Crystal-to-0.7V Differential HCSL/ LVCMOS Frequency Synthesizer ICS841S012DI DATA SHEET GENERAL DESCRIPTION FEATURES The ICS841S012DI is an optimized PCIe, sRIO ICS and Gigabit Ethernet Frequency Synthesizer and HiPerClockS™ a member of HiperClock s™ family of high performance clock solutions from IDT. The ICS841S012DI uses a 25MHz parallel resonant crystal to generate 33.33MHz - 200MHz clock signals, replacing multiple oscillators and fanout buffer solutions. The device supports ±0.25% center-spread, and -0.5% down-spread clocking with two spread select pins (SSC[1:0]). The VCO operates at a frequency of 2GHz. The device has three output banks: Bank A with two 100MHz – 250MHz HCSL outputs; Bank B with seven 33.33MHz – 200MHz LVCMOS/ LVTTL outputs; and Bank C with one 33.33MHz – 200MHz LVCMOS/LVTTL output. • Two 0.7V differential HCSL outputs (Bank A), configurable for PCIe (100MHz or 250MHz) and sRIO (100MHz or 125MHz) clock signals Eight LVCMOS/LVTTL outputs (Banks B/C), 18Ω typical output impedance Two REF_OUT LVCMOS/LVTTL clock outputs, 23Ω typical output impedance • Selectable crystal oscillator interface, 25MHz, 18pF parallel resonant crystal or one LVCMOS/LVTTL single-ended reference clock input • Supports the following output frequencies: HCSL Bank A: 100MHz, 125MHz, 200MHz and 250MHz LVCMOS/LVTTL Bank B/C: 33.33MHz, 50MHz, 66.67MHz, 100MHz, 125MHz, 133.33MHz, 166.67MHz and 200MHz All Banks A, B and C have their own dedicated frequency select pins and can be independently set for the frequencies mentioned above. The low jitter character istic of the ICS841S012DI makes it an ideal clock source for PCIe, sRIO and Gigabit Ethernet applications. Designed for networking and industrial applications, the ICS841S012DI can also drive the high-speed clock inputs of communication processors, DSPs, switches and bridges. • VCO: 2GHz • Spread spectrum clock: ±0.25% center-spread (typical) and -0.6% down-spread (typical) • PLL bypass and output enable • RMS period jitter: 10ps (typical), QAx/nQAx outputs • Full 3.3V supply mode • -40°C to 85°C ambient operating temperature • Available in lead-free (RoHS 6) package VDDOB VDDOB QB6 GND QB5 VDDOB QB4 GND QB3 VDDOB QB2 GND QB1 QB0 PIN ASSIGNMENT 56 55 54 53 52 51 50 49 48 47 46 45 44 43 VDD_REFOUT REF_OUT0 1 2 42 REF_OUT1 GND GND 3 4 5 6 7 8 9 10 11 40 39 38 ICS841S012DKI REVISION A JULY 20, 2009 1 56-Lead VFQFN 8mm x 8mm x 0.925mm package body K Package Top View 37 36 35 34 33 32 31 30 29 VDDOC QC GND QBC_OE VDDA VDDA GND GND IREF QA0 nQA0 QA1 nQA1 VDD GND VDD F_SELB2 F_SELB1 F_SELB0 F_SELC2 F_SELC1 F_SELC0 F_SELA1 F_SELA0 QA_OE 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 GND REF_OE nMR VDD ICS841S012DI SSC1 SSC0 REF_IN VDD REF_SEL XTAL_IN XTAL_OUT BYPASS 41 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER BLOCK DIAGRAM QA_OE Pullup F_SELA[1:0] Pulldown BYPASS Pulldown 2 QA0 nQA0 ÷NA 25MHz XTAL_IN OSC nQA1 1 0 PLL VCO XTAL_OUT 2GHz REF_IN Pulldown REF_SEL Pulldown QA1 QB0 0 1 QB1 QB2 M = ÷80 QB3 ÷NB QB4 F_SELB[2:0] Pulldown 3 QB5 IREF QB6 ÷NC F_SELC[2:0] Pulldown nMR Pullup QBC_OE Pullup SSC[1:0] Pullup QC 3 2 Spread Spectrum REF_OUT0 REF_OUT1 REF_OE Pulldown ICS841S012DKI REVISION A JULY 20, 2009 2 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER TABLE 1. PIN DESCRIPTIONS Number Name Type 1 VDD_REFOUT Power Output supply pin for REF_OUT. 7, 14, 28, 29 2, 3 4, 5, 15, 27, 35, 36, 40, 46, 50, 54 6 VDD REF_OUT0, REF_OUT1 Power Core supply pins. Single-ended LVCMOS/LVTTL reference clock outputs. 23Ω typical output impedance. Output GND Power REF_IN Input 8 REF_SEL Input 9, 10 XTAL_IN, XTAL_OUT Input 11 BYPASS Input 12 REF_OE Input 13 nMR Input 16, 17 18, 19, 20 21, 22, 23 24, 25 SSC1, SSC0 F_SELB2, F_SELB1, F_SELB0 F_SELC2, F_SELC1, F_SELC0 F_SELA1, F_SELA0 26 Description Power supply ground. Pulldown Single-ended LVCMOS/LVTTL reference clock input. Reference select pin. When HIGH selects REF_IN. When LOW, Pulldown selects cr ystal. LVCMOS/LVTTL interface levels. See Table 3E. Cr ystal oscillator interface. XTAL_OUT is the output. XTAL_IN is the input. External tuning capacitor must be used for proper operation. When HIGH bypasses PLL. When LOW, selects PLL. Pulldown LVCMOS/LVTTL interface levels. See Table 3J. Active HIGH REF_OUT enables/disables pin. Pulldown LVCMOS/LVTTL interface levels. See Table 3H. Active LOW Master Reset. When logic LOW, the internal dividers are reset and the outputs are in high impedance (HI-Z). When logic HIGH, the Pullup internal dividers and the outputs are enabled. LVCMOS/LVTTL interface levels. See Table 3I. Input Pullup SSC control pin. LVCMOS/LVTTL interface levels. See Table 3D. Input Pulldown Frequency select pins for QBx outputs. See Table 3B. LVCMOS/LVTTL interface levels. Input Pulldown Frequency select pins for QC output. See Table 3C. LVCMOS/LVTTL interface levels. Input Pulldown QA_OE Input Pullup 30, 31 32, 33 nQA1, QA1 nQA0, QA0 Output 34 IREF Output 37, 38 VDDA Power 39 QBC_OE Input 41 QC Output 42 VDDOC Power Frequency select pins for QAx/nQAx outputs. See Table 3A. LVCMOS/LVTTL interface levels. Output enable pin for Bank A outputs. See Table 3F. LVCMOS/LVTTL interface levels. Differential Bank A clock outputs. HCSL interface levels. Pullup External fixed precision resistor (475Ω) from this pin to ground provides a reference current used for differential current-mode QAx/nQAx clock outputs. Analog supply pin. Output enable pin for Bank B and Bank C outputs. LVCMOS/LVTTL Interface levels. See Table 3G. Single-ended Bank C clock output. LVCMOS/LVTTL interface levels. 18Ω typical output impedance. Output supply pin for QC LVCMOS output. 43, 48, 52, 56 VDDOB Power Output supply pins for QBx LVCMOS outputs. 44, 45, QB0, QB1, Single-ended Bank B clock outputs. LVCMOS/LVTTL interface levels. 47, 49, QB2, QB3, Output 18Ω typical output impedance. 51, 53, 55 QB4, QB5, QB6 NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values. ICS841S012DKI REVISION A JULY 20, 2009 3 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER TABLE 2. PIN CHARACTERISTICS Symbol Parameter CIN Input Capacitance Test Conditions CPD Power Dissipation Capacitance QB[0:6], QC Minimum Typical VDD, VDD_REFOUT, VDDOB, VDDOC = 3.465V Maximum Units 4 pF 19 pF RPULLUP Input Pullup Resistor 51 kΩ RPULLDOWN Input Pulldown Resistor 51 kΩ ROUT Output Impedance QB[0:6], QC 18 Ω REF_OUT[1:0] 23 Ω TABLE 3A. F_SELA FREQUENCY SELECT FUNCTION TABLE Inputs Output Frequency (25MHz Ref.) F_SELA1 F_SELA0 M Divider Value NA Divider Value QA[0:1]/nQA[0:1] (MHz) L L 80 20 100 (default) L H 80 16 125 H L 80 10 200 H H 80 8 250 TABLE 3B. F_SELB FREQUENCY SELECT FUNCTION TABLE Inputs Output Frequency (25MHz Ref.) F_SELB2 F_SELB1 F_SELB0 M Divider Value NB Divider Value QB[0:6] (MHz) L L L 80 60 33.33 (default) L L H 80 40 50 L H L 80 30 66.67 L H H 80 20 10 0 H L L 80 16 125 H L H 80 15 133.33 H H L 80 12 166.67 H H H 80 10 200 TABLE 3C. F_SELC FREQUENCY SELECT FUNCTION TABLE Inputs Output Frequency (25MHz Ref.) F_SELC2 F_SELC1 F_SELC0 M Divider Value NC Divider Value QC (MHz) L L L 80 60 33.33 (default) L L H 80 40 50 L H L 80 30 66.67 L H H 80 20 100 H L L 80 16 125 H L H 80 15 133.33 H H L 80 12 166.67 H H H 80 10 200 ICS841S012DKI REVISION A JULY 20, 2009 4 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER TABLE 3D. SSC FUNCTION TABLE TABLE 3E. REF_SEL FUNCTION TABLE Input Input SSC1 0 SSC0 0 Mode 0 to -0.5% Down-spread 0 1 1 0 ±0.25% Center-spread 1 1 SSC Off (default) ±0.25% Center-spread TABLE 3F. QA_OE FUNCTION TABLE REF_SEL 0 Input Reference 1 REF_IN XTAL TABLE 3G. QBC_OE FUNCTION TABLE Input QA_OE 0 1(default) Input Function QBC_OE 0 Function QA[0:1]/nQA[0:1] disabled (High-Impedance) QA[0:1]/nQA[0:1] enabled 1 (default) QB[0:6] and QC enabled TABLE 3H. REF_OE FUNCTION TABLE TABLE 3I. nMR FUNCTION TABLE Input REF_OE 0 (default) 1 QB[0:6] and QC disabled (High-Impedance) Input Function Function Device reset, output divider disabled 0 (High-Impedance) 1 (default) Output enabled NOTE: This device requires a reset signal after power-up to function properly. nMR REF_OUT[0:1] disabled (High-Impedance REF_OUT[0:1] enabled TABLE 3J. BYPASS FUNCTION TABLE Input BYPASS 0 (default) 1 Function PLL Bypass (reference ÷N) ICS841S012DKI REVISION A JULY 20, 2009 5 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER ABSOLUTE MAXIMUM RATINGS Supply Voltage, VDD 4.6V Inputs, VI -0.5V to VDD + 0.5 V Outputs, VO -0.5V to VDDO + 0.5V NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability. Package Thermal Impedance, θJA 31.4°C/W (0 mps) Storage Temperature, TSTG -65°C to 150°C TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDD_REFOUT = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C Symbol VDD Parameter Core Supply Voltage VDDA Test Conditions Minimum 3.135 Typical 3. 3 Maximum 3.465 Units V Analog Supply Voltage VDD – 0.20 3. 3 VDD V VDDOB, VDDOC Output Supply Voltage 3.135 3.3 3.465 V IDD Power Supply Current 300 mA IDDA Analog Supply Current 20 mA HCSL Loaded, LVCMOS No Load TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = VDD_REFOUT = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C Symbol Parameter Test Conditions Minimum Typical Maximum Units VIH Input High Voltage 2 VDD + 0.3 V VIL Input Low Voltage -0.3 0.8 V VDD = VIN = 3.465V 10 µA VDD = VIN = 3.465V 150 µA IIH IIL Input High Current Input Low Current QA_OE, QBC_OE, nMR, SSC0, SSC1, F_SELA[0:1], F_SELB[0:2]. F_SELC[0:2], REF_OE, BYPASS, REF_IN, REF_SEL QA_OE, QBC_OE, nMR, SSC0, SSC1, VDD = 3.465V, VIN = 0V -150 µA F_SELA[0:1], F_SELB[0:2]. F_SELC[0:2], REF_OE, BYPASS, REF_IN, REF_SEL VDD = 3.465V, VIN = 0V -1 0 µA 2.6 V VOH Output High Voltage VDDOB, VDDOC = IOH = -2mA VOL Output Low Voltage VDDOB, VDDOC = IOL = 2mA 0.5 V Maximum Units TABLE 5. CRYSTAL CHARACTERISTICS Parameter Test Conditions Mode of Oscillation Minimum Typical Fundamental Frequency 25 MHz Equivalent Series Resistance (ESR) 50 Ω Shunt Capacitance 7 pF 100 µW Drive Level NOTE: Characterized using an 18pF parallel resonant cr ystal. ICS841S012DKI REVISION A JULY 20, 2009 6 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER TABLE 6. AC CHARACTERISTICS, VDD = VDD_REFOUT = VDDOB = VDDOC = 3.3V±5%, TA = -40°C TO 85°C Symbol Parameter Test Conditions QB[0:6] fOUT Output Frequency QA[0:1]/nQA[0:1] QC Minimum Maximum Units 33.33 200 MHz 100 250 MHz 33.33 200 MHz QB[0:6] 50 ps QA[0:1]/nQA[0:1] 50 ps 160 ps 65 ps tsk(b) Bank Skew; NOTE 1, 2 tsk(o) Output Skew; NOTE 1, 3 tjit(cc) Cycle-to-Cycle Jitter ; NOTE 1 QA[0:1]/nQA[0:1] tjit(per) RMS Period Jitter QB[0:6] FM QC SSC Modulation Banks A, B, C Frequency Voltage High; NOTE 4, 5 across Banks B and C (at Same Frequency) All Outputs at Same Frequency QA[0:1]/nQA[0:1] VHIGH VLOW VCROSS ΔVCROSS tR / tF Typical Voltage Low; NOTE 4, 6 Absolute Crossing Voltage; NOTE 4, 7, 8 Total Variation of VCROSS over all edges; NOTE 4, 7, 9 Bank A Output Rise/Fall Time Banks B, C 10 ps 20 ps 20 ps 29 33.33 kHz 580 1200 mV REF_OE = 0, All Outputs at Same Frequency -150 200 mV 600 mV 200 mV ±150mV from crosspoint 25 100 ps 20% - 80% 0.4 1.3 ns Bank A 45 55 % odc Output Duty Cycle Banks B, C 42 58 % NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. NOTE 1: This parameter is defined in accordance with JEDEC Standard 65. NOTE 2: Defined as skew within a bank of outputs at the same supply voltage and with equal load conditions. NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions. Measured at VDDOB, C/2. NOTE 4: Measurement taken from single-ended waveform. NOTE 5: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section. NOTE 6: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section. NOTE 7: Measured at crossing point where the instantaneous voltage value of the rising edge of Qx equals the falling edge of nQx. See Parameter Measurement Information Section. NOTE 8: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing points for this measurement. See Parameter Measurement Information Section. NOTE 9: Defined as the total variation of all crossing voltage of rising Qx and falling nQx. This is the maximum allowed variance in the VCROSS for any par ticular system. See Parameter Measurement Information Section. ICS841S012DKI REVISION A JULY 20, 2009 7 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER PARAMETER MEASUREMENT INFORMATION 3.3V±5% 1.65V±5% 3.3V±5% 1.65V±5% VDD, VDDOB, VDDOC SCOPE VDD 0Ω 50Ω Measurement Point 50Ω Measurement Point VDDA VDDA 49.9Ω Qx 2pF HCSL LVCMOS 0Ω GND GND 49.9Ω RREF = 475Ω 2pF -1.65V±5% 0V 3.3V CORE/3.3V LVCMOS OUTPUT LOAD AC TEST CIRCUIT 3.3V CORE/3.3V HCSL OUTPUT LOAD AC TEST CIRCUIT VOH nQx VREF Qx VOL 1σ contains 68.26% of all measurements 2σ contains 95.4% of all measurements 3σ contains 99.73% of all measurements 4σ contains 99.99366% of all measurements 6σ contains (100-1.973x10-7)% of all measurements nQy Qy tsk(o) Histogram Reference Point Mean Period (Trigger Edge) (First edge after trigger) HCSL OUTPUT SKEW RMS PERIOD JITTER Qx:Qx VDDOX 2 V DDOX Qx 2 VDDOX 2 Qx:Qx V DDOX Qy tsk(b) 2 tsk(o) (where X = Bank B or Bank C) LVCMOS BANK SKEW LVCMOS OUTPUT SKEW ICS841S012DKI REVISION A JULY 20, 2009 8 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER PARAMETER MEASUREMENT INFORMATION, CONTINUED nQA0, nQA1 80% 80% tR tF QA0, QA1 ➤ ➤ tcycle n tcycle n+1 QC, QB0:QB6 ➤ ➤ tjit(cc) = tcycle n – tcycle n+1 1000 Cycles 20% 20% LVCMOS RISE/FALL TIME DIFFERENTIAL CYCLE-TO-CYCLE JITTER VMAX nQ nQ VCROSS_MAX VCROSS_DELTA VCROSS_MIN Q Q VMIN SINGLE-ENDED MEASUREMENT POINTS FOR ABSOLUTE CROSS POINT AND SWING SINGLE-ENDED MEASUREMENT POINTS FOR DELTA CROSS POINT Clock Period (Differential) V DDOX QC, QB0:QB6 Positive Duty Cycle (Differential) 2 t PW t Negative Duty Cycle (Differential) PERIOD 0.0V odc = t PW x 100% Q - nQ t PERIOD LVCMOS OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD Rise Edge Rate DIFFERENTIAL MEASUREMENT POINTS FOR DUTY CYCLE/PERIOD Fall Edge Rate +150mV 0.0V -150mV Q - nQ DIFFERENTIAL MEASUREMENT POINTS FOR RISE/FALL TIME ICS841S012DKI REVISION A JULY 20, 2009 9 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER APPLICATION INFORMATION POWER SUPPLY FILTERING TECHNIQUES As in any high speed analog circuitry, the power supply pins are vulnerable to random noise. To achieve optimum jitter performance, power supply isolation is required. The ICS841S012DI provides separate power supplies to isolate any high switching noise from the outputs to the internal PLL. VDD, VDDA, VDDOB, and V DDOC should be individually connected to the power supply plane through vias, and 0.01µF bypass capacitors should be used for each pin. Figure 1 illustrates this for a generic VDD pin and also shows that VDDA requires that an additional10Ω resistor along with a 10µF bypass capacitor be connected to the VDDA pin. 3.3V VDD .01μF 10Ω VDDA .01μF 10μF FIGURE 1. POWER SUPPLY FILTERING RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS INPUTS: OUTPUTS: CRYSTAL INPUTS For applications not requiring the use of the crystal oscillator input, both XTAL_IN and XTAL_OUT can be left floating. Though not required, but for additional protection, a 1kΩ resistor can be tied from XTAL_IN to ground. LVCMOS OUTPUTS All unused LVCMOS output can be left floating. We recommend that there is no trace attached. DIFFERENTIAL OUTPUTs All unused differential outputs can be left floating. We recommend that there is no trace attached. Both sides of the differential output pair should either be left floating or terminated. REF_IN INPUT For applications not requiring the use of the reference clock, it can be left floating. Though not required, but for additional protection, a 1kΩ resistor can be tied from the REF_IN to ground. LVCMOS CONTROL PINS All control pins have internal pull-ups or pull-downs; additional resistance is not required but can be added for additional protection. A 1kΩ resistor can be used. ICS841S012DKI REVISION A JULY 20, 2009 10 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER CRYSTAL INPUT INTERFACE The ICS841S012DI has been characterized with 18pF parallel resonant crystals. The capacitor values shown in Figure 2 below were determined using a 25MHz, 18pF parallel resonant crystal and were chosen to minimize the ppm error. NOTE: External tuning capacitors must be used for proper operations. XTAL_IN C1 15p X1 18pF Parallel Crystal XTAL_OUT C2 22p FIGURE 2. CRYSTAL INPUT INTERFACE LVCMOS TO XTAL INTERFACE equals the transmission line impedance. In addition, matched termination at the crystal input will attenuate the signal in half. This can be done in one of two ways. First, R1 and R2 in parallel should equal the transmission line impedance. For most 50Ω applications, R1 and R2 can be 100Ω. This can also be accomplished by removing R1 and making R2 50Ω. By overdriving the crystal oscillator, the device will be functional, but note the device performance is guaranteed by using a quartz crystal. The XTAL_IN input can accept a single-ended LVCMOS signal through an AC coupling capacitor. A general interface diagram is shown in Figure 3. The XTAL_OUT pin can be left floating. The input edge rate can be as slow as 10ns. For LVCMOS signals, it is recommended that the amplitude be reduced from full swing to half swing in order to prevent signal interference with the power rail and to reduce noise. This configuration requires that the output impedance of the driver (Ro) plus the series resistance (Rs) VDD VDD R1 Ro .1uf Rs Zo = 50 XTAL_IN R2 Zo = Ro + Rs XTAL_OUT FIGURE 3. GENERAL DIAGRAM FOR LVCMOS DRIVER TO XTAL INPUT INTERFACE ICS841S012DKI REVISION A JULY 20, 2009 11 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER SPREAD SPECTRUM The ICS841S012DI triangle modulation frequency deviation will not exceed 0.7% down-spread from the nominal clock frequency (+0.0% / -0.5%). An example of the amount of down spread relative to the nominal clock frequency can be seen in the frequency domain, as shown in Figure 4B. The ratio of this width to the fundamental frequency is typically 0.4%, and will not exceed 0.7%. The resulting spectral reduction will be greater than 5dB, as shown in Figure 4B. It is important to note the ICS841S012DI 5dB minimum spectral reduction is the component-specific EMI reduction, and will not necessarily be the same as the system EMI reduction. Spread-spectrum clocking is a frequency modulation technique for EMI reduction. When spread-spectrum is enabled, a 32kHz triangle waveform is used with 0.6% down-spread (+0.0% / 0.5%) from the nominal output frequency. An example of a triangle frequency modulation profile is shown in Figure 4A below. The ramp profile can be expressed as: • Fnom = Nominal Clock Frequency in Spread OFF mode • Fm = Nominal Modulation Frequency (30kHz) • δ = Modulation Factor (0.6% down spread) 1, 2Fm (1 - δ) fnom - 2 Fm x δ x Fnom x t when 1 < t < 1 2Fm Fm ➤ (1 - δ) fnom + 2 Fm x δ x Fnom x t when 0 < t < Fnom Frequency Δ − 10 dBm B A (1 - δ) Fnom 1/fm ➤ 0.5/fm ➤ δ = .6% ➤ Time FIGURE 4A. TRIANGLE FREQUENCY MODULATION FIGURE 4B. 200MHZ CLOCK OUTPUT IN FREQUENCY DOMAIN (A) SPREAD -S PECTRUM OFF (B) SPREAD -S PECTRUM ON ICS841S012DKI REVISION A JULY 20, 2009 12 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER VFQFN EPAD THERMAL RELEASE PATH are application specific and dependent upon the package power dissipation as well as electrical conductivity requirements. Thus, thermal and electrical analysis and/or testing are recommended to determine the minimum number needed. Maximum thermal and electrical performance is achieved when an array of vias is incorporated in the land pattern. It is recommended to use as many vias connected to ground as possible. It is also recommended that the via diameter should be 12 to 13mils (0.30 to 0.33mm) with 1oz copper via barrel plating. This is desirable to avoid any solder wicking inside the via during the soldering process which may result in voids in solder between the exposed pad/ slug and the thermal land. Precautions should be taken to eliminate any solder voids between the exposed heat slug and the land pattern. Note: These recommendations are to be used as a guideline only. For further information, refer to the Application Note on the Surface Mount Assembly of Amkor’s Thermally/ Electrically Enhance Leadframe Base Package, Amkor Technology. In order to maximize both the removal of heat from the package and the electrical perfor mance, a land patter n must be incorporated on the Printed Circuit Board (PCB) within the footprint of the package corresponding to the exposed metal pad or exposed heat slug on the package, as shown in Figure 5. The solderable area on the PCB, as defined by the solder mask, should be at least the same size/shape as the exposed pad/slug area on the package to maximize the thermal/electrical performance. Sufficient clearance should be designed on the PCB between the outer edges of the land pattern and the inner edges of pad pattern for the leads to avoid any shorts. While the land pattern on the PCB provides a means of heat transfer and electrical grounding from the package to the board through a solder joint, thermal vias are necessary to effectively conduct from the surface of the PCB to the ground plane(s). The land pattern must be connected to ground through these vias. The vias act as “heat pipes”. The number of vias (i.e. “heat pipes”) PIN PIN PAD SOLDER EXPOSED HEAT SLUG GROUND PLANE SOLDER LAND PATTERN THERMAL VIA PIN PIN PAD (GROUND PAD) FIGURE 5. P.C.ASSEMBLY FOR EXPOSED PAD THERMAL RELEASE PATH –SIDE VIEW (DRAWING NOT TO SCALE) ICS841S012DKI REVISION A JULY 20, 2009 13 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER RECOMMENDED TERMINATION Figure 6A is the recommended termination for applications which require the receiver and driver to be on a separate PCB. All traces should be 50Ω impedance. FIGURE 6A. RECOMMENDED TERMINATION Figure 6B is the recommended termination for applications which require a point to point connection and contain the driver and receiver on the same PCB. All traces should all be 50Ω impedance. FIGURE 6B. RECOMMENDED TERMINATION ICS841S012DKI REVISION A JULY 20, 2009 14 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER SCHEMATIC EXAMPLE Figure 7 shows an example of the ICS841S012DI application schematic. In this example, the device is operated at VD D= VDDOB = VDDOC = 3.3V. The 18pF parallel resonant 25MHz crystal is used. The C1= 33pF and C2 = 33pF are recommended for frequency accuracy. For different board layouts, the C1 and C2 may be slightly adjusted for optimizing frequency accuracy. Two examples of HCSL and one example of LVCMOS termination are shown in this schematic. The decoupling capacitors should be located as close as possible to the power pin. Logic Control Input Examples R1 35 Zo = 50 QB0 Set Logic Input to '1' VDD Set Logic Input to '0' VDD VDD R2 10 LVCMOS VDDA RU1 1K RU2 Not Install VDDO C5 10u C6 0.01u To Logic Input pins VDD To Logic Input pins RD2 1K R4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 REF_OUT0 REF_OUT1 Q1 Zo = 50 Ohm REF_IN 43 REF_SEL C1 15pF BYPASS REF_OE nMR X1 XTAL_OUT GND SSC1 SSC0 F_SELB2 F_SELB1 F_SELB0 F_SELC2 F_SELC1 F_SELC0 F_SELA1 F_SELA0 QA_OE GND VDD Note: External tuning capacitors must be used for proper operation. XTAL_IN C2 22pF ICS841S012DI C3 0.01u VDDOC QC GND QBC_OE VDDA VDDA GND GND IREF QA0 nQA0 QA1 nQA1 VDD 42 41 40 39 38 37 36 35 34 33 32 31 30 29 C4 10u R5 33 R7 33 Zo = 50 + TL3 Zo = 50 IREF - TL5 QA0 nQA0 R8 50 QA1 R9 50 Using for PCI Express Add-In Card R10 475 Ohm 15 16 17 18 19 20 21 22 23 24 25 26 27 28 25MHz, CL=18pF Driv er_LVCMOS VDD_REFOUT REF_OUT0 REF_OUT1 GND GND REF_IN VDD REF_SEL XTAL_IN XTAL_OUT BY PASS REF_OE nMR VDD 10 VDDA VDDOB QB6 GND QB5 VDDOB QB4 GND QB3 VDDOB QB2 GND QB1 QB0 VDDOB U1 R6 Zo = 50 LVCMOS VDD Ro ~ 7 Ohm 30 VDD VDDO 56 55 54 53 52 51 50 49 48 47 46 45 44 43 RD1 Not Install R3 REF_OUT1 HCSL Termination SSC1 SSC0 F_SELB2 F_SELB1 F_SELB0 F_SELC2 F_SELC1 F_SELC0 F_SELA1 F_SELA0 QA_OE Note: This device requires a reset signal at nMR after power-up to function properly. Zo = 50 + TL6 nQA1 VDDO VDD=3.3V (U1, 42) VDDO VDD (U1, 43) (U1, 48) (U1, 52) (U1, 56) (U1, 1) VDD 0.1u C8 0.1u C9 0.1u C10 0.1u C11 0.1u C12 0.1u - TL7 (U1, 7) (U1, 14) (U1, 28) R11 50 (U1, 29) VDDO=3.3V C7 Zo = 50 C13 C14 0.1u 0.1u C15 0.1u C16 R12 50 Using for PCI Express Point-to-Point Connection 0.1u FIGURE 7. ICS841S012DI SCHEMATIC EXAMPLE ICS841S012DKI REVISION A JULY 20, 2009 15 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER POWER CONSIDERATIONS This section provides information on power dissipation and junction temperature for the ICS841S012DI. Equations and example calculations are also provided. 1. Power Dissipation. The total power dissipation for the ICS841S012DI is the sum of the core power plus the power dissipated in the load(s). The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results. Core and HCSL Output Power Dissipation The maximum IDD current at 85° is 284mA. The HCSL output current (17mA per output pair) is included in this value. For power considerations, this output current is treated separately from the core currents, so for power calculations, I = 284mA - 2 * 17mA = 250mA. DD • Power (core) = VDD_MAX * (IDD + IDDA ) = 3.465V * (250mA + 20mA) = 935.6mW Power (HCSL) = 44.5mW/Load Output Pair If all outputs are loaded, the total power is 2 * 44.5mW = 89mW LVCMOS Output Power Dissipation • Dynamic Power Dissipation at 200MHz, (QB, QC) Power (200MHz) = CPD * Frequency * (VDDO)2 = 19pF * 200MHz * (3.465V)2 = 45mW per output Total Power (200MHz) = 45mW * 8 = 360mW • Dynamic Power Dissipation at 25MHz, (REF_OUT) Power (25MHz) = CPD * Frequency * (VDDO)2 = 19pF * 25MHz * (3.465V)2 = 5.6mW per output Total Power (25MHz) = 5.6mW * 2 = 11.2mW Total Power Dissipation • Total Power = Power (core) + Power (HCSL) + Total Power (200MHz) + Total Power (25MHz) = 935.6mW + 89mW + 360mW + 11mW = 1396mW ICS841S012DKI REVISION A JULY 20, 2009 16 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER 2. Junction Temperature. Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the device. The maximum recommended junction temperature for HiPerClockSTM devices is 125°C. The equation for Tj is as follows: Tj = θJA * Pd_total + TA Tj = Junction Temperature θJA = Junction-to-Ambient Thermal Resistance Pd_total = Total Device Power Dissipation (example calculation is in section 1 above) TA = Ambient Temperature In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming 1 meter per second air flow and a multi-layer board, the appropriate value is 27.5°C/W per Table 7. Therefore, Tj for an ambient temperature of 85°C with all outputs switching is: 85°C + 1.396W * 27.5°C/W = 123.4°C. This is below the limit of 125°C. This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow, and the type of board (multi-layer). TABLE 7. THERMAL RESISTANCE θJA FOR 56 LEAD VFQFN, FORCED CONVECTION θJA by Velocity (Meters per second) Multi-Layer PCB, JEDEC Standard Test Boards ICS841S012DKI REVISION A JULY 20, 2009 17 0 1 2.5 31.4°C/W 27.5°C/W 24.6°C/W ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER 3. Calculations and Equations. The purpose of this section is to calculate power dissipation on the IC per HCSL output pair. HCSL output driver circuit and termination are shown in Figure 8. VDD IOUT = 17mA ➤ VOUT RREF = 475Ω ± 1% RL 50Ω IC FIGURE 8. HCSL DRIVER CIRCUIT AND TERMINATION HCSL is a current steering output which sources a maximum of 17mA of current per output. To calculate worst case on-chip power dissipation, use the following equations which assume a 50Ω load to ground. The highest power dissipation occurs at maximum VDD . Power = (VDD_MAX – VOUT ) * IOUT, since VOUT = IOUT * RL = (VDD_MAX – IOUT * RL) * IOUT = (3.465V – 17mA * 50Ω) * 17mA Total Power Dissipation per output pair = 44.5mW ICS841S012DKI REVISION A JULY 20, 2009 18 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER RELIABILITY INFORMATION TABLE 8. θJAVS. AIR FLOW TABLE FOR 56 LEAD VFQFN θJA by Velocity (Meters per second) Multi-Layer PCB, JEDEC Standard Test Boards 0 1 2.5 31.4°C/W 27.5°C/W 24.6°C/W TRANSISTOR COUNT The transistor count for ICS841S012DI is: 11,537 ICS841S012DKI REVISION A JULY 20, 2009 19 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER PACKAGE OUTLINE - K SUFFIX FOR 56 LEAD VFQFN (Ref.) S eating Plan e N &N Even (N -1)x e (R ef.) A1 Ind ex Area L A3 N N e (Ty p.) 2 If N & N 1 Anvil Singula tion are Even 2 OR E2 (N -1)x e (Re f.) E2 2 To p View b A (Ref.) D e D2 2 N &N Odd 0. 08 Chamfer 4x 0.6 x 0.6 max OPTIONAL C Th er mal Ba se D2 C NOTE: The following package mechanical drawing is a generic drawing that applies to any pin count VFQFN package. This drawing is not intended to convey the actual pin count or pin layout of this device. The pin count and pinout are shown on the front page. The package dimensions are in Table 9 below. TABLE 9. PACKAGE DIMENSIONS JEDEC VARIATION ALL DIMENSIONS IN MILLIMETERS SYMBOL MINIMUM 56 N A 0.80 A1 0 1.0 0.05 0.25 Reference A3 b MAXIMUM 0.18 0.30 e 0.50 BASIC ND 14 NE 14 D 8.0 D2 4.35 4.65 8.0 E E2 5.05 5.35 L 0.3 0.55 Reference Document: JEDEC Publication 95, MO-220 ICS841S012DKI REVISION A JULY 20, 2009 20 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER TABLE 10. ORDERING INFORMATION Part/Order Number Marking Package Shipping Packaging Temperature 841S012DKILF ICS841S012DIL 56 lead "Lead-Free" VFQFN tray -40°C to 85°C 841S012DKILFT ICS841S012DIL 56 lead "Lead-Free" VFQFN 1000 tape & reel -40°C to 85°C NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant. While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments. ICS841S012DKI REVISION A JULY 20, 2009 21 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER www.IDT.com 6024 Silver Creek Valley Road San Jose, CA 95138 Sales 800-345-7015 (inside USA) +408-284-8200 (outside USA) Fax: 408-284-2775 www.IDT.com/go/contactIDT Techical Support [email protected] +480-763-2056 DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT’s sole discretion. All information in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined in the independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT’s products for any particular purpose, an implied warranty of merchantability, or non-infringement of the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties. IDT’s products are not intended for use in life support systems or similar devices where the failure or malfunction of an IDT product can be reasonably expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT. Integrated Device Technology, IDT and the IDT logo are registered trademarks of IDT. Other trademarks and service marks used herein, including protected names, logos and designs, are the property of IDT or their respective third party owners. Copyright 2009. All rights reserved.