HD74ALVCH16501 18-bit Universal Bus Transceivers with 3-state Outputs REJ03D0036-0300Z (Previous ADE-205-168A(Z)) Rev.3.00 Oct.02.2003 Description Data flow in each direction is controlled by output enable (OEAB and OEBA), latch enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A to B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CLKAB is held at a high or low logic level. If LEAB is low, the A bus data is stored in the latch flip flop on the low to high transition of CLKAB. When OEAB is high, the outputs are active. When OEAB is low, the outputs are in the high impedance state. Data flow for B to A is similar to that of A to B but uses OEBA, LEBA, and CLKBA. The output enables are complementary (OEAB is active high, and OEBA is active low). Active bus hold circuitry is provided to hold unused or floating data inputs at a valid logic level. Features • • • • • VCC = 2.3 V to 3.6 V Typical VOL ground bounce < 0.8 V (@VCC = 3.3 V, Ta = 25°C) Typical VOH undershoot > 2.0 V (@VCC = 3.3 V, Ta = 25°C) High output current ±24 mA (@VCC = 3.0 V) Bus hold on data inputs eliminates the need for external pullup / pulldown resistors Rev.3.00, Oct.02.2003, page 1 of 11 HD74ALVCH16501 Function Table *3 Inputs Output B OEAB LEAB CLKAB A L X X X Z H H X L L H H X H H H L L L H L H H H L H X B0 *1 H L L X B0 *2 H : High level L : Low level X : Immaterial Z : High impedance ↑ : Low to high transition Notes: 1. Output level before the indicated steady state input conditions were established. 2. Output level before the indicated steady state input conditions were established, provided that CLKAB was high before LEAB went low. 3. A to B data flow is show; B to A flow is similar but uses OEBA, LEBA, and CLKBA. Rev.3.00, Oct.02.2003, page 2 of 11 HD74ALVCH16501 Pin Arrangement OEAB 1 56 GND LEAB 2 55 CLKAB 54 B1 A1 3 53 GND GND 4 A2 5 52 B2 A3 6 VCC 7 51 B3 A4 8 49 B4 A5 9 48 B5 A6 10 47 B6 50 VCC GND 11 46 GND A7 12 45 B7 A8 13 44 B8 A9 14 43 B9 A10 15 42 B10 A11 16 41 B11 A12 17 40 B12 GND 18 39 GND A13 19 38 B13 A14 20 37 B14 A15 21 36 B15 VCC 22 35 VCC A16 23 34 B16 A17 24 33 B17 GND 25 32 GND A18 26 31 B18 OEBA 27 30 CLKBA LEBA 28 29 GND (Top view) Rev.3.00, Oct.02.2003, page 3 of 11 HD74ALVCH16501 Absolute Maximum Ratings Item Supply voltage Input voltage *1, 2 Symbol Ratings Unit VCC –0.5 to 4.6 V VI –0.5 to 4.6 V –0.5 to VCC +0.5 Conditions Except I/O ports I/O ports Output voltage *1, 2 VO –0.5 to VCC +0.5 V Input clamp current IIK –50 mA VI < 0 Output clamp current IOK ±50 mA VO < 0 or VO > VCC Continuous output current IO ±50 mA VO = 0 to VCC TSSOP ±100 Maximum power dissipation *3 at Ta = 55°C (in still air) PT 1 W Storage temperature Tstg –65 to 150 °C Notes: Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. 2. This value is limited to 4.6 V maximum. 3. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils. Recommended DC Operating Conditions Item Symbol Min Max Unit Supply voltage VCC 2.3 3.6 V Input voltage VI 0 VCC V Output voltage VO 0 VCC V High level output current IOH — –12 mA — –12 — –24 — 12 — 12 VCC = 2.7 V — 24 VCC = 3.0 V Low level output current IOL VCC = 2.3 V VCC = 2.7 V VCC = 3.0 V mA Input transition rise or fall rate ∆t / ∆v 0 10 ns / V Operating temperature Ta –40 85 °C Note: Unused control inputs must be held high or low to prevent them from floating. Rev.3.00, Oct.02.2003, page 4 of 11 Conditions VCC = 2.3 V HD74ALVCH16501 Logic Diagram OEAB CLKAB LEAB LEBA CLKBA OEBA A1 1 55 2 28 30 27 3 1D C1 CLK 1D C1 CLK To seventeen other channels Rev.3.00, Oct.02.2003, page 5 of 11 54 B1 HD74ALVCH16501 Electrical Characteristics (Ta = –40 to 85°C) Item Symbol VCC (V) *1 Min Max Unit Input voltage VIH 2.3 to 2.7 1.7 — V 2.7 to 3.6 2.0 — 2.3 to 2.7 — 0.7 2.7 to 3.6 — 0.8 VIL Output voltage VOH IOH = –100 µA Min to Max VCC–0.2 — 2.3 2.0 — IOH = –6 mA, VIH = 1.7 V 2.3 1.7 — IOH = –12 mA, VIH = 1.7 V 2.7 2.2 — IOH = –12 mA, VIH = 2.0 V 3.0 2.4 — IOH = –12 mA, VIH = 2.0 V 3.0 2.0 — IOH = –24 mA, VIH = 2.0 V Min to Max — 0.2 IOL = 100 µA 2.3 — 0.4 IOL = 6 mA, VIL = 0.7 V 2.3 — 0.7 IOL = 12 mA, VIL = 0.7 V 2.7 — 0.4 IOL = 12 mA, VIL = 0.8 V 3.0 — 0.55 IOL = 24 mA, VIL = 0.8 V IIN 3.6 — ±5 IIN (hold) 2.3 45 — VIN = 0.7 V 2.3 –45 — VIN = 1.7 V 3.0 75 — VIN = 0.8 V 3.0 –75 — VIN = 2.0 V VOL Input current V Test Conditions µA VIN = VCC or GND 3.6 — ±500 Off state output current *2 IOZ 3.6 — ±10 µA VIN = 0 to 3.6 V VOUT = VCC or GND Quiescent supply current ICC 3.6 — 40 µA VIN = VCC or GND ∆ICC 3.0 to 3.6 — 750 µA VIN = one input at (VCC–0.6) V, other inputs at VCC or GND Notes: 1. For conditions shown as Min or Max, use the appropriate values under recommended operating conditions. 2. For I/O ports, the parameter IOZ includes the input leakage current. Rev.3.00, Oct.02.2003, page 6 of 11 HD74ALVCH16501 Switching Characteristics (Ta = 40 to 85°C) Item Symbol VCC (V) Min Typ Max Unit Maximum clock frequency fmax 2.5±0.2 150 — — MHz 2.7 150 — — 3.3±0.3 150 — — tPLH 2.5±0.2 1.2 — 4.8 tPHL 2.7 — — 4.5 3.3±0.3 1.0 — 3.9 2.5±0.2 1.6 — 5.7 2.7 — — 5.3 3.3±0.3 1.3 — 4.6 2.5±0.2 1.7 — 6.1 2.7 — — 5.6 3.3±0.3 1.4 — 4.9 tZH 2.5±0.2 1.1 — 5.8 tZL 2.7 — — 5.3 3.3±0.3 1.0 — 4.6 2.5±0.2 1.4 — 6.3 2.7 — — 6.0 3.3±0.3 1.1 — 5.0 tHZ 2.5±0.2 2.2 — 6.2 tLZ 2.7 — — 5.7 3.3±0.3 1.4 — 5.0 Propagation delay time Output enable time Output disable time 2.5±0.2 2.0 — 5.3 2.7 — — 4.6 3.3±0.3 1.3 — 4.2 ns ns ns FROM (Input) TO (Output) A or B B or A LE A or B CLK A or B OEAB B OEBA A OEAB B OEBA A Input capacitance CIN 3.3 — 4.0 — pF Control inputs Output capacitance CIN / O 3.3 — 8.0 — pF A or B ports Rev.3.00, Oct.02.2003, page 7 of 11 HD74ALVCH16501 • Test Circuit See under table 500 Ω S1 OPEN GND *1 C L = 50 pF 500 Ω Load Circuit for Outputs Symbol Vcc=2.5±0.2 V t PLH / t PHL OPEN t su / t h / t w t ZH/ t HZ t ZL / t LZ Vcc = 2.7 V, 3.3±0.3 V OPEN GND GND 4.6 V 6.0 V Note: 1. C L includes probe and jig capacitance. Rev.3.00, Oct.02.2003, page 8 of 11 HD74ALVCH16501 • Waveforms – 1 tr tf VIH 90 % Vref 90 % Input Vref 10 % 10 % GND t PHL t PLH VOH Output Vref Vref VOL • Waveforms – 2 tr VIH 90 % Vref Timing Input 10 % tsu GND th VIH Data Input Vref Vref GND tw VIH Input Vref Vref GND Rev.3.00, Oct.02.2003, page 9 of 11 HD74ALVCH16501 • Waveforms – 3 Output Control tf tr 90 % Vref VIH 90 % Vref 10 % t ZL 10 % GND t LZ ≈VOH1 Vref Waveform - A t ZH Waveform - B VOL + 0.3 V t HZ VOH – 0.3 V Vref VOL VOH ≈VOL1 TEST VIH Vref VOH1 VOL1 Vcc=2.5±0.2V Vcc=2.7V, 3.3±0.3V 2.3 V 2.7 V 1.2 V 2.3 V 1.5 V 3.0 V GND GND Notes: 1. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Zo = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. 2. Waveform – A is for an output with internal conditions such that the output is low except when disabled by the output control. 3. Waveform – B is for an output with internal conditions such that the output is high except when disabled by the output control. 4. The output are measured one at a time with one transition per measurement. Rev.3.00, Oct.02.2003, page 10 of 11 HD74ALVCH16501 Package Dimensions As of January, 2003 14.0 14.2 Max 56 Unit: mm 6.10 29 1 *0.19 ± 0.05 0.50 28 0.08 M 1.0 8.10 ± 0.20 0.65 Max *Ni/Pd/Au plating Rev.3.00, Oct.02.2003, page 11 of 11 0.10 ± 0.05 0.10 *0.15 ± 0.05 1.20 Max 0˚ – 8˚ 0.50 ± 0.1 Package Code JEDEC JEITA Mass (reference value) TTP-56DAV — — 0.23 g Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. 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