5506GL
1336
10-15-13
50
0
100
MP9180DG
1339
10-15-13
50
0
100
NB650GL
1339
10-15-13
50
0
100
MP2617AGL
1337
10-15-13
50
0
100
MP2617GL
1337
10-15-13
50
0
100
MPQ8636GL-10
1335
10-15-13
50
0
100
MPQ8636GL-10
1334
10-15-13
50
0
100
The Future of Analog IC Technology®
- 53 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1339
10-23-13
50
0
100
MP9180DG
1339
10-23-13
50
0
100
FA NO.
# of
cycle
MP8762GL
1339
10-23-13
50
0
100
MP9180DG
1340
10-23-13
50
0
100
NB671GQ
1323
10-23-13
50
0
100
MP28251GD
1330
11-13-13
50
0
100
MPQ8632GL-6
1340
10-23-13
50
0
100
MP9180DG
1339
10-23-13
50
0
100
NB671GQ
1322
10-23-13
50
0
100
MPQ8632GLE-6
1339
10-23-13
50
0
100
MP9181DD
1337
10-23-13
50
0
100
NB650GL
1339
10-23-13
50
0
100
MP9447GL
1340
10-23-13
50
0
100
MP9180DG
1340
10-23-13
50
0
100
MPQ8616GL-6
1338
10-23-13
50
0
100
MP1482DS
1330
10-23-13
50
0
100
MP2617GL
1339
10-23-13
50
0
100
MP9180DG
1340
10-23-13
50
0
100
MP9180DG
1340
10-23-13
50
0
100
NB650GL
1339
10-23-13
50
0
100
MP2625GL
1339
10-23-13
50
0
100
MP2617AGL
1337
10-23-13
50
0
100
MP8736DL
1339
10-23-13
50
0
100
MP2617GL
1339
10-23-13
50
0
100
MP28251GD
1330
12-31-13
50
0
100
MP3360DG
1340
10-23-13
50
0
100
MPQ8636GL-10
1339
10-23-13
50
0
100
MP3306EG
1341
10-30-13
50
0
100
NB650GL
1341
10-30-13
50
0
100
NB671AGQ
1336
10-30-13
50
0
100
MP38900DL
1337
10-30-13
50
0
100
NB671GQ
1324
10-30-13
50
0
100
MP9180DG
1340
10-29-13
50
0
100
MP28258DD-C471
1331
10-30-13
50
0
100
MPQ8632GL-10
1340
10-30-13
50
0
100
MP2617GL
1339
10-30-13
50
0
100
NB671GQ
1325
10-30-13
50
0
100
MP28259DD-A-C441 1337
10-30-13
50
0
100
MP8736DL
1341
10-30-13
50
0
100
MP2139DD
1342
10-30-13
50
0
100
MP9181DD
1340
10-30-13
50
0
100
MP2334DD
1336
10-29-13
50
0
100
The Future of Analog IC Technology®
- 54 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1341
10-29-13
50
0
100
MP2625GL
1329
10-30-13
50
0
100
MP28258DD-C471
1325
10-30-13
50
0
100
NB671GQ
1336
10-30-13
50
0
100
NB671GQ
1336
10-30-13
50
0
100
NB671AGQ
1342
10-30-13
50
0
100
MP2617GL
1339
10-30-13
50
0
100
FA NO.
# of
cycle
NB650HGL
1310
10-30-13
50
0
100
MP86884DQKT
1340
10-30-13
50
0
100
MP8736DL
1342
10-30-13
50
0
100
MP2130DG
1303
11-06-13
50
0
100
MP8736DL
1342
11-06-13
50
0
100
MP8606DL
1339
11-06-13
50
0
100
NB671GQ
1338
11-13-13
50
0
100
MP2130DG
1334
11-06-13
50
0
100
MPQ8632GL-10
1321
11-06-13
50
0
100
MP9180DG
1339
11-06-13
50
0
100
MP2130DG
1249
11-06-13
50
0
100
MP2334DD
1333
11-06-13
50
0
100
NB650HGL
1311
11-06-13
50
0
100
MP2130DG
1338
11-06-13
50
0
100
MP9181DD
1340
11-06-13
50
0
100
MP2617AGL
1339
11-06-13
50
0
100
MP2130DG
1303
11-06-13
50
0
100
MP9180DG
1340
11-06-13
50
0
100
MP9180DG
1339
11-06-13
50
0
100
MP2130DG
1335
11-06-13
50
0
100
MP2162GQH
1342
11-06-13
50
0
100
MP8736DL
1342
11-06-13
50
0
100
MPQ8632GL-10
1340
11-06-13
50
0
100
MP8606DL
1339
11-06-13
50
0
100
MPM3805GQB
1343
11-06-13
50
0
100
MP86884DQKT
1340
11-06-13
50
0
100
MP2130DG
1334
11-06-13
50
0
100
MP2625GL
1338
11-06-13
50
0
100
MPM3805GQB
1343
11-06-13
50
0
100
MP2130DG
1334
11-06-13
50
0
100
MPM3810GQB
1343
11-06-13
50
0
100
MP8606DL
1326
11-06-13
50
0
100
MPQ8632GL-12
1321
11-15-13
50
0
100
MP2158GQH
1344
11-15-13
50
0
100
MPQ8632GV-20
1327
11-15-13
50
0
100
The Future of Analog IC Technology®
- 55 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1338
11-15-13
50
0
100
MPQ8632GL-8
1335
11-15-13
50
0
100
FA NO.
# of
cycle
MP8736DL
1343
11-06-13
50
0
100
MPM3805GQB
1341
11-06-13
50
0
100
MP2162GQH
1341
11-06-13
50
0
100
MP9180DG
1340
11-06-13
50
0
100
MP9180DG
1339
11-06-13
50
0
100
NB671AGQ
1343
11-15-13
50
0
100
MP8762GLE
1315
11-15-13
50
0
100
MP2162GQH
1344
11-15-13
50
0
100
MP2162GQH
1344
11-15-13
50
0
100
MP2130DG
1343
11-15-13
50
0
100
MP8736DL
1344
11-15-13
50
0
100
NB670GQ-C557
1344
11-08-13
50
0
100
MP2130DG
1338
11-08-13
50
0
100
MP28251GD
1339
12-31-13
50
0
100
MP8736DL
1343
11-08-13
50
0
100
NB671GQ
1335
12-05-13
50
0
100
NB671GQ
1339
12-02-13
50
0
100
NB650HGL
1323
11-08-13
50
0
100
NB670GQ
1318
11-08-13
50
0
100
MP9447GL
1342
11-08-13
50
0
100
NB670GQ
1315
11-08-13
50
0
100
MP8760GL
1342
11-08-13
50
0
100
MP2334DD
1333
11-08-13
50
0
100
MP2160GQH
1340
11-08-13
50
0
100
MP2158GQH
1339
11-08-13
50
0
100
MP2130DG
1342
11-08-13
50
0
100
MP9180DG
1341
11-08-13
50
0
100
MPQ8632GL-12
1321
11-08-13
50
0
100
NB670GQ
1319
11-20-13
50
0
100
MP2334DD
1334
11-08-13
50
0
100
MP8760GL
1343
11-08-13
50
0
100
MP2162GQH
1341
11-08-13
50
0
100
NB650HGL
1323
11-11-13
50
0
100
MP8606DL
1339
11-11-13
50
0
100
NB670GQ
1315
11-11-13
50
0
100
MPQ8632GVE-15
1327
11-11-13
50
0
100
NB670GQ
1319
11-20-13
50
0
100
MP8736DL
1345
11-20-13
50
0
100
MP8736DL
1345
11-20-13
50
0
100
MP28251GD
1342
11-20-13
50
0
100
The Future of Analog IC Technology®
- 56 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1343
11-21-13
50
0
100
MP2334DD
1319
11-21-13
50
0
100
FA NO.
# of
cycle
NB670GQ
1319
11-21-13
50
0
100
MP28251GD
1343
11-21-13
50
0
100
MPQ8632GVE-20
1344
11-21-13
50
0
100
NB671GQ
1337
12-12-13
50
0
100
MP8760GL
1345
11-21-13
50
0
100
MP28251GD
1342
11-21-13
50
0
100
MP2158GQH
1346
11-21-13
50
0
100
MP28251GD
1343
11-21-13
50
0
100
MP28251GD
1343
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP2625GL
1345
11-27-13
50
0
100
MP2162GQH
1344
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP28251GD
1345
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MP2625GL
1346
11-27-13
50
0
100
NB671LGQ
1337
12-31-13
50
0
100
MP28251GD
1344
11-27-13
50
0
100
MPQ8636GVE-20
1333
11-29-13
50
0
100
MP28251GD
1344
11-29-13
50
0
100
MPQ8636GL-10
1344
11-29-13
50
0
100
NB671GQ
1339
12-18-13
50
0
100
MP28251GD
1327
11-29-13
50
0
100
MP28251GD
1346
11-29-13
50
0
100
MPQ8632GLE-6
1342
11-29-13
50
0
100
MP28251GD
1345
11-29-13
50
0
100
MP2617GL
1346
11-29-13
50
0
100
MPQ8636GVE-20
1335
11-29-13
50
0
100
MP28251GD
1345
11-29-13
50
0
100
NB671AGQ
1343
12-02-13
50
0
100
MPQ8636GL-10
1344
12-02-13
50
0
100
MPQ8632GLE-12
1344
12-02-13
50
0
100
MP28251GD
1345
12-31-13
50
0
100
MP28251GD
1345
12-31-13
50
0
100
MP28251GD
1345
12-31-13
50
0
100
MPQ8632GLE-6
1342
12-02-13
50
0
100
NB671LGQ
1338
12-26-13
50
0
100
The Future of Analog IC Technology®
- 57 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4470GL-AEC1
1345
12-05-13
50
0
100
MP28251GD
1345
12-31-13
50
0
100
FA NO.
# of
cycle
MPQ4470GL-AEC1
1342
12-10-13
50
0
100
MP28251GD
1345
12-31-13
50
0
100
MPQ8636HGL-10
1343
12-05-13
50
0
100
MP2162GQH
1345
12-05-13
50
0
100
MP8606DL
1329
12-05-13
50
0
100
NB671GQ
1339
12-18-13
50
0
100
MPQ8632GL-10
1344
12-10-13
50
0
100
MPQ8632GLE-10
1344
12-18-13
50
0
100
MP28258DD
1347
12-12-13
50
0
100
MP2162GQH
1345
12-12-13
50
0
100
MP9180DG
1342
12-12-13
50
0
100
MP2162GQH
1345
12-12-13
50
0
100
MPQ8636GL-10
1345
12-12-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
MPQ8632GV-15
1344
12-12-13
50
0
100
MP8736DL
1348
12-12-13
50
0
100
MP9180DG
1347
12-12-13
50
0
100
MPQ8632GV-15
1346
12-18-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
MP8736DL
1348
12-18-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
MP28258DD-C471
1331
12-18-13
50
0
100
MP2162GQH
1349
12-18-13
50
0
100
NB650GL
1349
12-18-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
MP28257DD
1348
12-18-13
50
0
100
MPQ8632GL-12
1343
12-18-13
50
0
100
MPQ8636GL-10
1346
12-18-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
MP28251GD
1346
12-31-13
50
0
100
NB670GQ-C557
1349
12-20-13
50
0
100
MP38900DL
1349
12-20-13
50
0
100
MP2162GQH
1348
12-19-13
50
0
100
NB650GL
1350
12-20-13
50
0
100
NB670GQ
1320
12-20-13
50
0
100
MPQ8632GL-10
1346
12-26-13
50
0
100
MPQ4470AGL
1345
12-26-13
50
0
100
MP28259DD
1346
12-26-13
50
0
100
MPQ8636GL-10
1348
12-26-13
50
0
100
MPQ8636GL-10
1346
12-26-13
50
0
100
The Future of Analog IC Technology®
- 58 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1499GD
1349
12-26-13
50
0
FA NO.
# of
cycle
100
MP2140DD
1328
12-26-13
50
0
100
MP86884DQKT
1349
12-26-13
50
0
100
MP86884DQKT
1350
12-26-13
50
0
100
MP2162GQH
1349
12-26-13
50
0
100
MPQ8636GV-20
1343
12-26-13
50
0
100
MP2162GQH
1349
12-26-13
50
0
100
MPQ8632GV-15
1343
12-26-13
50
0
100
MP2308GD
1350
12-26-13
50
0
100
MPQ8636GL-10
1350
12-31-13
50
0
100
MPQ8632GV-15
1348
12-31-13
50
0
100
MP2162GQH
1350
12-31-13
50
0
100
MPQ8632GVE-15
1349
12-31-13
50
0
100
MPQ8632GLE-8
1337
12-31-13
50
0
100
MPQ8632GVE-15
1347
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP2130DG
1348
12-31-13
50
0
100
MP1499GD
1350
12-31-13
50
0
100
MPQ8636GL-10
1350
12-31-13
50
0
100
MPQ8632GLE-10
1341
12-31-13
50
0
100
MPQ8632GL-8
1346
12-31-13
50
0
100
MPQ8632GL-10
1346
12-31-13
50
0
100
MP2162GQH
1349
12-31-13
50
0
100
Total
0
4.6.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1311
10-09-13
97
0
168
MP2617AGL
1325
10-09-13
46
0
168
MP2617AGL
1319
10-09-13
47
0
168
MP28259DD
1318
10-09-13
47
0
168
MP28259DD
1321
10-09-13
47
0
168
MP28251GD
1330
10-08-13
97
0
168
NB677GQ
1331
10-12-13
97
0
168
MP9151GD
1248
11-01-13
85
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 59 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1310
10-29-13
97
0
168
MP5018GD
1338
11-06-13
97
0
168
MP8606DL
1307
11-13-13
50
0
168
MP8606DL
1307
11-13-13
49
0
168
MPM3830GQV
1335
11-14-13
97
0
168
MP5505GL
1252
12-17-13
87
0
168
MP2316DG
1319
12-20-13
99
0
168
FA NO.
# of hrs
NB676GQ
1331
12-20-13
97
0
168
MPM3830GQV
1339
12-20-13
97
0
168
MP5505GL
1330
12-31-13
47
0
168
MP5505GL
1335
12-31-13
47
0
168
MP2625GL
1339
12-31-13
47
0
168
MP2625GL
1337
12-31-13
47
0
168
MP28251GD
1339
12-05-13
80
0
168
MP28251GD
1339
12-05-13
97
0
168
MP28251GD
1303
10-08-13
50
0
48
MP28251GD
1302
10-08-13
50
0
48
MP28251GD
1301
10-08-13
50
0
48
MP28251GD
1250
10-08-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
11-06-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1304
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1311
10-08-13
50
0
48
MP28251GD
1306
10-08-13
50
0
48
MP28251GD
1306
11-13-13
50
0
48
MP28251GD
1311
10-30-13
50
0
48
MP28251GD
1309
11-13-13
50
0
48
MP28251GD
1311
11-13-13
50
0
48
MP28251GD
1306
11-13-13
50
0
48
MP28251GD
1311
11-13-13
50
0
48
MP28251GD
1310
11-13-13
50
0
48
MP28251GD
1311
11-13-13
50
0
48
The Future of Analog IC Technology®
- 60 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1310
11-13-13
50
0
48
MP28251GD
1311
11-13-13
50
0
48
MP28251GD
1306
11-13-13
50
0
48
MP28251GD
1310
11-13-13
50
0
48
MP28251GD
1312
11-13-13
49
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1315
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
FA NO.
# of hrs
The Future of Analog IC Technology®
- 61 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1319
11-13-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP2617GL
1320
11-29-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP2617GL
1322
11-29-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP2617AGL
1325
10-09-13
50
0
48
FA NO.
# of hrs
MP2617GL
1320
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP2617AGL
1325
10-09-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1317
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP2617AGL
1325
10-09-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1316
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1318
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP2617AGL
1325
10-09-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1320
11-13-13
50
0
48
The Future of Analog IC Technology®
- 62 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1328
10-08-13
50
0
48
MP28251GD
1328
10-08-13
50
0
48
MP28251GD
1322
11-13-13
50
0
48
MP28251GD
1321
11-13-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP28251GD
1319
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
FA NO.
# of hrs
MP2617AGL
1325
10-09-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP2617AGL
1325
10-09-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP2617AGL
1330
10-09-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP2617AGL
1330
10-09-13
50
0
48
MP28251GD
1330
11-13-13
50
0
48
MP2617AGL
1331
10-09-13
50
0
48
MP28251GD
1330
11-13-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP2617AGL
1331
10-09-13
50
0
48
MP28251GD
1329
11-27-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
12-10-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1329
12-10-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1331
12-31-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP28251GD
1331
11-13-13
50
0
48
MP28251GD
1331
11-13-13
50
0
48
MP28251GD
1331
11-13-13
50
0
48
MP28251GD
1331
11-13-13
50
0
48
MP28251GD
1330
11-13-13
49
0
48
MP28251GD
1331
11-13-13
49
0
48
MP2617AGL
1332
10-09-13
50
0
48
The Future of Analog IC Technology®
- 63 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2617AGL
1333
10-09-13
50
0
48
MP28251GD
1329
11-13-13
50
0
48
MP2617AGL
1334
10-09-13
50
0
48
MP2617AGL
1334
10-09-13
50
0
48
MP2617AGL
1335
10-09-13
50
0
48
MP5506GL
1336
10-09-13
99
0
48
MP8762GL
1336
10-08-13
50
0
48
NB671LGQ
1336
10-08-13
50
0
48
MP8736DL
1337
10-09-13
50
0
48
MP2617GL
1334
10-08-13
50
0
48
NB671LGQ
1336
10-08-13
50
0
48
FA NO.
# of hrs
NB671AGQ
1337
10-08-13
50
0
48
MP2162GQH
1336
10-08-13
50
0
48
NB6381DL
1324
10-08-13
50
0
48
MP2617GL
1337
10-08-13
50
0
48
NB671GQ
1307
10-08-13
50
0
48
MP28258DD-C471
1337
10-08-13
50
0
48
MP2617AGL
1336
10-08-13
50
0
48
NB638DL
1335
10-08-13
50
0
48
MPQ4470GL
1336
10-15-13
50
0
48
MP2617GL
1336
10-08-13
50
0
48
MP8736DL
1337
10-08-13
50
0
48
MP2625GL
1336
10-08-13
50
0
48
MP2130DG
1333
10-08-13
50
0
48
NB671LGQ
1336
10-08-13
50
0
48
NB671GQ
1326
10-08-13
50
0
48
MP2139DD
1329
10-08-13
50
0
48
MPQ8632GL-10
1336
10-08-13
50
0
48
MP2617AGL
1337
10-08-13
50
0
48
MP2130DG
1333
10-08-13
50
0
48
NB671GQ
1326
10-08-13
50
0
48
MP8620DQK
1337
10-08-13
50
0
48
MP8620DQK
1323
10-08-13
50
0
48
MP8620DQK
1338
10-08-13
50
0
48
MP9180DG
1338
10-08-13
50
0
48
MP4470GL
1338
10-08-13
50
0
48
MP2130DG
1332
10-08-13
50
0
48
MP2130DG
1334
10-08-13
50
0
48
MP8051DQU
1207
10-15-13
50
0
48
NB670AGQ
1338
10-15-13
50
0
48
MP2617GL
1338
10-15-13
50
0
48
MP8736DL
1337
10-15-13
50
0
48
The Future of Analog IC Technology®
- 64 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2617GL
1338
10-15-13
50
0
48
MP9180DG
1338
10-15-13
50
0
48
FA NO.
# of hrs
NB671LGQ
1336
10-15-13
50
0
48
MPQ8632GL-8
1338
10-15-13
50
0
48
NB670AGQ
1338
10-15-13
50
0
48
MP2617AGL
1337
10-15-13
50
0
48
MP9180DG
1338
10-15-13
50
0
48
MP2130DG
1333
10-15-13
50
0
48
MP8736DL
1337
10-15-13
50
0
48
MP2617AGL
1337
10-15-13
50
0
48
MPQ8632GLE-6
1313
10-15-13
50
0
48
MP5506GL
1336
10-15-13
100
0
48
MP9180DG
1339
10-15-13
50
0
48
NB650GL
1339
10-15-13
50
0
48
MP2617AGL
1337
10-15-13
50
0
48
MP2617GL
1337
10-15-13
50
0
48
MPQ8636GL-10
1335
10-15-13
50
0
48
MPQ8636GL-10
1334
10-15-13
50
0
48
MP8736DL
1339
10-23-13
50
0
48
MP9180DG
1339
10-23-13
50
0
48
MP8762GL
1339
10-23-13
50
0
48
MP9180DG
1340
10-23-13
50
0
48
NB671GQ
1323
10-23-13
50
0
48
MP28251GD
1330
11-13-13
50
0
48
MPQ8632GL-6
1340
10-23-13
50
0
48
MP9180DG
1339
10-23-13
50
0
48
NB671GQ
1322
10-23-13
50
0
48
MPQ8632GLE-6
1339
10-23-13
50
0
48
MP9181DD
1337
10-23-13
50
0
48
NB650GL
1339
10-23-13
50
0
48
MP9447GL
1340
10-23-13
50
0
48
MP9180DG
1340
10-23-13
50
0
48
MPQ8616GL-6
1338
10-23-13
50
0
48
MP1482DS
1330
10-23-13
50
0
48
MP2617GL
1339
10-23-13
50
0
48
MP9180DG
1340
10-23-13
50
0
48
MP9180DG
1340
10-23-13
50
0
48
NB650GL
1339
10-23-13
50
0
48
MP2625GL
1339
10-23-13
50
0
48
MP2617AGL
1337
10-23-13
50
0
48
MP8736DL
1339
10-23-13
50
0
48
MP2617GL
1339
10-23-13
50
0
48
The Future of Analog IC Technology®
- 65 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1330
12-31-13
50
0
48
MP3360DG
1340
10-23-13
50
0
48
FA NO.
# of hrs
MPQ8636GL-10
1339
10-23-13
50
0
48
MP3306EG
1341
10-30-13
50
0
48
NB650GL
1341
10-30-13
50
0
48
NB671AGQ
1336
10-30-13
50
0
48
MP38900DL
1337
10-30-13
50
0
48
NB671GQ
1324
10-30-13
50
0
48
MP9180DG
1340
10-29-13
50
0
48
MP28258DD-C471
1331
10-30-13
50
0
48
MPQ8632GL-10
1340
10-30-13
50
0
48
MP2617GL
1339
10-30-13
50
0
48
NB671GQ
1325
10-30-13
50
0
48
MP28259DD-A-C441 1337
10-30-13
50
0
48
MP8736DL
1341
10-30-13
50
0
48
MP2139DD
1342
10-30-13
50
0
48
MP9181DD
1340
10-30-13
50
0
48
MP2334DD
1336
10-29-13
50
0
48
MP8736DL
1341
10-29-13
50
0
48
MP2625GL
1329
10-30-13
50
0
48
MP28258DD-C471
1325
10-30-13
50
0
48
NB671GQ
1336
10-30-13
50
0
48
NB671GQ
1336
10-30-13
50
0
48
NB671AGQ
1342
10-30-13
50
0
48
MP2617GL
1339
10-30-13
50
0
48
NB650HGL
1310
10-30-13
50
0
48
MP86884DQKT
1340
10-30-13
50
0
48
MP8736DL
1342
10-30-13
50
0
48
MP2130DG
1303
11-06-13
50
0
48
MP8736DL
1342
11-06-13
50
0
48
MP8606DL
1339
11-06-13
50
0
48
NB671GQ
1338
11-13-13
50
0
48
MP2130DG
1334
11-06-13
50
0
48
MPQ8632GL-10
1321
11-06-13
50
0
48
MP9180DG
1339
11-06-13
50
0
48
MP2130DG
1249
11-06-13
50
0
48
MP2334DD
1333
11-06-13
50
0
48
NB650HGL
1311
11-06-13
50
0
48
MP2130DG
1338
11-06-13
50
0
48
MP9181DD
1340
11-06-13
50
0
48
MP2617AGL
1339
11-06-13
50
0
48
MP2130DG
1303
11-06-13
50
0
48
The Future of Analog IC Technology®
- 66 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP9180DG
1340
11-06-13
50
0
48
MP9180DG
1339
11-06-13
50
0
48
FA NO.
# of hrs
MP2130DG
1335
11-06-13
50
0
48
MP2162GQH
1342
11-06-13
50
0
48
MP8736DL
1342
11-06-13
50
0
48
MPQ8632GL-10
1340
11-06-13
50
0
48
MP8606DL
1339
11-06-13
50
0
48
MPM3805GQB
1343
11-06-13
50
0
48
MP86884DQKT
1340
11-06-13
50
0
48
MP2130DG
1334
11-06-13
50
0
48
MP2625GL
1338
11-06-13
50
0
48
MPM3805GQB
1343
11-06-13
50
0
48
MP2130DG
1334
11-06-13
50
0
48
MPM3810GQB
1343
11-06-13
50
0
48
MP8606DL
1326
11-06-13
50
0
48
MPQ8632GL-12
1321
11-15-13
50
0
48
MP2158GQH
1344
11-15-13
50
0
48
MPQ8632GV-20
1327
11-15-13
50
0
48
MP28251GD
1338
11-15-13
50
0
48
MPQ8632GL-8
1335
11-15-13
50
0
48
MP8736DL
1343
11-06-13
50
0
48
MPM3805GQB
1341
11-06-13
50
0
48
MP2162GQH
1341
11-06-13
50
0
48
MP9180DG
1340
11-06-13
50
0
48
MP9180DG
1339
11-06-13
50
0
48
NB671AGQ
1343
11-15-13
50
0
48
MP8762GLE
1315
11-15-13
50
0
48
MP2162GQH
1344
11-15-13
50
0
48
MP2162GQH
1344
11-15-13
50
0
48
MP2130DG
1343
11-15-13
50
0
48
MP8736DL
1344
11-15-13
50
0
48
NB670GQ-C557
1344
11-08-13
50
0
48
MP2130DG
1338
11-08-13
50
0
48
MP28251GD
1339
12-31-13
50
0
48
MP8736DL
1343
11-08-13
50
0
48
NB671GQ
1335
12-05-13
50
0
48
NB671GQ
1339
12-02-13
50
0
48
NB650HGL
1323
11-08-13
50
0
48
NB670GQ
1318
11-08-13
50
0
48
MP9447GL
1342
11-08-13
50
0
48
NB670GQ
1315
11-08-13
50
0
48
MP8760GL
1342
11-08-13
50
0
48
The Future of Analog IC Technology®
- 67 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2334DD
1333
11-08-13
50
0
48
MP2160GQH
1340
11-08-13
49
0
48
MP2158GQH
1339
11-08-13
50
0
48
MP2130DG
1342
11-08-13
50
0
48
MP9180DG
1341
11-08-13
50
0
48
MPQ8632GL-12
1321
11-08-13
50
0
48
NB670GQ
1319
11-20-13
50
0
48
FA NO.
# of hrs
MP2334DD
1334
11-08-13
50
0
48
MP8760GL
1343
11-08-13
50
0
48
MP2162GQH
1341
11-08-13
50
0
48
NB650HGL
1323
11-11-13
50
0
48
MP8606DL
1339
11-11-13
50
0
48
NB670GQ
1315
11-11-13
50
0
48
MPQ8632GVE-15
1327
11-11-13
50
0
48
NB670GQ
1319
11-20-13
50
0
48
MP8736DL
1345
11-20-13
50
0
48
MP8736DL
1345
11-20-13
50
0
48
MP28251GD
1342
11-20-13
50
0
48
MP28251GD
1343
11-21-13
50
0
48
MP2334DD
1319
11-21-13
50
0
48
NB670GQ
1319
11-21-13
50
0
48
MP28251GD
1343
11-21-13
50
0
48
MPQ8632GVE-20
1344
11-21-13
50
0
48
NB671GQ
1337
12-12-13
50
0
48
MP8760GL
1345
11-21-13
50
0
48
MP28251GD
1342
11-21-13
50
0
48
MP2158GQH
1346
11-21-13
50
0
48
MP28251GD
1343
11-21-13
50
0
48
MP28251GD
1343
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP2625GL
1345
11-27-13
50
0
48
MP2162GQH
1344
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP28251GD
1345
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MP2625GL
1346
11-27-13
50
0
48
NB671LGQ
1337
12-31-13
50
0
48
MP28251GD
1344
11-27-13
50
0
48
MPQ8636GVE-20
1333
11-29-13
50
0
48
The Future of Analog IC Technology®
- 68 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1344
11-29-13
50
0
48
MPQ8636GL-10
1344
11-29-13
50
0
48
FA NO.
# of hrs
NB671GQ
1339
12-18-13
50
0
48
MP28251GD
1327
11-29-13
50
0
48
MP28251GD
1346
11-29-13
50
0
48
MPQ8632GLE-6
1342
11-29-13
50
0
48
MP28251GD
1345
11-29-13
50
0
48
MP2617GL
1346
11-29-13
50
0
48
MPQ8636GVE-20
1335
11-29-13
50
0
48
MP28251GD
1345
11-29-13
50
0
48
NB671AGQ
1343
12-02-13
50
0
48
MPQ8636GL-10
1344
12-02-13
50
0
48
MPQ8632GLE-12
1344
12-02-13
50
0
48
MP28251GD
1345
12-31-13
50
0
48
MP28251GD
1345
12-31-13
50
0
48
MP28251GD
1345
12-31-13
50
0
48
MPQ8632GLE-6
1342
12-02-13
50
0
48
NB671LGQ
1338
12-26-13
50
0
48
MPQ4470GL-AEC1
1345
12-05-13
50
0
48
MP28251GD
1345
12-31-13
50
0
48
MPQ4470GL-AEC1
1342
12-10-13
50
0
48
MP28251GD
1345
12-31-13
50
0
48
MPQ8636HGL-10
1343
12-05-13
50
0
48
MP2162GQH
1345
12-05-13
50
0
48
MP8606DL
1329
12-05-13
50
0
48
NB671GQ
1339
12-18-13
50
0
48
MPQ8632GL-10
1344
12-10-13
50
0
48
MPQ8632GLE-10
1344
12-18-13
50
0
48
MP28258DD
1347
12-12-13
50
0
48
MP2162GQH
1345
12-12-13
50
0
48
MP9180DG
1342
12-12-13
50
0
48
MP2162GQH
1345
12-12-13
50
0
48
MPQ8636GL-10
1345
12-12-13
50
0
48
MP28251GD
1346
12-31-13
50
0
48
MPQ8632GV-15
1344
12-12-13
50
0
48
MP8736DL
1348
12-12-13
50
0
48
MP9180DG
1347
12-12-13
50
0
48
MPQ8632GV-15
1346
12-18-13
50
0
48
MP28251GD
1346
12-31-13
50
0
48
MP8736DL
1348
12-18-13
50
0
48
MP28251GD
1346
12-31-13
50
0
48
MP28258DD-C471
1331
12-18-13
50
0
48
The Future of Analog IC Technology®
- 69 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2162GQH
1349
12-18-13
50
0
48
NB650GL
1349
12-18-13
50
0
48
FA NO.
# of hrs
MP28251GD
1346
12-31-13
50
0
48
MP28257DD
1348
12-18-13
50
0
48
MPQ8632GL-12
1343
12-18-13
50
0
48
MPQ8636GL-10
1346
12-18-13
50
0
48
MP28251GD
1346
12-31-13
50
0
48
MP28251GD
1346
12-31-13
50
0
48
NB670GQ-C557
1349
12-20-13
50
0
48
MP38900DL
1349
12-20-13
50
0
48
MP2162GQH
1348
12-19-13
50
0
48
NB650GL
1350
12-20-13
50
0
48
NB670GQ
1320
12-20-13
50
0
48
MPQ8632GL-10
1346
12-26-13
50
0
48
MPQ4470AGL
1345
12-26-13
50
0
48
MP28259DD
1346
12-26-13
50
0
48
MPQ8636GL-10
1348
12-26-13
50
0
48
MPQ8636GL-10
1346
12-26-13
50
0
48
MP1499GD
1349
12-26-13
50
0
48
MP2140DD
1328
12-26-13
50
0
48
MP86884DQKT
1349
12-26-13
50
0
48
MP86884DQKT
1350
12-26-13
50
0
48
MP2162GQH
1349
12-26-13
50
0
48
MPQ8636GV-20
1343
12-26-13
50
0
48
MP2162GQH
1349
12-26-13
50
0
48
MPQ8632GV-15
1343
12-26-13
50
0
48
MP2308GD
1350
12-26-13
50
0
48
MPQ8636GL-10
1350
12-31-13
50
0
48
MPQ8632GV-15
1348
12-31-13
50
0
48
MP2162GQH
1350
12-31-13
50
0
48
MPQ8632GVE-15
1349
12-31-13
50
0
48
MPQ8632GLE-8
1337
12-31-13
50
0
48
MPQ8632GVE-15
1347
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP2130DG
1348
12-31-13
50
0
48
MP1499GD
1350
12-31-13
50
0
48
MPQ8636GL-10
1350
12-31-13
50
0
48
MPQ8632GLE-10
1341
12-31-13
50
0
48
The Future of Analog IC Technology®
- 70 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8632GL-8
1346
12-31-13
45
0
48
MPQ8632GL-10
1346
12-31-13
50
0
48
MP2162GQH
1349
12-31-13
50
0
48
Total
FA NO.
# of hrs
0
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1311
10-09-13
80
0
MP2617AGL
1325
10-09-13
49
0
MP2617AGL
1319
10-09-13
47
0
MP28251GD
1330
10-08-13
80
0
NB677GQ
1331
10-12-13
79
0
MP9151GD
1248
11-01-13
80
0
MP28251GD
1310
10-29-13
78
0
MP2316DG
1319
12-20-13
78
0
NB676GQ
1331
12-20-13
90
0
MPM3830GQV
1339
12-20-13
90
0
MP8736DL
1338
12-20-13
96
0
MP8736DL
1338
12-20-13
96
0
MP8736DL
1339
12-20-13
96
0
MP8736DL
1339
12-20-13
96
0
MP2625GL
1339
12-31-13
48
0
MP2625GL
1337
12-31-13
47
0
MP2316DG
1338
12-05-13
100
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 71 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
4.7 FLIP CHIP-SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE PACKAGE
ASSY SITE
PACKAGE
UCD
ANST
FCSOIC8
FCSOIC8
JCET
JCAP
FCSOIC8
ANST
FCSOIC16
FCSOIC8
4.7.1 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1492DS
1334
10-08-13
50
0
FA NO.
# of
cycle
100
MP1492DS
1334
10-08-13
50
0
100
MP28257DS-C541
1338
10-15-13
50
0
100
MP1492DS
1328
10-15-13
50
0
100
MP1482DS
1241
10-15-13
50
0
100
MP1482DS
1330
10-23-13
50
0
100
MP1492DS
1338
10-30-13
50
0
100
MP1482DS
1335
10-30-13
50
0
100
MP1482DS
1339
10-30-13
50
0
100
MP1492DS
1342
11-15-13
50
0
100
MP1493DS
1345
11-20-13
50
0
100
MP1493DS
1345
11-21-13
50
0
100
MP1482DS
1345
12-05-13
50
0
100
MP1492DS
1343
12-12-13
50
0
100
MP1482SDS-C416
1324
12-18-13
50
0
100
MP28258DS
1348
12-26-13
50
0
1000
MP1482DS
1348
12-31-13
50
0
1000
MP1493DS
1348
12-31-13
50
0
1000
MP1492DS
1350
12-31-13
50
0
1000
Total
0
4.7.2 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1492DS
1334
10-08-13
50
0
FA NO.
# of hrs
100
MP1492DS
1334
10-08-13
50
0
100
MP28257DS-C541
1338
10-15-13
50
0
100
MP1492DS
1328
10-15-13
50
0
100
The Future of Analog IC Technology®
- 72 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1241
10-15-13
50
0
100
MP1482DS
1330
10-23-13
50
0
100
MP1492DS
1338
10-30-13
50
0
100
MP1482DS
1335
10-30-13
50
0
100
MP1482DS
1339
10-30-13
50
0
100
MP1492DS
1342
11-15-13
50
0
100
MP1493DS
1345
11-20-13
50
0
100
MP1493DS
1345
11-21-13
50
0
100
MP1482DS
1345
12-05-13
50
0
100
MP1492DS
1343
12-12-13
50
0
100
MP1482SDS-C416
1324
12-18-13
50
0
100
MP28258DS
1348
12-26-13
50
0
1000
MP1482DS
1348
12-31-13
50
0
1000
MP1493DS
1348
12-31-13
50
0
1000
MP1492DS
1350
12-31-13
50
0
1000
Total
FA NO.
# of hrs
0
4.8 FLIP CHIP-TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
FCTSOT-5
JCET
FCTSOT-6
ANST
FCTSOT-6
JCET
FCTSOT-8
ANST
FCTSOT-8
4.8.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1496DJ
1314
10-09-13
150
0
MP1496DJ
1318
10-09-13
150
0
MP1494DJ
1328
10-12-13
200
0
MP1494DJ
1331
11-01-13
200
0
MP1494DJ
1331
11-01-13
200
0
MP1494DJ
1331
11-01-13
200
0
MP3221GJ
1333
11-01-13
200
0
MP1494SGJ
1320
11-14-13
297
0
MP1494DJ
1336
11-21-13
302
0
MP4050GJ
1312
12-26-13
402
0
MP1470GJ
1323
12-03-13
302
0
MP1494DJ
1321
12-03-13
302
0
FA NO.
The Future of Analog IC Technology®
- 73 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1321
12-03-13
302
0
MP2318GJ
1322
12-20-13
94
0
MP4026GJ
1338
12-05-13
210
0
MP4027GJ
1337
12-05-13
210
0
MP4027GJ
1329
12-05-13
105
0
MP2489DJ
1338
12-20-13
200
0
MP1494SGJ
1333
12-20-13
280
0
Total
FA NO.
0
SAT picture of FLIP CHIP-TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.8.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1316
10-09-13
94
0
1000
MP1496DJ
1314
10-09-13
45
0
1000
MP1496DJ
1318
10-09-13
47
0
1000
MP1470GJ
1327
10-08-13
94
0
1000
FA NO.
# of
cycle
MP1494DJ
1328
10-12-13
97
0
1000
MP1470GJ
1305
10-16-13
47
0
1000
MP1470GJ
1307
10-16-13
47
0
1000
MP1494DJ
1331
11-01-13
97
0
1000
MP1494DJ
1331
11-01-13
97
0
1000
MP1494DJ
1331
11-01-13
97
0
1000
MP3221GJ
1333
11-01-13
94
0
1000
The Future of Analog IC Technology®
- 74 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494SGJ
1320
11-14-13
94
0
1000
MP1494DJ
1336
11-21-13
94
0
1000
MP4050GJ
1312
12-26-13
93
0
1000
MP1470GJ
1323
12-03-13
97
0
1000
MP1494DJ
1321
12-03-13
97
0
1000
MP1494DJ
1321
12-03-13
97
0
1000
MP4026GJ
1338
12-05-13
93
0
1000
MP4027GJ
1337
12-05-13
93
0
1000
MP4027GJ
1329
12-05-13
94
0
1000
MP2489DJ
1338
12-20-13
94
0
1000
MP1494SGJ
1333
12-20-13
94
0
1000
FA NO.
# of
cycle
MP2617AGL
1319
10-09-13
50
0
1000
MP2161GJ
1326
12-26-13
50
0
1000
MP2161GJ-C499
1327
12-26-13
50
0
1000
MP2161GJ
1334
10-24-13
50
0
100
MP1495DJ
1336
10-08-13
50
0
100
MP2234GJ
1336
10-08-13
50
0
100
MP1496DJ
1333
10-08-13
50
0
100
MP3414DJ
1337
10-08-13
50
0
100
MP1470GJ
1336
10-08-13
50
0
100
MP2489DJ
1335
10-08-13
50
0
100
MP1496DJ
1333
10-08-13
50
0
100
MP1470GJ
1334
10-08-13
50
0
100
MP1470GJ
1335
10-08-13
50
0
100
MP1496DJ
1336
10-08-13
50
0
100
MP2143DJ-C463
1336
10-08-13
50
0
100
MP3414DJ
1337
10-08-13
50
0
100
MP1496DJ
1331
10-08-13
50
0
100
MP1495DJ
1323
10-08-13
46
0
100
MP1472GJ
1327
11-21-13
50
0
100
MP2315GJ
1335
10-08-13
50
0
100
MP1472GJ
1338
10-08-13
50
0
100
MP3414DJ
1337
10-08-13
50
0
100
MP1472GJ
1323
10-08-13
50
0
100
MP1494DJ
1335
10-08-13
50
0
100
MP1494DJ
1326
10-08-13
50
0
100
MP1471AGJ
1337
10-08-13
50
0
100
MP1497DJ
1334
10-08-13
50
0
100
MP1472GJ
1333
10-08-13
50
0
100
MP2122GJ
1337
10-08-13
50
0
100
MP1471GJ
1332
10-08-13
50
0
100
MP1471GJ
1332
10-08-13
50
0
100
The Future of Analog IC Technology®
- 75 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1337
10-15-13
50
0
100
MP1472GJ-C452
1338
10-15-13
50
0
100
MP3221GJ
1329
10-15-13
50
0
100
MP9495DJ
1337
10-15-13
50
0
100
MP3221GJ
1328
10-15-13
50
0
100
MP1470GJ
1336
10-24-13
50
0
100
MP1472GJ-C452
1338
10-15-13
50
0
100
FA NO.
# of
cycle
MP1472GJ-C452
1338
10-15-13
50
0
100
MP2144GJ
1337
10-15-13
50
0
100
MP2315GJ
1335
10-15-13
50
0
100
MP2144GJ
1337
10-15-13
50
0
100
MP1496DJ
1329
10-15-13
50
0
100
MP1496DJ
1329
10-15-13
50
0
100
MP1495DJ
1328
10-15-13
50
0
100
MP1496DJ
1332
10-15-13
50
0
100
MP1496DJ
1332
10-15-13
50
0
100
MP1497DJ
1332
10-15-13
50
0
100
MP1494DJ
1328
10-15-13
50
0
100
MP1496DJ
1328
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1496DJ
1332
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1496DJ
1334
10-15-13
50
0
100
MP1495DJ
1337
10-15-13
50
0
100
MP1494DJ
1337
10-15-13
50
0
100
MP1494DJ
1337
10-15-13
50
0
100
MP1496DJ
1338
10-15-13
50
0
100
MP1495DJ
1319
10-15-13
50
0
100
MP1495DJ
1337
10-23-13
50
0
100
MP1495DJ
1338
10-15-13
50
0
100
MP1470GJ
1336
10-15-13
50
0
100
MP1470GJ
1336
10-15-13
50
0
100
MP3414DJ
1337
10-15-13
50
0
100
MP1498DJ
1336
10-15-13
50
0
100
MP2144GJ
1337
10-23-13
50
0
100
MP1496DJ
1338
10-15-13
50
0
100
MP1470GJ
1335
10-15-13
50
0
100
MP1494DJ
1333
10-15-13
50
0
100
MP156GJ
1337
10-23-13
50
0
100
The Future of Analog IC Technology®
- 76 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1339
10-23-13
50
0
100
MP1472GJ
1337
10-23-13
50
0
100
FA NO.
# of
cycle
MP1494DJ
1331
10-23-13
50
0
100
MP1470GJ
1336
10-23-13
50
0
100
MP1494DJ
1331
10-23-13
50
0
100
MP3414DJ
1340
10-23-13
50
0
100
MP3414DJ
1339
10-23-13
50
0
100
MP1497DJ
1339
10-23-13
50
0
100
MP2143DJ
1339
10-23-13
50
0
100
MP1472GJ-C452
1338
10-23-13
50
0
100
MP24894GJ
1333
10-23-13
50
0
100
MP1472GJ-C452
1338
10-30-13
50
0
100
MP1494DJ
1335
10-30-13
50
0
100
MP2161GJ
1339
10-30-13
50
0
100
MP2233DJ
1340
10-30-13
50
0
100
MP1471GJ
1340
10-30-13
50
0
100
MP1494DJ
1335
10-30-13
50
0
100
MP1470GJ
1336
10-30-13
50
0
100
MP2161GJ-C499
1339
10-30-13
50
0
100
MP2144GJ
1337
10-30-13
50
0
100
MP2161GJ
1339
10-30-13
50
0
100
MP2143DJ
1337
10-30-13
50
0
100
MP2161GJ-C514
1339
10-30-13
50
0
100
MP3414DJ
1339
10-30-13
50
0
100
MP2144GJ
1336
10-30-13
50
0
100
MP1495DJ
1337
10-30-13
50
0
100
MP1496DJ
1335
10-30-13
50
0
100
MP1472GJ-C452
1338
10-30-13
50
0
100
MP2161GJ
1341
10-30-13
50
0
100
MP2161GJ
1341
10-30-13
50
0
100
MP1472GJ-C452
1338
10-30-13
50
0
100
MP1470GJ
1340
10-30-13
50
0
100
MP1470GJ
1340
10-30-13
50
0
100
MP1495DJ
1339
10-30-13
50
0
100
MP2314GJ
1341
10-30-13
50
0
100
MP2161GJ
1339
10-30-13
50
0
100
MP1494DJ
1340
10-30-13
50
0
100
MP1471GJ
1341
10-30-13
50
0
100
MP1497DJ
1339
10-30-13
50
0
100
MP2315GJ
1335
10-30-13
50
0
100
MP1494DJ
1340
10-30-13
50
0
100
MP1470GJ
1341
10-30-13
50
0
100
The Future of Analog IC Technology®
- 77 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1337
10-30-13
50
0
100
MP2161GJ
1339
10-30-13
50
0
100
FA NO.
# of
cycle
MP2161GJ-C514
1341
10-30-13
50
0
100
MP2144GJ
1339
10-30-13
50
0
100
MP1495DJ
1337
11-06-13
50
0
100
MP2144GJ
1339
11-06-13
50
0
100
MP2161GJ-C499
1339
11-06-13
50
0
100
MP2161GJ-C514
1339
11-06-13
50
0
100
MP2314GJ
1341
11-06-13
50
0
100
MP1470GJ
1340
11-06-13
50
0
100
MP2122GJ
1341
11-06-13
50
0
100
MP2161GJ
1339
11-06-13
50
0
100
MP3414DJ
1340
11-06-13
50
0
100
MP2161GJ
1340
11-06-13
50
0
100
MP1470GJ
1341
11-06-13
50
0
100
MP3414DJ
1339
11-06-13
50
0
100
MP1471GJ
1341
11-06-13
50
0
100
MP9495DJ
1339
11-06-13
50
0
100
MP2161GJ
1339
11-06-13
50
0
100
MP2314GJ
1334
11-06-13
50
0
100
MP2144GJ
1339
11-06-13
50
0
100
MP2159GJ
1342
11-06-13
50
0
100
MP1470GJ
1341
11-06-13
50
0
100
MP2144GJ
1343
11-06-13
50
0
100
MP1497DJ
1339
11-06-13
50
0
100
MP1470GJ
1343
11-06-13
50
0
100
MP156GJ
1340
11-06-13
50
0
100
MP1495DJ
1339
11-06-13
50
0
100
MP1497DJ
1334
11-06-13
50
0
100
MP1470GJ
1342
11-06-13
50
0
100
MP2161GJ-C514
1341
11-06-13
50
0
100
MP1470GJ
1341
11-06-13
50
0
100
MP1472GJ-C452
1340
11-15-13
50
0
100
MP2315GJ
1341
11-27-13
50
0
100
MP1470GJ
1341
11-15-13
50
0
100
MP1494DJ
1332
11-15-13
50
0
100
MP1495DJ
1338
11-27-13
50
0
100
MP1472GJ-C452
1340
11-15-13
50
0
100
MP2315GJ
1341
11-08-13
50
0
100
MP1497DJ
1335
11-08-13
50
0
100
MP1472GJ
1338
11-08-13
50
0
100
MP1496DJ
1338
11-08-13
50
0
100
The Future of Analog IC Technology®
- 78 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C514
1341
11-08-13
50
0
100
MP1497DJ
1335
11-08-13
50
0
100
MP1472GJ
1340
11-08-13
50
0
100
MP1470GJ
1341
11-08-13
50
0
100
MP2122GJ
1343
11-08-13
50
0
100
MP1496DJ
1338
11-08-13
50
0
100
MP2161GJ-C499
1341
11-08-13
50
0
100
MP1472GJ
1340
11-08-13
50
0
100
MP1470GJ
1341
11-08-13
50
0
100
MP1497DJ
1335
11-08-13
50
0
100
MP1472GJ-C452
1340
11-20-13
50
0
100
FA NO.
# of
cycle
MP3414DJ
1340
11-08-13
50
0
100
MP1470GJ
1341
11-08-13
50
0
100
MP1470GJ
1334
11-08-13
50
0
100
MP1470GJ
1312
11-08-13
50
0
100
MP1497DJ
1339
11-08-13
50
0
100
MP2161GJ-C499
1341
11-11-13
50
0
100
MP1497DJ
1331
11-11-13
50
0
100
MP2315GJ
1341
11-15-13
50
0
100
MP1494DJ
1341
11-11-13
50
0
100
MP1470GJ
1341
11-20-13
50
0
100
MP2161GJ
1341
11-20-13
50
0
100
MP1470GJ
1341
11-20-13
50
0
100
MP2161GJ-C514
1343
11-21-13
50
0
100
MP1495DJ
1340
11-27-13
50
0
100
MP2159GJ
1344
11-21-13
50
0
100
MP3414DJ
1340
11-21-13
50
0
100
MP1472GJ-C452
1340
11-21-13
50
0
100
MP1495DJ
1343
11-27-13
50
0
100
MP1495DJ
1338
11-27-13
50
0
100
MP2161GJ-C499
1343
11-27-13
50
0
100
MP2315GJ
1335
11-27-13
50
0
100
MP1472GJ
1340
11-27-13
50
0
100
MP2489DJ
1345
11-27-13
50
0
100
MP2122GJ
1345
11-27-13
50
0
100
MP1495DJ
1340
11-29-13
50
0
100
MP2314GJ
1341
11-29-13
50
0
100
MP1472GJ-C452
1340
11-29-13
49
0
100
MP1471GJ
1341
11-29-13
50
0
100
MP1472GJ-C452
1340
12-05-13
50
0
100
MP1472GJ-C452
1340
12-05-13
50
0
100
MP1472GJ-C452
1340
12-05-13
50
0
100
The Future of Analog IC Technology®
- 79 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ
1343
12-05-13
50
0
100
MP1470GJ
1342
12-05-13
50
0
100
FA NO.
# of
cycle
MP1495DJ
1345
12-05-13
50
0
100
MP1472GJ-C452
1340
12-05-13
50
0
100
MP1470GJ
1346
12-05-13
50
0
100
MP2161GJ
1343
12-05-13
50
0
100
MP3414DJ
1342
12-10-13
50
0
100
MP2161GJ
1343
12-10-13
50
0
100
MP2143DJ
1347
12-10-13
50
0
100
MP2314GJ
1341
12-10-13
50
0
100
MP3414DJ
1344
12-12-13
50
0
100
MP1470GJ
1345
12-12-13
50
0
100
MP1470GJ
1347
12-12-13
50
0
100
MP2161GJ
1343
12-12-13
50
0
100
MP156GJ
1346
12-12-13
50
0
100
MP1472GJ
1338
12-12-13
50
0
100
MP3414DJ
1342
12-12-13
50
0
100
MP1470GJ
1344
12-12-13
50
0
100
MP2161GJ
1336
12-12-13
50
0
100
MP1472GJ-C452
1345
12-12-13
50
0
100
MP2161GJ
1341
12-12-13
50
0
100
MP1470GJ
1345
12-18-13
50
0
100
MP1472GJ-C452
1345
12-18-13
50
0
100
MP2161GJ
1341
12-18-13
50
0
100
MP1494DJ
1346
12-18-13
50
0
100
MP3414DJ
1344
12-18-13
50
0
100
MP1495DJ-C494
1347
12-19-13
50
0
100
MP3414DJ
1344
12-19-13
50
0
100
MP1471GJ
1349
12-19-13
50
0
100
MP1498DJ
1349
12-19-13
50
0
100
MP2314GJ
1341
12-19-13
50
0
100
MP9495DJ
1348
12-19-13
50
0
100
MP2144GJ
1345
12-19-13
50
0
100
MP3414DJ
1347
12-19-13
50
0
100
MP1471GJ
1344
12-19-13
50
0
100
MP1497DJ
1335
12-20-13
50
0
100
MP2144GJ
1346
12-20-13
50
0
100
MP1472GJ
1338
12-26-13
50
0
100
MP1472GJ
1331
12-26-13
50
0
100
MP1472GJ
1345
12-26-13
50
0
100
MP2144GJ
1347
12-26-13
50
0
100
MP2161GJ
1349
12-26-13
50
0
100
The Future of Analog IC Technology®
- 80 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2234GJ
1349
12-26-13
50
0
100
MP2161GJ
1348
12-26-13
50
0
100
MP1495DJ
1347
12-26-13
50
0
100
MP1496DJ
1335
12-26-13
50
0
100
MP1495DJ-C494
1348
12-26-13
50
0
100
MP1471GJ
1349
12-26-13
50
0
100
MP2161GJ
1348
12-26-13
50
0
100
MP1497DJ
1333
12-26-13
50
0
100
MP1495DJ
1347
12-26-13
50
0
100
MP1498DJ
1349
12-26-13
50
0
100
MP1470GJ
1349
12-26-13
50
0
100
MP2314GJ
1350
12-26-13
50
0
100
MP2159GJ
1346
12-26-13
50
0
100
MP3414DJ
1349
12-26-13
50
0
100
MP1470GJ
1349
12-26-13
50
0
100
FA NO.
# of
cycle
MP2315GJ
1346
12-26-13
50
0
100
MP1472GJ-C452
1344
12-26-13
50
0
100
MP1470GJ
1349
12-31-13
50
0
100
MP1470GJ
1349
12-31-13
50
0
100
MP1472GJ-C452
1345
12-31-13
50
0
100
MP1472GJ-C452
1345
12-31-13
45
0
100
MP3414DJ
1344
12-31-13
50
0
100
MP1470GJ
1349
12-31-13
50
0
100
MP2143DJ
1351
12-31-13
50
0
100
Total
0
4.8.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1316
10-09-13
97
0
168
MP1496DJ
1314
10-09-13
50
0
168
FA NO.
# of hrs
MP1496DJ
1318
10-09-13
50
0
168
MP1470GJ
1327
10-08-13
97
0
168
MP1494DJ
1328
10-12-13
97
0
168
MP1470GJ
1305
10-16-13
50
0
168
MP1470GJ
1307
10-16-13
50
0
168
MP1494DJ
1331
11-01-13
97
0
168
MP1494DJ
1331
11-01-13
97
0
168
MP1494DJ
1331
11-01-13
97
0
168
The Future of Analog IC Technology®
- 81 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3221GJ
1333
11-01-13
97
0
168
MP1494SGJ
1320
11-14-13
97
0
168
FA NO.
# of hrs
MP1494DJ
1336
11-21-13
97
0
168
MP4050GJ
1312
12-26-13
97
0
168
MP1470GJ
1323
12-03-13
97
0
168
MP1494DJ
1321
12-03-13
97
0
168
MP1494DJ
1321
12-03-13
97
0
168
MP4026GJ
1338
12-05-13
97
0
168
MP4027GJ
1337
12-05-13
95
0
168
MP2489DJ
1338
12-20-13
97
0
168
MP1494SGJ
1333
12-20-13
97
0
168
MP2617AGL
1319
10-09-13
50
0
48
MP2161GJ
1326
12-26-13
50
0
48
MP2161GJ-C499
1327
12-26-13
50
0
48
MP2161GJ
1334
10-24-13
50
0
48
MP1495DJ
1336
10-08-13
50
0
48
MP2234GJ
1336
10-08-13
50
0
48
MP1496DJ
1333
10-08-13
50
0
48
MP3414DJ
1337
10-08-13
50
0
48
MP1470GJ
1336
10-08-13
50
0
48
MP2489DJ
1335
10-08-13
50
0
48
MP1496DJ
1333
10-08-13
50
0
48
MP1470GJ
1334
10-08-13
50
0
48
MP1470GJ
1335
10-08-13
50
0
48
MP1496DJ
1336
10-08-13
50
0
48
MP2143DJ-C463
1336
10-08-13
50
0
48
MP3414DJ
1337
10-08-13
50
0
48
MP1496DJ
1331
10-08-13
50
0
48
MP1495DJ
1323
10-08-13
50
0
48
MP1472GJ
1327
11-21-13
50
0
48
MP2315GJ
1335
10-08-13
50
0
48
MP1472GJ
1338
10-08-13
50
0
48
MP3414DJ
1337
10-08-13
50
0
48
MP1472GJ
1323
10-08-13
50
0
48
MP1494DJ
1335
10-08-13
50
0
48
MP1494DJ
1326
10-08-13
50
0
48
MP1471AGJ
1337
10-08-13
50
0
48
MP1497DJ
1334
10-08-13
50
0
48
MP1472GJ
1333
10-08-13
50
0
48
MP2122GJ
1337
10-08-13
50
0
48
MP1471GJ
1332
10-08-13
50
0
48
MP1471GJ
1332
10-08-13
50
0
48
The Future of Analog IC Technology®
- 82 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1337
10-15-13
50
0
48
MP1472GJ-C452
1338
10-15-13
50
0
48
MP3221GJ
1329
10-15-13
50
0
48
MP9495DJ
1337
10-15-13
50
0
48
MP3221GJ
1328
10-15-13
50
0
48
MP1470GJ
1336
10-24-13
50
0
48
MP1472GJ-C452
1338
10-15-13
50
0
48
MP1472GJ-C452
1338
10-15-13
50
0
48
MP2144GJ
1337
10-15-13
50
0
48
MP2315GJ
1335
10-15-13
50
0
48
MP2144GJ
1337
10-15-13
50
0
48
MP1496DJ
1329
10-15-13
50
0
48
MP1496DJ
1329
10-15-13
50
0
48
MP1495DJ
1328
10-15-13
50
0
48
MP1496DJ
1332
10-15-13
50
0
48
MP1496DJ
1332
10-15-13
50
0
48
MP1497DJ
1332
10-15-13
50
0
48
MP1494DJ
1328
10-15-13
50
0
48
MP1496DJ
1328
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1496DJ
1332
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1496DJ
1334
10-15-13
50
0
48
MP1495DJ
1337
10-15-13
50
0
48
MP1494DJ
1337
10-15-13
50
0
48
MP1494DJ
1337
10-15-13
50
0
48
MP1496DJ
1338
10-15-13
50
0
48
MP1495DJ
1319
10-15-13
50
0
48
MP1495DJ
1337
10-23-13
50
0
48
MP1495DJ
1338
10-15-13
50
0
48
MP1470GJ
1336
10-15-13
50
0
48
MP1470GJ
1336
10-15-13
50
0
48
MP3414DJ
1337
10-15-13
50
0
48
MP1498DJ
1336
10-15-13
50
0
48
MP2144GJ
1337
10-23-13
50
0
48
MP1496DJ
1338
10-15-13
50
0
48
MP1470GJ
1335
10-15-13
50
0
48
MP1494DJ
1333
10-15-13
50
0
48
MP156GJ
1337
10-23-13
50
0
48
FA NO.
# of hrs
The Future of Analog IC Technology®
- 83 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1339
10-23-13
50
0
48
MP1472GJ
1337
10-23-13
50
0
48
FA NO.
# of hrs
MP1494DJ
1331
10-23-13
50
0
48
MP1470GJ
1336
10-23-13
50
0
48
MP1494DJ
1331
10-23-13
50
0
48
MP3414DJ
1340
10-23-13
50
0
48
MP3414DJ
1339
10-23-13
50
0
48
MP1497DJ
1339
10-23-13
50
0
48
MP2143DJ
1339
10-23-13
50
0
48
MP1472GJ-C452
1338
10-23-13
50
0
48
MP24894GJ
1333
10-23-13
50
0
48
MP1472GJ-C452
1338
10-30-13
50
0
48
MP1494DJ
1335
10-30-13
50
0
48
MP2161GJ
1339
10-30-13
50
0
48
MP2233DJ
1340
10-30-13
50
0
48
MP1471GJ
1340
10-30-13
50
0
48
MP1494DJ
1335
10-30-13
50
0
48
MP1470GJ
1336
10-30-13
50
0
48
MP2161GJ-C499
1339
10-30-13
50
0
48
MP2144GJ
1337
10-30-13
50
0
48
MP2161GJ
1339
10-30-13
50
0
48
MP2143DJ
1337
10-30-13
50
0
48
MP2161GJ-C514
1339
10-30-13
50
0
48
MP3414DJ
1339
10-30-13
50
0
48
MP2144GJ
1336
10-30-13
50
0
48
MP1495DJ
1337
10-30-13
50
0
48
MP1496DJ
1335
10-30-13
50
0
48
MP1472GJ-C452
1338
10-30-13
50
0
48
MP2161GJ
1341
10-30-13
50
0
48
MP2161GJ
1341
10-30-13
50
0
48
MP1472GJ-C452
1338
10-30-13
50
0
48
MP1470GJ
1340
10-30-13
50
0
48
MP1470GJ
1340
10-30-13
50
0
48
MP1495DJ
1339
10-30-13
50
0
48
MP2314GJ
1341
10-30-13
50
0
48
MP2161GJ
1339
10-30-13
50
0
48
MP1494DJ
1340
10-30-13
50
0
48
MP1471GJ
1341
10-30-13
50
0
48
MP1497DJ
1339
10-30-13
50
0
48
MP2315GJ
1335
10-30-13
50
0
48
MP1494DJ
1340
10-30-13
50
0
48
MP1470GJ
1341
10-30-13
50
0
48
The Future of Analog IC Technology®
- 84 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1337
10-30-13
50
0
48
MP2161GJ
1339
10-30-13
50
0
48
MP2161GJ-C514
1341
10-30-13
50
0
48
MP2144GJ
1339
10-30-13
50
0
48
MP1495DJ
1337
11-06-13
50
0
48
MP2144GJ
1339
11-06-13
50
0
48
MP2161GJ-C499
1339
11-06-13
50
0
48
MP2161GJ-C514
1339
11-06-13
50
0
48
MP2314GJ
1341
11-06-13
50
0
48
MP1470GJ
1340
11-06-13
50
0
48
MP2122GJ
1341
11-06-13
50
0
48
MP2161GJ
1339
11-06-13
50
0
48
MP3414DJ
1340
11-06-13
50
0
48
MP2161GJ
1340
11-06-13
50
0
48
MP1470GJ
1341
11-06-13
50
0
48
FA NO.
# of hrs
MP3414DJ
1339
11-06-13
50
0
48
MP1471GJ
1341
11-06-13
50
0
48
MP9495DJ
1339
11-06-13
50
0
48
MP2161GJ
1339
11-06-13
50
0
48
MP2314GJ
1334
11-06-13
50
0
48
MP2144GJ
1339
11-06-13
50
0
48
MP2159GJ
1342
11-06-13
50
0
48
MP1470GJ
1341
11-06-13
50
0
48
MP2144GJ
1343
11-06-13
50
0
48
MP1497DJ
1339
11-06-13
50
0
48
MP1470GJ
1343
11-06-13
50
0
48
MP156GJ
1340
11-06-13
50
0
48
MP1495DJ
1339
11-06-13
50
0
48
MP1497DJ
1334
11-06-13
50
0
48
MP1470GJ
1342
11-06-13
50
0
48
MP2161GJ-C514
1341
11-06-13
50
0
48
MP1470GJ
1341
11-06-13
50
0
48
MP1472GJ-C452
1340
11-15-13
50
0
48
MP2315GJ
1341
11-27-13
50
0
48
MP1470GJ
1341
11-15-13
50
0
48
MP1494DJ
1332
11-15-13
50
0
48
MP1495DJ
1338
11-27-13
50
0
48
MP1472GJ-C452
1340
11-15-13
50
0
48
MP2315GJ
1341
11-08-13
50
0
48
MP1497DJ
1335
11-08-13
50
0
48
MP1472GJ
1338
11-08-13
50
0
48
MP1496DJ
1338
11-08-13
50
0
48
The Future of Analog IC Technology®
- 85 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C514
1341
11-08-13
50
0
48
MP1497DJ
1335
11-08-13
50
0
48
MP1472GJ
1340
11-08-13
50
0
48
MP1470GJ
1341
11-08-13
50
0
48
MP2122GJ
1343
11-08-13
50
0
48
MP1496DJ
1338
11-08-13
50
0
48
MP2161GJ-C499
1341
11-08-13
50
0
48
MP1472GJ
1340
11-08-13
50
0
48
MP1470GJ
1341
11-08-13
50
0
48
MP1497DJ
1335
11-08-13
50
0
48
MP1472GJ-C452
1340
11-20-13
50
0
48
FA NO.
# of hrs
MP3414DJ
1340
11-08-13
50
0
48
MP1470GJ
1341
11-08-13
50
0
48
MP1470GJ
1334
11-08-13
50
0
48
MP1470GJ
1312
11-08-13
50
0
48
MP1497DJ
1339
11-08-13
50
0
48
MP2161GJ-C499
1341
11-11-13
50
0
48
MP1497DJ
1331
11-11-13
50
0
48
MP2315GJ
1341
11-15-13
50
0
48
MP1494DJ
1341
11-11-13
50
0
48
MP1470GJ
1341
11-20-13
50
0
48
MP2161GJ
1341
11-20-13
50
0
48
MP1470GJ
1341
11-20-13
50
0
48
MP2161GJ-C514
1343
11-21-13
50
0
48
MP1495DJ
1340
11-27-13
50
0
48
MP2159GJ
1344
11-21-13
50
0
48
MP3414DJ
1340
11-21-13
50
0
48
MP1472GJ-C452
1340
11-21-13
50
0
48
MP1495DJ
1343
11-27-13
50
0
48
MP1495DJ
1338
11-27-13
50
0
48
MP2161GJ-C499
1343
11-27-13
50
0
48
MP2315GJ
1335
11-27-13
50
0
48
MP1472GJ
1340
11-27-13
50
0
48
MP2489DJ
1345
11-27-13
50
0
48
MP2122GJ
1345
11-27-13
50
0
48
MP1495DJ
1340
11-29-13
50
0
48
MP2314GJ
1341
11-29-13
50
0
48
MP1472GJ-C452
1340
11-29-13
50
0
48
MP1471GJ
1341
11-29-13
50
0
48
MP1472GJ-C452
1340
12-05-13
50
0
48
MP1472GJ-C452
1340
12-05-13
50
0
48
MP1472GJ-C452
1340
12-05-13
50
0
48
The Future of Analog IC Technology®
- 86 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ
1343
12-05-13
50
0
48
MP1470GJ
1342
12-05-13
50
0
48
FA NO.
# of hrs
MP1495DJ
1345
12-05-13
50
0
48
MP1472GJ-C452
1340
12-05-13
50
0
48
MP1470GJ
1346
12-05-13
50
0
48
MP2161GJ
1343
12-05-13
50
0
48
MP3414DJ
1342
12-10-13
50
0
48
MP2161GJ
1343
12-10-13
50
0
48
MP2143DJ
1347
12-10-13
50
0
48
MP2314GJ
1341
12-10-13
50
0
48
MP3414DJ
1344
12-12-13
50
0
48
MP1470GJ
1345
12-12-13
50
0
48
MP1470GJ
1347
12-12-13
50
0
48
MP2161GJ
1343
12-12-13
50
0
48
MP156GJ
1346
12-12-13
50
0
48
MP1472GJ
1338
12-12-13
50
0
48
MP3414DJ
1342
12-12-13
50
0
48
MP1470GJ
1344
12-12-13
50
0
48
MP2161GJ
1336
12-12-13
50
0
48
MP1472GJ-C452
1345
12-12-13
50
0
48
MP2161GJ
1341
12-12-13
50
0
48
MP1470GJ
1345
12-18-13
50
0
48
MP1472GJ-C452
1345
12-18-13
50
0
48
MP2161GJ
1341
12-18-13
50
0
48
MP1494DJ
1346
12-18-13
50
0
48
MP3414DJ
1344
12-18-13
50
0
48
MP1495DJ-C494
1347
12-19-13
50
0
48
MP3414DJ
1344
12-19-13
50
0
48
MP1471GJ
1349
12-19-13
50
0
48
MP1498DJ
1349
12-19-13
50
0
48
MP2314GJ
1341
12-19-13
50
0
48
MP9495DJ
1348
12-19-13
50
0
48
MP2144GJ
1345
12-19-13
50
0
48
MP3414DJ
1347
12-19-13
50
0
48
MP1471GJ
1344
12-19-13
50
0
48
MP1497DJ
1335
12-20-13
50
0
48
MP2144GJ
1346
12-20-13
50
0
48
MP1472GJ
1338
12-26-13
50
0
48
MP1472GJ
1331
12-26-13
50
0
48
MP1472GJ
1345
12-26-13
50
0
48
MP2144GJ
1347
12-26-13
50
0
48
MP2161GJ
1349
12-26-13
50
0
48
The Future of Analog IC Technology®
- 87 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2234GJ
1349
12-26-13
50
0
48
MP2161GJ
1348
12-26-13
50
0
48
MP1495DJ
1347
12-26-13
50
0
48
MP1496DJ
1335
12-26-13
50
0
48
MP1495DJ-C494
1348
12-26-13
50
0
48
MP1471GJ
1349
12-26-13
50
0
48
MP2161GJ
1348
12-26-13
50
0
48
MP1497DJ
1333
12-26-13
50
0
48
MP1495DJ
1347
12-26-13
50
0
48
MP1498DJ
1349
12-26-13
50
0
48
MP1470GJ
1349
12-26-13
50
0
48
MP2314GJ
1350
12-26-13
50
0
48
MP2159GJ
1346
12-26-13
50
0
48
MP3414DJ
1349
12-26-13
50
0
48
MP1470GJ
1349
12-26-13
50
0
48
FA NO.
# of hrs
MP2315GJ
1346
12-26-13
50
0
48
MP1472GJ-C452
1344
12-26-13
50
0
48
MP1470GJ
1349
12-31-13
50
0
48
MP1470GJ
1349
12-31-13
50
0
48
MP1472GJ-C452
1345
12-31-13
50
0
48
MP1472GJ-C452
1345
12-31-13
45
0
48
MP3414DJ
1344
12-31-13
50
0
48
MP1470GJ
1349
12-31-13
50
0
48
MP2143DJ
1351
12-31-13
50
0
48
Total
0
4.8.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1316
10-09-13
100
0
MP1496DJ
1314
10-09-13
50
0
MP1496DJ
1318
10-09-13
50
0
MP1470GJ
1327
10-08-13
92
0
MP1470GJ
1305
10-16-13
48
0
MP1470GJ
1307
10-16-13
48
0
MP1494SGJ
1320
11-14-13
97
0
MP1494DJ
1336
11-21-13
97
0
MP4050GJ
1312
12-26-13
83
0
MP1470GJ
1323
12-03-13
95
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 88 -
MONOLITHIC POWER SYSTEMS
Q4
2013
PRODUCT RELIABILITY REPORT
Monolithic Power Systems (Chengdu) Co., Ltd.
No.8 Kexin Rd. West Park of Export Processing Zone,
West Hi-Tech Zone, Chengdu, Sichuan 611731
Tel: 86-28-87303000
Fax: 86-28-87303060
www.monolithicpower.com
The Future of Analog IC Technology®
- 89 -