Submodule Screening H1, H2, H3

SUBMODULE SCREENING TEST PLAN
For Modules H1, H2 and H3
TEST
CONDITION
MIL-STD-750
TEST METHOD
Storage
TA = +175°C for 24 hours
1032
Temp Cycle
-65°C to +175°C, 20 cycles, 15 minutes each extreme
1051
Acceleration
20KG, Y1 axis, no hold time
2006
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
4016
4022
Pulse
20 pulses @ rated IPP, tp = 10 x 1000µs
Electrical
Reverse Current (IR) @ rated VWM
4016
Burn-In
TA = +125°C @ rated VWM for 96 hours
1038
Electrical
Reverse Current (IR) @ rated VWM, D-IR = 50% or 1µA, whichever is
greater
Breakdown Voltage (V(BR)) @ IT, D-V(BR) ±2% from initial reading
4016
-8
atmcc/sec
4022
Fine Leak
5 x 10
1071G/H
Gross Leak
TA = +125°C for 1 minute, no bubbles
1071C/D
Group A
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
Clamping Voltage (VC) @ IPP, tp = 10 x 1000µs
Forward Voltage (VF) @ IF, tp = 8.3ms
4016
4022
4011
Note: For bidirectional devices, test both polarities – split hours on Burn-in test and surge pulse to 50% each polarity.
Attributes Data Supplied
Module – H1, H2, H3
05231.R0 11/04
ProTek Devices
2929 S. Fair Lane ● Tempe, Arizona ● 85282
Tel: 602-431-8101 ● Fax: 602-431-2288
Email: [email protected] ● Web: www.protekdevices.com
1