PCN03A-14 Characterization Report

April 4, 2014
Subject: Characterization Summary – Copper Bond Wire at Amkor Philippines
SUMMARY
Per PCN# 03A-14, this document summarizes the electrical characterization that supports an
alternate qualified assembly and test site (Amkor Philippines) and alternate qualified material
sets.
METHODOLOGY
The characterization focused on five items:
1)
2)
3)
4)
5)
Assessment of critical Bill of Materials
Comparison of production yields
Assessment of Critical Parameters
SSO (Simultaneous Switching Output) Characteristics
SERDES performance (ECP3-150 only)
BILL OF MATERIALS
Product/Package combinations for characterization were chosen to represent a cross-section of
the BOM (Bill of Material) changes specified in the PCN. The product/packages and the critical
BOM components are:
Product/Pkg
LFE3-150EA/
1156fpBGA
ASEM Copper (Control)
Mold
Wire/
Die Attach
Compound
Diameter
EMEG750SE
0.8mil Pd
ABLEBOND
Coated Cu
2100A
AMKOR Copper (New)
Mold
Wire/
Die Attach
Compound
Diameter
Hitachi
0.8mil Pd
Ablebond
GE-110
Coated Cu
2300
LFXP2-17E/
256ftBGA
EMEG750SE
0.8mil Pd
Coated Cu
ABLEBOND
2100A
Hitachi
GE-110
0.8mil Pd
Coated Cu
Ablebond
2300
LFXP2-5E/
144TQFP
EMEG700Y
0.8mil Pure
Cu
Yizbond
8143
Sumitomo
G700SY
0.8mil Pd
Coated Cu
Ablebond
3230
Multiple lots of in various product/package combinations were built as part of the reliability
qualification process for the AMKOR Copper BOM. Samples from the qual lots were
characterized and compared to comparable lots processed with the released ASE Malaysia
(ASEM) Copper BOM.
5555 Northeast Moore Court Hillsboro, Oregon 97124-6421 • T: +1.503.268.8000 • F: +1.503.268.8347 • www.latticesemi.com
From an electrical viewpoint, the same wire diameter and same base material implies that
electrical performance should be constant. Characterization was performed to confirm that
assumption.
ASSEMBLY/ELECTRICAL TEST YIELDS
The first step in the characterization process is an analysis of process yields. Yield information
is critical to gauge the manufacturability of a new package. As Lattice considers yield
information proprietary, the yield information below is normalized with respect to the control
material, which in this case is the existing ASEM Copper wire BOM.
LFE3-150
Normalized
Yield
LFXP2-17E
Normalized
Yield
LFXP2-5E
Normalized
Yield
Assembly Yield
ASEM Copper
(Control)
1.00
Electrical Test Yield
Amkor
ASEM Copper
(Control)
Amkor
1.00
1.00
1.00
Assembly Yield
Electrical Test Yield
ASEM Copper
(Control)
Amkor
ASEM Copper
(Control)
Amkor
1.00
0.98
1.00
0.97
Assembly Yield
ASEM Copper
(Control)
1.00
Electrical Test Yield
Amkor
ASEM Copper
(Control)
Amkor
0.98
1.00
0.94
Lower electrical test yields on the LFXP2-5E were attributable to a test error. No other
discernible differences in either assembly yield or electrical final test yields between ASEM and
AMKOR copper assembly processes were noted.
CRITICAL PARAMETERS
For the purposes of this characterization, critical parameters are defined as speed and power.
Samples of the qualification lots from AMKOR were tested at the same time as comparative
product from ASEM. The tabulated statistics, Cpk values and histograms of the actual
distributions are shown below.
Note that Tpdcounter is a Built-in Self Test (BIST) routine that is correlated to datasheet
parameters. Higher counts equate to faster devices.
Note that in most cases the Cpk of the Amkor material is actually better than the control units
but the change is not significant and more a function of the sample sizes used. The critical
parameters look normally distributed and do not point to any significant parametric difference
between ASEM and AMKOR copper bond wire.
5555 Northeast Moore Court Hillsboro, Oregon 97124-6421 • T: +1.503.268.8000 • F: +1.503.268.8347 • www.latticesemi.com
LFE3-150EA
AMKOR Copper lot
ASEM Copper lot (control)
N
704
590
LFXP2-17E
AMKOR Copper lot
ASEM Copper lot (control)
1083
7349
54.75
53.1
11.01
20.71
395
395
1.66
0.9
LFXP2-5E
AMKOR Copper lot
ASEM Copper lot (control)
1921
28435
39.3
23.5
8.93
8.08
172
172
1.5
1
FE3-150E
SICC_VCC
ASEASEM
CuCopper Lot
Mean
391.73
612.7
Icc(mA)
Std
Spec
49.04
2693
140.6
2693
ASEM Copper Lot
XP2-17E
XP2-5E
SICC_VCC
SICC_VCC
Cpk
2.7
1.5
ASEM Copper Lot
ASET Copper lot
ASET Copper lot
ASET Copper lot
Amkor Cu
5555 Northeast Moore Court Hillsboro, Oregon 97124-6421 • T: +1.503.268.8000 • F: +1.503.268.8347 • www.latticesemi.com
Product
Group
Amkor Copper
LFE3-150
ASEM Copper (control)
TPDCOUNT
N
Mean
698
31398
1161
31875
Std
1043.9
754.3
Spec
26561
26561
Cpk
1.54
2.35
LFXP2-17E
Amkor Copper
ASEM Copper (control)
949
2711
42040
41702
1525.4
1733.3
31630
31630
2.27
1.94
LFXP2-5E
Amkor Copper
ASEM Copper (control)
1686
6112
40180
39331
1158.3
1331.0
32000
32000
2.35
1.84
LFE3-150EA
LFXP2-17E
LFXP2-5E
SIMULTANEOUS OUTPUT SWITCHING PERFORMANCE
Electrical characterization of a new assembly facility includes a check of Simultaneous
Switching Output (SSO) performance. This characteristic is also referred to as Ground Bounce
although it can affect both power and ground supply rails.
Different assembly site may have different process or tooling which can affect SSO
performance. Since copper build in ASE Malaysia and Amkor have the same bond wire
geometry (length and diameter), SSO results are expected to be comparable. A delta greater
than 10% is considered significant.
Ground Bounce
Product
Material
Amkor Cu
FE3-150EA-BFN1156
ASEM Cu Control
Max (mV) Min (mV) Max (V)
258
-130
1.93
256
-126
1.942
Delta
%Delta
LFXP2-17E-FTN256
Amkor Cu
ASEM Cu Control
Delta
%Delta
LFXP2-5E-TN144
Output Disturb
Amkor Cu
ASEM Cu Control
Delta
%Delta
Min (V)
1.448
1.486
2
0.8%
-4
3.2%
-0.012
-0.6%
-0.038
-2.6%
222
244
-144
-154
1.376
1.348
0.904
0.956
-22
-9.0%
10
-6.5%
0.028
2.1%
-0.052
-5.4%
332
362
-188
-200
1.728
1.708
0.796
0.758
-30
-8.3%
12
-6.0%
0.02
1.2%
0.038
5.0%
As expected, SSO measurements of output high and low disturbs vary by less than 10%. This
is within experimental variation.
5555 Northeast Moore Court Hillsboro, Oregon 97124-6421 • T: +1.503.268.8000 • F: +1.503.268.8347 • www.latticesemi.com
SERDES PERFORMANCE
Similar to SSO performance, increased inductance due to bond wire geometry could affect highspeed operation. The LFE3-150EA was chosen as a characterization vehicle so that SERDES
performance could be quantified.
Three units of LFE3-150EA were programmed with an actual customer pattern that internally
generates a PN7 pattern that is then transmitted over the SERDES channel. Eye diagrams and
jitter measurements were collected at nominal temperature and voltage to compare relative
performance. Pre-emphasis is off.
LFE3-150EA 1156fpBGA Eye Diagrams (3.07Gbps)
AMKOR
Amkor
ASEM
(Control)
Delta
% Delta
ASEM (Control)
Duty Cycle Dist
(%)
2.00
2.10
Eye Jitter
(ps)
8.07
8.02
Eye Width
(ps)
603.35
605.37
Eye Height
(mV)
624.95
634.25
-0.10
-4.8%
0.06
0.7%
-2.02
-0.3%
-9.30
-1.5%
SERDES Jitter Statistics
As can be seen by the eye diagrams above, SERDES performance has not been measurably
affected by the BOM change.
SUMMARY
There are no significant electrical performance issues related to the new alternate qualified
material from AMKOR. Lattice recommends the production release of products from Amkor
Philippines.