Die Datasheet GA10JT06-CAL Normally – OFF Silicon Carbide Junction Transistor VDS RDS(ON) ID @ 25 oC hFE = = = = 600 V 120 mΩ 25 A 120 Features • • • • • • • • 210°C maximum operating temperature Gate Oxide Free SiC switch Exceptional Safe Operating Area Excellent Gain Linearity Temperature Independent Switching Performance Low Output Capacitance Positive Temperature Co-efficient of RDS,ON Suitable for connecting an anti-parallel diode Die Size = 2.10 mm x 2.10 mm Advantages Applications • • • • • • • • • • • • • • Compatible with Si MOSFET/IGBT gate-drivers > 20 µs Short-Withstand Capability Lowest-in-class Conduction Losses High Circuit Efficiency Minimal Input Signal Distortion High Amplifier Bandwidth Down Hole Oil Drilling, Geothermal Instrumentation Hybrid Electric Vehicles (HEV) Solar Inverters Switched-Mode Power Supply (SMPS) Power Factor Correction (PFC) Induction Heating Uninterruptible Power Supply (UPS) Motor Drives Absolute Maximum Ratings (TC = 25 oC unless otherwise specified) Parameter Drain – Source Voltage Continuous Drain Current Continuous Drain Current Continuous Gate Current Symbol VDS ID ID IGM Turn-Off Safe Operating Area RBSOA Short Circuit Safe Operating Area SCSOA Reverse Gate – Source Voltage Reverse Drain – Source Voltage Operating Junction and Storage Temperature Maximum Processing Temperature Conditions VGS = 0 V TC = 25°C TC > 125°C, assumes RthJC < 0.88 oC/W TVJ = 210 oC, Clamped Inductive Load TVJ = 210 oC, IG = 1 A, VDS = 400 V, Non Repetitive Value 600 25 10 1.3 ID,max = 10 @ VDS ≤ VDSmax Unit V A A A A > 20 µs VSG VSD 30 25 V V Tj, Tstg -55 to 210 °C 325 °C TProc 10 min. maximum Notes Electrical Characteristics Parameter Symbol Conditions Min. Value Typical Max. Unit Notes mΩ Fig. 5 V Fig. 4 – Fig. 5 μA Fig. 6 On State Characteristics Drain – Source On Resistance RDS(ON) ID = 10 A, Tj = 25 °C ID = 10 A, Tj = 125 °C ID = 10 A, Tj = 175 °C ID = 10 A, Tj = 210 °C Gate – Source Saturation Voltage VGS,SAT ID = 10 A, ID/IG = 40, Tj = 25 °C ID = 10 A, ID/IG = 30, Tj = 175 °C hFE VDS = 5 V, ID = 10 A, Tj = 25 °C VDS = 5 V, ID = 10 A, Tj = 125 °C VDS = 5 V, ID = 10 A, Tj = 175 °C VDS = 10 V, ID = 10 A, Tj = 210 °C Drain Leakage Current IDSS VR = 600 V, VGS = 0 V, Tj = 25 °C VR = 600 V, VGS = 0 V, Tj = 125 °C VR = 600 V, VGS = 0 V, Tj = 210 °C Gate Leakage Current ISG VSG = 20 V, Tj = 25 °C DC Current Gain 120 180 240 320 3.50 3.27 120 87 80 76 Off State Characteristics Feb 2015 10 50 100 20 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ nA Pg1 of 8 Die Datasheet GA10JT06-CAL Figures Figure 1: Typical Output Characteristics at 25 °C Figure 2: Typical Output Characteristics at 125 °C Figure 3: Typical Output Characteristics at 210 °C Figure 4: Typical Gate – Source Saturation Voltage Figure 5: Normalized On-Resistance and Current Gain vs. Temperature Figure 6: Typical Blocking Characteristics Feb 2015 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg2 of 8 Die Datasheet GA10JT06-CAL Driving the GA10JT06-CAL Drive Topology TTL Logic Constant Current High Speed – Boost Capacitor High Speed – Boost Inductor Proportional Pulsed Power Gate Drive Power Consumption High Medium Medium Low Lowest Medium Switching Frequency Low Medium High High High N/A Application Emphasis Availability Wide Temperature Range Wide Temperature Range Fast Switching Ultra Fast Switching Wide Drain Current Range Pulse Power Coming Soon Coming Soon Production Coming Soon Coming Soon Coming Soon A: Static TTL Logic Driving The GA10JT06-CAL may be driven using direct (5 V) TTL logic after current amplification. The (amplified) current level of the supply must meet or exceed the steady state gate current (IG,steady) required to operate the GA10JT06- CAL. The power level of the supply can be estimated from the target duty cycle of the particular application. IG,steady is dependent on the anticipated drain current ID through the SJT and the DC current gain hFE, it may be calculated from the following equation. An accurate value of the hFE may be read from Figure 5. 𝐼𝐼𝐺𝐺,𝑠𝑠𝑠𝑠𝑠𝑠𝑠𝑠𝑠𝑠𝑠𝑠 ≈ 𝐼𝐼𝐷𝐷 ∗ 1.5 ℎ𝐹𝐹𝐹𝐹 (𝑇𝑇, 𝐼𝐼𝐷𝐷 ) 5V SiC SJT TTL Gate Signal D G 5/0V TTL i/p IG,steady S Figure 7: TTL Gate Drive Schematic B: High Speed Driving The SJT is a current controlled transistor which requires a positive gate current for turn-on as well as to remain in on-state. An ideal gate current waveform for ultra-fast switching of the SJT, while maintaining low gate drive losses, is shown in Figure 8 which features a positive current peak during turn-on, a negative current peak during turn-off, and continuous gate current to remain on. Figure 8: An idealized gate current waveform for fast switching of an SJT. An SJT is rapidly switched from its blocking state to on-state, when the necessary gate charge, QG, for turn-on is supplied by a burst of high gate current, IG,on, until the gate-source capacitance, CGS, and gate-drain capacitance, CGD, are fully charged. 𝑄𝑄𝑜𝑜𝑜𝑜 = 𝐼𝐼𝐺𝐺,𝑜𝑜𝑜𝑜 ∗ 𝑡𝑡1 Feb 2015 𝑄𝑄𝑜𝑜𝑜𝑜 ≥ 𝑄𝑄𝑔𝑔𝑔𝑔 + 𝑄𝑄𝑔𝑔𝑔𝑔 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg3 of 8 Die Datasheet GA10JT06-CAL Ideally, IG,pon should terminate when the drain voltage falls to its on-state value in order to avoid unnecessary drive losses during the steady on-state. In practice, the rise time of the IG,on pulse is affected by the parasitic inductances, Lpar in the device package and drive circuit. A voltage developed across the parasitic inductance in the source path, Ls, can de-bias the gate-source junction, when high drain currents begin to flow through the device. The voltage applied to the gate pin should be maintained high enough, above the VGS,sat (see Figure 4) level to counter these effects. A high negative peak current, -IG,off is recommended at the start of the turn-off transition, in order to rapidly sweep out the injected carriers from the gate, and achieve rapid turn-off. While satisfactory turn off can be achieved with VGS = 0 V, a negative gate voltage VGS may be used in order to speed up the turn-off transition. Two high-speed drive topologies for the SiC SJTs are presented below. B:1: High Speed, Low Loss Drive with Boost Capacitor, GA03IDDJT30-FR4 The GA10JT06- CAL may be driven using a High Speed, Low Loss Drive with Boost Capacitor topology in which multiple voltage levels, a gate resistor, and a gate capacitor are used to provide fast switching current peaks at turn-on and turn-off and a continuous gate current while in on-state. A 3 kV isolated evaluation gate drive board (GA03IDDJT30-FR4) utilizing this topology is commercially available for high and lowside driving, its datasheet provides additional details about this drive topology. C2 +12 V GA03IDDJT30-FR4 Gate Driver Board VGL VCC High U3 C5 VCC High RTN CG1 VGL VGH Signal R1 R2 U1 CG2 U5 R4 C9 VEE C6 Gate Signal VEE C10 VGL VGL R3 U2 VCC Low RTN G SiC SJT RG2 S C8 VGH VCC Low C1 U6 VEE VEE IG RG1 D1 Signal RTN +12 V D Gate U4 C3 C4 Source VEE Voltage Isolation Barrier Figure 9: Topology of the GA03IDDJT30-FR4 Two Voltage Source gate driver. The GA03IDDJT30-FR4 evaluation board comes equipped with two on board gate drive resistors (RG1, RG2) pre-installed for an effective 3 gate resistance of RG = 3.75 Ω. It may be necessary for the user to reduce RG1 and RG2 under high drain current conditions f or safe operation of the GA10JT06- CAL. The steady state current supplied to the gate pin of the GA10JT06- CAL with on-board RG = 3.75 Ω, is shown in Figure 10. The maximum allowable safe value of RG for the user’s required drain current can be read from Figure 11. For the GA10JT06-CAL, RG must be reduced for ID ≥ ~10 A for safe operation with the GA03IDDJT30-FR4. For operation at ID ≥ ~10 A, RG may be calculated from the following equation, which contains the DC current gain hFE (Figure 5) and the gatesource saturation voltage VGS,sat (Figure 4). 𝑅𝑅𝐺𝐺,𝑚𝑚𝑚𝑚𝑚𝑚 = Feb 2015 �4.7𝑉𝑉 − 𝑉𝑉𝐺𝐺𝐺𝐺,𝑠𝑠𝑠𝑠𝑠𝑠 � ∗ ℎ𝐹𝐹𝐹𝐹 (𝑇𝑇, 𝐼𝐼𝐷𝐷 ) − 0.6Ω 𝐼𝐼𝐷𝐷 ∗ 1.5 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg4 of 8 Die Datasheet Figure 10: Typical steady state gate current supplied by the GA03IDDJT30-FR4 board for the GA10JT06-CAL with the on board resistance of 3.75 Ω GA10JT06-CAL Figure 11: Maximum gate resistance for safe operation of the GA10JT06-CAL at different drain currents using the GA03IDDJT30-FR4 board. B:2: High Speed, Low Loss Drive with Boost Inductor A High Speed, Low-Loss Driver with Boost Inductor is also capable of driving the GA10JT06- CAL at high-speed. It utilizes a gate drive inductor instead of a capacitor to provide the high-current gate current pulses IG,on and IG,off. During operation, inductor L is charged to a specified IG,on current value then made to discharge IL into the SJT gate pin using logic control of S1, S2, S3, and S4, as shown in Figure 12. After turn on, while the device remains on the necessary steady state gate current IG,steady is supplied from source VCC through RG. Please refer to the article “A current-source concept for fast and efficient driving of silicon carbide transistors” by Dr. Jacek Rąbkowski for additional 4 information on this driving topology. VCC S1 VCC S2 L VEE S3 SiC SJT D G RG S4 S VEE Figure 12: Simplified Inductive Pulsed Drive Topology 3 – RG = (1/RG1 +1/RG2)-1. Driver is pre-installed with RG1 = RG2 = 7.5 Ω 4 Feb 2015 – Archives of Electrical Engineering. Volume 62, Issue 2, Pages 333–343, ISSN (Print) 0004-0746, DOI: 10.2478/aee-2013-0026, June 2013 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg5 of 8 Die Datasheet GA10JT06-CAL C: Proportional Gate Current Driving For applications in which the GA10JT06- CAL will operate over a wide range of drain current conditions, it may be beneficial to drive the device using a proportional gate drive topology to optimize gate drive power consumption. A proportional gate driver relies on instantaneous drain current ID feedback to vary the steady state gate current IG,steady supplied to the GA10JT06- CAL C:1: Voltage Controlled Proportional Driver The voltage controlled proportional driver relies on a gate drive IC to detect the GA10JT06- CAL drain-source voltage VDS during on-state to sense ID. The gate drive IC will then increase or decrease IG,steady in response to ID. This allows IG,steady, and thus the gate drive power consumption, to be reduced while ID is relatively low or for IG,steady to increase when is ID higher. A high voltage diode connected between the drain and sense protects the IC from high-voltage when the driver and GA10JT06- CAL are in off-state. A simplified version of this topology is shown in Figure13, additional information will be available in the future at http://www.genesicsemi.com/commercial-sic/sic-junction-transistors/ HV Diode Sense Gate Signal Proportional Gate Current Driver Signal D G Output IG,steady SiC SJT S Figure 13: Simplified Voltage Controlled Proportional Driver C:2: Current Controlled Proportional Driver The current controlled proportional driver relies on a low-loss transformer in the drain or source path to provide feedback ID of the GA10JT06CAL during on-state to supply IG,steady into the device gate. IG,steady will then increase or decrease in response to ID at a fixed forced current gain which is set be the turns ratio of the transformer, hforce = ID / IG = N2 / N1. GA10JT06- CAL is initially tuned-on using a gate current pulse supplied into an RC drive circuit to allow ID current to begin flowing. This topology allows IG,steady, and thus the gate drive power consumption, to be reduced while ID is relatively low or for IG,steady to increase when is ID higher. A simplified version of this topology is shown in Figure14, additional information will be available in the future at http://www.genesicsemi.com/commercial-sic/sic-junction-transistors/. N2 SiC SJT Gate Signal D G S N3 N1 N2 Figure 14: Simplified Current Controlled Proportional Driver Feb 2015 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg6 of 8 Die Datasheet GA10JT06-CAL Mechanical Parameters 2.10 x 2.10 mm2 83 x 83 mil2 4.41/3.31 mm2 6836/5134 mil Die Thickness 360 µm 14 mil Wafer Size 100 mm 3937 mil 0 deg 0 deg Die Dimensions Die Area total / active Flat Position Die Frontside Passivation 2 Polyimide Gate/Source Pad Metallization 4000 nm Al Bottom Drain Pad Metallization 400 nm Ni + 200 nm Au Die Attach Electrically conductive glue or solder Wire Bond Al ≤ 10 mil (Source) Al ≤ 3 mil (Gate) Φ ≥ 0.3 mm Reject ink dot size Store in original container, in dry nitrogen, Recommended storage environment < 6 months at an ambient temperature of 23 °C Chip Dimensions A C E H Feb 2015 mil 2.10 83 B 2.10 83 C 1.47 58 D 1.52 60 E 0.17 7 F 0.40 16 G 0.30 12 H 0.30 12 DIE F G mm A D B SOURCE WIREBONDABLE GATE WIREBONDABLE http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg7 of 8 Die Datasheet GA10JT06-CAL Revision History Date Revision Comments 2015/02/06 1 Updated Electrical Characteristics 2014/08/26 0 Initial Release Supersedes Published by GeneSiC Semiconductor, Inc. 43670 Trade Center Place Suite 155 Dulles, VA 20166 GeneSiC Semiconductor, Inc. reserves right to make changes to the product specifications and data in this document without notice. GeneSiC disclaims all and any warranty and liability arising out of use or application of any product. No license, express or implied to any intellectual property rights is granted by this document. Unless otherwise expressly indicated, GeneSiC products are not designed, tested or authorized for use in life-saving, medical, aircraft navigation, communication, air traffic control and weapons systems, nor in applications where their failure may result in death, personal injury and/or property damage. Feb 2015 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg8 of 8 Die Datasheet GA10JT06-CAL SPICE Model Parameters This is a secure document. Please copy this code from the SPICE model PDF file on our website (http://www.genesicsemi.com/images/hit_sic/baredie/sjt/GA10JT06-CAL_SPICE.pdf) into LTSPICE (version 4) software for simulation of the GA10JT06-CAL. * MODEL OF GeneSiC Semiconductor Inc. * * $Revision: 2.0 $ * $Date: 26-AUG-2014 $ * * GeneSiC Semiconductor Inc. * 43670 Trade Center Place Ste. 155 * Dulles, VA 20166 * * COPYRIGHT (C) 2014 GeneSiC Semiconductor Inc. * ALL RIGHTS RESERVED * * These models are provided "AS IS, WHERE IS, AND WITH NO WARRANTY * OF ANY KIND EITHER EXPRESSED OR IMPLIED, INCLUDING BUT NOT LIMITED * TO ANY IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A * PARTICULAR PURPOSE." * Models accurate up to 2 times rated drain current. * .model GA10JT06 NPN + IS 4.4E-48 + ISE 1.858E-28 + EG 3.23 + BF 125 + BR 0.55 + IKF 400 + NF 1 + NE 2 + RB 7.0 + RE 0.005 + RC 0.105 + CJC 3.96E-10 + VJC 3.189 + MJC 0.469 + CJE 8.083E-10 + VJE 3.1441 + MJE 0.4308 + XTI 3 + XTB -0.9 + TRC1 1.0E-2 + VCEO 600 + ICRATING 10 + MFG GeneSiC_Semiconductor * * End of GA10JT06 SPICE Model Aug 2014 http://www.genesicsemi.com/high-temperature-sic/high-temperature-sic-bare-die/ Pg1 of 1