NDPL180N10B - ON Semiconductor

NDPL180N10B
Power MOSFET
100V, 3.0mΩ, 180A, N-Channel
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VDSS
Features
• Ultra Low On-Resistance
• Low Gate Charge
• High Speed Switching
• 100% Avalanche Test
• Pb-Free and RoHS Compliance
RDS(on) Max
3.0mΩ@ 15V
100V
N-Channel
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Unit
Value
VDSS
100
V
Gate to Source Voltage
VGSS
±20
V
Drain Current (DC)
ID
180
A
Drain Current (DC) Limited by Package
IDL
100
A
IDP
600
A
Drain Current (Pulse)
PW≤10μs, duty cycle≤1%
Power Dissipation
Tc=25°C
200
°C
−55 to +175
°C
100
A
EAS
451
mJ
TL
260
°C
Storage Temperature
Tstg
Source Current (Body Diode)
IS
Avalanche Energy (Single Pulse) *1
2
1 : Gate
2 : Drain
3 : Source
1
W
175
Tj
Purposes, 3mm from Case for 10 Seconds
2.1
PD
Junction Temperature
Lead Temperature for Soldering
180A
3.5mΩ@ 10V
Electrical Connection
Specifications
Drain to Source Voltage
ID Max
3
Marking
180N10
B
Thermal Resistance Ratings
Parameter
Symbol
Value
Junction to Case Steady State
RθJC
0.75
Junction to Ambient *2
RθJA
71.4
Unit
1
2
3
LOT No.
TO-220-3L
°C/W
Note: *1 VDD=48V, L=100μH, IAV=70A (Fig.1)
*2 Insertion mounted
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
ORDERING INFORMATION
See detailed ordering and shipping information on page 5 of this data sheet.
© Semiconductor Components Industries, LLC, 2015
March 2015 - Rev. 3
1
Publication Order Number :
NDPL180N10B/D
NDPL180N10B
Electrical Characteristics at Ta = 25°C
Parameter
Symbol
Value
Conditions
min
typ
Unit
max
Drain to Source Breakdown Voltage
V(BR)DSS
ID=10mA, VGS=0V
Zero-Gate Voltage Drain Current
IDSS
VDS=100V, VGS=0V
10
μA
Gate to Source Leakage Current
IGSS
VGS=±20V, VDS=0V
±200
nA
Gate Threshold Voltage
VGS(th)
VDS=10V, ID=1mA
4
V
Forward Transconductance
gFS
VDS=10V, ID=50A
150
RDS(on)1
ID=50A, VGS=15V
2.5
3.0
mΩ
RDS(on)2
ID=50A, VGS=10V
2.7
3.5
mΩ
Static Drain to Source On-State Resistance
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Turn-ON Delay Time
Rise Time
tr
Turn-OFF Delay Time
td(off)
Fall Time
tf
Total Gate Charge
Qg
Gate to Source Charge
Qgs
Gate to Drain “Miller” Charge
Qgd
Forward Diode Voltage
100
V
2
S
6,950
pF
3,000
pF
Crss
15
pF
td(on)
95
ns
320
ns
185
ns
VDS=50V, f=1MHz
See Fig.2
130
ns
95
nC
VDS=48V, VGS=10V, ID=100A
31
nC
VSD
IS=100A, VGS=0V
0.9
Reverse Recovery Time
trr
See Fig.3
150
ns
Reverse Recovery Charge
Qrr
IS=100A, VGS=0V, VDD=50V, di/dt=100A/μs
580
nC
26
nC
1.5
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be
indicated by the Electrical Characteristics if operated under different conditions.
Fig.1 Unclamped Inductive Switching Test Circuit
Fig.3 Reverse Recovery Time Test Circuit
NDPL180N10B
D
L
G
S
VDD
Driver MOSFET
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2
Fig.2 Switching Time Test Circuit
NDPL180N10B
www.onsemi.com
3
NDPL180N10B
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4
NDPL180N10B
Package Dimensions
NDPL180N10BG
TO-220, 3-Lead / TO-220-3L
CASE 221AU
ISSUE O
unit : mm
1: Gate
2: Drain
3: Source
ORDERING INFORMATION
Device
NDPL180N10BG
Package
Shipping
Note
TO-220, 3-Lead
TO-220-3L
50 pcs. / Tube
Pb-Free
Note on usage : Since the NDPL180N10B is a MOSFET product, please avoid using this device in the vicinity
of highly charged objects.
ON Semiconductor and the ON logo are registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States
and/or other countries. SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of
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nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including
without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can
and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each
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not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or
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