SEMiX151GAL12Vs Absolute Maximum Ratings Symbol Conditions Values Unit IGBT VCES IC Tj = 25 °C Tj = 175 °C 1200 V Tc = 25 °C 231 A Tc = 80 °C 176 A 150 A ICnom ICRM SEMiX® 1s VGES tpsc Tj ICRM = 3xICnom VCC = 720 V VGE ≤ 15 V VCES ≤ 1200 V 450 A -20 ... 20 V 10 µs -40 ... 175 °C Tc = 25 °C 189 A Tc = 80 °C 141 A 150 A Tj = 125 °C Inverse diode SEMiX151GAL12Vs IF Tj = 175 °C IFnom Features • Homogeneous Si • VCE(sat) with positive temperature coefficient • High short circuit capability • UL recognised file no. E63532 IFRM IFRM = 3xIFnom 450 A IFSM tp = 10 ms, sin 180°, Tj = 25 °C 900 A -40 ... 175 °C Tc = 25 °C 189 A Tc = 80 °C 141 A 150 A Tj Freewheeling diode IF Tj = 175 °C Typical Applications* IFnom • AC inverter drives • UPS • Electronic Welding IFRM IFRM = 3xIFnom 450 A IFSM tp = 10 ms, sin 180°, Tj = 25 °C 900 A -40 ... 175 °C Remarks • Case temperature limited to TC=125°C max. • Product reliability results are valid for Tj=150°C Tj Module It(RMS) Tterminal = 80 °C Tstg Visol AC sinus 50Hz, t = 1 min 600 A -40 ... 125 °C 4000 V Characteristics Symbol IGBT VCE(sat) VCE0 Conditions IC = 150 A VGE = 15 V chiplevel chiplevel rCE VGE = 15 V chiplevel VGE(th) VGE=VCE, IC = 6 mA ICES VGE = 0 V VCE = 1200 V Cies Coes Cres VCE = 25 V VGE = 0 V min. Tj = 25 °C typ. max. Unit 1.75 2.20 V Tj = 150 °C 2.2 2.5 V Tj = 25 °C 0.94 1.04 V Tj = 150 °C 0.88 0.98 V Tj = 25 °C 5.4 7.7 m 8.8 10.1 m 6 6.5 V 0.1 0.3 mA Tj = 150 °C 5.5 Tj = 25 °C Tj = 150 °C mA f = 1 MHz 9.0 nF f = 1 MHz 0.89 nF f = 1 MHz 0.88 nF QG VGE = - 8 V...+ 15 V 1650 nC RGint Tj = 25 °C 5.00 GAL © by SEMIKRON Rev. 2 – 13.12.2012 1 SEMiX151GAL12Vs Characteristics Symbol td(on) tr Eon td(off) tf Eoff SEMiX® 1s SEMiX151GAL12Vs Rth(j-c) Inverse diode VF = VEC IF = 150 A VGE = 0 V chiplevel VF0 chiplevel rF Features • Homogeneous Si • VCE(sat) with positive temperature coefficient • High short circuit capability • UL recognised file no. E63532 Typical Applications* • AC inverter drives • UPS • Electronic Welding Remarks • Case temperature limited to TC=125°C max. • Product reliability results are valid for Tj=150°C Conditions VCC = 600 V IC = 150 A VGE = ±15 V RG on = 1 RG off = 1 di/dton = 4600 A/µs di/dtoff = 1700 A/µs du/dtoff = 6700 V/ µs per IGBT IRRM Qrr Err Rth(j-c) chiplevel IRRM Qrr Err Rth(j-c) chiplevel typ. max. Unit 319 ns Tj = 150 °C 46 ns Tj = 150 °C 19.4 mJ Tj = 150 °C 482 ns Tj = 150 °C 68 ns Tj = 150 °C 17.1 mJ 0.19 K/W Tj = 25 °C 2.1 2.46 V Tj = 150 °C 2.1 2.4 V V Tj = 25 °C 1.1 1.3 1.5 Tj = 150 °C 0.7 0.9 1.1 V Tj = 25 °C 4.3 5.6 6.4 m 7.8 8.5 m Tj = 150 °C IF = 150 A Tj = 150 °C di/dtoff = 4400 A/µs T = 150 °C j VGE = -15 V T j = 150 °C VCC = 600 V per diode Freewheeling diode VF = VEC IF = 150 A VGE = 0 V chiplevel VF0 chiplevel rF min. Tj = 150 °C 7.0 175 A 27.5 µC 11.5 mJ 0.31 K/W Tj = 25 °C 2.1 2.46 V Tj = 150 °C 2.1 2.4 V V Tj = 25 °C 1.1 1.3 1.5 Tj = 150 °C 0.7 0.9 1.1 V Tj = 25 °C 4.3 5.6 6.4 m 7.0 7.8 8.5 m Tj = 150 °C IF = 150 A Tj = 150 °C di/dtoff = 4400 A/µs T = 150 °C j VGE = -15 V T j = 150 °C VCC = 600 V per diode 175 A 27.5 µC 11.5 mJ 0.31 K/W Module LCE RCC'+EE' res., terminal-chip Rth(c-s) per module Ms to heat sink (M5) 16 nH TC = 25 °C 0.7 m TC = 125 °C 1 m 0.075 to terminals (M6) Mt K/W 3 5 2.5 5 Nm Nm Nm w 145 g 493 ± 5% 3550 ±2% K Temperatur Sensor R100 B100/125 Tc=100°C (R25=5 k) R(T)=R100exp[B100/125(1/T-1/T100)]; T[K]; GAL 2 Rev. 2 – 13.12.2012 © by SEMIKRON SEMiX151GAL12Vs Fig. 1: Typ. output characteristic, inclusive RCC'+ EE' Fig. 2: Rated current vs. temperature IC = f (TC) Fig. 3: Typ. turn-on /-off energy = f (IC) Fig. 4: Typ. turn-on /-off energy = f (RG) Fig. 5: Typ. transfer characteristic Fig. 6: Typ. gate charge characteristic © by SEMIKRON Rev. 2 – 13.12.2012 3 SEMiX151GAL12Vs Fig. 7: Typ. switching times vs. IC Fig. 8: Typ. switching times vs. gate resistor RG Fig. 9: Typ. transient thermal impedance Fig. 10: Typ. CAL diode forward charact., incl. RCC'+ EE' Fig. 11: Typ. CAL diode peak reverse recovery current Fig. 12: Typ. CAL diode recovery charge 4 Rev. 2 – 13.12.2012 © by SEMIKRON SEMiX151GAL12Vs SEMiX 1s spring configuration This is an electrostatic discharge sensitive device (ESDS), international standard IEC 60747-1, Chapter IX * The specifications of our components may not be considered as an assurance of component characteristics. Components have to be tested for the respective application. Adjustments may be necessary. The use of SEMIKRON products in life support appliances and systems is subject to prior specification and written approval by SEMIKRON. We therefore strongly recommend prior consultation of our staff. © by SEMIKRON Rev. 2 – 13.12.2012 5