Application Note / Report for VSWA2-63DR+

PCN REPORT
PART NUMBER, VSWA2-63DR+:
AN-80-010
Due to obsolescence of the Dice used in Current part (Current Fab), a new set of dice in
a nearly identical package (Future Fab) has been qualified.
Performance of Part with Replacement Die set has been judged by Mini-Circuits
Engineering as a suitable one with Current Die seta
MECHANICAL DIMENSIONS & PCB LAND PATTERN
CURRENT FAB:
FUTURE FAB:
Case Style: DG1235
Case Style: DG1235-1 (minor dimensional changes
as below)
MECHANICAL DRAWING & PCB LAND PATTERN
Inches (mm)
E & F 0.085 (2.16) Inches (mm)
J 0.022 (0.56) Q 0.035 (0.89) E & F J Q 0.106 0.016 0.031 (2.70) (0.40) (0.79 Note:
1) Dimensions not shown are the same as in
DG1235
2) Mini-Circuits experiment shows part can fit into
existing PCB Land pattern
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 1 of 9 PCN REPORT
CONCLUSION:
1) FORM-FIT-FUNCTIONAL COMPATIBLE a:
Part using Current Fab Die is Form, Fit, Function compatible with that using Die from Future Fab, except
for the following:
Parameter
CURRENT FAB
REPLACEMENT PART
Control Voltage: High
VDD= + 4 to +5V
2.7V min & VDD
max
3.5V min to VDD max
Supply Current
12µA Typ.
50uA Typ.
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 2 of 9 PCN REPORT
2) PERFORMANCE COMPARISON, TYPICAL AT VDD=+5V at 25°Ca
Parameter
Insertion Loss
RF-COM to RF1
Insertion Loss
RF-COM to RF2
Isolation
RF-COM to RF1
Isolation
RF-COM to RF2
Isolation
RF1 ro RF2 (RF1 ON)
Isolation
RF1 ro RF2 (RF2 ON)
Return Loss
RF COM (RF1 ON)
Return Loss
RF COM (RF2 ON)
Return Loss
RF1 ON
Return Loss
RF2 ON
Return Loss
RF1 OFF
Return Loss
RF2 OFF
Future Fab
MHz
From To
Average
0.3 500
0.74
500 2000
0.77
2000 3000
0.83
3000 4000
0.90
4000 6000
1.04
0.3 500
0.70
500 2000
0.72
2000 3000
0.77
3000 4000
0.83
4000 6000
1.01
0.3 500
76.9
500 2000
70.4
2000 3000
66.7
3000 4000
58.6
4000 6000
55.6
0.3 500
69.7
500 2000
62.9
2000 3000
61.9
3000 4000
57.6
4000 6000
52.6
0.3 500
70.9
500 1000
59.6
1000 2000
56.0
2000 3000
52.2
3000 4000
49.8
4000 6000
46.4
0.3 500
78.1
500 1000
61.2
1000 2000
56.8
2000 3000
52.3
3000 4000
49.6
4000 6000
45.9
0.3 500
23.6
500 2000
23.7
2000 3000
22.4
3000 4000
18.7
4000 6000
19.0
0.3 500
23.4
500 2000
23.3
2000 3000
23.0
3000 4000
18.9
4000 6000
20.2
0.3 500
23.6
500 2000
22.6
2000 3000
21.2
3000 4000
22.8
4000 6000
20.3
0.3 500
23.3
500 2000
22.5
2000 3000
22.2
3000 4000
26.3
4000 6000
21.2
500 2000
23.8
2000 3000
33.1
3000 4000
22.4
4000 6000
23.0
500 2000
23.0
2000 3000
34.4
3000 4000
24.8
4000 6000
26.5
Current Fab
Average
0.83
0.87
0.89
0.97
1.10
0.75
0.78
0.80
0.89
1.03
70.5
69.5
75.1
67.3
65.8
82.3
68.2
60.4
56.7
55.8
71.1
58.3
52.6
48.3
45.8
44.0
80.6
59.1
53.4
48.8
45.6
42.5
23.5
24.1
25.4
17.3
18.6
23.2
24.1
22.0
15.7
17.8
23.6
25.1
24.1
25.7
25.0
23.1
22.3
22.1
22.5
22.8
15.7
16.4
20.3
21.2
15.1
16.4
20.8
27.4
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 3 of 9 PCN REPORT
3) PERFORMANCE COMPARISON, TYPICAL AT VDD=+3V at 25°Ca
Parameter
Insertion Loss
RF-COM to RF1
Insertion Loss
RF-COM to RF2
Isolation
RF-COM to RF1
Isolation
RF-COM to RF2
Isolation
RF1 ro RF2 (RF1 ON)
Isolation
RF1 ro RF2 (RF2 ON)
Return Loss
RF COM (RF1 ON)
Return Loss
RF COM (RF2 ON)
Return Loss
RF1 ON
Return Loss
RF2 ON
Return Loss
RF1 OFF
Return Loss
RF2 OFF
Future Fab
MHz
From To
Average
0.3 500
0.73
500 2000
0.76
2000 3000
0.82
3000 4000
0.89
4000 6000
1.05
0.3 500
0.67
500 2000
0.70
2000 3000
0.75
3000 4000
0.81
4000 6000
1.01
0.3 500
76.6
500 2000
69.6
2000 3000
67.1
3000 4000
59.1
4000 6000
54.7
0.3 500
69.4
500 2000
62.7
2000 3000
62.1
3000 4000
57.7
4000 6000
52.9
0.3 500
70.3
500 1000
59.5
1000 2000
56.0
2000 3000
52.3
3000 4000
49.9
4000 6000
46.3
0.3 500
76.9
500 1000
61.0
1000 2000
56.7
2000 3000
52.5
3000 4000
49.9
4000 6000
46.0
0.3 500
23.7
500 2000
24.1
2000 3000
23.0
3000 4000
18.8
4000 6000
19.2
0.3 500
23.8
500 2000
23.8
2000 3000
23.4
3000 4000
18.9
4000 6000
20.3
0.3 500
23.6
500 2000
23.2
2000 3000
22.2
3000 4000
23.8
4000 6000
21.2
0.3 500
23.7
500 2000
23.1
2000 3000
23.2
3000 4000
28.0
4000 6000
22.4
500 2000
23.7
2000 3000
32.0
3000 4000
22.0
4000 6000
22.5
500 2000
22.7
2000 3000
33.4
3000 4000
24.5
4000 6000
26.0
Current Fab
Average
0.82
0.86
0.88
0.99
1.14
0.74
0.77
0.79
0.91
1.07
80.2
67.8
60.6
57.0
55.8
69.4
69.3
77.0
68.2
65.2
71.1
58.3
52.6
48.3
45.9
44.3
79.2
59.1
53.3
48.8
45.7
42.8
23.7
24.4
25.7
16.4
17.5
23.4
24.5
22.5
15.1
16.2
23.8
26.0
26.3
25.7
25.9
23.3
22.9
24.1
22.4
21.2
16.0
16.9
21.8
22.8
15.4
17.0
22.2
27.4
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 4 of 9 PCN REPORT
4) PERFORMANCE COMPARISON CURVES a, CURRENT FAB vs. FUTURE FAB: VDD=+5V
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 5 of 9 PCN REPORT
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 6 of 9 PCN REPORT
5) PERFORMANCE COMPARISON CURVES a, CURRENT FAB vs. FUTURE FAB: VDD=+3V
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 7 of 9 PCN REPORT
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 8 of 9 PCN REPORT
Notes:
a.
Suitability for model with new die must be determined by and is solely the responsibility of the customer based on, among other things, electrical performance
criteria, stimulus conditions, application, compatibility with other components and environmental conditions and stresses.
AN‐80‐010 Rev: OR (03/27/15) M150546 File: AN80010.doc This document and its contents are the property of Mini‐Circuits. Page 9 of 9