Vishay Semiconductors Degradation of IREDs The diagrams in figure 103 and figure 104 are based on electrical life tests, calculated with Ea = 0.8 eV at Tj = 25°C. 20 10 IF=50mA IF=50mA Degradation ( % ) Degradation ( % ) 8 6 4 94 8169 104 0 103 105 Time (h) Figure 103. Average degradation of TSUS 5. Document Number 80084 02-02 10 5 2 0 103 15 94 8170 104 105 Time (h) Figure 104. Average degradation of TSHA 5. www.vishay.com 1