Reliability Report (Q2015-011) IX2120 Product Qualification High Voltage IC to Drive High Speed MOSFETs and IGBTs October 15, 2015 IXYS Integrated Circuits Division 78 Cherry Hill Drive, Beverly, MA 01915 www.ixysic.com IX2120 High Voltage IC to Drive High Speed MOSFETs and IGBTs Summary The IX2120 product has successfully passed IXYS ICD’s requirements for product qualification. Table 1: Device Information Product Number Package Type Assembly Site Test Site IX2120 28L SOIC Atec, Laguna, Philippines IXYS ICD BEV, Beverly, MA, USA Table 2: Reliability Test Result Stress Test HTRB Stress Conditions Thermal Shock Temperature Cycle Hot Storage MSL Product/ Applicable Specs Package Mil-Std-883 IX2120 M1005 TE3508 JESD22-A-108 Sample # of Size (SS) Failures 105 1 0 to 100°C, 10/10 dwells, 15 cycles -55 to 125°C, 10/10 dwells, 300 cycles 125C, 1000 hrs Mil-Std-883, M1011 IX2120 TE3508 50 0 Mil-Std-883, M1010, “B” IX2120 TE3508 TE3546 IX2120 TE3508 50 0 50 0 IR Reflow, Level 1 J-STD-020D.1 IX2120 TE3541 TE3546 25 0 125°C, 80% WVDC, 1000 hrs JESD22-A103-C IXYS Integrated Circuits Division, Beverly, MA, USA 55 55 Report# Q2015-011 Page 2 of 4 IX2120 High Voltage IC to Drive High Speed MOSFETs and IGBTs Table 3: ESD Results – 28L SOIC Stress Test Stress Conditions HBM All Pins, 1.5kΩ, 100pF Applicable Specs Product/ Package Highest Passed Class JESD22A114-E IX2120 TE3508 +/-1000V 1B Table 4: FIT Rate Summary Qual Lot # 1 Stress Test HTRB # of Devices 105 # of Fail 1 Hours Tested 1000 Equivalent Dev. Hours 26,817,626 FIT Rate @ 60% CL 75.70* * HTRB FIT Rate was calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy at 125°C test temperature and 40°C use temperature. IXYS Integrated Circuits Division, Beverly, MA, USA Report# Q2015-011 Page 3 of 4 IX2120 High Voltage IC to Drive High Speed MOSFETs and IGBTs Approvals Prepared by: _Martha W. Brandt*_________________________________10/15/15_ Martha W. Brandt Date Quality Engineer Approved by: _George Belezos*__________________________________10/15/15__ George Belezos Date Quality Manager Approved by: _James Archibald*__________________________________10/15/15__ James Archibald Date Director of Engineering *Signature on File IXYS Integrated Circuits Division, Beverly, MA, USA Report# Q2015-011 Page 4 of 4