Automotive Line Transient Protection Circuit

Application Report
SNVA717 – September 2014
Automotive Line Transient Protection Circuit
Alan Martin
ABSTRACT
Automobile electrical power systems are subjected to many tortuous conditions over the life of the vehicle.
In addtion to adverse conditions on the battery power bus, there are also operating extremes due to
environmental factors such as temperature, humidity and long term vehicle storage. This application note
will discuss how these transient conditions are formed and the design requirements for the circuit to
protect electrical systems down the line.
1
2
3
4
5
6
7
8
1
Contents
TRANSIENTS IN AUTOMOTIVE APPLICATIONS...................................................................... 1
DESIGN REQUIREMENTS ................................................................................................ 2
2.1
Quiescent Current .................................................................................................. 2
2.2
Polarity Guard ...................................................................................................... 2
2.3
Overvoltage Protection and Supervisory Circuit ................................................................ 3
2.4
Overall Circuit Parameters......................................................................................... 4
FUNCTIONAL BLOCK DIAGRAM ......................................................................................... 4
AUTOMOTIVE LINE TRANSIENT PROTECTION CIRCUIT SCHEMATIC.......................................... 5
CIRCUIT DESCRIPTION ................................................................................................... 6
5.1
Reverse Polarity Protection and Overvoltage Disconnect ..................................................... 6
5.2
Soft-Start and Inrush Control Circuit ............................................................................. 7
5.3
SMPS Enable Supervisory Circuit ................................................................................ 8
TEST SETUP AND CONNECTIONS ..................................................................................... 9
TYPICAL PERFORMANCE CURVES ................................................................................... 10
BILL OF MATERIALS...................................................................................................... 12
TRANSIENTS IN AUTOMOTIVE APPLICATIONS
While the vehicle battery is capable of large currents for re-starting the engine and serves as a reservoir
for high power accessories such as headlights, blowers and cigarette lighters; the voltage level is poorly
regulated even in the best operating conditions. Fault conditions make matters even worse. Open battery
cells (or a dirty battery terminal) will lead to a “load dump” if an open battery event occurs while the
vehicle engine is running. A load dump event creates a surge voltage to the 12 V vehicle bus that reaches
40 V to 60 V for a short period of time.
Other physical factors in vehicle design are also a concern. In particular there are long power supply lines
that feed from the power distribution box in the engine compartment to the distant corners of the vehicle.
Because of the inductive characteristic of long leads there are even higher transient levels than those that
occur during load dump. The governing specification for tail light electronics is that they be able to
withstand transients of +100 V and -300 V. This is a foreboding challenge for IC based electronics such as
LED tail light regulators.
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1
DESIGN REQUIREMENTS
2
DESIGN REQUIREMENTS
2.1
Quiescent Current
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A typical 12 V lead acid battery based vehicle power system has a very high current capability primarily
because a starter motor must be able to turn the vehicle engine over each time the engine is to be restarted. The engine starting event may occur many times during the course of a day and as infrequently
as once in several weeks. Thus it is important that all electronic systems attached directly to the battery
bus have the lowest possible quiescent (or operating) current while the vehicle is shut-down and not
charging so that the periods of nonoperation can be as long as possible. This low quiescent current
requirement is also true of added protection circuits.
With these factors in mind, a combination of discrete devices can be assembled to create a low quiescent
current, self-resetting protection circuit. This circuitry will allow survival of a typical IC based switching
mode dc-dc converter that would otherwise be damaged by input voltages outside of its operating ratings.
2.2
Polarity Guard
The first electrical function of a protection system is that of a polarity guard. A polarity guard prevents
circuit damage due to application of negative polarity input voltage. Reverse polarity source voltage occurs
due to either normal wiring inductance transients or from the accidental reversal of battery terminals
during vehicle battery replacement or dead battery jump starting. Thus this stage of the protection system
is that of a reverse input polarity protection mechanism. In normal operation the stage passes the input
voltage directly through and should have the lowest practical forward voltage drop. Finite voltage drop
results in lowering the dropout headroom of the protected downstream electrical circuitry. So a leading
motive in polarity guard design is to migrate toward a circuit with the lowest forward drop. A polarity guard
using a MOSFET would appear to be the best choice as it offers the lowest drop of the available choices.
In contrast to the requirement of low forward voltage drop during normal operation is the opposing
requirement that during the reversed input voltage blocking state the breakdown rating may need to stand
off several hundreds of volts without damage. In this case a silicon diode would be the best choice due to
the limited breakdown rating of available schottky diodes, usually 100V maximum. A tradeoff is that
conventional silicon diodes have the highest forward drop during normal system operation.
There is a third less obvious function of the polarity guard stage. The downstream protected circuit section
may include sizable bulk capacitance as part of its design requirements. During normal operation this bulk
storage capacitance will be charged to approximately the power bus rail voltage. There can then be fault
conditions whereby the input voltage bus is temporarily and rapidly shorted to ground. Such an event can
occur if jumper cables on a running system are momentarily tapped together. If such an event occurs, the
downstream bulk capacitance might then be discharged out through the input and cause a surge of
current that may damage related circuitry. To prevent this reverse action, the polarity guard should exhibit
diode blocking action during such an event. This blocking characteristic cannot be achieved with a simple
MOSFET approach as it conducts in either direction when enhanced. It might be possible to create a
MOSFET controller that could resolve this limitation but it would require quiescent current for operation.
In summary, diodes are simple, low cost, two terminal devices which provide the added benefit of
preventing reverse current flow from charged bulk capacitors within the protected stage. There is the
further factor that high voltage P-channel MOSFETS are comparatively expensive and if they are to be
considered, then search for a solution where as few as possible are employed.
Figure 1 and Figure 2 show three contending polarity guard approaches. During normal operation below
18 V all three approaches require no bias current for operation. In the case of the two diode (Figure 1)
approaches this should be obvious as they are floating two terminal applications that have no path to
ground. In the case of the p-channel mosfet (Figure 2) there is no gate current flow just leakage current
through the zener diode gate protection clamp.
2
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DESIGN REQUIREMENTS
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BATTERY BUS IN
TO LOAD CIRCUIT
SERIES SCHOTTKY DIODE POLARITY GUARD
BATTERY BUS IN
TO LOAD CIRCUIT
SERIES ULTRAFAST DIODE POLARITY GUARD
Figure 1. Diode Polarity Guard
Q1
BATTERY BUS IN
-30V MAX NEGATIVE INPUT
DETERMINED BY MOSFET
VDS MAX
C1
0.1µF
4
7,8
5,6,
+12.8V NOMINAL INPUT
TO LOAD CIRCUIT
1,2,3
AON7403
-30V
D1
BZT52C18T-7
18V
GND
C2
0.1µF
GND
R1
100k
GND
Figure 2. PFET Polarity Guard
The first two options in Figure 1 are simple diode based blocks that differ in the choice of diode type,
either Schottky with lowest available forward voltage drop, or a more conventional silicon diode type that
has higher forward voltage drop. The advantage of using the higher drop silicon selection is a much lower
cost and higher maximum reverse voltage rating. Schottky diode maximum reverse voltage ratings
generally top out at 100 V. In contrast silicon diodes are available as high as 600 V or even greater. As
previously mentioned, the diode forward voltage drop during normal system operation is a system power
loss contributor, so forward voltage drop should be minimized. If the higher forward drop of silicon diode is
permissible, then it is the best economic choice. These are much lower in cost than equivalent Schottky
based diodes and have multiple vendor choices. In this blocking application the speed of the diode is not a
concern at all, but in comparing diode characteristics it is observed that faster diodes generally have lower
forward drop. Following this comparison of available diodes and their tradeoffs, it is suggested that the
leading choice for a low drop high voltage diode would be those in the Ultra-Fast recovery category.
2.3
Overvoltage Protection and Supervisory Circuit
The next element in the protection circuit is an overvoltage disconnect switch. For simplicity, a p-channel
MOSFET is selected. As previously mentioned; these are not low cost devices. However, this choice
comes with a benefit of not needing an extra gate supply voltage for bias as would be the case if an nchannel MOSFET were chosen. Therefore the idea is that the added cost of using a p-channel will
outweigh the extra additional circuitry required to drive an n-channel. Additionally this leads to an overall
solution with essentially zero standby current. The p-channel series switch can also perform a soft-start
function by adding two R-C networks. This allows “hot connecting” large capacitive loads without
“sparking”. Be aware that optimum performance of this surge limit function involves calculations based on
load capacitor value and MOSFET capacitance characteristics
Finally, it is desirable to place a supervisor across the series p-channel switch such that the protected load
is only enabled when the switch is fully conducting.
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DESIGN REQUIREMENTS
2.4
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Overall Circuit Parameters
Figure 4 shows the full circuit schematic of the design. Considering all of the above requirements, this
resulting circuit has:
1. Essentially zero operating current during normal operation as the only conducting semiconductor in this
mode is the p-channel MOSFET.
2. Programmable over-voltage disconnect determined by selection of zener diodes.
3. Programmable in-rush current based on two R-C networks in conjunction with MOSFET and bulk input
capacitor calculations.
4. Immunity to damage in the event of a shorted input bus during operation.
5. OVP that self-resets when input voltage returns to normal operating range.
6. Does not rely on dissipative limiting.
7. Does not blow fuses when in voltage limiting mode.
3
FUNCTIONAL BLOCK DIAGRAM
LM43603PWPEVM
36V 3A
Synchronous Buck
6,03/(6:,7&+(5Š
Protected SMPS
+12V BATTERY BUS
+13.8V IN
(-300V to +50V input range)
Polarity
Protection
P-Channel MOSFET
Pass Transistor
Out-rush
Blocking
In-Rush
Limit
Over
Voltage
Disconnect
VIN
VOUT
ENABLE
GND
Bulk
Capacitor
Supervisor
Figure 3. Functional Block Diagram for the Automotive Input Protection Circuit
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VIN
GND
575-4
GND
R2
22.0
C1
—)
100V
VIN
PDU540-13
DBLK
GND
100k
ROVS1
C2
—)
100V
RDAMP
10.0
VIN_RProt
GND
ROVS2
27.4k
DOVS
CMHZ4705
18V
1
2
3
TPIN
Copyright © 2014, Texas Instruments Incorporated
1
RVDS2
100k
1
QMOS
ZXMP3A13F
DGP2
CMHZ4705
18V
GND
QVDS3
MMBT3904
EN
100k
RVDS
RGP2
332k
GND
18V Clamp
RVDS1
27.0k
GND
QVDS
MMBT3906
1
QOVS
MMBT3906
2
3
2
3
VIN
575-4
3
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2
TPG
5126
C3
—)
100V
TPS
TPEN
5128
Gate
1,2,3
QIRL
4
RGS
10.2k
3
DRST
BAV99WT1G
70V
RG1
10.0
7,8
5,6,
PFET
2
GND
CGS
—)
100V
TPD
5129
REN1 JEN
100k 575-4
100k
RDEN
GND
CEMI1
—)
100V
GND
CDEN
—)
575-4
GND2
575-4
VOUT2
TPO
5129
COUTB
—)
50V
COUTA
—)
50V
GND
TPDEN
5128
VOUT2
575-4
CEMI2
—)
GND
JDEN
575-4
LEMI
744311470
VOUT1
VOUT1
ENABLE
VOUT2
VOUT1
4
1
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AUTOMOTIVE LINE TRANSIENT PROTECTION CIRCUIT SCHEMATIC
AUTOMOTIVE LINE TRANSIENT PROTECTION CIRCUIT SCHEMATIC
Figure 4. Automotive Line Transient Protection Circuit Schematic
Automotive Line Transient Protection Circuit
5
CIRCUIT DESCRIPTION
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5
CIRCUIT DESCRIPTION
5.1
Reverse Polarity Protection and Overvoltage Disconnect
Reverse
Polarity
Protection
Over
Voltage
Disconnect
Series
Pass
P-FET
Soft-Start
R-C
DBLK
Out-rush
Blocking
QOVS
ROVS1
100k
MMBT3906
18V Gate Clamp
S
BATTERY BUS IN
C3
—)
D
TO SMPS VIN
In-Rush
Control
10
RG
CGS
0.1uF
G
18V
SMPS
Bulk
Input
Capacitor
RGS
10.2K
Sets OVP
ROVS2
27.4k
RGP2
332K
DRST
BAV99
Capacitor
Reset
Figure 5. Soft-Start and Protection Circuit
The component ROVS1, QOVS and the zener diode in Figure 5 set the OVP voltage level at the circuit
input. Initially when the input voltage is below 18 V, the QOVS transistor will be in an off state allowing the
capacitor C3 to be charged through C3 and RGP2 thus turning on the PFET. Once the input voltage
reaches approximately 18V plus 2 diode drops, the transistor QOVS will be turned on since the base of
QOVS is held at the zener voltage of 18 V. When this transistor is turned on, it discharges capacitor C3
and pulls the gate of PFET to its source and thus turning the PFET OFF.
Once the input voltage goes back below 18 V, the OVP condition is cleared and QOVS is again turned off.
This allow the capacitor C3 to be slowly charged again, resulting a soft-start at the output. The whole OVP
sequence can be seen on Figure 6. Please refer to Figure 10 for test setup.
VIN
(20 V/DIV)
VOUT2
(10 V/DIV)
TPDEN
(10 V/DIV)
EVM VOUT
(5 V/DIV)
200 ms/DIV
Figure 6. 30V OVP Condition and Recovering from OVP at 12V
The Ultrafast diode (DBLK) in Figure 5 is used to block a negative voltage at the battery bus input. During
negative transition of the input voltage, the QOVS is also turned on to discharge the capacitor C3. The
discharging of the capacitor is required in order to ensure that soft-start is being implemented on the PFET
after the input voltage recovers from negative transition. Figure 7 shows the soft-start at VOUT2 after
every negative transition at the input. Also, there is a delayed enable response (TPDEN) for downstream
circuitry in order to make sure that the PFET is fully turned on before enabling the SMPS.
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CIRCUIT DESCRIPTION
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VIN
(20 V/DIV)
VOUT2
(20 V/DIV)
TPDEN
(10 V/DIV)
EVM VOUT
(5 V/DIV)
200 ms/DIV
Figure 7. +15 V to -15 V Transition at the input and soft-start at VOUT2
5.2
Soft-Start and Inrush Control Circuit
Referring to Figure 5, C3 and RGP2 alongside with CGS and RGS components are responsible for the
soft-start and inrush limit for the PFET. Initially the voltage across capacitor C3 is 0 V. Once the battery is
connected, the capacitor will charge towards the battery bus voltage with a pre-determined rate set by the
value of C3 and RGP2. The component CGS and RGS are used as a feedback network from drain to gate
of the PFET. If the drain voltage of the PFET rises too fast, then this voltage will couple back into the gate
of the PFET through CGS and RGS and slows down the rise time of the drain. By soft-starting the PFET,
the inrush current going to the bulk capacitors at the output will then be reduced. Figure 8 shows the
PFET gate transition during soft-start of the output.
VIN
(10 V/DIV)
VOUT2
(10 V/DIV)
PFET
GATE
(10 V/DIV)
INPUT
CURRENT
(5 A/DIV)
50 ms/DIV
Figure 8. PFET gate transition during soft-start
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CIRCUIT DESCRIPTION
5.3
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SMPS Enable Supervisory Circuit
Reverse
Polarity
Protection
Series
Pass
P-FET
S
BATTERY BUS IN
Out-rush
Blocking
D
TO SMPS VIN
10
G
QMOS
RGP2
332k
RVDS
QVDS
REN
100k
100k
RDEN
RVDS1
27.0k
100k
QVDS3
RVDS2
100k
ENABLE OUT
CDEN
1µF
SMPS
Enable
Supervisor
Figure 9. SMPS Enable Supervisory Circuit
Figure 9 shows the enable supervisory section of the circuit. This circuitry monitors the voltage across the
drain and source of the PFET to determine whether or not the PFET is fully turned on. Initially the QMOS
is on and QVDS monitors the voltage across the source and drain of the PFET. When the PFET is not
fully turned on, there is a voltage drop between source and drain of the FET. When this voltage is large
enough, then the QVDS will be turned on and pulled up to the PFET source. This voltage will then drive
the QVDS3 causing Enable Out node to be pulled low. The ENABLE OUT node can be used to disable
the downstream circuitry that has an enable pin to start-up. Therefore the current should not flow into the
protected circuitry without the PFET being fully turned on. When the PFET is fully on, QVDS will be turned
off and the Enable Out node will slowly rise towards SMPS VIN voltage with a rate determined by RDEN
and CDEN.
During input over-voltage events, the QMOS transistor is off due to QOVS being on which makes VGS = 0.
When QMOS is off, the current path through QVDS and RVDS is opened and removed as a shunt path
across the series pass PFET
RDEN and CDEN create a delayed Enable signal to allow more time for the series pass PFET to be
turned fully on in the initial startup. Additionally it acts as a delayed turn-off in the OVP state to maintain
SMPS operation to discharge the bulk CIN and reset the two R-C networks on the PFET.
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TEST SETUP AND CONNECTIONS
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6
TEST SETUP AND CONNECTIONS
Throughout the dynamic testing of the Automotive Line Transient Protection Circuit (Figure 13 to
Figure 18), a LM43603PWPEVM is attached at the VOUT2 and the TPDEN is connected to the EN post
on the EVM. The EVM itself is operating with a set output voltage of 3.3 V and a switching frequency of
500 kHz.
Fluke
Ammeter
Kikusui PBZ
Bipolar Power Supply
VOUT1
VIN
VOUT2
GND
GND
TPDEN
AUTOMOTIVE INPUT PROTECTION BOARD
Figure 10. Test Setup and Connection for Automotive Input Protection Circuit
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TYPICAL PERFORMANCE CURVES
7
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TYPICAL PERFORMANCE CURVES
100%
1000
96%
100
Quiescent Current (A)
Efficiency (%)
All the curves below are taken with the LM43603PWPEVM attached at the output of the Automotive Input
Protection Board. The EVM operating conditions are VOUT = 3.3 V , Fs = 500 kHz, and 1.1 Ohm Load.
92%
88%
84%
6VIN
10
1
0.1
12VIN
80%
0.01
0
0.5
1
1.5
2
2.5
Load Current (A)
3
0
6
Figure 11. Efficiency
18
24
30
36
C002
Figure 12. Quiescent Current vs VIN
VIN
(10 V/DIV)
VIN
(10 V/DIV)
VOUT2
(10 V/DIV)
VOUT2
(10 V/DIV)
PFET
GATE
(10 V/DIV)
PFET
GATE
(10 V/DIV)
INPUT
CURRENT
(5 A/DIV)
INPUT
CURRENT
(5 A/DIV)
20 s/DIV
50 ms/DIV
Figure 13. Initial Inrush Current at 12 V Input Hot-Swap
VIN
(10 V/DIV)
Figure 14. PFET Gate Transition after 12 V Input Hot-Swap
VIN
(20 V/DIV)
VOUT2
(10 V/DIV)
VOUT2
(20 V/DIV)
TPDEN
(10 V/DIV)
TPDEN
(10 V/DIV)
EVM VOUT
(5 V/DIV)
EVM VOUT
(5 V/DIV)
50 ms/DIV
200 ms/DIV
Figure 15. Delayed Enabled Response (TPDEN) for
downstream circuitry after Hot-Swap
10
12
Input Voltage (V)
C002
Figure 16. Soft Start on VOUT2 after multiple +15 V to -15
V Input Transition
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TYPICAL PERFORMANCE CURVES
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VIN
(20 V/DIV)
VIN
(20 V/DIV)
VOUT2
(10 V/
DIV)
VOUT2
(10 V/DIV)
TPDEN
(10 V/DIV)
TPDEN
(10 V/DIV)
EVM VOUT
(5 V/DIV)
EVM VOUT
(5 V/DIV)
20 ms/DIV
200 ms/DIV
Figure 17. OVP at 30 V Input with 20 ms ramp
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Figure 18. OVP at 30 V Input and Recovery from OVP
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BILL OF MATERIALS
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BILL OF MATERIALS
Table 1. Bill of Materials (BOM) for Automotive Input Protection Board
12
Designator
Description
Manufacturer
PartNumber
Quantity
C1, C2, C3,
CDEN, CEMI1
CAP, CERM, 1uF, 100V, +/-10%, X7R, 1206
MuRata
GRM31CR72A105KA01L
5
CEMI2
CAP, AL, 100uF, 50V, +/-20%, 0.3 ohm,
SMD
Panasonic
EEE-FC1H101P
1
CGS
CAP, CERM, 0.1uF, 100V, +/-10%, X7R,
1206
MuRata
GRM319R72A104KA01D
1
COUTA, COUTB
CAP, CERM, 10uF, 50V, +/-10%, X5R,
1206_190
TDK
CGA5L3X5R1H106K160AB
1
DBLK
Diode, Ultrafast Recovery Rectifier, 400V,
5A, PowerDI-5
Diodes Incorporated
PDU540-13
1
DGP2, DOVS
Diode, Zener, 18V, 500mW, SOD-123
Central
Semiconductor
CMHZ4705
2
DRST
Diode, P-N, 70V, 0.2A, SOT-323
Fairchild
Semiconductor
BAV99WT1G
1
GND, GND2,
JDEN, JEN, VIN,
VOUT1, VOUT2
Standard Banana Jack, Uninsulated, 5.5mm
Keystone
575-4
7
LEMI
Shielded Drum Core, Superflux, 4.7uH, 6A,
0.02 ohm, SMD
Wurth Elektronik
eiSos
744311470
1
QIRL
MOSFET, P-Channel, -60V, -42A, 0.025
ohm , TO-220AB
Vishay-Siliconix
SUP53P06-20
1
QMOS
MOSFET, P-Channel, -30V, -1.6A, 0.21
ohm, SOT-23
Diodes Incorporated
ZXMP3A13F
1
QOVS, QVDS
Transistor, PNP, 40V, 0.2A, SOT-23
Fairchild
Semiconductor
MMBT3906
2
QVDS3
Transistor, NPN, 40V, 0.2A, SOT-23
Fairchild
Semiconductor
MMBT3904
1
R2
RES, 22.0 ohm, 1%, 0.25W, 1206
Yageo America
RC1206FR-0722RL
1
RDAMP , RG1
RES, 10.0 ohm, 1%, 0.25W, 1206
Vishay-Dale
CRCW120610R0FKEA
1
RDEN, REN1,
ROVS1, RVDS,
RVDS2
RES, 100k ohm, 1%, 0.25W, 1206
Vishay-Dale
CRCW1206100KFKEA
5
RGP2
RES, 332k ohm, 1%, 0.25W, 1206
Yageo America
RC1206FR-07332KL
1
RGS
RES, 10.2k ohm, 1%, 0.25W, 1206
Vishay-Dale
CRCW120610K2FKEA
1
ROVS2, RVDS1
RES, 27.0k ohm, 1%, 0.25W, 1206
Yageo America
RC1206FR-0727KL
1
TPD, TPO
Test Point, Multipurpose, Purple, TH
Keystone
5129
1
TPDEN, TPEN
Test Point, Multipurpose, Grey, TH
Keystone
5128
1
TPG
Test Point, Multipurpose, Green, TH
Keystone
5126
1
TPIN
Test Point, Multipurpose, Orange, TH
Keystone
5013
1
TPS
Test Point, Multipurpose, Red, TH
Keystone
5010
1
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