CEF02N6 N-Channel Logic Level Enhancement Mode Field Effect Transistor Sep. 2002 FEATURES D 600V , 1.5A , RDS(ON)=5 Ω @VGS=10V. Super high dense cell design for extremely low RDS(ON). 6 High power and current handling capability. Lead free product is acquired. TO-220F full-pak for through hole G G D S S TO-220F ABSOLUTE MAXIMUM RATINGS (Tc=25 C unless otherwise noted) Symbol Limit Unit Drain-Source Voltage VDS 600 V Gate-Source Voltage VGS ± 30 V ID 1.5 A -Pulsed IDM 4.5 A Drain-Source Diode Forward Current IS 4.5 A Maximum Power Dissipation @Tc=25 C Derate above 25 C PD 29 0.23 W W/ C Parameter Drain Current-Continuous Operating and Storage Temperautre Range TJ, TSTG -65 to 150 C THERMAL CHARACTERISTICS Thermal Resistance, Junction-to-Case RθJC 4.3 C/W Thermal Resistance, Junction-to-Ambient RθJA 65 C/W 6-117 CEF02N6 ELECTRICAL CHARACTERISTICS (TC=25 C unless otherwise noted) Parameter Condition Symbol Min Typ Max Unit a DRAIN-SOURCE AVALANCHE RATING 6 Single Pulse Drain-Source Avalanche Energy EAS Maximum Drain-Source Avalanche Current IAS VDD =50V, L=60mH RG=9.1Ω 125 mJ 2 A OFF CHARACTERISTICS Drain-Source Breakdown Voltage BVDSS VGS = 0V,ID = 250µA Zero Gate Voltage Drain Current IDSS VDS = 600V, VGS = 0V Gate-Body Leakage IGSS VGS = ±30V, VDS = 0V Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA Drain-Source On-State Resistance RDS(ON) VGS =10V, ID = 1A On-State Drain Current ID(ON) gFS VGS = 10V, VDS = 10V VDS = 50V, ID = 1A 1.2 tD(ON) VDD = 300V, ID = 2A, VGS = 10V RGEN=18Ω 18 35 ns 18 35 ns 50 90 ns 600 V 25 µA ±100 nA ON CHARACTERISTICS a Forward Transconductance 2 3.8 4 V 5.0 Ω 2 A S b SWITCHING CHARACTERISTICS Turn-On Delay Time Rise Time Turn-Off Delay Time tr tD(OFF) Fall Time tf 16 40 ns Total Gate Charge Qg 20 25 nC Gate-Source Charge Qgs Gate-Drain Charge Qgd VDS =480V, ID = 2A, VGS =10V 6-118 2 nC 12 nC CEF02N6 ELECTRICAL CHARACTERISTICS (TC=25 C unless otherwise noted) Parameter Min Typ Max Unit Condition Symbol DYNAMIC CHARACTERISTICS b Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS VDS =25V, VGS = 0V f =1.0MHZ DRAIN-SOURCE DIODE CHARACTERISTICS Diode Forward Voltage 250 PF 50 PF 30 PF a VGS = 0V, Is =1.5A VSD 1.5 Notes a.Pulse Test:Pulse Width< 300μs, Duty Cycle < 2%. b.Guaranteed by design, not subject to production testing. 3.0 VGS=10,9,8,7V ID, Drain Current (A) ID, Drain Current(A) 2.5 2.0 1.5 VGS=6V 1.0 VGS=5V 0.5 150 C 1 -55 C 0.1 0 0 2 4 6 8 10 12 1.VDS=40V 2.Pulse Test 25 C 2 4 6 8 10 VDS, Drain-to-Source Voltage (V) VGS, Gate-to-Source Voltage (V) Figure 1. Output Characteristics Figure 2. Transfer Characteristics 6-119 V 6 CEF02N6 RDS(ON), Normalized RDS(ON), On-Resistance(Ohms) 600 C, Capacitance (pF) 500 6 400 Ciss 300 200 Coss 100 Crss 0 0 5 10 15 20 25 2.2 ID=1A VGS=10V 1.9 1.6 1.3 1.0 0.7 0.4 -100 VDS=VGS ID=250μA 1.10 1.0 0.90 0.80 0.70 25 50 75 100 125 150 BVDSS, Normalized Drain-Source Breakdown Voltage Vth, Normalized Gate-Source Threshold Voltage 1.30 0 150 200 1.15 ID=250μA 1.10 1.05 1.00 0.95 0.90 0.85 -50 -25 0 25 50 75 100 125 150 Tj, Junction Temperature ( C) Tj, Junction Temperature ( C) Figure 6. Breakdown Voltage Variation with Temperature Figure 5. Gate Threshold Variation with Temperature 20 10 4 VDS=50V Is, Source-drain current (A) gFS, Transconductance (S) 100 Figure 4. On-Resistance Variation with Temperature Figure 3. Capacitance 0.60 -50 -25 50 TJ, Junction Temperature( C) VDS, Drain-to Source Voltage (V) 1.20 0 -50 3 2 1 VGS=0V 1 0.1 0 0 1 2 3 4 0.4 IDS, Drain-Source Current (A) 0.6 0.8 1.0 1.2 VSD, Body Diode Forward Voltage (V) Figure 7. Transconductance Variation with Drain Current 6-120 Figure 8. Body Diode Forward Voltage Variation with Source Current CEF02N6 10 VDS=480V ID=2A 1m ID, Drain Current (A) 12 9 3 0 0 6 12 S (O N 10 0m s s s 0.1 0.01 24 18 RD m C 6 1 i )L 10 t mi D VGS, Gate to Source Voltage (V) 15 Tc=25 C Tj=150C Single Pulse 1 6 Qg, Total Gate Charge (nC) 500 1000 100 10 VDS, Drain-Source Voltage (V) Figure 9. Gate Charge Figure 10. Maximum Safe Operating Area VDD t on RL V IN D td(off) tf 90% 90% VOUT VOUT VGS RGEN toff tr td(on) 10% INVERTED 10% G 90% S VIN 50% 50% 10% PULSE WIDTH Figure 12. Switching Waveforms Figure 11. Switching Test Circuit 0.2 r(t),Normalized Effective Transient Thermal Impedance 2 1 D=0.5 0.1 PDM 0.1 0.05 t1 t2 1. RθJC (t)=r (t) * RθJC 2. RθJC=See Datasheet 3. TJM-TC = P* RθJC (t) 4. Duty Cycle, D=t1/t2 0.02 0.01 0.01 0.01 0.1 Single Pulse 1 10 100 1000 Square Wave Pulse Duration (msec) Figure 13. Normalized Thermal Transient Impedance Curve 6-121 10000