ZR01F-HR Screening Procedure Inverted Series Diode High-reliability discrete products and engineering services since 1977 ZR01F-HR SCREENING PROCEDURES All ZR01F-HR procured shall be 100% screened in accordance with the following procedures, as applicable. Unless otherwise noted, all testing is performed at room temperature. REFERENCE: MIL-PRF-19500 and Leach 002-4692-XXX-000 AG TEST/PROCESS SPEC/METHOD CONDITIONS 1 Temperature Cycle MIL-STD-750/Methond 1051 Condition C, 20 cycles from -55°C to +175°C. Minimum 10 minute dwell at each extreme. 2 Impact Ambient 002-4692-XXX-000 TA = 25°C. Perform electrical testing per Table I, Group A, Subgroup 2. Data by attributes. MIL-STD-750 Load parts on Digitron programmable burn-in boards. Ensure all parts are loaded with positive polarity to the green dot (Zener end). 3 Burn-in Load 4 Power Burn-in MIL-STD-750/Method 1038B Power burn shall be 96 hours minimum. IZ = 0.5 mA, TA = 125°C minimum. Parts shall be tested within 96 hours of removal of burn-in bias. 5 Burn-in Unload MIL-STD-750 Remove parts from burn-in boards. Inspect parts for damage. 6 Impact Ambient 002-4692-XXX-000 TA = 25°C. Perform electrical testing per Table I, Group A, Subgroup 2. Data by attributes. 7 PDA Calculation MIL-PRF-19500 Calculate PDA. 10% maximum for burnin and post burn-in electrical test failures. Rev. 20140114