NASA SPACE LEVEL BME X7R MLCC S311-P838 Approved AVX is the first company to be awarded the NASA S311-P838 specification for its Space BME 7XR MLCC technology. This technology delivers an advanced capacitance voltage capability compared to conventional PME (Precious Metal Electrode) technologies while meeting the reliability levels demanded by NASA’s space industry. The technology has several key benefits, downsizing case sizes, reducing weight and allowing more efficient use of the PCB area available. The range is tested using Mil spec standards and methods including 100% ultrasonic examination in compliance with the NASA space specification. These surface mount components also incorporate Flexiterm®, which greatly enhances resistance to any of the mechanical stress experienced by MLCCs during PCB assembly and in operation. FEATURES • Higher CV capability than standard capacitors resulting in reduced size / weight of components and saving in PCB space required. • Every production lot will have a C of C, DPA and a summary data package. • Use of Flexiterm® technology for enhanced mechanical stress resistance. • Case sizes: 0603 - 1812, cap values 2.2nF - 8.2uF available. • Voltages:16 - 100 Volts HOW TO ORDER S311P838 A GSFC Identifier F Ultrasonic Size Code Examination A = 0402 A = 100% B = 0603 C = 0805 D = 1206 E = 1210 F = 1812 X 825 J Dielectric Type X = X7R Capacitance in pF 2 significant digits + number of zeros e.g. 103 = 10nF 225 = 2.2μF Tolerance J = ±5% K = ±10% M = ±20% 1 R Voltage Termination 1 = 25Vdc R = Sn/Pb 2 = 50Vdc plated 3 = 100Vdc 6 = 16Vdc 3 Packaging/ Marking 1 = T/R unmarked capacitors 2 = T/R marked capacitors 3 = Waffle Pack, unmarked capacitors 4 = Waffle Pack, marked capacitors Please note all parts are terminated with a minimum 10% Pb plating. DIMENSIONS W L T t Size mm (inches) 0603 Min. Max. (L) Length 1.48 (0.058) 1.75 (0.069) (W) Width 0.66 0.026) 0.97 (0.038) (T) Thickness 1.02 (0.040) Max. (t) terminal 0.20 (0.008) 0.50 (0.020) 2 0805 1206 1210 Min. Max. Min. Max. Min. Max. 1.79 (0.070) 2.29 (0.090) 3.00 (0.118) 3.40 (0.134) 3.00 (0.118) 3.40 (0.124) 1.01 (0.040) 1.45 (0.057) 1.40 (0.055) 1.80 (0.071) 2.25 (0.088) 2.70 (0.108) 1.52 (0.060) Max. 1.80 (0.071) Max. 2.80 (0.110) Max. 0.25 (0.010) 0.75 (0.030) 0.25 (0.010) 0.75 (0.030) 0.25 (0.010) 0.75 (0.030) 1812 Min. Max. 4.19 (0.165) 4.95 (0.195) 2.79 (0.115) 3.56 (0.140) 2.80 (0.110) Max. 0.25 (0.010) 0.95 (0.037) 040416 NASA SPACE LEVEL BME X7R MLCC S311-P838 Approved PREFERRED SIZES ARE SHADED Case Size B (0603) Code Value 16V 25V 50V 100V 16V 222 2.2 (nF) 272 2.7 332 3.3 392 3.9 472 4.7 562 5.6 682 6.8 822 8.2 103 10 123 12 153 15 183 18 223 22 273 27 333 33 393 39 473 47 563 56 683 68 823 82 104 100 124 120 154 150 184 180 224 220 274 270 334 330 394 390 474 470 564 560 684 680 824 820 105 1 (μF) 125 1.2 155 1.5 185 1.8 225 2.2 275 2.7 335 3.3 395 3.9 475 4.7 565 5.6 685 6.8 825 8.2 106 10 040416 C (0805) 25V 50V 100V 16V D (1206) 25V 50V 100V 16V E (1210) 25V 50V 100V 16V F (1812) 25V 50V 100V 3 NASA SPACE LEVEL BME X7R MLCC S311-P838 Approved ELECTRICAL MEASUREMENTS AT ROOM TEMPERATURE Charateristics Symbol Test Method and Conditions Capacitance CA MIL-STD-202 Method 305 25ºC, 1KHz, 1Vrms Insulation Resistance RI Dissipation Factor Df Voltage Proof VP MIL-STD-202 Method 302 120 sec, 25ºC For Cn ≤ 10000pF: For Cn > 10000pF: Measured 25ºC, 1KHz, 1Vrms, 16-25 Volts > 25 Volts MIL-STD-202 Method 301 60 sec Tolerance (± %) 5 10 20 All Limits Max. 1.05Cn 1.1Cn 1.2Cn 100 1000 – – GΩ GΩ nF 3.5 3.5 % % – V All All Unit Min. 0.95Cn 0.9Cn 0.8Cn 2.5UR pF ELECTRICAL MEASUREMENTS AT HIGH AND LOW TEMPERATURE 4 Charateristics Symbol Insulation Resistance RI Test Method and Conditions (Note 1) MIL-STD-202 Method 302 For Cn ≤ 10000pF: For Cn > 10000pF: Limits Min. Max. 10 100 – Unit GΩ GΩ nF 040416