SSF2437E
Main Product Characteristics:
VDSS
-20V
RDS(on)
38mΩ (typ.)
ID
-5.5A ①
SOT-23-6
Marking and pin
Schematic diagram
Assignment
Features and Benefits:
Advanced MOSFET process technology
Special designed for PWM, load switching and
general purpose applications
Ultra low on-resistance with low gate charge
Fast switching and reverse body recovery
150℃ operating temperature
Description:
It utilizes the latest processing techniques to achieve the high cell density and reduces the on-resistance with
high repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable
device for use in power switching application and a wide variety of other applications.
Absolute max Rating: @TA=25℃ unless otherwise specified
Symbol
Parameter
Max.
ID @ TC = 25°C
Continuous Drain Current, VGS @ 10V
-5.5 ①
ID @ TC = 70°C
Continuous Drain Current, VGS @ 10V
-4 ①
IDM
Pulsed Drain Current ②
-30
PD @TC = 25°C
Power Dissipation ③
2.1
W
VDS
Drain-Source Voltage
-20
V
VGS
Gate-to-Source Voltage
±8
V
-55 to +150
°C
TJ
TSTG
Operating Junction and Storage Temperature Range
Units
A
Thermal Resistance
Symbol
Characterizes
RθJA
Junction-to-ambient (t ≤ 10s) ④
©Silikron Semiconductor CO.,LTD.
2010.03.01
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Typ.
Max.
Units
—
60
°C /W
Version : 1.0
page 1 of 8
SSF2437E
Electrical Characterizes @TA=25℃ unless otherwise specified
Symbol
Parameter
Min.
Typ.
Max.
Units
V(BR)DSS
Drain-to-Source breakdown voltage
-20
—
—
V
—
38
43
—
49
54
—
68
73
-0.3
—
-1.0
—
-0.44
—
—
—
-1
—
—
-50
—
—
10
—
—
-10
RDS(on)
Static Drain-to-Source on-resistance
VGS(th)
Gate threshold voltage
IDSS
Drain-to-Source leakage current
IGSS
Gate-to-Source forward leakage
Qg
Total gate charge
—
10
—
Qgs
Gate-to-Source charge
—
0.76
—
Qgd
Gate-to-Drain("Miller") charge
—
3.5
—
td(on)
Turn-on delay time
—
10
—
tr
Rise time
—
8.4
—
td(off)
Turn-Off delay time
—
29
—
tf
Fall time
—
13
—
Ciss
Input capacitance
—
939
—
Coss
Output capacitance
—
132
—
Crss
Reverse transfer capacitance
—
108
—
Conditions
VGS = 0V, ID = -250μA
VGS=-4.5V,ID = -4A
mΩ
VGS=-2.5V,ID = -4A
VGS=-1.8V,ID = -2A
V
μA
μA
VDS = VGS, ID = -250μA
TJ = 125°C
VDS = -16V,VGS = 0V
TJ = 125°C
VGS =8V
VGS = -8V
ID = -4A,
nC
VDS=-10V,
VGS = -4.5V
ns
VGS=-4.5V, VDS =-10V,
RGEN=3Ω，
VGS = 0V,
pF
VDS =-10V,
ƒ = 1MHz
Source-Drain Ratings and Characteristics
Symbol
IS
ISM
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Min.
Typ.
Max.
Units
—
—
-5.5 ①
A
—
—
-30
A
Conditions
MOSFET symbol
showing the
integral reverse
p-n junction diode.
VSD
Diode Forward Voltage
—
-0.76
-1.0
V
IS=1A, VGS=0V
trr
Reverse Recovery Time
—
9.2
—
ns
TJ = 25°C, IF =-4A,
Qrr
Reverse Recovery Charge
—
2.4
—
nC
di/dt = 100A/μs
©Silikron Semiconductor CO.,LTD.
2010.03.01
www.silikron.com
Version : 1.0
page 2 of 8
SSF2437E
Test circuits and Waveforms
EAS test circuit:
Gate charge test circuit:
S
Switching time test circuit:
Switch Waveforms:
Notes:
①Calculated continuous current based on maximum allowable junction temperature.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
©Silikron Semiconductor CO.,LTD.
2010.03.01
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Version : 1.0
page 3 of 8
SSF2437E
Typical electrical and thermal characteristics
Figure 2. Gate to source cut-off voltage
Figure 1: Typical Output Characteristics
Figure 3. Drain-to-Source Breakdown Voltage Vs.
Case Temperature
©Silikron Semiconductor CO.,LTD.
Figure 4: Normalized On-Resistance Vs. Case
Temperature
2010.03.01
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Version : 1.0
page 4 of 8
SSF2437E
Typical electrical and thermal characteristics
Figure 5. Maximum Drain Current Vs. Case
Figure 6. Typical Capacitance Vs. Drain-to-Source
Temperature
Voltage
Figure7. Maximum Effective Transient Thermal Impedance Junction-to-Case
©Silikron Semiconductor CO.,LTD.
2010.03.01
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Version : 1.0
page 5 of 8
SSF2437E
Mechanical Data：
Symbol
A
A1
A2
b
c
D
E
E1
e
e1
L
θ
Dimension In Millimeters
Min
Max
1.050
1.250
0.000
0.100
1.050
1.150
0.300
0.500
0.100
0.200
2.820
3.020
1.500
1.700
2.650
2.950
0.95(BSC)
1.800
2.000
0.300
0.600
00
©Silikron Semiconductor CO.,LTD.
80
2010.03.01
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Dimension In Inches
Min
Max
0.041
0.049
0.000
0.004
0.041
0.045
0.012
0.020
0.004
0.008
0.111
0.119
0.059
0.067
0.104
0.116
0.037(BSC)
0.071
0.079
0.012
0.024
00
Version : 1.0
80
page 6 of 8
SSF2437E
Ordering and Marking Information
Device Marking: 2437E
Package (Available)
SOT23-6
Operating Temperature Range
C : -55 to 150 ºC
Devices per Unit
Package
Type
Units/
Tape
Tapes/
Inner Box
Units/
Inner Box
Inner Boxes/
Carton Box
Units/
Carton
Box
SOT23-6
3000
10
30000
4
120000
Reliability Test Program
Test Item
Conditions
Duration
Sample Size
High
Temperature
Reverse
Bias(HTRB)
High
Temperature
Gate
Bias(HTGB)
Tj=125℃ to 150℃ @
80% of Max
VDSS/VCES/VR
168 hours
500 hours
1000 hours
3 lots x 77 devices
Tj=150℃@ 100% of
Max VGSS
168 hours
500 hours
1000 hours
3 lots x 77 devices
©Silikron Semiconductor CO.,LTD.
2010.03.01
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Version : 1.0
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SSF2437E
ATTENTION:
■
■
■
■
■
■
■
■
Any and all Silikron products described or contained herein do not have specifications that can handle applications
that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other
applications whose failure can be reasonably expected to result in serious physical and/or material damage.
Consult with your Silikron representative nearest you before using any Silikron products described or contained
herein in such applications.
Silikron assumes no responsibility for equipment failures that result from using products at values that exceed,
even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed
in products specifications of any and all Silikron products described or contained herein.
Specifications of any and all Silikron products described or contained herein stipulate the performance,
characteristics, and functions of the described products in the independent state, and are not guarantees of the
performance, characteristics, and functions of the described products as mounted in the customer’s products or
equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer
should always evaluate and test devices mounted in the customer’s products or equipment.
Silikron Semiconductor CO.,LTD. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents or
events cannot occur. Such measures include but are not limited to protective circuits and error prevention circuits for
safe design, redundant design, and structural design.
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without obtaining the export license from the authorities concerned in accordance with the above law.
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Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for
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implied regarding its use or any infringements of intellectual property rights or other rights of third parties.
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification" for the
Silikron product that you intend to use.
Customer Service
Worldwide Sales and Service:
[email protected]
Technical Support:
[email protected]
Suzhou Silikron Semiconductor Corp.
Building 11A Suchun Industrial Square, 428# Xinglong Street, Suzhou P.R. China
TEL: (86-512) 62560688
FAX: (86-512) 65160705
E-mail: [email protected]
©Silikron Semiconductor CO.,LTD.
2010.03.01
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Version : 1.0
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