MIL PROCESSING GROUP B TEST PLAN FOR DLZ SERIES – H2 VERSIONS (Unidirectional) TEST CONDITION MIL-STD-750 TEST METHOD SUBGROUP1 Solderability 2026 Resistance to Solvents 1022 SUBGROUP 2 Temp Cycle 10 cylces, 15 minutes @ min/max rated temperatures 1051 Fine Leak 1 x 10-8 atmcc/sec 1071G/H Gross Leak TA = +125°C, no bubbles 1071D Electrical Reverse Current (IR) @ rated VWM Breakdown Voltage (V(BR)) @ IT 4016 4022 SUBGROUP 3 Electrical Reverse Current (IR) @ rated VWM Breakdown Voltage (V(BR)) @ IT Pulse 20 pulses @ IPP = 10A, tp = 8 x 20µs Electrical Reverse Current (IR) @ rated VWM 4016 Steady State Op-Life (HRTB) TA = +125°C @ rated VWM for 340 hours 1027 Electrical Reverse Current (IR) @ rated VWM, D-IR = 100% or 20% of Grp A Limit, Whichever is greater Breakdown Voltage (V(BR)) @ IT, D-V(BR) = ±5% from initial reading SAMPLE PLAN (Units) SMALL LOT (Units) 15 c=0 4 c=0 22 c=0 6 c=0 45 c=0 12 c=0 32 c=0 12 c=0 4016 4022 4016 4022 SUBGROUP 4 Decap, Internal Visual Design Verification, 1 device c=0 2075 Bond Strength 11 wires c=0 2037 SUBGROUP 5 Not Applicable SUBGROUP 6 Electrical Reverse Current (IR) @ rated VWM Breakdown Voltage (V(BR)) @ IT 4016 4022 High Temperature Life (no-op) Tstg = +150°C for 340 hours 1032 Electrical Reverse Current (IR) @ rated VWM, D-IR = 100% or 20% of Grp A Limit, Whichever is greater Breakdown Voltage (V(BR)) @ IT, D-V(BR) = ±5% from initial reading Sampling per MIL-PRF-19500 DLZ-H2 Group B(Unidirectional) 05228.R1 03/10 4016 4022 ProTek Devices 2929 S. Fair Lane ● Tempe, Arizona ● 85282 Tel: 602-431-8101 ● Fax: 602-431-2288 Email: [email protected] ● Web: www.protekdevices.com 1