SSIG15N135H Main Product Characteristics: VCES 1350V VCE(sat) 1.9V (typ.) ID 15A @ TC = 100°C TO-247 Schematic diagram Features and Benefits: Advanced Trench-FS Process Technology Low Collector-Emitter Saturation Voltage, Typical Data is 1.9V@15A Fast Switching High Input Impedance Pb- Free Product Power Switch Circuit of Induction Cooker Description: It utilizes the latest processing techniques to achieve the high cell density and reduces VCE(sat) rating. These features combine to make this design an extremely efficient and reliable device for use in power switching application of induction cooker and a wide variety of other applications. Absolute max Rating: Symbol Parameter Max. Units IC @ TC = 25°C Continuous Collector Current 30 IC @ TC = 100°C Continuous Collector Current 15 ICM Pulsed Collector Current 45 Power Dissipation@ TC = 25°C 260 W Power Dissipation@ TC = 100°C 130 W VCES Collector-Emitter Voltage 1350 V VGES Gate-to-Emitter Voltage ± 30 V TJ Operating Junction Temperature Range -55 to +175 °C TSTG Storage Temperature Range -55 to +175 °C TL Maximum Temperature of Solding 260 °C PD @TC = 25°C ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 A page 1 of 9 SSIG15N135H Thermal Resistance Symbol Characterizes Typ. Max. Units RθJC Junction-to-case① — 0.6 ℃/W RθJA Junction-to-ambient ② — 40 ℃/W Electrical Characterizes @TA=25℃ unless otherwise specified Symbol V(BR)CES VCE(sat) Parameter Collector-to-Emitter breakdown voltage Min. Typ. Max. Units 1350 — — V — 1.9 2.2 V — 2.05 — V Collector-Emitter Saturation voltage Conditions VGE = 0V, IC = 0.5mA VGE=15V, IC=15A,TC=25°C VGE=15V, IC=15A,TC=125°C VGE(th) Gate threshold voltage 4.8 5.8 6.8 V VGE= VCE, ID = 0.4mA ICES Zero gate voltage collector current — — 100 μA VCE = 1350V IGES Gate-to-Emitter forward leakage — — 300 — — -300 Qg Total gate charge — 165 — Qge Gate-to-Emitter charge — 12 — Qgc Gate-to-Collector("Miller") charge — 55 — td(off) Turn-Off delay time — 190 — tf Fall time — 100 — Eoff Turn-Off delay time — 0.8 — Cies Input capacitance — 1250 — Coes Output capacitance — 40 — Cres Reverse transfer capacitance — 32 — trr Reverse Recovery Time — 230 — ns TJ = 25°C, IF =15A, di/dt = Qrr Reverse Recovery Charge — 2450 — nC 20A/μs μA VGE =30V VGE = -30V Ic = 20A, nC VCE= 600V, VGE = 15V ns mJ VGE=15V, Vcc=600V, Rg=10Ω IC=15A, TJ = 25°C VGE = 0V pF VCE = 25V ƒ = 1MHz Notes: ①These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heat sink, assuming maximum junction temperature of TJ(MAX)=175°C. ②The R JA is the sum of the thermal impedance from junction to case RJC and case to ambient. ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 2 of 9 SSIG15N135H Typical electrical and thermal characteristics 45 45 Tj=25° C 40 VGE=15V 40 VGE=18V IC,Collector Current(A) 30 VGE=12V 25 VGE=10V 20 15 10 VGE=8V VGE=15V VGE=18V 35 35 IC,Collector Current(A) Tj=175° C VGE=12V 30 25 VGE=10V 20 15 VGE=8V 10 5 5 0 0 2 4 6 8 0 10 0 2 VCE,Collector to Emitter Voltage(V) 4 6 8 10 VCE,Collector to Emitter Voltage(V) O Figure 1: Typical Output Characteristics(TJ=25 C) O Figure 2: Typical Output Characteristics(TJ=175 C) 45 7 35 VGE, Gate-Emitter Voltage (V) IC, Collector Current(A) 40 30 25 20 15 O 175 C 10 5 O 25 C 6 5 4 3 2 0 4 6 8 10 1 12 0 VGE, Gate-Emitter Voltage (V) Figure 3.Typical Transfer Characteristics 25 50 75 100 125 150 O TJ, Junction Temperature ( C) Figure 4: Gate to Emitter threshold Voltage as a function of TJ ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 3 of 9 175 SSIG15N135H Typical electrical and thermal characteristics 2.7 45 IC=30A 40 2.4 O IF, Forward current (A) 35 VF,Forward Voltage (V) TJ=25 C 30 25 O TJ=175 C 20 15 10 2.1 IC=15A 1.8 1.5 IC=7.5A 1.2 5 0 2.0 0.9 2.5 3.0 3.5 4.0 4.5 5.0 0 o 50 75 100 125 150 175 o TJ,Junction Temperature ( C) TJ,Junction Temperature ( C) Figure 5: Typical Diode Forward Characteristics Figure 6. Forward Voltage as a Function of TJ 4.0 10000 3.5 CAP,Capacitance(pF) VCE,Collector-Emitter Voltage (V) 25 IC=30A 3.0 IC=15A 2.5 2.0 IC=7.5A 1.5 1.0 0 25 50 75 100 125 150 175 o 1000 100 Coss Crss 10 0 10 20 VCE, Collector-Emitter Voltage (V) TJ,Junction Temperature ( C) Figure 7. Typical VCE(sat) as a Function of TJ ©Silikron Semiconductor CO.,LTD. Ciss 2015.03.09 www.silikron.com Figure 8: Capacitance Characteristics Version : 1.0 page 4 of 9 30 SSIG15N135H Typical electrical and thermal characteristics 1000 4 td(on) 10 VCE=600V VGE=± 15V IC=15A TC=25°C 3 tf 100 Switching Loss(mJ) Switching Time(ns) td(off) tr VCE=600V VGE=± 15V IC=40A TC=25°C Eon 2 Eoff 1 1 0 10 20 30 40 50 60 70 0 0 Rg,Gate Resistance(Ω ) 10 20 30 40 Rg,Gate resistence(Ω) Figure 9: Switching Time Vs Rg Figure 10: Switching Loss Vs Rg 3.0 15 VGE,Gate to Emitter Voltage(V) 2.5 Switching Loss(mJ) Eon VCE=600V VGE=± 15V TC=25° C Rg=10ohm 2.0 Eoff 1.5 1.0 0.5 12 9 6 IC =15A VCE=600V VGE =15V 3 0.0 5 10 15 20 25 30 35 40 45 0 IC,Collector Current(A) 5 10 15 20 QG, Gate charge(nC) Figure11: Switching Loss Vs IC ©Silikron Semiconductor CO.,LTD. 0 Figure 12: Gate Charge Characteristics 2015.03.09 www.silikron.com Version : 1.0 page 5 of 9 25 SSIG15N135H Typical electrical and thermal characteristics 100 100 50μs 100μs 10 1ms DC Operation 1 IC,Collector Current(A) IC,Collector Current(A) Max Current Limited 10 1 0.1 1 10 100 1000 1 VCE,Collector to Emitter Volgate(V) 10 100 1000 VCE,Collector to Emitter Voltage(V) Figure 13. Maximum Forward Biased Safe Figure 14. Turn Off Safe Operating Area Operating Area Case Temperature Figure15. Normalized Maximum Transient Thermal Impedance ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 6 of 9 SSIG15N135H Mechanical Data: ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 7 of 9 SSIG15N135H Ordering and Marking Information Device Marking: SSIG15N135H Package (Available) TO247 Operating Temperature Range C : -55 to 175 ºC Devices per Unit Package Type Units/ Tube Tubes/Inner Box Units/Inner Inner Box Boxes/Carton Box Units/Carton Box TO247 30 8 240 1200 5 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) High Temperature Gate Bias(HTGB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices Tj=150℃@ 100% of Max VGES 168 hours 500 hours 1000 hours 3 lots x 77 devices ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 8 of 9 SSIG15N135H ATTENTION: ■ ■ ■ ■ ■ ■ ■ ■ Any and all Silikron products described or contained herein do not have specifications that can handle applications that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious physical and/or material damage. 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Customer Service Worldwide Sales and Service: [email protected] Technical Support: [email protected] Suzhou Silikron Semiconductor Corp. 11A, 428 Xinglong Street, Suzhou Industrial Park, P.R.China TEL: (86-512) 62560688 FAX: (86-512) 65160705 E-mail: [email protected] ©Silikron Semiconductor CO.,LTD. 2015.03.09 www.silikron.com Version : 1.0 page 9 of 9