NTE74221 Integrated Circuit TTL − Dual Monostable Multivibrator Description: The NTE74221 is a monolithic dual multivibrator in a 16−Lead plastic DIP type package with performance characteristics virtually identical to those of the NTE74121. Each multivibrator features a negative−transition−triggered input and a positive−transition−triggered input either of which can be used as an inhibit input. Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. Schmitt−trigger input circuitry (TTL hysteresis) for B input allows jitter−free triggering from inputs with transition rates as slow as 1 volt/second, providing the circuit with excellent noise immunity of typically 1.2 volts. A high immunity to VCC noise of typically 1.5V is also provided by internal latching circuitry. Once fired, the outputs are independent o further transitions of the A an B inputs and are a function of the timing components, or the output pulses can be terminated by the overriding clear. Input pulses may be of any duration relative to the output pulse. Output pulse length may be varied from 35ns to the maximum pulse length of 70 seconds by choosing appropriate timing components. With Rext = 2k and Cext = 0, and output pulse of typically 30ns is achieved which may be used as a DC triggered reset signal. Output rise and fall times are TTL compatible and independent of pulse length. Pulse width stability is achieved through internal compensation and is virtually independent of VCC and temperature. In most applications, pulse stability will only be limited by the accuracy of external timing components. Jitter−free operation is maintained over the full temperature and VCC ranges for more than six decades of timing capacitance (10pF to 10F) and more than one decade of timing resistance (2k to 40k).Throughout these ranges, pulse width is defined by the relationship: tw(out) = CextRext In2 [ 0.7 CextRext. In circuits where the pulse cutoff is not critical, timing capacitance up to 1000F and timing resistance as low as 1.4k may be used. Also, the range of jitter−free output pulse widths is extended if VCC is held to 5V and free−air temperature is +25C. Duty cycles as high as 90% are achieved when using maximum recommended RT. Higher duty cycles are available if a certain amount of pulse−width jitter is allowed. Features: D Overriding Clear Terminates Output Pulse Recommended Operating Conditions: Parameter Symbol Min Typ Max Unit Supply Voltage VCC 4.75 5.0 5.25 V High−Level Output Current IOH − − −800 A Low−Level Output Current IOL − − 16 mA dv/dt 1 − − V/s 1 − − V/s Rate of Rise or Fall of Input Pulse Schmitt, B Logic Input, A Input Pulse Width A or B tw(in) 50 − − ns Clear tw(clear) 20 − − ns tsu 15 − − ns External Timing Resistance Rext 1.4 − 40 k External Timing Capacitance Cext 0 − 1000 F RT = 2k − − 67 % RT = MAX Rext − − 90 % 0 − +70 C Min Typ Max Unit − 1.4 2.0 V Clear Inactive−State Setup Time Output Duty Cycle Operating Temperature Range TA Electrical Characteristics: (Note 1, Note 2) Parameter Symbol Threshold Voltage at A Input VT+ Threshold Voltage at B Input VT+ Test Conditions VCC = MIN VT− VCC = MIN VT− 0.8 1.4 − V − 1.55 2.0 V 0.8 1.35 − V − − −1.5 V 2.4 3.4 − V Input Clamp Voltage VIK VCC = MIN, II = −12mA High Level Output Voltage VOH VCC = MIN, IOH = −800A Low Level Output Voltage VOL VCC = MIN, IOL = 16mA − 0.2 0.4 V Input Current II VCC = MAX, VI = 5.5V − − 1 mA High Level Input Current IIH VCC = MAX, VI = 2.4V Input A − − 40 A Input B, Clear − − 80 A Input A − − −1.6 mA Input B, Clear − − −3.2 mA −18 − −55 mA Quiescent − 26 50 mA Triggered − 46 80 mA Low Level Input Current IIL VCC = MAX, VI = 0.4V Short−Circuit Output Current IOS VCC = MAX, Note 3 Supply Current ICC VCC = MAX Note 1. .For conditions shown as MIN or MAX, use the appropriate value specified under “Recommended Operation Conditions”. Note 2. All typical values are at VCC = 5V, TA = +25C. Note 3. Not more than one output should be shorted at a time. Switching Characteristics: (VCC = 5V, TA = +25C unless otherwise specified) Parameter Propagation Delay Time (From A Input to Q Output) Symbol tPLH Propagation Delay Time (From B Input to Q Output) Test Conditions Min Typ Max Unit − 45 70 ns tPLH − 35 55 ns Propagation Delay Time (From A Input to Q Output) tPHL − 50 80 ns Propagation Delay Time (From B Input to Q Output) tPHL − 40 65 ns Propagation Delay Time (From Clear Input to Q Output) tPHL − − 27 ns Propagation Delay Time (From Clear Input to Q Output) tPHL − − 40 ns Output Pulse Width (From A or B Input to Q or Q Output) tw(out) Cext = 80pF, Rext = 2k 70 110 150 ns Cext = 0pF, Rext = 2k 20 30 50 ns Cext = 100pF, Rext = 10k 650 700 750 ns Cext = 1F, Rext = 10k 6.5 7.0 7.5 ns CL = 15pF, Cext = 80pF, Rext = 2k RL = 400 Function Table: Truth Table: Clear Inputs A B L X X H H * X H X L L X X L H H Outputs Q Q L L L H H H H = High Level L = Low Level X = Irrelavent = Transition from LOW−to−HIGH = Transition from HIGH−to−LOW = One HIGH Level Pulse = One LOW Level Pulse * This condition is true only if the output of the latch formed by the two NAND gates has been conditioned to the logical “1” state prior to CLR going high. This latch is conditioned by taking either A or B low which CLR is in the inactive state. Pin Connection Diagram 16 VCC 1A 1 15 1 REXT/CEXT 14 1 CEXT 1B 2 1 CLR 3 1Q 4 13 1 Q 2Q 5 12 2 Q 11 2 CLR 2 CEXT 6 2 REXT/CEXT 7 10 2 B GND 8 9 2A 16 9 1 8 .870 (22.0) Max .260 (6.6) Max .200 (5.08) Max .100 (2.54) .700 (17.78) .099 (2.5) Min