KAF 40000 D

KAF-40000
7304 (H) x 5478 (V) Full
Frame CCD Image Sensor
Description
The KAF−40000 Image Sensor is a high performance,
40-megapixel CCD. Based on the TRUESENSE 6.0 micron Full
Frame CCD Platform, the sensor features ultra-high resolution, broad
dynamic range, and a four-output architecture. A lateral overflow
drain suppresses image blooming, while an integrated Pulse Flush
Gate clears residual charge on the sensor with a single electrical pulse.
A Fast Dump Gate can be used to selectively remove a line of charge
to facilitate partial image readout. The sensor also utilizes the
TRUESENSE Transparent Gate Electrode to improve sensitivity
compared to the use of a standard front side illuminated polysilicon
electrode.
The sensor shares a common pin-out and electrical configuration
with the KAF−50100 Image Sensor, allowing a single camera design
to support both members of this sensor family.
Table 1. GENERAL SPECIFICATIONS
Parameter
Figure 1. KAF−40000 CCD Image Sensor
Features
• TRUESENSE Transparent Gate Electrode
Typical Value
Architecture
Full Frame CCD (Square Pixels)
Total Number of Pixels
7410 (H) × 5566 (V) = 41.2 Mp
Number of Effective Pixels
7336 (H) × 5510 (V) = 40.4 Mp
Number of Active Pixels
7304 (H) × 5478 (V) = 40.0 Mp
Pixel Size
6.0 mm (H) × 6.0 mm (V)
Active Image Size
45.76 mm (H) × 35.34 mm (V)
54.78 mm (Diagonal),
645 1.3x Optical Format
Aspect Ratio
4:3
Horizontal Outputs
4
Saturation Signal
42 ke−
Output Sensitivity
31 mV/e−
Quantum Efficiency (Peak R, G, B)
42%, 44%, 38%
Read Noise (f = 18 MHz)
13 e−
Dark Signal (T = 60°C)
42 pA/cm2
Dark Current Doubling Temperature
5.5°C
Dynamic Range (f = 18 MHz)
70.2 dB
Estimated Linear Dynamic Range
(f = 18 MHz)
69.3 dB
Charge Transfer Efficiency
Horizontal
Vertical
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•
•
•
•
for High Sensitivity
Ultra-High Resolution
Board Dynamic Range
Low Noise Architecture
Large Active Imaging Area
Application
• Digitization
• Mapping/Aerial
• Photography
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
0.999995
0.999999
Blooming Protection
(4 ms Exposure Time)
1400X Saturation Exposure
Maximum Date Rate
18 MHz
Package
Ceramic PGA
Cover Glass
MAR Coated, 2 Sides
NOTE: All Parameters are specified at T = 40°C unless otherwise noted.
© Semiconductor Components Industries, LLC, 2015
September, 2015 − Rev. 3
1
Publication Order Number:
KAF−40000/D
KAF−40000
ORDERING INFORMATION
Table 2. ORDERING INFORMATION
Part Number
Description
KAF−40000−FXA−JD−AA
Gen2 Color (Bayer RGB), Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Standard Grade
KAF−40000−FXA−JD−AE
Gen2 Color (Bayer RGB), Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Engineering Sample
KAF−40000−CXA−JD−AA*
Gen1 Color (Bayer RGB), Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Standard Grade
KAF−40000−CXA−JD−AE*
Gen1 Color (Bayer RGB), Microlens, Enhanced, ESD, Ceramic PGA,
Clear Cover Glass with AR Coating (Both Sides), Engineering Sample
Marking Code
KAF−40000−FX
Serial Number
KAF−40000−CX
Serial Number
*Not recommended for new designs.
See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention
used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at
www.onsemi.com.
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2
KAF−40000
DEVICE DESCRIPTION
Architecture
1 Test Row
26
16
V1
V1
4
KAF−40000
7304 (H) × 5478 (V)
6.0 × 6.0 mm Pixels
4 28 16
16 28 4
1 Test Column
PFG
FDG
LOD
1 Test Column
V2
V2
4
(Last VCCD Phase = V2)
H1L
OGL
H1R
OG R
4 Blue + 12 Buffer Pixels
29 Dark Pixels
RD L
RG L
VDD LA
VOUT LA
VSS L
VSUB
1 10 4 1 4
28 16
3652
PFG
FDG
LOD
RD R
RG R
VDD RA
3652
16 28
4 1 4 10 1
VOUT RA
VSS R
VSUB
VOUT LB
VDD LB
1 10 4 1 4
28 16
3652
3652
16 28
4 1 4 10 1
VOUT RB
VDD RB
XG
H1B L
H2 L
H1A L
H1A R
H2R
H1B R
3716 Pixels/Line/Output
Figure 2. Block Diagram
non-uniformities. For the leading 16 active column pixels,
the first 4 pixels are covered with blue pigment while the
remaining active buffer pixels are arranged in a Bayer
pattern (R, GR, GB, B).
Dark Reference Pixels
Surrounding the periphery of the device is a border of light
shielded pixels creating a dark region. Existing within this
dark region are light shielded pixels that include 28 leading
dark pixels on every line. There are also 29 full dark lines at
the start and 26 full dark lines at the end of every frame.
Under normal circumstances, these pixels do not respond to
light and may be used as a dark reference.
CTE Monitor Pixels
Two CTE test columns, at the leading end of each output,
and one CTE test row are included for manufacturing test
purposes.
Dummy Pixels
Within each horizontal shift register there are 20 leading
pixels. These are designated as dummy pixels and should not
be used to determine a dark reference level. These pixels are
noted on the block diagram as the leading pixels in
a horizontal line sequence: 1 + 10 + 4 + 1 (CTE monitor
pixel) + 4.
Image Acquisition
An electronic representation of an image is formed when
incident photons falling on the sensor plane create
electron-hole pairs (charge) within the device. These
photon-induced electrons are collected locally by the
formation of potential wells at each pixel site. The number
of electrons collected is linearly dependent on light level and
exposure time and non-linearly dependent on wavelength.
When the pixel’s capacity is reached, excess electrons are
discharged into the lateral overflow drain (LOD) to prevent
crosstalk or ‘blooming’. During the integration period, the
V1 and V2 register clocks are held at a constant (low) level.
Active Buffer Pixels
Forming the outer boundary of the effective active pixel
region, there are 16 unshielded active buffer pixels between
the photoactive area and the dark reference. These pixels are
light sensitive but they are not tested for defects and
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KAF−40000
Charge Transport
in the Fast Dump Gate (FDG) row that are drained using the
separate FDG pin. Draining is accomplished by first
clocking V2 high while V1 is held low. This forces all charge
into the V2 phase of the pixel. While V2 is high, PFG (or
FDG) may be clocked high to begin draining the signal from
the pixel to the LOD. Charge transfer out of the pixel is fully
completed only after V2 has been clocked low plus some
characteristic time.
The integrated charge from each pixel in the Vertical CCD
(VCCD) is transported to the output using a two-step
process. Each remaining line (row) of charge is first
transported from the VCCD to a dual parallel split horizontal
register (HCCD) using the V1 and V2 register clocks. The
transfer to the HCCD occurs on the falling edge of V2 while
H1A is held high. This line of charge may be readout
immediately (dual split) or may be passed through a transfer
gate (XG) into a second (B) HCCD register while the next
line loads into the first (A) HCCD register (dual parallel
split). Readout of each line in the HCCD is always split at the
middle and, thus, either two or four outputs are used. Left (or
right) outputs carry image content from pixels in the left (or
right) columns of the VCCD. A separate connection to the
last H1 phase (H1L) is provided to improve the transfer
speed of charge to the output amplifier. On each falling edge
of H1L, a new charge packet is sensed by the output
amplifier. Left and right HCCDs are electrically isolated
from each other except for the common transfer gate (XG).
Horizontal Register
Output Structure
The output consists of a floating diffusion connected to
a three-stage source follower. Charge presented to the
floating diffusion (FD) is converted into a voltage and is
current amplified in order to drive off-chip loads. The
resulting voltage change seen at the output is linearly related
to the amount of charge placed on the FD. Once the signal
has been sampled by the system electronics, the reset gate
(RG) is clocked to remove the signal and FD is reset to the
potential applied by reset drain (RD). Increased signal at the
floating diffusion reduces the voltage seen at the output pin.
To activate the output structure, an off-chip current source
must be added to the VOUT pin of the device. See Figure 4.
Pulsed Flush Gate/Fast Dump Gate
The Pulsed Flush Gate (PFG) feature is used to drain the
charge of all pixels prior to exposure. The exception is pixels
H2
H1
H2
HCCD
Charge
Transfer
HIL
VDD
OG
RG
RD
Floating
Diffusion
VOUT
VSUB
VSS
Source
Follower
#1
Source
Follower
#2
Source
Follower
#3
Figure 3. Output Architecture (Each Output)
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4
KAF−40000
Output Load
VDD = +15 V
0.1 mF
IOUT = |5 mA|
VOUT
2N3904 or
Equivalent
Buffered
Video
Output
140 W
1 kW
NOTE: Component values may be revised based on operating conditions and other design considerations.
Figure 4. Recommended Output Structure Load Diagram
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5
KAF−40000
Physical Description
Pin Description and Device Orientation
DIRECTION OF TRANSFER
DIRECTION OF TRANSFER
To VOUTLA
To VOUTRA
To VOUTLB
To VOUTRB
PIN 1
Figure 5. Image Transfer Diagram Viewed from the Top (Cover Glass Side)
VSUB
FDG
V1
V2
LOD
LOD
V2
V1
FDG VSUB
D
1
2
3
4
5
8
9
10
11
12
D
C
1
2
3
4
5
8
9
10
11
12
C
LOD
PFG
V1
V2
PFG
V2
V1
PFG
LOD
7
6
PFG VSUB
VSUB
KAF−40000
XG
VSUB
VSUB
NC
B
VOUTLA VOUTLB OGL RGL H1LL H1BL
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
B
A
1
2
3
4
5
6
7
10
11
12
13
14
15
16
A
VSUB VDDLA VSSL RDL VDDLB
H1AL H2L
H1BR H1LR RGR
OGR VOUTRB VOUTRA
H2R H1AR VDDRB RDR VSSR VDDRA VSUB
Notes:
1. Pins with the same name are nominally tied together on the circuit board and have the same operating conditions. In addition, pins labeled
with left (‘L’) and (‘R’) designations may also be tied together except for VOUT pins.
2. To achieve optimal output signal matching, electrical layout of the PCB should be made as symmetrical as possible relative to the left and
right sides of the sensor.
Figure 6. Pinout Diagram
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KAF−40000
Table 3. PIN DESCRIPTION
Pin
Name
A1
VSUB
A2
VDDLA
A3
VSSL
A4
RDL
A5
VDDLB
A6
H1AL
Pin
Name
Substrate
C1
LOD
Lateral Overflow Drain
Output Amplifier Supply, Left A
C2
PFG
Pulse Flush Gate
Output Amplifier Return, Left
C3
V1
Vertical Phase 1
Reset Drain, Left
C4
V2
Vertical Phase 2
Output Amplifier Supply, Left B
C5
PFG
Pulse Flush Gate
Horizontal Phase 1, A Left
C6
VSUB
Substrate
VSUB
Substrate
Description
Description
A7
H2L
Horizontal Phase 2, Left
C7
A10
H2R
Horizontal Phase 2, Right
C8
PFG
Pulse Flush Gate
Horizontal Phase 1, A Right
C9
V2
Vertical Phase 2
Output Amplifier Supply, Right B
C10
V1
Vertical Phase 1
A11
H1AR
A12
VDDRB
A13
RDR
Reset Drain, Right
C11
PFG
Pulse Flush Gate
A14
VSSR
Output Amplifier Return, Right
C12
LOD
Lateral Overflow Drain
A15
VDDRA
A16
VSUB
D1
VSUB
D2
FDG
Fast Dump Gate
Output Amplified Supply, Right A
Substrate
Substrate
B1
VOUTLA
Video Output, Left A
D3
V1
Vertical Phase 1
B2
VOUTLB
Video Output, Left B
D4
V2
Vertical Phase 2
B3
OGL
Output Gate, Left
D5
LOD
Lateral Overflow Drain
B4
RGL
Reset Gate, Left
D8
LOD
Lateral Overflow Drain
B5
H1LL
Horizontal Phase 1, Last Gate, Left
D9
V2
Vertical Phase 2
B6
H1BL
Horizontal Phase 1, B Left
D10
V1
Vertical Phase 1
B7
XG
Fast Dump Gate
Horizontal Transfer Gate
D11
FDG
D12
VSUB
B8
VSUB
Substrate
B9
VSUB
Substrate
Substrate
NOTE: The leads are on a 0.100″ spacing.
B10
NC
B11
H1BR
No Connection
Horizontal Phase 1, B Right
B12
H1LR
Horizontal Phase 1, Last Gate, Right
B13
RGR
Reset Gate, Right
B14
OGR
Output Gate, Right
B15
VOUTRB
Video Output, Right B
B16
VOUTRA
Video Output, Right A
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KAF−40000
IMAGING PERFORMANCE
Table 4. TYPICAL OPERATIONAL CONDITIONS
Test Condition − Unless
Otherwise Noted
Units
2093
ms
Variable
33
200
250
1000
ms
Variable
2126 (2093 + 33)
2293 (2093 + 200)
2343 (2093 + 250)
3093 (2093 + 1000)
ms
364.3
ms
12 (as Tested)
MHz
Temperature − Room
20
°C
Room Temperature
Temperature − Device
29
°C
Typical Device Operating Temperature at Test
Room Temperature
Description
Readout Time (tREADOUT)
Integration Time (tINT)
Frame Time (tREADOUT + tINT)
Line Time (tLINE)
Horizontal Clock Frequency
Operation
Notes
Includes 140 Overclock Pixels
Includes 178 Overclock Lines
Low Light Tests
Saturation Tests
Brightfield Tests
Darkfield and Linearity Tests
Low Light Tests
Saturation Tests
Brightfield Tests
Darkfield and Linearity Tests
Nominal Operating Levels
Includes 140 Overclock Pixels
Guaranteed for 18 MHz Operation
Dual Parallel Split Mode
Table 5. SPECIFICATIONS
Description
Symbol
Min.
Nom.
Saturation Signal (Note 1)
NSAT
Ne−SAT
Q/V
1075
1300
42
31
Photoresponse Non-Linearity (Note 2)
PRNL
5
Photoresponse Non-Uniformity (Note 3)
PRNU
Max.
Units
Verification
Plan15
mV
e−
mV/e−
Die
10
%
Die
8.5
25
% p−p
Die
VDARK,READ
18
20
mV/s
Die
VDARK,INT
3
10
mV/s
Die
DSNU
1
4
mV p−p
Die
Dark Signal Doubling Temperature (Note 4)
DT
5.5
°C
Design
Read Noise (Note 7)
NR
13
e− rms
Design
Dynamic Range (Note 8)
DR
70.2
dB
Design
DRLIN (Est.)
69.3
dB
Design
RGHueUnif
BGHueUnif
5
%
Die
Readout Dark Signal (Note 4)
Integration Dark Signal (Note 5)
Dark Signal Non-Uniformity (Notes 6, 16)
Estimated Linear Dynamic Range
Red-Green Hue Shift
Blue-Green Hue Shift (Note 9)
Horizontal Charge Transfer Efficiency
(Note 10)
HCTE
0.999995
Vertical Charge Transfer Efficiency
VCTE
0.999999
0.999998
XAB
800
1400
DC Offset, Output Amplifier (Note 12)
VODC
6.0
7.5
Output Amplifier Bandwidth (Note 13)
f−3dB
Output Impedance, Amplifier
ROUT
Reset Feedthrough
VRFT
Blooming Protection (Note 11)
12
Die
Die
9.5
220
100
145
0.5
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8
300
x ESAT
Design
V
Die
MHz
Design
W
Die
V
Design
KAF−40000
Table 5. SPECIFICATIONS (continued)
Description
Symbol
Min.
Nom.
Max.
−
−
−
39
45
37
−
−
−
−
−
−
600
530
470
−
−
−
−
−
−
37
41
37
−
−
−
−
−
−
600
520
470
−
−
−
Units
Verification
Plan15
% QE
Design
nm
Design
% QE
Design
nm
Design
KAF−40000−FXA CONFIGURATION GEN2 COLOR
Peak Quantum Efficiency
Red
Green
Blue
Peak Quantum Efficiency Wavelength
Red
Green
Blue
QEMAX
lQE
KAF−40000−CXA CONFIGURATION GEN1 COLOR (Note 17)
Peak Quantum Efficiency
Red
Green
Blue
Peak Quantum Efficiency Wavelength
Red
Green
Blue
QEMAX
lQE
1. Increasing output load currents to improve bandwidth will decrease these values.
2. Worst-case deviation (from 15 mV & 90% NSAT min) relative to a linear fit applied between 0 and 65% of VSAT.
3. Difference between the maximum and minimum average signal levels of 168 × 168 blocks within the sensor on a per color basis as a % of
average signal level.
4. T = 60°C. tINT = 0. Average non-illuminated signal with respect to over-clocked horizontal register signal.
5. T = 60°C. Average non-illuminated signal with respect to over-clocked vertical register signal.
6. T = 60°C. Absolute difference between the maximum and minimum average signal levels of 168 × 168 blocks within the sensor.
7. rms deviation of horizontal over-clocked pixels measured in the dark.
8. 20Log (Ne−SAT / NR)
9. Gradual variations in hue (red with respect to green pixels and blue with respect to green pixels) in regions of interest (168 × 168 blocks)
within the sensor. The specification refers to the largest value of the response difference.
10. Measured per transfer above and below (~70% VSAT min) saturation exposure levels. Typically, no degradation in HCCD CTE is observed
up to 18 MHz.
11. XAB is the number of times above the VSAT illumination level that the sensor will bloom by spot size doubling. The spot size is 10% of the
imager height. XAB is measured at 4 ms.
12. Video level offset with respect to ground.
13. Last stage only. Assumes 5 pF off-chip load.
14. Amplitude of feed-through in VOUT during RG clocking.
15. A “die” parameter is measured on every sensor during production testing. A “design” parameter is quantified during design verification and
not guaranteed by specification.
16. tINT = 1000 ms.
17. This color filter set configuration (Gen1) is not recommended for new designs.
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KAF−40000
TYPICAL PERFORMANCE CURVES
KAF−40000 Average Quantum Efficiency
50
45
35
30
25
20
15
10
5
0
350
400
450
500
550
600
650
700
750
800
850
Wavelength (nm)
Figure 7. Spectral Response
KAF−40000 Response Difference (GR−GB)
QE Response Difference (GR−GB)
Absolute Quantum Effeciency (%)
40
Wavelength (nm)
Figure 8. Typical GR−GB QE Difference
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10
900
950
1000
1050
1100
KAF−40000
KAF−40000 Anti-Blooming Performance
6000
5000
XAB
4000
3000
2000
1000
0
0
5
10
15
20
Integration Time (ms)
Figure 9. Minimum Expected Anti-Blooming Performance
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25
KAF−40000
DEFECT DEFINITIONS
Operating Conditions
Bright defect tests performed at T = 25°C, tINT = 250 ms and tREADOUT = 2093 ms.
Dark defect tests performed at T = 25°C, tINT = 1,000 ms and tREADOUT = 2093 ms.
Table 6. SPECIFICATIONS
Classification
Points
Clusters
Single Columns
Includes Dead Columns
Standard Grade
< 4,000
< 50
< 20
Yes
A column that deviates by more that 1.5% above or below
neighboring columns under illuminated conditions.
Point Defects
A pixel that deviates by more than 36 mV above
neighboring pixels under non-illuminated conditions.
A pixel that deviates by more than 7% above or 11%
below neighboring pixels under illuminated conditions
Column defects are separated by no less than 4 good
columns. No multiple column defects (double or more) will
be permitted.
Cluster Defect
A grouping of not more than 10 adjacent point defects.
Column and cluster defects are separated by at least 4
good columns in the x direction.
Cluster defects are separated by no less than 4 good pixels
in any direction.
Dead Column
A column that deviates by more than 50% below
neighboring columns under illuminated conditions.
Column Defect
A grouping of more than 10 point defects along a single
column.
Saturated Column
A column that deviates by more than 120 mV above
neighboring columns under non-illuminated conditions. No
saturated columns are allowed.
A column that deviates by more that 1.2 mV above
neighboring columns under non-illuminated conditions.
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KAF−40000
OPERATION
Table 7. ABSOLUTE MAXIMUM RATINGS
Description
Symbol
Minimum
Maximum
Units
Diode Pin Voltages (Notes 1, 2)
VDIODE
−0.5
20
V
Gate Pin Voltages (Notes 1, 3)
VGATE1
−14.3
14.5
V
RG Pin Voltage (Note 1)
VRG
−0.5
14.5
V
Overlapping Gate Voltages (Note 4)
V1−2
−14.3
14.5
V
Non-Overlapping Gate Voltages (Note 5)
Vq−q
−14.3
14.5
V
Output Bias Current (Note 6)
IOUT
−30
mA
LOD Diode Voltage (Note 1)
VLODT
−0.5
13.5
V
TOP
0
60
°C
Operating Temperature (Note 7)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Referenced to pin VSUB.
2. Includes pins: RD, VDD, VSS, VOUT.
3. Includes pins: V1, V2, H1A, H1B, H1L, H2, OG, PFG, FDG, XG.
4. Voltage difference between overlapping gates. Includes: V1 to V2, H1/H1L to H2, H1L to OG, V1 to H2, PFG to V1/V2, FDG to V1/V2, XG
to H1A/H1B/H2.
5. Voltage difference between non-overlapping gates. Includes: V1 to H1A/H1B/H1L, V2 to XG, H2 to PFG/FDG, PFG to FDG.
6. Avoid shorting output pins to ground or any low impedance source during operation. Amplifier bandwidth increases at higher currents and
lower load capacitance at the expense of reduced gain (sensitivity). Operation at these values will reduce MTTF (Mean Time to Failure).
7. Noise performance will degrade at higher temperatures.
Power-up Sequence
1. Connect the ground pins (VSUB).
2. Supply the appropriate biases and clocks to the
remaining pins.
The sequence chosen to perform an initial power-up is not
critical for device reliability. A coordinated sequence may
minimize noise and the following sequence is
recommended:
Table 8. DC BIAS OPERATING CONDITIONS
Symbol
Minimum
Nominal
Maximum
Units
Maximum DC
Current (mA)
Reset Drain (Note 1)
VRD
11.3
11.5
11.7
V
IRD = 0.01
Output Amplifier Return (Note 1)
VSS
0.5
0.7
1.0
V
ISS = 3.0
Output Amplifier Supply (Note 1)
VDD
14.5
15.0
15.5
V
IOUT + ISS
Substrate
VSUB
V
0.01
Output Gate (Note 1)
VOG
−2.2
−2.0
−1.8
V
0.01
Lateral Drain (Note 1)
VLOD
9.8
10.0
10.2
V
0.01
Video Output Current (Note 2)
IOUT
5
10
mA
Description
0
1. Subscripts (L, R, LA, LB, RA, RB, T, B) have not been included in the symbol list.
2. An output load sink must be applied to VOUT to activate output amplifier – see Figure 4.
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KAF−40000
AC Operating Conditions
Table 9. CLOCK LEVELS
Description
Symbol
Level
Minimum
Nominal
Maximum
Units
V1
V1L
Low
−9.2
−9.0
−8.8
V
V1H
High
2.3
2.5
2.7
V
V2
H1A
H1B
H1L
H2
RG
PFG
FDG
XG
V2L
Low
−9.2
−9.0
−8.8
V
V2H
High
3.3
3.5
3.7
V
H1L
Low
−4.2
−4.0
−3.8
V
H1H
High
1.8
2.0
2.2
V
H1L
Low
−4.2
−4.0
−3.8
V
H1H
High
1.8
2.0
2.2
V
H1LLOW
Low
−6.2
−6.0
−5.8
V
H1LHIGH
High
1.8
2.0
2.2
V
H2L
Low
−4.2
−4.0
−3.8
V
H2H
High
1.8
2.0
2.2
V
VRGL
Low
0.8
1.0
1.2
V
VRGH
High
7.8
8.0
8.2
V
PFGL
Low
−9.2
−9.0
−8.8
V
PFGH
High
4.8
5.0
5.2
V
FDGL
Low
−9.2
−9.0
−8.8
V
FDGH
High
4.8
5.0
5.2
V
XGL
Low
−4.7
−4.5
−4.3
V
XGH
High
2.8
3.0
3.2
V
1. Subscripts (L, R) have not been included in this symbol column.
2. All pins draw less than 10 mA DC current. Capacitance values relative to SUB (substrate).
3. Capacitance values of left/right combined.
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14
KAF−40000
Capacitance Model
PFG
H1A
VDD
258 nF
V1
439 pF
H1B
VSS
455 nF
V2
484 pF
H2
917 pF
H1L
20 pF
RG
16 pF
FDG
76 pF
RD
517 nF
LOD
7 pF
17 pF
15 pF
XG
120 pF
237 pF
VOUT
(Each)
OG
13 pF
7 pF
Figure 10. Lumped Capacitance Value Model − KAF−40000
NOTE: A simplified pin capacitance model is provided by ON Semiconductor as a guideline for circuit design and tends to overstate the
effective capacitance experienced by the clock driver. This model should be used as a reference. Although it is a moderately accurate
target, it does not represent the values required for any automated circuit analysis.
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15
KAF−40000
TIMING
Table 10. REQUIREMENTS AND CHARACTERISTICS
Description
Symbol
Minimum
Nominal
Maximum
Units
H1, H2 Clock Frequency (Note 1, 2)
fH
18
MHz
V1, V2 Clock Frequency (Note 1, 2)
fV
25
kHz
V1−V2 Cross-over
VVCR
0
1.0
2.7
V
H1−H2 Cross-over
VHCR
−2.0
−1.0
0
V
H1, H2 Setup Time
tHS
5
ms
V2−H1A Delay
tD1
5
ms
H1A−XG Delay
tD2
30
ms
XG−V2 Delay
tD3
5
ms
H1, H2 Rise, Fall Times (Note 5, 6)
tH1r, tH1f
5
H1L Rise − H2 Fall Crossover (Note 9)
VH1LCR
−2.0
V1, V2 Rise, Fall Times (Note 5)
tV1r, tV1f
5
RG Clock Pulse Width (Note 7)
tRGw
5
tRGr, tRGf
5
tVw
16
te
55.56
RG Rise, Fall Times (Note 5)
V1, V2 Clock Pulse Width (Notes 2, 3, 4)
Pixel Period (1 Count) (Note 2)
−1.0
10
%
1.0
V
10
%
ns
10
20
%
ms
ns
H1L−VOUT Delay
tHV
10
ns
RG−VOUT Delay
tRV
5
ns
Readout Time (Note 8)
tREADOUT − DS
tREADOUT − DPS
1.35
0.76
s
tF − DS
tF − DPS
0.7
1.3
fps
Line Rate (Note 8)
tLINEDS − DS
tLINEDP − DPS
242.2
274.4
ms
PFG Holdoff Time
tPFG
180
ms
FDG Holdoff Time
tFDG
20
ms
Frame Rate (Note 8)
1.
2.
3.
4.
5.
6.
7.
8.
9.
50% duty cycle values.
CTE will degrade above the maximum frequency.
Longer times will degrade noise performance.
Measured where VCLOCK is at 0 V.
Relative to the pulse width (based on 50% of high/low levels).
The maximum specification or 10 ns whichever is greater based on the frequency of the horizontal clocks.
RG should be clocked continuously.
DS = Dual Split DPS = Dual Parallel Split.
The charge capacity near the output could be degraded if the voltage at the clock crossover point is outside this range.
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16
KAF−40000
Edge Alignment
Horizontal Clock
H1AL/H1AR/H1BL/H1BR
H2L/H2R
VHCR
H1LL/H1LR
H2L/H2R
VH1LCR
Vertical Clock
V2
V1
VVCR
Figure 11. Timing Edge Alignment
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17
KAF−40000
Frame Timing
Dual-Parallel Split timing reads pixels out of all four outputs
with even lines reading out of VOUTLA and VOUTRA and
odd lines reading out of VOUTLB and VOUTRB.
Dual split timing reads the pixels out of VOUTLA and
VOUTRA. H1B may be grounded in this operating mode.
Frame Timing − Dual Split
tINT
V1
V2
tREADOUT
Line
1
2
5565
3
5566
H1A/B/L
H2
XG
Frame Timing − Dual-Parallel Split
tINT
V1
V2
tREADOUT
Line Pair
1
3
2
2782
2783
H1A
XG
H1B/L
H2
Figure 12. Frame Timing
Frame Timing Detail
Vertical Clocks
V1
V1HIGH
90%
tV
10%
V1LOW
tV1r
tV1f
V2
V2HIGH
90%
tV
10%
V2LOW
tV2r
tV2f
Figure 13. Frame Timing Detail
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18
KAF−40000
Line Timing (Each Output)
H1A (tD2), and then passed through XG (tD3) and into H1B.
During this time, a second, full resolution, row will load into
H1A at the second falling edge of V2 following the
characteristic delay tHD.
XG is held low unless the Dual-Parallel Split timing is
required. While operating in Dual-Parallel Split mode, full
resolution rows are passed from V2 (tD1), through
Line Timing − Dual Split
t LINE
tV
tV
t HS
V1
V2
H1A/B/L
3716 Cnts
H2
XG
Line Timing − Dual-Parallel Split
t LINE
tV
tV
tV
t D3
t HS
V1
V2
H1A
XG
t D1
H1B/L
t D2
tV
3716 Cnts
H2
Figure 14. Line Timing
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19
KAF−40000
Pixel Timing
te
H1A/B/L
H2
RG
VOUT
Figure 15. Pixel Timing
Pixel Timing Detail
Reset Clock
RGHIGH
RGL/RGR
90%
tRGw
VRG
10%
RGLOW
tRGr
tRGf
Horizontal Clocks
H1AHIGH/
H1BHIGH/
H2HIGH
H1AR/H1BR/H2R/
H1AL/H1BL/H2L
90%
50%
te / 2
10%
tHr
tHf
H1LHIGH
H1LR/H1LL
H1ALOW/
H1BLOW/
H2LOW
90%
50%
te / 2
10%
tHr
tHf
Figure 16. Pixel Timing Detail
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20
H1LLOW
KAF−40000
MODE OF OPERATION
Pulse Flush Gate Timing
The PFG clock resets all pixels in the array (except the
FDG row). Charge transfer out of the pixel is fully
completed only after V2 has been clocked low as shown.
Frame Timing − Pulse Flush Operation
tFLUSH
tINT
tREADOUT
V1
V2
tV
PFG
tPFG
Figure 17. Pulse Flush Gate Timing
Fast Dump Gate (FDG) Timing
The FDG clock only resets pixels that happen to be in the
FDG row. Charge transfer out of the pixel is fully completed
only after V2 has been clocked low plus the characteristic
time period (tFDG). The position of the FDG row is
illustrated in Figures 19–21, including the timing required
for a simple 1 line dump operation.
Row#
4
3
2
Fast Dump Gate Row
1
Bottom LOD Contact Row
HCCD Register A
HCCD Register B
Figure 18. Fast Line Dump Layout
Line Timing − Fast Dump Gate
tFDG
V1
V2
FDG
H1
3716 Cnts
H2
t0
t1
t2
t3
t4
t5
Figure 19. One Line Dump Timing Example
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21
KAF−40000
Line Timing − Fast Dump Gate (3 Line Dump)
tV
tV
tFDG
V1
V2
FDG
H1
3716 Cnts
H2
Figure 20. Line Dump Timing Example
t0
V2
4
VCCD
4
3
FDG
LOD
2
1
V1
V2
V1
V2
V1
V2
V1
V2
t1
GR4
B4
GR4
B4
R3
GB3
R3
GB3
GR2
B2
GR2
B2
R1
GB1
R1
GB1
GR4
B4
GR4
B4
R3
GB3
R3
GB3
GR2
R1
B2
GB1
t3
t2
GR2
R1
GR4
B4
GR4
B4
R3
GB3
R3
GB3
GR4
B4
GR4
B4
R3
GB3
R3
GB3
B2
t5
t4
GR4
B4
GR4
B4
R3
GB3
R3
GB3
R1
GB1
R1
GB1
GB1
R1
GB1
R1
B4
GR4
B4
R3
GB3
R3
GB3
R1
GB1
R1
GB1
GB1
R1
V1
V2
HCCD A
GB1
R1
GB1
XG
HCCD B
NOTE: Areas highlighted in yellow represent pixels drained of charge.
Figure 21. One Line Dump Pixel Illustration Using Color Filter Designation
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22
GR4
KAF−40000
STORAGE AND HANDLING
Table 11. STORAGE CONDITIONS
Description
Symbol
Minimum
Maximum
Units
Storage Temperature (Note 1)
TST
−20
70
°C
1. Long-term storage toward the maximum temperature will accelerate color filter degradation.
For information on ESD and cover glass care and
cleanliness, please download the Image Sensor Handling
and Best Practices Application Note (AN52561/D) from
www.onsemi.com.
For quality and reliability information, please download
the Quality & Reliability Handbook (HBD851/D) from
www.onsemi.com.
For information on device numbering and ordering codes,
please download the Device Nomenclature technical note
(TND310/D) from www.onsemi.com.
For information on soldering recommendations, please
download the Soldering and Mounting Techniques
Reference
Manual
(SOLDERRM/D)
from
www.onsemi.com.
For information on Standard terms and Conditions of
Sale, please download Terms and Conditions from
www.onsemi.com.
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23
KAF−40000
MECHANICAL DRAWINGS
Completed Assembly
Figure 22. Completed Assembly Drawing
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24
KAF−40000
Alignment Marks
The 98 + 48 mark should be used if alignment to die surface is required.
Figure 23. Individual Alignment Mark “98 + 48” (1 of 4)
2
2
3
3
Diagonal:
Image Center
X−Y:
Die Center
1
4
1
4
NOTE: Image center is −0.55 mm (X) and 34.05 mm (Y) from Die center.
Figure 24. Location of Recommended Alignment Marks (4 Locations)
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25
KAF−40000
Locations of marked alignment marks are listed in the table below with respect to the die center. Locations are listed in mm
from the die center.
Table 12.
Alignment Mark
X Location
Y Location
1
−22700
−16340
2
−22700
16340
3
22700
16340
4
22700
−16340
Locations of marked alignment marks are listed in the table below with respect to the image center. Locations are listed in
mm from the image center.
Table 13.
Alignment Mark
X Location
Y Location
1
−22699.45
−16374.05
2
−22699.45
16305.95
3
22700.55
16305.95
4
22700.55
−16374.05
Cover Glass Specification
1. Substrate material Schott D263T eco or equivalent.
2. 10 mm max. scratch/dig specification on the glass. No defect in the glass that exceeds 10 mm in any X−Y dimension.
3. Multilayer anti-reflective coating.
Table 14.
Wavelength
Total Reflectance
420−450
≤ 2%
450−630
≤ 1%
630−680
≤ 2%
ON Semiconductor and the
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KAF−40000/D