IS-1825ASRH ® Data Sheet June 14, 2005 Single Event and Total Dose Hardened, High-Speed, Dual Output PWM FN9065.1 Features • Electrically Screened to DSCC SMD # 5962-02511 The single event and total dose hardened IS-1825ASRH pulse width modulator is designed to be used in high frequency, switching power supplies in either voltage or current-mode configurations. The design includes a precision voltage reference, a low power start-up circuit, a high frequency oscillator, a wide-band error amplifier and a fast current-limit comparator. The use of proprietary process capabilities and unique design techniques results in fast propagation delay times and high output current over a wide range of output voltages. Constructed with the Intersil Rad-hard Silicon Gate (RSG) dielectrically isolated BiCMOS process, these devices are immune to single event latch-up and have been specifically designed to provide a high level of immunity to single event transients. All specified parameters are guaranteed and tested for 300krad(Si) total dose performance. Detailed Electrical Specifications for these devices are contained in SMD 5962-02511. A “hot-link” is provided on our website for downloading the SMD. • QML Qualified per MIL-PRF-38535 Requirements • Radiation Environment - Total Dose. . . . . . . . . . . . . . . . . . . . . 300krad(SI) (max) - Latch-up Immune . . . . . . . . . . . . . Dielectrically Isolated - SEU immune . . . . . . . . . . . LET=35MeV/mg/cm2(max) • Oscillator Frequency . . . . . . . . . . . . . . . . . . . .1MHz(max) • High Output Drive Current . . . . . . . . . . . . . . .1A peak(typ) • Low Start-up Current . . . . . . . . . . . . . . . . . . . 300µA(max) • Undervoltage Lockout - Start Threshold . . . . . . . . . . . . . . . . . . . . . . . .8.8V(max) - Stop Threshold . . . . . . . . . . . . . . . . . . . . . . . . 7.6V(min) - Hysteresis. . . . . . . . . . . . . . . . . . . . . . . . . . 300mV(min) • Improved Soft-Start Function Compared with Commercial 1825A Types • Pulse-by-Pulse Current Limiting • Latched Overcurrent Comparator with Full Cycle Restart • Programmable Leading Edge Blanking Pinout IS1-1825ASRH (CDIP2-T16 SBDIP) TOP VIEW Applications • Voltage or Current-Mode Switching Power Supplies 16 VREF INV 1 NON-INV 2 15 VCC • Control of High Current MOSFET Drivers E/A OUT 3 14 OUT B • Motor Speed and Direction Control CLK/LEB 4 13 VC RT 5 12 PGND CT 6 11 OUT A Ordering Information ORDERING NUMBER 10 GND RAMP 7 9 ILIM/SD SS 8 IS9-1825ASRH (CDFP4-F20 FLATPACK) TOP VIEW NC 1 20 VREF INTERNAL MKT. NUMBER TEMP. RANGE (°C) 5962F0251101QEC IS1-1825ASRH-8 -50 to 125 5962F0251101QXC IS9-1825ASRH-8 -50 to 125 5962F0251101VEC IS1-1825ASRH-Q -50 to 125 5962F0251101VXC IS9-1825ASRH-Q -50 to 125 INV 2 19 VCC IS1-1825ASRH/Proto IS1-1825ASRH/Proto -50 to 125 NON-INV 3 18 OUT B IS9-1825ASRH/Proto IS9-1825ASRH/Proto -50 to 125 E/A OUT 4 17 PGND CLK/LEB 5 16 VC RT 6 15 VC CT 7 14 PGND RAMP 8 13 OUT A SS 9 12 GND NC 10 11 ILIM/SD 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a trademark of Intersil Americas Inc. Copyright © Intersil Americas Inc. 2002, 2005. All Rights Reserved All other trademarks mentioned are the property of their respective owners. IS-1825ASRH Die Characteristics Substrate: Radiation Hardened Silicon Gate, Dielectric Isolation DIE DIMENSIONS: 4310µm x 5840µm (170 mils x 230 mils) Thickness: 483µm ± 25.4µm (19 mils ± 1 mil) Backside Finish: Silicon INTERFACE MATERIALS ASSEMBLY RELATED INFORMATION Glassivation Substrate Potential: Type: Phosphorus Silicon Glass (PSG) Thickness: 8.0kA +/- 1.0kA Top Metallization Unbiased (DI) ADDITIONAL INFORMATION Type: AlSiCu Thickness: 16.0kA +/- 2kA Worst Case Current Density: <2.0 x 105 A/cm2 Transistor Count: 585 Metallization Mask Layout IS-1825ASRH RT CLK/LEB CT E/A OUT RAMP NON-INV INV SS ILIM/SD VREF OGND GND VCC OUT A OUT B PGND PGND VC VC Notes: 1. Both the OGND (oscillator ground) and the GND (control circuit ground) pads must be bonded to ground. These pads are both bonded to the GND pin on the packaged devices. 2. All double-sized bond pads must be double bonded for current sharing purposes. All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems. Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com 2 FN9065.1 June 14, 2005