CPC1540

Reliability Report: CPC1540 6 Pin DIP
Qualification Report No.: 2010-017
Reliability Report
Reliability Data for CPC1540
6 Pin DIP Product
Report Title:
Reliability Data for CPC1540
6 Pin DIP Product
Report Number:
2010-017
Date:
9/19/11
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com
Page 1 of 5
Reliability Report: CPC1540 6 Pin DIP
Qualification Report No.: 2010-017
Introduction:
This report summarizes the Reliability data of Clare’s CPC1540. The Reliability data
presented here were collected during Clare’s product qualification. The purpose of this
qualification was to verify Clare’s Quality and Reliability requirements as outlined in
Clare’s internal specifications. The CPC1540 Gate Driver is manufactured at Clare and
assembled at ATEC in the Philippines. The process is Clare P10 and CPC1540 is available
in a 6 Pin DIP package type.
Reliability Tests:
Table 1 below provides the qualification tests that were performed. The stress tests and
sample size are chosen based on the Clare’s specification P-04-25-WW, “Reliability, Risk
Analysis and Qualification Procedure” and with the approval of the product development
team and quality assurance.
Table 1: CPC1540 Reliability Tests
Product Package Stress Test
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
Applicable Specs
and Readpoints
JESD22-A108
Stress
# Lots Sample Size
Conditions
HTRB
125C, 80%
3
90
WVDC,
1000 hrs
1
77
THB
JESD22,
85°C, 85%
A101
1000 hrs
Thermal Shock Mil-Std-883,
1
55
0 to 100°C,
M1011
10/10 dwells,
15 cycles
3
55
Temp Cycle
Mil-Std-883, N1010,-55 to 125°C,
“B”
10/10 dwells,
300 cycles
MSL
J-STD-020D.1
IR Reflow,
2
50
Level 1,
Level 3
High
JESD22-A103C
1
50
125°C,
Temp Storage
1000hrs
ESD
JESD22,
3
6
1.5kΩ, 100pF
HBM
A114-E
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com
Page 2 of 5
Total
270
77
55
165
100
50
18
Reliability Report: CPC1540 6 Pin DIP
Qualification Report No.: 2010-017
Reliability Test Results:
The stress tests and associated results for CPC1540 qualification are summarized in Table 2.
The devices chosen for the qualification were from standard material manufactured through
normal production test flow and electrically tested to datasheet limits prior to stressing.
Then reliability stresses were conducted and electrically tested to datasheet limit at each
interval and final readpoints.
Table 2: CPC1540 Reliability Test Results
Product/
Package
Stress/
Kits
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
HTRB
TE3089
HTRB
TE3113
HTRB
TE3114
THB
TE3089
Thermal
Shock
TE3089
Temp
Cycle
TE3089
Temp
Cycle
TE3113
Temp
Cycle
TE3114
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
CPC1540
6 Pin DIP
MSL 1
TE3089
CPC1540
6 Pin DIP
MSL 3
TE3089
CPC1540
6 Pin DIP
High
Temp
Storage
TE3089
Readpoint 1 Readpoint 2 Readpoint 3
/ Reject/
/ Reject/
/ Reject/
SS
SS
SS
168 hrs.
500 hrs.
1000 hrs.
0/90
0/90
0/90
168 hrs.
500 hrs.
1000 hrs.
0/90
0/90
0/90
168 hrs.
500 hrs.
1000 hrs.
0/90
0/90
0/90
168 hrs.
0/77
15 Cycles
0/55
Comments
300 Cycles
0/55
300 Cycles
0/55
(3) Failures:
Ball Bond
break at neck
Ref Report
FA11-114
300 Cycles
3/55
IR Reflow
Level 1
0/50
IR Reflow
Level 2
0/50
168 hrs.
0/50
500 hrs.
0/50
1000 hrs.
0/50
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com
Page 3 of 5
Reliability Report: CPC1540 6 Pin DIP
Qualification Report No.: 2010-017
ESD Testing Results:
As part of this qualification, the product CPC1540 was subjected to Human Body Model
(HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The
results are summarized in Table 3. All samples were electrically tested to data sheet limits
before and after ESD stressing and they passed after +/- 8000V zapping.
ESD
Model
HBM
Table3: Product CPC1540 ESD Characterization Results
Kit
Package
ESD Test
RC
Highest
Class
Number
Spec
Network Passed
CPC1540 6 Pin Dip
8000V
3A
JESD22,
1.5kΩ,
TE3034
A114-E
100pF
TE3113
TE3114
FIT (Failure in Time) Rate of CPC1540
Table 4 below summarizes the FIT rate from the HTRB data. Using the Reliability HTRB
data, FIT rate was calculated based on the equivalent device hours at use condition of 40°C
and stressed condition of 125°C at 0.7eV of activation energy according to the Clare’s
procedure P-04-25-WW. The FIT rate came out to be 13.34 FITs.
Product/
Stress
CPC1540/
HTRB
Table 4: CPC1540 FIT Rate Summary
Lot
# of
# of
Hours Test
Number Devices Failed Tested Temp
(°° C)
TE3089
270
0
1000
125
TE3113
TE3114
Eq. Device
Hours
68,959,611
Conclusion:
The qualification of the product CPC1540 has been successfully completed for the
production release.
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com
Page 4 of 5
FITs
@ 60%
CL
13.34
Reliability Report: CPC1540 6 Pin DIP
Qualification Report No.: 2010-017
APPROVAL:
Prepared by: _Martha W. Brandt*_______________9/19/11_______
Martha W. Brandt
Quality Engineer
Date
Approved by: __Ronald P. Clark*________________9/22/11_______
Ronald P. Clark
Director of Quality
Date
Approved by: _Eirik Gude*
9/22/11_______
Date
Eirik Gude
Sr. Design Engineer
Approved by: _James Archibald*____________ ___ 9/22/11_______
James Archibald
Date
Director of Development Engineering
*Signature on File
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, www.ixysic.com
Page 5 of 5