1.25Gbps, 850nm VCSEL Transmitters OPV200 Series Reliability Data Description The Optek Quality Assurance System provides a means to monitor, control and correct product quality on a real-time basis. Each product family that Optek produces is extensively tested prior to manufacturing release for quality and reliability. An ongoing commitment to quality and product improvement insures that reliability will continue to progress throughout the product’s life cycle. The OPV200 series VCSEL transmitters were designed to provide the high a degree of performance with equal level of reliability. The data contained in this report serves to validate the reliability of these components and stands as Optek’s commitment to continuous product improvement. OPV200 Series Demonstrated Performance Test Name Total Units Total Device Tested Hours Conditions Failures High Temperature TA = 100 C, IF = 20mA Operating Life VF(AVG) = 1.9 V Predicted Failure Rate at If = 7.0 mA (typical) Predicted Performance 90% Confidence MTTF FIT Ambient Temp. Junction Temp. MTTF1 FIT2 ( C) ( C) (Hours) (109 Hours) ! ' ( Optek Technology, Inc. " ( ! (Hours) (109 Hours) Predicted Performance 60% Confidence MTTF FIT (Hours) (109 Hours) # $% & ( July 2003 Issue 4.0 Carrollton, Texas 75006 (972) 323-2200 Page 1 of 3 [email protected] www.optekinc.com OPV200 Series Reliability Data OPV200 Series Mechanical and Environmental Tests Results3 MIL-STD-883 (Unless otherwise stated) Examination or Test Method Details LTPD Reject Pass 11 Parts Group 1 20 Mechanical Shock 2002 1,500 G at 0.5ms, 5 times per axis Vibration 2007 Condition A 20-2,000 Hz, 4 min/cycle, 4 cycles/axis End point testing for Group 1 11 Parts Group 2 1011 0-100 C Solderability 2003 Steam aging not required End point testing for Group 2 Group 3 10 parts Accelerated Aging Life Test (Central Office Rating) Output power maintained at 1.1mW. TC = 70 C (TA may be adjusted to obtain TC value. End point testing for Group 3 5,000 Hour read point Group 4 25 parts Accelerated Aging Life Test (Uncontrolled Env. Rating) Biased at rated power. TC = 85 C , 1.1mW End point testing for Group 4 5,000 Hour read point Group 5 11 Parts 1008 11 0 11 0 10 0 25 20 Thermal Shock High Temp Storage 0 20 TA = 125 C (2,000 hours total) Mid point testing for Group 5 1,000 Hours 0 11 End point testing for Group 5 2,000 Hours 0 11 Group 6 11 Parts Low Temp Storage TA = -40 C (2,000 hours total) Mid point testing for Group 6 1,000 hour mid point 0 11 End point testing for Group 6 2,000 hour end point 0 11 20 July 2003 Issue 4.0 Optek Technology, Inc. Carrollton, Texas 75006 (972) 323-2200 Page 2 of 3 [email protected] www.optekinc.com OPV200 Series Reliability Data OPV200 Series Mechanical and Environmental Tests Examination or Test Results3 MIL-STD-883 (Unless otherwise stated) Method Details LTPD Reject Pass 20 11 Parts Group 7 Temperature Cycling (Central office rating) 1011 -40 - 70 C, 500 cycles End point testing for Group 7 Temperature Cycling (Uncontrolled Env. Rating) 1010 5,000 Hour read point Group 9 11 Parts 103 11 0 11 0 5 85 C/85% Relative Humidity; 1,000 hours 20 11 Parts Moisture Resistance 20 cycles with 10 sub-cycles End point testing for Group 10 5 Parts 1004 0 MIL-STD-202 Group 10 Water Vapor Content 11 20 End point testing for Group 9 Group 11 0 -40 - 85 C, 500 cycles End point testing for Group 8 Damp Heat 11 20 11 Parts Group 8 0 - 5,000 PPM Max H2O End point testing for Group 11 Notes: 1. MTTF is the total devices hours divided by either the number of failures or unity if there are no failures. 2. Failure in time (FIT) is equal to the number of failures expected in one billion device hours. For example, 1 FIT = 1 failure per 1,000,000,000 devices hours. 3. End point failure criteria is a catastrophic failure or when the product demonstrates a drop in optical power of greater than 2 dBm at IF = 12mA. July 2003 Issue 4.0 Optek Technology, Inc. Carrollton, Texas 75006 (972) 323-2200 Page 3 of 3 [email protected] www.optekinc.com