MODULE SCREENING TEST PLAN For Module H2 TEST CONDITION MIL-STD-750 TEST METHOD Storage TA = +150°C for 24 hours 1032 Temp Cycle -65°C to +150°C, 10 cycles, 30 minutes each extreme 1051 Electrical Reverse Current (IR) @ rated VWM Breakdown Voltage (V(BR)) @ IT 4016 4022 Pulse 20 pulses @ rated IPP, tp = rated Electrical Reverse Current (IR) @ rated VWM 4016 Burn-In TA = +125°C @ rated VWM for 96 hours 1038 Reverse Current (IR) @ rated VWM, D-IR = 50% or 1µA, whichever is greater Breakdown Voltage (V(BR)) @ IT, D-V(BR) ±2% from initial reading Reverse Current (IR) @ rated VWM Breakdown Voltage (V(BR)) @ IT Clamping Voltage (VC) @ IPP, tp = rated Forward Voltage (VF) @ IF, tp = 8.3ms 4016 Electrical Group A 4022 4016 4022 4011 Note: For bidirectional devices, test both polarities – split hours on Burn-in test and surge pulse to 50% each polarity. Attributes Data Supplied Module – H2 05233.R0 11/04 ProTek Devices 2929 S. Fair Lane ● Tempe, Arizona ● 85282 Tel: 602-431-8101 ● Fax: 602-431-2288 Email: [email protected] ● Web: www.protekdevices.com 1