GA50SICP12-227 - GeneSiC Semiconductor

GA50SICP12-227
Silicon Carbide Junction
Transistor/Schottky Diode Co-Pack
Features
Package
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

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

 RoHS Compliant
175 °C Maximum Operating Temperature
Gate Oxide Free SiC Switch
Exceptional Safe Operating Area
Integrated SiC Schottky Rectifier
Excellent Gain Linearity
Temperature Independent Switching Performance
Low Output Capacitance
Positive Temperature Coefficient of RDS,ON
Suitable for Connecting an Anti-parallel Diode
=
1200 V
RDS(ON)
=
20 mΩ
ID (Tc = 25°C)
=
80 A
ID (Tc = 115°C)
=
50 A
hFE (Tc = 25°C)
=
104
D
S
GR
D
Pin D - Drain
Pin S - Source
Pin GR - Gate Return
Pin G - Gate
G
G
GR
S
SOT-227
Advantages
Applications
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
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
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Compatible with Si MOSFET/IGBT Gate Drive ICs
> 20 µs Short-Circuit Withstand Capability
Lowest-in-class Conduction Losses
High Circuit Efficiency
Minimal Input Signal Distortion
High Amplifier Bandwidth
Reduced cooling requirements
Reduced system size
VDS
Please note: The Source and Gate Return
pins are not exchangeable. Their exchange
might lead to malfunction.
Down Hole Oil Drilling, Geothermal Instrumentation
Hybrid Electric Vehicles (HEV)
Solar Inverters
Switched-Mode Power Supply (SMPS)
Power Factor Correction (PFC)
Induction Heating
Uninterruptible Power Supply (UPS)
Motor Drives
Table of Contents
Section I: Absolute Maximum Ratings ...........................................................................................................1
Section II: Static Electrical Characteristics ....................................................................................................2
Section III: Dynamic Electrical Characteristics .............................................................................................3
Section IV: Figures ...........................................................................................................................................4
Section V: Driving the GA50SICP12-227 ........................................................................................................7
Section VI: Package Dimensions ................................................................................................................. 11
Section VII: SPICE Model Parameters ......................................................................................................... 12
Section I: Absolute Maximum Ratings
Parameter
Symbol
Conditions
Value
Unit
VDS
ID
ID
IG
IGR
VGS = 0 V
TC = 25°C
TC = 115°C
1200
80
50
3.5
3.5
ID,max = 50
@ VDS ≤ VDSmax
V
A
A
A
A
>20
µs
30
25
265 / 106
-55 to 175
V
V
W
°C
Notes
SiC Junction Transistor
Drain – Source Voltage
Continuous Drain Current
Continuous Drain Current
Continuous Gate Current
Continuous Gate Return Current
Turn-Off Safe Operating Area
RBSOA
Short Circuit Safe Operating Area
SCSOA
Reverse Gate – Source Voltage
Reverse Drain – Source Voltage
Power Dissipation
Operating and storage temperature
Mar 2015
VSG
VSD
Ptot
Tstg
TVJ = 175 oC,
Clamped Inductive Load
TVJ = 175 oC, IG = 1 A, VDS = 800 V,
Non Repetitive
TC = 25 °C / 115 °C, tp > 100 ms
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A
Fig. 12
Fig. 12
Fig. 14
Fig. 11
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GA50SICP12-227
Parameter
Symbol
Conditions
Value
Unit
Repetitive peak reverse voltage
Continuous forward current
RMS forward current
Surge non-repetitive forward current,
Half Sine Wave
Non-repetitive peak forward current
VRRM
IF
IF(RMS)
TC ≤ 115 °C
V
A
A
TC = 25 °C, tP = 10 ms
TC = 115 °C, tP = 10 ms
1200
50
87
350
313
1625
450
300
IFSM
TC = 25 °C, tP = 10 ms
TC = 115 °C, tP = 10 ms
IF,max
TC = 25 °C, tP = 10 µs
I2t value
∫i2 dt
RthJC
RthJC
SiC Junction Transistor
SiC Diode
0.57
0.53
Notes
Free-Wheeling SiC Diode
TC ≤ 115 °C
A
A
A2s
Thermal Characteristics
Thermal resistance, junction - case
Thermal resistance, junction - case
Mechanical Properties
Min.
Mounting Torque
Terminal Connection Torque
Weight
Case Color
Dimensions
Md
Values
Typical
1.5
1.3
°C/W
°C/W
Max.
1.5
29
Black
38 x 25.4 x 12
Nm
Nm
g
mm
Section II: Static Electrical Characteristics
Parameter
Symbol
Conditions
Drain – Source On Resistance
RDS(ON)
ID = 50 A, Tj = 25 °C
ID = 50 A, Tj = 150 °C
ID = 50 A, Tj = 175 °C
Gate – Source Saturation Voltage
VGS,SAT
ID = 50 A, ID/IG = 40, Tj = 25 °C
ID = 50 A, ID/IG = 30, Tj = 175 °C
DC Current Gain
hFE
VDS = 8 V, ID = 50 A, Tj = 25 °C
VDS = 8 V, ID = 50 A, Tj = 125 °C
VDS = 8 V, ID = 50 A, Tj = 175 °C
FWD forward voltage
VF
IF = 50 A, Tj = 25 °C
IF = 50 A, Tj = 175 °C
Min.
Value
Typical
Max.
Unit
Notes
mΩ
Fig. 4
V
Fig. 7
–
Fig. 5
A: On State
20
36
42
3.42
3.23
104
65
58
1.5
2.4
1.8
3.0
V
B: Off State
Drain Leakage Current
IDSS
VDS = 1200 V, VGS = 0 V, Tj = 25 °C
VDS = 1200 V, VGS = 0 V, Tj = 150 °C
VDS = 1200 V, VGS = 0 V, Tj = 175 °C
Gate Leakage Current
ISG
VSG = 20 V, Tj = 25 °C
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50
100
200
20
1000
μA
Fig. 8
nA
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GA50SICP12-227
Section III: Dynamic Electrical Characteristics
Parameter
Value
Typical
Symbol
Conditions
Ciss
Crss/Coss
VGS = 0 V, VDS = 800 V, f = 1 MHz
VDS = 800 V, f = 1 MHz
Total FWD capacitance
CFWD
VR = 1 V, f = 1 MHz, Tj = 25 °C
VR = 400 V, f = 1 MHz, Tj = 25 °C
VR = 1000 V, f = 1 MHz, Tj = 25 °C
Output Capacitance Stored Energy
Effective Output Capacitance,
time related
Effective Output Capacitance,
energy related
Gate-Source Charge
Gate-Drain Charge
Gate Charge - Total
EOSS
VGS = 0 V, VDS = 800 V, f = 1 MHz
Coss,er
VGS = 0 V, VDS = 0…800 V
357
pF
QGS
QGD
QG
VGS = -5…3 V
VGS = 0 V, VDS = 0…800 V
55
419
474
nC
nC
nC
Total FWD capacitive charge
QC,FWD
158
247
nC
0.58
Ω
0.09
25
60
80
50
650
525
1175
Ω
ns
ns
ns
ns
µJ
µJ
µJ
Min.
Unit
Notes
7209
265
2940
203
142
112
pF
pF
Fig. 9
Fig. 9
524
pF
Max.
A: Capacitance and Gate Charge
Input Capacitance
Reverse Transfer/Output Capacitance
Coss,tr
B: SJT Switching Characteristics
Internal Gate Resistance – zero bias
Internal Gate Resistance – ON
Turn On Delay Time
Fall Time, VDS
Turn Off Delay Time
Rise Time, VDS
Turn-On Energy Per Pulse
Turn-Off Energy Per Pulse
Total Switching Energy
1
ID = constant, VGS = 0 V, VDS = 0…800 V
IF ≤ IF,MAX
dIF/dt = 200 A/μs
Tj = 175 °C
VR = 400 V
VR = 960 V
pF
µJ
Fig. 10
1
RG(INT-ZERO)
RG(INT-ON)
td(on)
tf
td(off)
tr
Eon
Eoff
Etot
f = 1 MHz, VAC = 50 mV, VDS = 0 V,
VGS = 0 V, Tj = 175 ºC
VGS > 2.5 V, VDS = 0 V, Tj = 175 ºC
Tj = 25 ºC, VDS = 750 V,
ID = 30 A, Inductive Load
Refer to Section V for additional
driving information.
Tj = 25 ºC, VDS = 750 V,
ID = 30 A, Inductive Load
Refer to Section V.
– All times are relative to the Drain-Source Voltage VDS
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GA50SICP12-227
Section IV: Figures
A: Static Characteristics
Figure 1: Typical Output Characteristics at 25 °C
Figure 2: Typical Output Characteristics at 150 °C
Figure 3: Typical Output Characteristics at 175 °C
Figure 4: On-Resistance vs. Gate Current
Figure 5: DC Current Gain and Normalized On-Resistance
vs. Temperature
Figure 6: DC Current Gain vs. Drain Current
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GA50SICP12-227
Figure 7: Typical Gate – Source Saturation Voltage
Figure 8: Typical Blocking Characteristics
B: Dynamic Characteristics
Figure 9: Input, Output, and Reverse Transfer Capacitance
Figure 10: Energy Stored in Output Capacitance
C: Current and Power Derating
Figure 11: Power Derating Curve
Mar 2015
Figure 12: Drain Current Derating vs. Temperature
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GA50SICP12-227
Figure 13: Forward Bias Safe Operating Area at Tc= 25 oC
Figure 14: Turn-Off Safe Operating Area
Figure 15: SJT Transient Thermal Impedance
Figure 16: FWD Transient Thermal Impedance
Figure 17: Drain Current Derating vs. Pulse Width
Figure 18: Typical FWD Forward Characteristics
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GA50SICP12-227
Section V: Driving the GA50SICP12-227
Drive Topology
TTL Logic
Constant Current
High Speed – Boost Capacitor
High Speed – Boost Inductor
Proportional
Pulsed Power
Gate Drive Power
Consumption
High
Medium
Medium
Low
Lowest
Medium
Switching
Frequency
Low
Medium
High
High
High
N/A
Application Emphasis
Availability
Wide Temperature Range
Wide Temperature Range
Fast Switching
Ultra Fast Switching
Wide Drain Current Range
Pulse Power
Coming Soon
Coming Soon
Production
Coming Soon
Coming Soon
Coming Soon
A: Static TTL Logic Driving
The GA50SICP12-227 may be driven using direct (5 V) TTL logic after current amplification. The (amplified) current level of the supply must
meet or exceed the steady state gate current (IG,steady) required to operate the GA50SICP12-227. The power level of the supply can be
estimated from the target duty cycle of the particular application. IG,steady is dependent on the anticipated drain current ID through the SJT and
the DC current gain hFE, it may be calculated from the following equation. An accurate value of the hFE may be read from Figure 6.
D
5V
TTL
Gate Signal
G
5/0V
TTL i/p
IG,steady
GR
S
Figure 19: TTL Gate Drive Schematic
B: High Speed Driving
The SJT is a current controlled transistor which requires a positive gate current for turn-on as well as to remain in on-state. An ideal gate
current waveform for ultra-fast switching of the SJT, while maintaining low gate drive losses, is shown in Figure 20 which features a positive
current peak during turn-on, a negative current peak during turn-off, and continuous gate current to remain on.
Figure 20: An idealized gate current waveform for fast switching of an SJT.
An SJT is rapidly switched from its blocking state to on-state, when the necessary gate charge, QG, for turn-on is supplied by a burst of high
gate current, IG,on, until the gate-source capacitance, CGS, and gate-drain capacitance, CGD, are fully charged.
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GA50SICP12-227
Ideally, IG,on should terminate when the drain voltage falls to its on-state value in order to avoid unnecessary drive losses during the steady onstate. In practice, the rise time of the I G,on pulse is affected by the parasitic inductances, Lpar in the device package and drive circuit. A voltage
developed across the parasitic inductance in the source path, L s, can de-bias the gate-source junction, when high drain currents begin to flow
through the device. The voltage applied to the gate pin should be maintained high enough, above the VGS,sat (see Figure 7) level to counter
these effects.
A high negative peak current, -IG,off is recommended at the start of the turn-off transition, in order to rapidly sweep out the injected carriers from
the gate, and achieve rapid turn-off. While satisfactory turn off can be achieved with V GS = 0 V, a negative gate voltage VGS may be used in
order to speed up the turn-off transition.
Two high-speed drive topologies for the SiC SJTs are presented below.
B:1: High Speed, Low Loss Drive with Boost Capacitor, GA03IDDJT30-FR4
The GA50SICP12-227 may be driven using a High Speed, Low Loss Drive with Boost Capacitor topology in which multiple voltage levels, a
gate resistor, and a gate capacitor are used to provide fast switching current peaks at turn-on and turn-off and a continuous gate current while
in on-state. A 3 kV isolated evaluation gate drive board (GA03IDDJT30-FR4) utilizing this topology is commercially available for high and lowside driving, its datasheet provides additional details about this drive topology.
C2
+12 V
GA03IDDJT30-FR4
Gate Driver Board
VGL
VCC High
U3
C5
VCC High RTN
CG1
VGL
VGH
Signal
R1
R2
U1
CG2
U5
R4
C9
VEE C6
Gate
Signal
VEE
VGL
VEE
VCC Low RTN
G
RG2
GR
S
C8
VGH
VCC Low
C1
U6
VEE
IG
RG1
D1
Signal RTN
+12 V
Gate
VGL
R3
U2
D
C10
U4
C3
C4
Source
VEE
Voltage Isolation Barrier
Figure 21: Topology of the GA03IDDJT30-FR4 Two Voltage Source gate driver.
The GA03IDDJT30-FR4 evaluation board comes equipped with two on board gate drive resistors (RG1, RG2) pre-installed for an effective
gate resistance3 of RG = 3.75 Ω. It may be necessary for the user to reduce RG1 and RG2 under high drain current conditions for safe
operation of the GA50SICP12-227. The steady state current supplied to the gate pin of the GA50SICP12-227 with on-board RG = 3.75 Ω, is
shown in Figure 22. The maximum allowable safe value of RG for the user’s required drain current can be read from Figure 23.
For the GA50SICP12-227, RG must be reduced for ID ≥ ~14 A for safe operation with the GA03IDDJT30-FR4.
For operation at ID ≥ ~14 A, RG may be calculated from the following equation, which contains the DC current gain hFE (Figure 6) and the gatesource saturation voltage VGS,sat (Figure 7).
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GA50SICP12-227
Figure 22: Typical steady state gate current supplied by the
GA03IDDJT30-FR4 board for the GA50SICP12-227 with the
on board resistance of 3.75 Ω
Figure 23: Maximum gate resistance for safe operation of
the GA50SICP12-227 at different drain currents using the
GA03IDDJT30-FR4 board.
B:2: High Speed, Low Loss Drive with Boost Inductor
A High Speed, Low-Loss Driver with Boost Inductor is also capable of driving the GA50SICP12-227 at high-speed. It utilizes a gate drive
inductor instead of a capacitor to provide the high-current gate current pulses IG,on and IG,off. During operation, inductor L is charged to a
specified IG,on current value then made to discharge IL into the SJT gate pin using logic control of S 1, S2, S3, and S4, as shown in Figure 24.
After turn on, while the device remains on the necessary steady state gate current IG,steady is supplied from source VCC through RG. Please refer
to the article “A current-source concept for fast and efficient driving of silicon carbide transistors” by Dr. Jacek Rąbkowski for additional
information on this driving topology.4
S1
VCC
S2
L
D
VEE
S3
G
RG
S4
GR
S
VEE
Figure 24: Simplified Inductive Pulsed Drive Topology
3
– RG = (1/RG1 +1/RG2)-1. Driver is pre-installed with RG1 = RG2 = 7.5 Ω
4
– Archives of Electrical Engineering. Volume 62, Issue 2, Pages 333–343, ISSN (Print) 0004-0746, DOI: 10.2478/aee-2013-0026, June 2013
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GA50SICP12-227
C: Proportional Gate Current Driving
For applications in which the GA50SICP12-227 will operate over a wide range of drain current conditions, it may be beneficial to drive the
device using a proportional gate drive topology to optimize gate drive power consumption. A proportional gate driver relies on instantaneous
drain current ID feedback to vary the steady state gate current IG,steady supplied to the GA50SICP12-227
C:1: Voltage Controlled Proportional Driver
The voltage controlled proportional driver relies on a gate drive IC to detect the GA50SICP12-227 drain-source voltage VDS during on-state to
sense ID. The gate drive IC will then increase or decrease IG,steady in response to ID. This allows IG,steady, and thus the gate drive power
consumption, to be reduced while ID is relatively low or for IG,steady to increase when is ID higher. A high voltage diode connected between the
drain and sense protects the IC from high-voltage when the driver and GA50SICP12-227 are in off-state. A simplified version of this topology
is shown in Figure 25, additional information will be available in the future at http://www.genesicsemi.com/commercial-sic/sic-junctiontransistors/
D
HV Diode
Sense
Gate Signal
Proportional
Gate Current
Driver
Signal
G
Output
IG,steady
GR
S
Figure 25: Simplified Voltage Controlled Proportional Driver
C:2: Current Controlled Proportional Driver
The current controlled proportional driver relies on a low-loss transformer in the drain or source path to provide feedback ID of the
GA50SICP12-227 during on-state to supply IG,steady into the device gate. IG,steady will then increase or decrease in response to ID at a fixed forced
current gain which is set be the turns ratio of the transformer, hforce = ID / IG = N2 / N1. GA50SICP12-227 is initially tuned-on using a gate current
pulse supplied into an RC drive circuit to allow ID current to begin flowing. This topology allows IG,steady, and thus the gate drive power
consumption, to be reduced while ID is relatively low or for IG,steady to increase when is ID higher. A simplified version of this topology is shown in
Figure 26, additional information will be available in the future at http://www.genesicsemi.com/commercial-sic/sic-junction-transistors/.
N2
D
G
Gate Signal
GR
S
N3
N1
N2
Figure 26: Simplified Current Controlled Proportional Driver
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GA50SICP12-227
Section VI: Package Dimensions
SOT-227
PACKAGE OUTLINE
0.472 (11.9)
0.480 (12.19)
1.240 (31.5)
1.255 (31.88)
0.372 (9.45)
0.378 (9.60)
0.310 (7.87)
0.322 (8.18)
0.108 (2.74)
0.124 (3.15)
Ø 0.163 (4.14)
0.169 (4.29)
R 3.97
1.049 (26.6)
1.059 (26.90)
0.163 (4.14)
0.169 (4.29)
0.990 (25.1)
1.000 (25.40)
0.495 (12.5)
0.506 (12.85)
0.172 (4.37)
0.186 (4.72)
0.191 (4.85)
0.080 (2.03)
0.084 (2.13)
0.234 (5.94)
M4
0.165 (4.19)
0.169 (4.29)
0.164 (4.16)
0.174 (4.42)
0.030 (0.76)
0.033 (0.84)
0.588 (14.9)
0.594 (15.09)
1.186 (30.1)
1.192 (30.28)
1.494 (37.9)
1.504 (38.20)
NOTE
1. CONTROLLED DIMENSION IS INCH. DIMENSION IN BRACKET IS MILLIMETER.
2. DIMENSIONS DO NOT INCLUDE END FLASH, MOLD FLASH, MATERIAL PROTRUSIONS
Revision History
Date
Revision
Comments
2015/03/26
0
Initial release
Supersedes
Published by
GeneSiC Semiconductor, Inc.
43670 Trade Center Place Suite 155
Dulles, VA 20166
GeneSiC Semiconductor, Inc. reserves right to make changes to the product specifications and data in this document without notice.
GeneSiC disclaims all and any warranty and liability arising out of use or application of any product. No license, express or implied to any
intellectual property rights is granted by this document.
Unless otherwise expressly indicated, GeneSiC products are not designed, tested or authorized for use in life-saving, medical, aircraft
navigation, communication, air traffic control and weapons systems, nor in applications where their failure may result in death, personal
injury and/or property damage.
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GA50SICP12-227
Section VII: SPICE Model Parameters
This is a secure document. Please copy this code from the SPICE model PDF file on our website
(http://www.genesicsemi.com/images/products_sic/igbt_copack/GA50SICP12-227_spice.pdf)
into
LTSPICE (version 4) software for simulation of the GA50SICP12-227.
*
MODEL OF GeneSiC Semiconductor Inc.
*
$Revision: 1.0
$
*
$Date:
26-MAR-2015
$
*
*
GeneSiC Semiconductor Inc.
*
43670 Trade Center Place Ste. 155
*
Dulles, VA 20166
*
*
COPYRIGHT (C) 2014 GeneSiC Semiconductor Inc.
*
ALL RIGHTS RESERVED
*
* These models are provided "AS IS, WHERE IS, AND WITH NO WARRANTY
* OF ANY KIND EITHER EXPRESSED OR IMPLIED, INCLUDING BUT NOT LIMITED
* TO ANY IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A
* PARTICULAR PURPOSE."
* Models accurate up to 2 times rated drain current.
*
* Start of GA50SICP12-227 SPICE Model
*
.SUBCKT GA50SIPC12 DRAIN GATE SOURCE
Q1 DRAIN GATE SOURCE GA50SIPC12_Q
D1 SOURCE DRAIN GA50SIPC12_D1
D2 SOURCE DRAIN GA50SIPC12_D2
*
.model GA50SIPC12_Q NPN
+ IS
9.833E-48
ISE
1.073E-26
EG
3.23
+ BF
110
BR
0.55
IKF
9000
+ NF
1
NE
2
RB
0.95
+ RE
0.005
RC
0.014
CJC
2.398E-9
+ VJC
2.8346
MJC
0.4846
CJE
6.026E-09
+ VJE
3.1791
MJE
0.5295
XTI
3
+ XTB
-1.5
TRC1
9.0E-03
MFG GeneSiC_Semi
+ IRB
0.005
RBM
0.073
.MODEL GA50SIPC12_D1 D
+ IS
1.99E-16
RS
0.015652965
N
1
+ IKF
1000
EG
1.2
XTI
3
+ TRS1
0.0042
TRS2
1.3E-05
CJO
3.86E-09
+ VJ
1.362328465
M
0.48198551
FC
0.5
+ TT
1.00E-10
IAVE
50
.MODEL GA50SIPC12_D2 D
+ IS
1.54E-19
RS
0.1
N
3.941
+ EG
3.23
TRS1
-0.004
IKF
19
+ XTI
0
FC
0.5
TT
0
.ENDS
* End of GA50SICP12-227 SPICE Model
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