CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 EMC TEST REPORT According to EN 55022:2010 (Class B) EN 61000-3-2:2006+A1:2009+A2:2009 EN 61000-3-3:2008 EN 55024:2010 IEC 61000-4-2:2008 IEC 61000-4-3:2006+A1:2007+A2:2010 IEC 61000-4-4:2004+A1:2010 IEC 61000-4-5:2005 IEC 61000-4-6:2008 IEC 61000-4-8:2009 IEC 61000-4-11:2004 Applicant : TRACO Electronic Ltd. Address Sihlbruggstrasse 111 : CH-6340 Baar Switzerland Equipment : Switching Power Module Model No. : Trade Name TXH 600-112, TXH 600-124, TXH 600-148, TXH 600-154 TRACOPOWER The test result refers exclusively to the test presented test model / sample. Without written approval of Cerpass Technology Corp. the test report shall not be reproduced except in full. This test report is only applicable to European Community. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 1 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Contents CERTIFICATE OF COMPLIANCE ......................................................................................................................5 1. Summary of Test Procedure and Test Results .........................................................................................6 2. Immunity Testing Performance Criteria Definition...................................................................................6 3. Test Configuration of Equipment under Test............................................................................................7 3.1. Feature of Equipment under Test .....................................................................................................7 3.2. Test Manner ......................................................................................................................................7 3.3. Description of Test System ...............................................................................................................7 3.4. General Information of Test ..............................................................................................................8 3.5. Measurement Uncertainty ................................................................................................................8 4. Test of Conducted Emission ......................................................................................................................9 4.1. Test Limit...........................................................................................................................................9 4.2. Test Procedures............................................................................................................................. 10 4.3. Typical Test Setup.......................................................................................................................... 10 4.4. Measurement Equipment .............................................................................................................. 10 4.5. Test Result and Data ......................................................................................................................11 4.6. Test Photographs........................................................................................................................... 15 5. Test of Radiated Emission....................................................................................................................... 16 5.1. Test Limit ....................................................................................................................................... 16 5.2. Test Procedures............................................................................................................................. 17 5.3. Typical Test Setup.......................................................................................................................... 18 5.4. Measurement Equipment .............................................................................................................. 18 5.5. Test Result and Data (30MHz ~ 1GHz) ......................................................................................... 19 5.6. Test Photographs (30MHz ~ 1GHz) .............................................................................................. 23 6. Harmonics Test ......................................................................................................................................... 24 6.1. Limits of Harmonics Current Measurement................................................................................... 24 6.2. Measurement Equipment .............................................................................................................. 24 6.3. Test Result and Data ..................................................................................................................... 25 7. Voltage Fluctuations Test ........................................................................................................................ 26 7.1. Test Procedure .............................................................................................................................. 26 7.2. Measurement Equipment .............................................................................................................. 26 7.3. Test Result and Data ..................................................................................................................... 27 7.4. Test Photographs........................................................................................................................... 28 8. Electrostatic Discharge Immunity Test .................................................................................................. 29 8.1. Test Procedure .............................................................................................................................. 29 8.2. Test Setup for Tests Performed in Laboratory ............................................................................... 30 8.3. Test Severity Levels....................................................................................................................... 31 8.4. Measurement Equipment .............................................................................................................. 31 8.5. Test Result and Data ..................................................................................................................... 32 8.6. Test Photographs........................................................................................................................... 33 9. Radio Frequency electromagnetic field immunity test......................................................................... 34 9.1. Test Procedure .............................................................................................................................. 34 9.2. Test Severity Levels....................................................................................................................... 34 9.3. Measurement Equipment .............................................................................................................. 34 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 2 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 9.4. Test Result and Data ..................................................................................................................... 35 9.5. Test Photographs........................................................................................................................... 36 10. Electrical Fast Transient/ Burst Immunity Test ..................................................................................... 37 10.1. Test Procedure .............................................................................................................................. 37 10.2. Test Severity Levels....................................................................................................................... 38 10.3. Measurement Equipment .............................................................................................................. 38 10.4. Test Result and Data ..................................................................................................................... 39 10.5. Test Photographs........................................................................................................................... 40 11. Surge Immunity Test ................................................................................................................................ 41 11.1. Test Procedure .............................................................................................................................. 41 11.2. Test Severity Level ........................................................................................................................ 42 11.3. Measurement Equipment .............................................................................................................. 42 11.4. Test Result and Data ..................................................................................................................... 43 11.5. Test Photographs........................................................................................................................... 44 12. Conduction Disturbances induced by Radio-Frequency Fields.......................................................... 45 12.1. Test Procedure .............................................................................................................................. 45 12.2. Test Severity Levels....................................................................................................................... 46 12.3. Measurement Equipment .............................................................................................................. 46 12.4. Test Result and Data ..................................................................................................................... 47 12.5. Test Photographs........................................................................................................................... 48 13. Power Frequency Magnetic Field Immunity Test .................................................................................. 49 13.1. Test Setup...................................................................................................................................... 49 13.2. Test Severity Levels....................................................................................................................... 49 13.3. Measurement Equipment .............................................................................................................. 49 13.4. Test Result and Data ..................................................................................................................... 50 13.5. Test Photographs........................................................................................................................... 51 14. Voltage Dips and Voltage Interruptions Immunity Test Setup.............................................................. 52 14.1. Test Conditions .............................................................................................................................. 52 14.2. Measurement Equipment .............................................................................................................. 52 14.3. Test Result and Data ..................................................................................................................... 53 14.4. Test Photographs........................................................................................................................... 54 Appendix A. Photographs of EUT……………….………….……..…..…..…….…………….….…..….....A1 ~ A3 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 3 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 History of this test report ORIGINAL. Additional attachment as following record: Attachment No. Issue Date Description Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 4 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 CERTIFICATE OF COMPLIANCE According to EN 55022:2010 (Class B) EN 61000-3-2:2006+A1:2009+A2:2009 EN 61000-3-3:2008 Applicant Address EN 55024:2010 IEC 61000-4-2:2008 IEC 61000-4-3:2006+A1:2007+A2:2010 IEC 61000-4-4:2004+A1:2010 IEC 61000-4-5:2005 IEC 61000-4-6:2008 IEC 61000-4-8:2009 IEC 61000-4-11:2004 : TRACO Electronic Ltd. : Sihlbruggstrasse 111 CH-6340 Baar Switzerland Equipment : Switching Power Module Model No. : TXH 600-112, TXH 600-124, TXH 600-148, TXH 600-154 I HEREBY CERTIFY THAT : The measurements shown in this test report were made in accordance with the procedures given in EUROPEAN COUNCIL DIRECTIVE 2004/108/EC. The test was carried out on May 10, 2013 at Cerpass Technology Corp. Signature Hill Chen EMC/RF B.U. Assistant Manager Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 5 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 1. Summary of Test Procedure and Test Results Test Item Normative References Test Result Conducted Emission EN 55022:2010 PASS Radiated Emission EN 55022:2010 PASS Harmonics EN 61000-3-2:2006+A1:2009+A2:2009 PASS Voltage Fluctuations EN 61000-3-3:2008 PASS IEC 61000-4-2:2008 PASS IEC 61000-4-3:2006+A1:2007+A2:2010 PASS IEC 61000-4-4:2004+A1:2010 PASS IEC 61000-4-5:2005 PASS IEC 61000-4-6:2008 PASS IEC 61000-4-8:2009 PASS IEC 61000-4-11:2004 PASS Electrostatic Discharge Immunity Test (ESD) Radio Frequency electromagnetic field immunity test (RS) Electrical Fast Transient/ Burst Immunity Test (EFT) Surge Immunity Test Conduction Disturbances induced by Radio-Frequency Fields Power Frequency Magnetic Field Immunity Test Voltage Dips and Voltage Interruptions Immunity Test 2. Immunity Testing Performance Criteria Definition A. Normal performance within limits specified by the manufacture, requestor or purchaser. B. Temporary loss of function or degradation of performance which ceases after the disturbance ceases, and from which the equipment under test recovers its normal performance, without operator intervention. C.Temporary loss of function or degradation of performance, the correction of which requires operation intervention. D.Loss of function or degradation of performance which is not recoverable, owing to damage to hardware or software, or loss of data. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 6 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 3. Test Configuration of Equipment under Test 3.1. Feature of Equipment under Test Please refer to user manual. 3.2. Test Manner a. During testing, the interface cables and equipment positions were varied according to Europe Standard EN 55022 Class B. b. The complete test system included Dummy Load, Metal Case and EUT for the EMC test. c. The test mode for EMC test as follow: Test Mode: For Load 3.3. Description of Test System Device Manufacturer Model No. Description Multi-Meter DHA DMM-93B N/A Dummy Load N/A N/A N/A Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 7 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 3.4. General Information of Test Test Site Location (OATS2-SD) : Cerpass Technology Corp. 2F-11, No. 3, Yuan Qu St., (Nankang Software Park), Taipei, Taiwan 115, R.O.C. No.68-1, Shihbachongsi, Shihding Township, Taipei City 223, Taiwan, R.O.C. FCC Registration Number : TW1049, TW1061, 390316, 488071 IC Registration Number : 4934B-1, 4934D-1 VCCI Registration Number : T-1173 for Telecommunication Test C-4139 for Conducted emission test R-3428 for Radiated emission test G-97 for Radiated emission test above 1GHz Frequency Range Investigated : Conducted Emission Test: from 150kHz to 30 MHz Radiated Emission Test: from 30 MHz to 6,000 MHz Test Distance : The test distance of radiated emission below 1GHz from antenna to EUT is 10 M. The test distance of radiated emission above 1GHz from antenna to EUT is 3 M. Test Site : Laboratory Accreditation : 3.5. Measurement Uncertainty Measurement Item Measurement Frequency Polarization Uncertainty Conducted Emission 9 kHz ~ 30 MHz LINE / NEUTRAL 3.25 dB 30 MHz ~ 1,000 MHz Vertical / Horizontal 3.93 dB 1,000 MHz ~ 18,000 MHz Vertical / Horizontal 5.18 dB Radiated Emission Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 8 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 4. Test of Conducted Emission 4.1. Test Limit Conducted Emissions were measured from 150 kHz to 30 MHz with a bandwidth of 9 kHz and return leads of the EUT according to the methods defined in European Standard EN 55022. The EUT was placed on a nonmetallic stand in a shielded room 0.8 meters above the ground plane as shown in section 4.2. The interface cables and equipment positioning were varied within limits of reasonable applications to determine the position producing maximum conducted emissions. Table 1 Class B Line Conducted Emission Limits: Limits (dB µ V) Frequency range (MHz) Quasi Peak Average 0.15 to 0.50 66 to 56 56 to 46 0.50 to 5 56 46 5. to 30. 60 50 Note 1: The lower limits shall apply at the transition frequencies. Note 2:The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to .50MHz. Table 2 - Limits of conducted common mode (asymmetric mode) disturbance at telecommunication ports in the frequency range 0.15 MHz to 30 MHz for class B equipment. Frequency range (MHz) 0.15 to 0.5 0.5 to 30 Voltage limits dB(μV) Quasi-peak Average 84 to 74 74 to 64 74 64 Current limits dB(μA) Quasi-peak Average 40 to 30 30 to 20 30 20 Note 1: The limits decrease linearly with the logarithm of the frequency in the range 0.15 to 0.5 MHz. Note 2: The current and voltage disturbance limits are derived for use with an impedance stabilization network (ISN) which presents a common mode (asymmetric mode) impedance of 150Ω to the telecommunication under test (conversion factor is 20 log10 150/1 = 44dB). Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 9 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 4.2. Test Procedures a. The EUT was placed on a desk 0.8 meters height from the metal ground plane and 0.4 meter from the conducting wall of the shielding room and it was kept at least 0.8 meters from any other grounded conducting surface. b. Connect EUT to the power mains through a line impedance stabilization network (LISN). c. All the support units are connecting to the other LISN. d. The LISN provides 50 ohm coupling impedance for the measuring instrument. e. The CISPR states that a 50 ohm, 50 micro-Henry LISN should be used. f. Both sides of AC line were checked for maximum conducted interference. g. The frequency range from 150 kHz to 30 MHz was searched h. Set the test-receiver system to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. 4.3. Typical Test Setup 10cm EUT 80cm 80cm AE 80cm 40cm LISN ISN LISN 40cm 4.4. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date Valid Date EMI Receiver R&S ESCI 100821 2012/12/24 2013/12/23 LISN Schwarzbeck NSLK 8127 8127-516 2013/03/08 2014/03/07 LISN Schwarzbeck NSLK 8127 8127-568 2012/08/22 2013/08/21 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 10 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 4.5. Test Result and Data Power : AC 230V Pol/Phase : LINE Test Mode : For Load Temperature : 21°C Test Date : May 09, 2013 Humidity : 56 % Atmospheric : 1019hPa Pressure Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 11 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Note: Level = Reading + Factor Margin = Level – Limit Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 12 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Power : AC 230V Pol/Phase : NEUTRAL Test Mode : For Load Temperature : 21°C Test Date : May 09, 2013 Humidity : 56 % Atmospheric : 1019hPa Pressure Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 13 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Note: Level = Reading + Factor Margin = Level – Limit Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 14 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 4.6. Test Photographs Front View Side View Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 15 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 5. Test of Radiated Emission 5.1. Test Limit The EUT shall meet the limits of below Table when measured at the measuring distance R in accordance with the methods described in European Standard EN 55022 Clause 10. If the reading on the measuring receiver shows fluctuations close to the limit, the reading shall be observed for at least 15 s at each measurement frequency; the highest reading shall be recorded, with the exception of any brief isolated high reading, which shall be ignored. Table – Limits for radiated disturbance of class B ITE at a measuring distance of 10 m Frequency range Quasi-peak limits MHz dB(V/m) 30 to 230 30 230 to 1000 37 NOTE 1 The lower limit shall apply at the transition frequency. NOTE 2 Additional provisions may be required for cases where interference occurs. The EUT shall meet the limits of below Table when measured in accordance with the method described in European Standard EN 55022 Clause 10 and the conditional testing procedure described below. Table – Limits for radiated disturbance of class B ITE at a measuring distance of 3 m Frequency range Average limit GHz dB(V/m) 1 to 3 50 3 to 6 54 NOTE The lower limit applies at the transition frequency. • Peak limits dB(V/m) 70 74 Conditional testing procedure: The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes. If the highest frequency of the internal sources of the EUT is less than 108 MHz, the measurement shall only be made up to 1 GHz. If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz, the measurement shall only be made up to 2 GHz. If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz, the measurement shall only be made up to 5 GHz. If the highest frequency of the internal sources of the EUT is above 1 GHz, the measurement shall be made up to 5 times the highest frequency or 6 GHz, whichever is less. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 16 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 5.2. Test Procedures a. The EUT was placed on a rotatable table top 0.8 meter above ground. b. The EUT was set 10 meters from the interference receiving antenna which was mounted on the top of a variable height antenna tower. c. The table was rotated 360 degrees to determine the position of the highest radiation. d. The antenna is a half wave dipole and its height is varied between one meter and four meters above ground to find the maximum value of the field strength both horizontal polarization and vertical polarization of the antenna are set to make the measurement. e. For each suspected emission the EUT was arranged to its worst case and then tune the antenna tower (from 1 M to 4 M) and turn table (from 0 degree to 360 degrees) to find the maximum reading. f. Set the test-receiver system to Peak Detect Function and specified bandwidth with Maximum Hold Mode. g. If the emission level of the EUT in peak mode was 3 dB lower than the limit specified, then testing will be stopped and peak values of EUT will be reported, otherwise, the emissions which do not have 3 dB margin will be repeated one by one using the quasi-peak method and reported. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 17 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 5.3. Typical Test Setup Below 1GHz Test Setup Above 1GHz Test Setup 5.4. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date Valid Date Amplifier Agilent 8447D 2944A10531 2012/10/17 2013/10/16 Bilog Antenna Schaffner CBL6112B 2840 2013/03/27 2014/03/26 Spectrum Analyzer R&S FSP 3 100800 2013/03/14 2014/03/13 EMI Receiver Schaffner SCR3501 437 2013/03/15 2014/03/14 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 18 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 5.5. Test Result and Data (30MHz ~ 1GHz) Power : AC 230V Pol/Phase : VERTICAL Test Mode : For Load Temperature : 25°C Test Date : Apr. 29, 2013 Humidity : 52 % Atmospheric : 983hPa Pressure Note: Level = Reading + Factor Margin = Level – Limit Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 19 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Power : AC 230V Pol/Phase : VERTICAL Test Mode : For Load Temperature : 25°C Test Date : Apr. 29, 2013 Humidity : 52 % Atmospheric : 983hPa Pressure Note: Level = Reading + Factor Margin = Level – Limit Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 20 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Power : AC 230V Pol/Phase : HORIZONTAL Test Mode : For Load Temperature : 25°C Test Date : Apr. 29, 2013 Humidity : 52 % Atmospheric : 983hPa Pressure Note: Level = Reading + Factor Margin = Level – Limit Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 21 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Power : AC 230V Pol/Phase : HORIZONTAL Test Mode : For Load Temperature : 25°C Test Date : Apr. 29, 2013 Humidity : 52 % Atmospheric : 983hPa Pressure Note: Level = Reading + Factor Margin = Level – Limit Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 22 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 5.6. Test Photographs (30MHz ~ 1GHz) Front View Rear View Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 23 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 6. Harmonics Test 6.1. Limits of Harmonics Current Measurement Limits for Class A equipment Harmonics Max. Permissible Order harmonics n current A Odd harmonics 3 2.30 5 1.14 7 0.77 9 0.40 11 0.33 13 0.21 15<=n<=39 0.1515/n Even harmonics 2 1.08 4 0.43 6 0.30 8<=n<=40 0.238/n Harmonics Order n 3 5 7 9 11 13 15<=n<=39 Limits for Class D equipment Max. Permissible Max. Permissible harmonics current per harmonics current watt mA/W A Odd Harmonics only 3.4 2.30 1.9 1.14 1.0 0.77 0.5 0.40 0.35 0.33 0.30 0.21 3.85/n 0.15 x15/n NOTE: 1. 2. Class A and Class D are classified according to item section 5 of EN 61000-3-2:2006/A1:2009/A2:2009. According go section 7 of EN 61000-3-2:2006/A1:2009/A2:2009, the above limits for all equipment except for lighting equipment are for all applications having an active input power > 75 W and no limits apply for equipment with an active input power up to and including 75 W. 6.2. Measurement Equipment Instrument Manufacturer Model No. Power & Harmonics Analyzer TTI HA1600 Serial No. Calibration Date 198226 2012/09/26 Valid Date 2013/09/25 The actual power output of EUT is less than 75W, so it is unable to quote from EN 61000-3-2. The power output of EUT is less than 75W, so this test item is not applicable. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 24 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 6.3. Test Result and Data Final Test Result : PASS Basic Standard : EN 61000-3-2 Temperature : 21 °C Test Data : May 10, 2013 Relative Humidity : 55 % Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 25 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 7. Voltage Fluctuations Test 7.1. Test Procedure The equipment shall be tested under the conditions of Clause 5. The total impedance of the test circuit, excluding the appliance under test, but including the internal impedance of the supply source, shall be equal to the reference impedance. The stability and tolerance of the reference impedance shall be adequate to ensure that the overall accuracy of 8% is achieved during the whole assessment procedure. 7.2. Measurement Equipment Instrument Power & Harmonics Analyzer Manufacturer Model No. Serial No. Calibration Date TTI HA1600 198226 2012/09/26 Valid Date 2013/09/25 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 26 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 7.3. Test Result and Data Basic Standard Final Test Result Test Data : EN 61000-3-3 : PASS : May 10, 2013 Temperature Relative Humidity : 21 °C : 55 % Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 27 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 7.4. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 28 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 8. Electrostatic Discharge Immunity Test 8.1. Test Procedure a. In the case of air discharge testing the climatic conditions shall be within the following ranges: - ambient temperature: 15℃ to 35℃; - relative humidity : 30％ to 60％; - atmospheric pressure : 86 KPa (860 mbar) to 106 KPa (1060 mbar). b. Test programs and software shall be chosen so as to exercise all normal modes of operation of the EUT. The use of special exercising software is encouraged, but permitted only where it can be shown that the EUT is being comprehensively exercised. c. The test voltage shall be increased from the minimum to the selected test severity level, in order to determine any threshold of failure. The final severity level should not exceed the product specification value in order to avoid damage to the equipment. d. The test shall be performed with both air discharge and contact discharge. On reselected points at least 10 single discharges (in the most sensitive polarity) shall be applied on air discharge. On reselected points at least 25 single discharges (in the most sensitive polarity) shall be applied on contact discharge. e. For the time interval between successive single discharges an initial value of one second is recommended. Longer intervals may be necessary to determine whether a system failure has occurred. f. In the case of contact discharges, the tip of the discharge electrode shall touch the EUT before the discharge switch is operated. g. In the case of painted surface covering a conducting substrate, the following procedure shall be adopted : If the coating is not declared to be an insulating coating by the equipment manufacturer, then the pointed tip of the generator shall penetrate the coating so as to make contact with the conducting substrate. Coating declared as insulating by the manufacturer shall only be submitted to the air discharge. The contact discharge test shall not be applied to such surfaces. h. In the case of air discharges, the round discharge tip of the discharge electrode shall be approached as fast as possible (without causing mechanical damage) to touch the EUT . After each discharge, the ESD generator (discharge electrode) shall be removed from the EUT. The generator is then retriggered for a new single discharge. This procedure shall be repeated until the discharges are completed. In the case of an air discharge test, the discharge switch, which is used for contact discharge, shall be closed. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 29 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 8.2. Test Setup for Tests Performed in Laboratory VCP: 0.5x0.5 Table 1.6LX0.8WX0.8H 470K EU 10c 470K 10c 470K HC 1.6mx0.8 470K The test setup consists of the test generator, EUT and auxiliary instrumentation necessary to perform DIRECT and INDIRECT application of discharges to the EUT as applicable, in the follow manner : a. CONTACT DISCHARGE to the conductive surfaces and to coupling plane; b. AIR DISCHARGE at insulating surfaces. The preferred test method is that of type tests performed in laboratories and the only accepted method of demonstrating conformance with this standard. The EUT was arranged as closely as possible to arrangement in final installed conditions. A ground reference plane was provided on the floor of the test site. It was a metallic sheet (copper or aluminum) of 0.25 mm, minimum thickness; other metallic may be used but they shall have at least 0.65 mm thickness. In the Cerpass Technology Corp., we provided 1 mm thickness stainless steel ground reference plane. The minimum size of the ground reference plane is 2.5 m x 2.5 m, the exact size depending on the dimensions of the EUT. It was connected to the protective grounding system. The EUT was arranged and connected according to its functional requirements. A distance of 1m minimum was provided between the EUT and the wall of the lab. and any other metallic structure. In cases where this length exceeds the length necessary to apply the discharges to the selected points, the excess length shall, where possible, be placed non-inductively off the ground reference plane and shall not come closer than 0.2m to other conductive parts in the test setup. Where the EUT is installed on a metal table, the table was connected to the reference plane via a cable with a 470k ohm resister located at each end, to prevent a build-up of charge. The test setup was consist a wooden table, 0.8m high, standing on the ground reference plane. A HCP, 1.6 m x 0.8 m, was placed on the table. The EUT and cables was isolated from the HCP by an insulating support 0.5 mm thick. The VCP size, 0.5 m x 0.5 m . Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 30 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 8.3. Test Severity Levels Contact Discharge Level Air Discharge Test Voltage (KV) of Level Contact discharge Test Voltage (KV) of Air Discharge 1 2 1 2 2 4 2 4 3 6 3 8 4 8 4 15 X Specified X Specified Remark: “X” is an open level. 8.4. Measurement Equipment Instrument ESD SIMULATOR Manufacturer Model No. Schaffner NSG438 Serial No. 878 Calibration Date Valid Date 2013/03/29 2014/03/28 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 31 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 8.5. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : B Basic Standard : IEC 61000-4-2 Product Standard : EN 55024 Test Voltage : 2 / 4 KV for contact discharge Temperature : 21°C Relative Humidity : 53 % Atmospheric Pressure : 1014 hPa Test Date : May 10, 2013 Contact Discharge 25 times / each Voltage 2 KV 4 KV Point\Polarity +/－ +/－ HCP A A VCP A A Note:” A” means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 32 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 8.6. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 33 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 9. Radio Frequency electromagnetic field immunity test 9.1. Test Procedure a. The equipment to be tested is placed in the center of the enclosure on a wooden table. The equipment is then connected to power and signal leads according to pertinent installation instructions. b. The antenna which is enabling the complete frequency range of 80-1000 MHz is placed 3m away from the equipment. The required field strength is determined by placing the field strength meter(s) on top of or directly alongside the equipment under test and monitoring the field strength meter via a remote field strength indicator outside the enclosure while adjusting the continuous-wave to the applicable antennae. c. The test is normally performed with the antenna facing the most sensitive side of the EUT. The polarization of the field generated by the bucolical antenna necessitates testing each position twice, once with the antenna positioned vertically and again with the antenna positioned horizontally. The circular polarization of the field from the log-spiral antenna makes a change of position of the antenna unnecessary. d. At each of the above conditions, the frequency range is swept 80-1000 MHz, pausing to adjust the R.F. signal level or to switch oscillators and antenna. The rate of sweep is in the order of 1.5*10-3 decades/s. The sensitive frequencies or frequencies of dominant interest may be discretely analyzed. 9.2. Test Severity Levels Level 1 2 3 X Frequency Band : 80-1000 MHz Test field strength (V/m) 1 3 10 Specified Remark: “X” is an open class. 9.3. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date Valid Date Amplifiers SCHAFFNER 80-1000MHz/100W CBA9413B 43510 N/A N/A Amplifiers 80-3000MHz/20W SCHAFFNER CBA9428 43515 N/A N/A Antenna SCHAFFNER CBL6141A 4257 N/A N/A Power Meter Boonton 4231A-01 115902 2012/09/26 2013/09/25 Field Probe HOLADAY HI-6105 00144727 2012/09/20 2013/09/19 Signal Generator HP 8648C 3629U00612 2012/09/26 2013/09/25 Power Sensor Boonton 51011-EMC 33312 2012/09/26 2013/09/25 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 34 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 9.4. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-3 Product Standard : EN 55024 Frequency Range : 80~1000 MHz Temperature : 23°C Relative Humidity : 58 % Atmospheric Pressure : 1011 hPa Test Date : Mar. 15, 2013 Modulation : AM 80% , 1KHz sine wave, Dwell time: 2.9 S Frequency Step Size : 1 % of preceding frequency value Frequency (MHz) Antenna Polarization face Field strength (V/m) Result 80~1000 Vertical Front 3 V/m A 80~1000 Vertical Rear 3 V/m A 80~1000 Vertical Left 3 V/m A 80~1000 Vertical Right 3 V/m A 80~1000 Horizontal Front 3 V/m A 80~1000 Horizontal Rear 3 V/m A 80~1000 Horizontal Left 3 V/m A 80~1000 Horizontal Right 3 V/m A Note: “A” means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 35 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 9.5. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 36 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 10. Electrical Fast Transient/ Burst Immunity Test 10.1.Test Procedure a. In order to minimize the effect of environmental parameters on test results, the climatic conditions when test is carrying out shall comply with the following requirements: ambient temperature: 15℃ to 35℃; relative humidity : 45％ to 75％; Atmospheric pressure: 86 Kpa (860 mbar) to 106 Kpa (1060 mbar). b. In order to minimize the effect of environmental parameters on test results, the electromagnetic environment of the laboratory shall not influence the test results. c. The variety and diversity of equipment and systems to be tested make it difficult to establish general criteria for the evaluation of the effects of fast transients/bursts on equipment and systems. d. Test on Power Line: The EFT/B-generator was located on the GRP.. The length from the EFT/B-generator to the EUT is not exceeding 1 m. The EFT/B-generator provides the ability to apply the test voltage in a non-symmetrical condition to the power supply input terminals of the EUT. e. Test on Communication Lines The coupling clamp is composed of a clamp unit for housing the cable (length more than 3 m), and was placed on the GRP. The coupling clamp provides the ability of coupling the fast transient/bursts to the cable under test. f. The test results may be classified on the basic of the operating conditions and the functional specification of the equipment under test, according to the following performance criteria : Normal performance within the specification limits. Temporary degradation or loss of function or performance which is self-recoverable. Temporary degradation or loss of function or performance which requires operator intervention or system reset. Degradation or loss of function which is not recoverable due to damage of equipment (components). Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 37 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 10.2.Test Severity Levels The following test severity levels are recommended for the fast transient/burst test : Open circuit output test voltage ± 10％ Level On Power Supply On I/O signal, data and control line 1 0.5 KV 0.25 KV 2 1.0 KV 0.50 KV 3 2.0 KV 1.00 KV 4 4.0 KV 2.00 KV X Specified Specified Remark : “ X ” is an open level. The level is subject to negotiation between the user and manufacturer or is specified by the manufacturer. 10.3.Measurement Equipment Instrument TESQ NSG3060 Manufacturer Model No. Serial No. Calibration Date TESQ NSG3060 1385 2012/10/25 Valid Date 2013/10/24 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 38 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 10.4. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-4 Product Standard : EN 55024 Test Voltage : On Power Supply -- 0.5 KV, 1.0 KV, Temperature : 21C Relative Humidity : 53 % Atmospheric Pressure : 1014 hPa Test Date : May 10, 2013 Pulse : 5/50 ns Repetition Rate: 5 kHz Burst : 15m/300ms Test time : 1 min/each condition + － + 1.0 kV － L A A A A N A A A A L-N A A A A PE A A A A L-PE A A A A N-PE A A A A L-N-PE A A A A Voltage/ Mode/ Polarity/ Result/ Phase Power Line 0.5 kV Note: “A” means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 39 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 10.5. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 40 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 11. Surge Immunity Test 11.1. Test Procedure a. Climatic conditions The climatic conditions shall comply with the following requirements : ambient temperature : 15 ℃ to 35 ℃ relative humidity : 10 % to 75 % atmospheric pressure : 86 kPa to 106 kPa ( 860 mbar to 1060 mbar ) b. Electromagnetic conditions the electromagnetic environment of the laboratory shall not influence the test results. c. The test shall be performed according the test plan that shall specify the test set-up with generator and other equipment utilized; test level ( voltage/current ); generator source impedance; internal or external generator trigger; number of tests : at least five positive and five negative at the selected points; repetition rate : maximum 1/min. inputs and outputs to be tested; representative operating conditions of the EUT; sequence of application of the surge to the circuit; phase angle in the case of AC. power supply; actual installation conditions, for example : AC : neutral earthed, DC : ( + ) or ( - ) earthed to simulated the actual earthing conditions. d. If not otherwise specified the surges have to be applied synchronized to the voltage phase at the zero-crossing and the peak value of the AC. voltage wave ( positive and negative ). e. The surges have to be applied line to line and line(s) and earth. When testing line to earth, the test voltage has to be applied successively between each of the lines and earth, if there is no other specification. f. The test procedure shall also consider the non-linear current-voltage characteristics of the equipment under test. Therefore the test voltage has to be increased by steps up to the test level specified in the product standard or test plan. g. All lower levels including the selected test level shall be satisfied. For testing the secondary protection, the output voltage of the generator shall be increased up to the worst-case voltage breakdown level ( let-through level ) of the primary protection. h. If the actual operating signal sources are not available, that may be simulated. Under no circumstances may the test level exceed the product specification. The test shall be carried out according to a test plan. i. To find all critical points of the duty cycle of the equipment, a sufficient number of positive and negative test pulses shall be applied. For acceptance test previously unstressed equipment shall be used to the protection devices shall be replaced. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 41 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 11.2. Test Severity Level Level 1 Open-circuit test voltage, ± 10％, KV 0.5 2 1.0 3 2.0 4 4.0 X Specified NOTE: “X” is an open class. This level can be specified in the product specification. 11.3. Measurement Equipment Instrument Manufacturer Model No. TESQ NSG3060 TESQ NSG3060 Serial No. Calibration Date 1385 2012/10/25 Valid Date 2013/10/24 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 42 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 11.4. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : B Basic Standard : IEC 61000-4-5 Product Standard : EN 55024 Test Voltage : Input AC Power Port L-N-- 0.5 kV, 1.0 kV, 2.0 kV Temperature : 21 °C Relative Humidity : 53 % Atmospheric Pressure : 1014 hPa Test Date : May 10, 2013 Waveform : 1.2/50μs(8/20μs) Repetition rate : 60 sec Time : 5 time/each condition /Phase Voltage / Mode / Polarity / Result 0° 90° 180° 270° + A A A A - A A A A L-PE + A A A A N-PE - A A A A 0.5, 1.0 kV L-N 2.0 kV Note: “A” Means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 43 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 11.5. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 44 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 12. Conduction Disturbances induced by Radio-Frequency Fields 12.1. Test Procedure a. The EUT shall be operated within its intended climatic conditions. The temperature and relative humidity should be recorded. b. This test method test can be performed without using a sell shielded enclosure. This is because the disturbance levels applied and the geometry of the setups are not likely to radiated a high amount of energy, especially at the lower frequencies. If under certain circumstances the radiated energy is too high, a shielded enclosure has to be used. c. The test shall be performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non-excited RF-input ports of the coupling devices are terminated by a 50 ohm load resistor. d. The frequency range is swept from 150 KHz to 80 MHz, using the signal levels established during the setting process, and with the disturbance signal 80% amplitude modulated with a 1KHz sign wave, pausing to adjust the RF-signal level or to switch coupling devices as necessary. The rate of sweep shall no exceed 1.5 x 10-3 decades/s. Where the frequency is swept incrementally, the step size shall no exceed 1% of the start and thereafter 1% of the preceding frequency value. e. The dwell time at each frequency shall not be less than the time necessary for the EUT to be exercised, and able to respond. Sensitive frequencies e.g. clock frequency (ies) and harmonics or frequencies of dominant interest shall be analyzed separately. f. An alternative test procedure may be adopted, wherein the frequency range is swept incrementally, with a step size not exceeding 4% of the start ad thereafter 4% of the preceding frequency value. The test level should be at least twice the value of the specified test level. g. In cases of dispute, the test procedure using a step size not exceeding 1% of the start and thereafter 1% of preceding frequency value shall take precedence. h. Attempts should be made to fully exercise the EUT during testing, and to fully interrogate all exercise modes selected for susceptibility. i. The use of special exercising programs is recommended. j. Testing shall be performed according to a Test Plan, which shall be included in the test report. k. It may be necessary to carry out some investigatory testing in order to establish some aspects of the test plan. Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 45 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 12.2. Test Severity Levels Level Voltage Level ( EMF ) 1 1V 2 3V 3 10 V x Specified NOTE - x is an open class. This level can be specified in the product specification. 12.3.Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date Valid Date CS GENERATOR Schaffner NSG 2070 1059 2012/09/26 2013/09/25 CDN (M2+M3) Schaffner M016 20056 2012/09/26 2013/09/25 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 46 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 12.4. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-6 Product Standard : EN 55024 Coupling mode : Temperature : 21°C Relative Humidity : 53 % Atmospheric Pressure : 1014 hPa Test Date : May 10, 2013 CDN-(M3) for AC power ports Frequency : 0.15~80MHz, Modulation : AM 80%,1KHz sine wave, Dwell time: 2.9s Frequency Step Size : 1 % of preceding frequency value Frequency Test mode Voltage(V) Result 0.15 ~ 80MHz Power(M3) 3 A Note: “A” Means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 47 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 12.5. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 48 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 13. Power Frequency Magnetic Field Immunity Test 13.1. Test Setup GPR A S EUT Lc E : : : : : : Ground plane Safety earth Insulating support Equipment under test Induction coil Earth terminal C1 C2 L B D G : : : : : : Power supply circuit Signal circuit Communication line To power supply source To signal source, simulator To the test generator 13.2. Test Severity Levels Level Magnetic field strength A/m 1 1 2 3 3 10 4 30 5 100 X1) special NOTE 1 “X” is an open level. This level can be givenin the product specification. 13.3. Measurement Equipment Instrument Manufacturer Model No. MAGNETIC FIELD GENERATOR KeyTek F-1000-4-8-G -125A Serial No. Calibration Date N/A 2012/09/26 Valid Date 2013/09/25 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 49 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 13.4. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-8 Product Standard : EN 55024 Temperature : 23°C Relative Humidity : 58 % Atmospheric Pressure : 1011 hPa Test Date : Mar. 15, 2013 Power Frequency Magnetic Field : 50 Hz, 1 A/m Coil Orientation Testing duration Results X-axis 1.0 Min A Y-axis 1.0 Min A Z-axis 1.0 Min A Note: “A” Mean the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 50 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 13.5. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 51 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 14. Voltage Dips and Voltage Interruptions Immunity Test Setup 14.1. Test Conditions 1. Source voltage and frequency : 230V / 50Hz, Single phase. 2. Test of interval : 10 sec. 3. Level and duration : Sequence of 3 dips/interrupts. 4. Voltage rise (and fall) time : 1 5 s. 5. Test severity : Voltage dips and Interrupt Test Duration reduction (%) (period) >95% 250 30% 25 >95% 0.5 14.2. Measurement Equipment Instrument Manufacturer TESQ NSG3060 TESQ Model No. Serial No. Calibration Date Valid Date NSG3060 1385 2012/10/25 2013/10/24 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 52 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 14.3. Test Result and Data Final Test Result : PASS Pass performance Criteria : B for voltage interruption, A for voltage dips Required performance Criteria : C for voltage interruption, B/C for voltage dips Basic Standard : IEC 61000-4-11 Product Standard : EN 55024 Temperature : 21°C Relative Humidity : 53 % Atmospheric Pressure : 1014 hPa Test Date : May 10, 2013 Voltage(UT): AC 100/230/240 V Test mode Voltage interruptions 50 Hz Interval(s) : 10s Times : 3 Phase / Result Test level UT % Durations (period) 0° 180° >95% 250 B B 30% 25 A A >95% 0.5 A A Voltage dips Note: “A” Means the EUT function is normal working during the test. ”B” Means the EUT function is affect during the test, but it can be recover automatically, after a while Test engineer: Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 53 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 14.4. Test Photographs Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Page No. : 54 of 54 Fax:886-2-2655-8200 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Appendix A. EUT Photo Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A1 of A3 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A2 of A3 CERPASS TECHNOLOGY CORP. Report No.: TECE1308055 Cerpass Technology Corp. Issued Date : Aug. 13, 2013 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A3 of A3