AOS Semiconductor Product Reliability Report AON7520, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AON7520. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AON7520 passes AOS quality and reliability requirements. Table of Contents: I. II. III. IV. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation I. Product Description: • Latest Trench Power AlphaMOS (αMOS LV) technology • Very Low RDS(ON) at 2.5V VGS • Low Gate Charge • ESD protection Application • Load switch, battery switch in portable devices -RoHS Compliant -Halogen-Free Detailed information refers to datasheet. II. Die / Package Information: AON7520 Standard sub-micron Low voltage N channel Package Type DFN 3.3x3.3 EP Lead Frame Bare Cu Die Attach Solder paste Bonding Cu Clip Mold Material Epoxy resin with silica filler MSL (moisture sensitive level) Level 1 based on J-STD-020 Process III. Result of Reliability Stress for AON7520 Test Item Test Condition Time Point Lot Attribution Total Sample size Number of Failures MSL Precondition 168hr 85°c /85%RH +3 cycle reflow@260°c HTGB Standard - 12 lots 2618pcs 0 JESD22A113 Temp = 150 c, Vgs=100% of Vgsmax 168hrs 500 hrs 1000 hrs 3 lots 4 lots 3 lots 770pcs 0 JESD22A108 HTRB Temp = 150 c, Vds=80% of Vdsmax 168hrs 500 hrs 1000 hrs 3 lots 4 lots 3 lots 77pcs / lot 770pcs 0 JESD22A108 HAST 130 c, 85%RH, 33.3 psi, Vds = 80% of Vdsmax 96 hrs 11 lots 77pcs / lot 847pcs 0 JESD22A110 Pressure Pot 121c, 29.7psi, RH=100% 96 hrs (Note A*) 11 lots 77 pcs / lot 847pcs 0 JESD22A102 Temperature Cycle -65c to 150c, air to air 250 / 500 cycles (Note A*) 12 lots 77 pcs / lot 924pcs 0 JESD22A104 (Note A*) 77 pcs / lot Note A: The reliability data presents total of available generic data up to the published date. IV. Reliability Evaluation FIT rate (per billion): 4.16 MTTF = 27446 years The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AON7520). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. 2 9 Failure Rate = Chi x 10 / [2 (N) (H) (Af)] 9 = 1.83 x 10 / [2x (6x77x168 +8x77x500 +6x77x1000) x259] = 4.16 9 8 MTTF = 10 / FIT = 2.40 x 10 hrs = 27446 years Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C Af 259 88 32 13 5.64 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u = The use junction temperature in degree (Kelvin), K = C+273.16 -5 K = Boltzmann’s constant, 8.617164 X 10 eV / K 130 deg C 150 deg C 2.59 1