Reliability Report-IX21844 Qualification No: 2013-015 Reliability Report Reliability Data for IX21844 Report Title: Reliability Data for IX21844 Report Number: 2013-015 Date: 12/17/13 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 1 of 5 Reliability Report-IX21844 Qualification No: 2013-015 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division IX21844. The Reliability data presented here were collected during IXYS product qualification. The purpose of this qualification was to verify the IXYS Quality and Reliability requirements as outlined in IXYS internal specifications. The IX21844 silicon is manufactured at IXYS IC Division using the P32 process and assembled at Greatek in Taiwan. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS internal specification and with the approval of the product development team and quality assurance. Table 1: Product IX21844 Reliability Tests Stress Test HTRB Applicable Stress Specs Conditions Mil-Std-883 125°C, 80% 1000hrs HAST JESD22A110-C Thermal Shock (T/S) Thermal Shock (T/S) Temp Cycle (T/C) Mil-Std-883, M1011 Mil-Std-883, M1011 Mil-Std-883, N1010, “B” Temp Cycle Mil-Std-883, (T/C) N1010, “B” MSL MSL Hot Storage Hot Storage ESD HBM J-STD020D.1 J-STD020D.1 JESD22A103-C JESD22A103-C JESD22, A114-E Product/ Package IX21844N/ 14L SOIC IX21844G/ 14L DIP IX21844N/ 130°C, 85% 14L SOIC 18.8PSI, 96hrs IX21844G/ 14L DIP 0 to 100°C, 10/10 IX21844N dwells, 15 cycles 14L SOIC 0 to 100°C, 10/10 IX21844G dwells, 15 cycles 14L DIP -55 to 125°C, 10/10 IX21844N 14L SOIC dwells, 300 cycles -55 to 125°C, 10/10 IX21844G 14L DIP dwells, 300 cycles IR Reflow, IX21844N Level 1 14L SOIC IR Reflow, IX21844G Level 1 14L DIP 125C, 1000 hrs IX21844N 14L SOIC 125C, 1000 hrs IX21844G 14L DIP IX21844N 1.5kΩ, 100pF 14L SOIC Number Sample Total of Lots Size (SS) SS 2 111, 113 224 3 110, 99, 102 311 1 55 55 1 55 55 1 55 55 2 55 110 1 50 50 1 50 50 1 50 50 1 50 50 1 15 15 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 2 of 5 Reliability Report-IX21844 Qualification No: 2013-015 Reliability Test Results: The stress tests and associated results for the product IX21844 qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product IX21844 Reliability Test Results Stress Test HTRB Product/Kit Number IX21844N GE0029 HTRB IX21844N GE0032 HAST IX21844N GE0029 HAST HAST IX21844N GE0029 IX21844G GE0033 Thermal Shock IX21844N GE0029 Thermal Shock IX21844G GE0032 Temp Cycle IX21844N GE0029 Temp Cycle IX21844G GE0032 Temp Cycle IX21844G GE0033 MSL IX21844G GE0030 MSL IX21844N GE0029 Hot Storage IX21844N GE0029 Hot Storage IX21844G GE0030 Readpoint / (Reject/ SS) 1000 hrs. 0/111 1000 hrs. 1/113 96 hrs. Comments Qual Lot#1 Data Qual Lot#2 Data Failure for IQCC Qual Lot#1 Data 0/110 96 hrs Qual Lot#2 Data 0/99 96 hrs Qual Lot#3 Data 0/102 15 Cycles 0/55 15 Cycles 0/55 300 Cycles 0/55 300 Cycles 0/55 300 Cycles 0/55 Level 1 0/50 Level 1 0/50 1000 hrs 0/50 1000 hrs 1/50 Qual Lot#1 Data Qual Lot#2 Data Qual Lot#1 Data Qual Lot#2 Data Qual Lot#3 Data Qual Lot #1 Data Qual Lot #2 Data Qual Lot #1 Data Qual Lot #2 Data Failure for IQBS IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 3 of 5 Reliability Report-IX21844 Qualification No: 2013-015 ESD Testing Results: As part of this qualification, the product IX21844 was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-2000V testing. Table3: Product IX21844 ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Model Number Spec Network Passed HBM IX21844N 14L SOIC JESD22, 2000V 1.5kΩ, GE0029 A114-E 100pF Class 1C FIT (Failure in Time) Rate on the Product IX21844: Table 4 summarizes the number of devices used for the product IX21844 reliability stress with associated failures. Using the HTRB data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperature. For HAST stress, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV activation energy for 130°C test temperature and 40°C use temperature. The calculated FITs from the reliability stress came out to be 35.48 and 21.52 for HTRB and HAST, respectively. Table 4: Product IX21844 FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTRB IX21844 GE0029 GE0032 224 HAST IX21844 GE0029 GE0033 311 1 1000 Equivalent Dev. Hours FIT Rate @ 60% CL 57,210,936 35.48 1.4318E 42,747,390 +03 21.52 0.7 255.41 0 96 0.7 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 4 of 5 Reliability Report-IX21844 Qualification No: 2013-015 Conclusion: The qualification of the product IX21844 has been successfully completed for the production release. APPROVAL: Prepared by: _Martha W. Brandt*_________________________________12/17/13_ Martha W. Brandt Date Quality Engineer Approved by: _Ajit Patel*________________________________________12/17/13_ Ajit Patel Date Product Engineer Approved by: _Ronald P. Clark*___________________________________12/17/13_ Ronald P. Clark Date Director of Quality Approved by: _James Archibald*__________________________________12/17/13__ James Archibald Date Director of Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 5 of 5