Module Screening H2

MODULE SCREENING TEST PLAN
For Module H2
TEST
CONDITION
MIL-STD-750
TEST METHOD
Storage
TA = +150°C for 24 hours
1032
Temp Cycle
-65°C to +150°C, 10 cycles, 30 minutes each extreme
1051
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
4016
4022
Pulse
20 pulses @ rated IPP, tp = rated
Electrical
Reverse Current (IR) @ rated VWM
4016
Burn-In
TA = +125°C @ rated VWM for 96 hours
1038
Reverse Current (IR) @ rated VWM, D-IR = 50% or 1µA, whichever is
greater
Breakdown Voltage (V(BR)) @ IT, D-V(BR) ±2% from initial reading
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
Clamping Voltage (VC) @ IPP, tp = rated
Forward Voltage (VF) @ IF, tp = 8.3ms
4016
Electrical
Group A
4022
4016
4022
4011
Note: For bidirectional devices, test both polarities – split hours on Burn-in test and surge pulse to 50% each polarity.
Attributes Data Supplied
Module – H2
05233.R0 11/04
ProTek Devices
2929 S. Fair Lane ● Tempe, Arizona ● 85282
Tel: 602-431-8101 ● Fax: 602-431-2288
Email: [email protected] ● Web: www.protekdevices.com
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