AN10910 Protecting charger interfaces and typical battery charging topologies with external bypass transistors Rev. 2 — 23 June 2011 Application note Document information Info Content Keywords BISS, MOSFET-Schottky, low VCEsat, battery charger, Li-Ion battery (Li-polymer battery), overvoltage protection, reverse polarity protection, ESD protection Abstract This application note illustrates how to protect a mobile device charger port against overvoltage and reverse polarity and gives an overview of typical battery charging topologies and how to use NXP Semiconductors protection devices, bipolar and MOS transistors. AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies Revision history Rev Date 2 20110623 1 20100428 Description • • Table “Document information” updated Section 7 “Appendix” updated Initial version Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 2 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 1. Introduction This application note describes a complete solution for battery charging in mobile devices. This includes how to charge a Li-Ion battery with typical battery charger topologies, particularly with external bypass transistors and ways to effectively protect against overvoltage and overcurrent from the charger connector. 2. Battery charging via USB interface 2.1 Chinese battery charging standard (YDT1591-2006) This standard describes an AC-to-DC power adapter with a standard USB type A output connector, allowing different vendors to share common AC-to-DC adapters or allow the handset to be charged via a standard PC USB port. This will enable customers to carry only one cable to charge their handsets when USB ports are available. The idea behind this is to reduce the overall volume of AC-to-DC adapters, reduce the Bill Of Material (BOM) cost and improve the “think green” factor. The electrical specifications of the common AC-to-DC adapters are: • 5 V output voltage (5% tolerance) • 300 mA to 1800 mA charging current (PC USB port can offer 500 mA/900 mA) • included overvoltage protection for voltages higher than 6 V The battery charger circuit is located in the handset. To make sure that the handset can draw more than 500 mA (five unit loads) from the power adapter, the D+ and D lines must be shorted inside the adapter. 2.1.1 PC USB port The power distribution of USB devices is divided into different classes. With this separation the classes can be simplified into different unit loads. A unit load is defined to be 100 mA in USB 2.0 and 150 mA into USB 3.0. After configuration the maximum number of loads is five or six (500 mA or 900 mA) in USB 2.0 and USB 3.0 respectively. For configuration, communication with a PC must often be established to ensure so-called high-power, bus-powered function. A USB 3.0 port may support the USB charging specifications (D+/D shorted). Note that the USB 2.0 power distribution requirements are mandatory when a USB 3.0 device is operating in USB 2.0 modes (high-speed, full-speed or low-speed). 2.2 Micro-USB connector in smart phone Beginning in 2010, with a deadline of 2012, all data transfer capable mobile handsets must use a micro-USB connector as the battery charging interface. This agreement was signed by ten supplier of mobile handsets and network service providers in June 2009. In February 2009 seventeen partners published a memorandum on a volunteer basis. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 3 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies The idea behind is similar to the chinese battery charging standard, where any device can be charged by a common AC-to-DC adapter or a PC USB port. Today’s mobile handset volume is between 350 million to 400 million units, with a renew rate of approximately 180 million mobile handsets per year. 25% of today’s total volume are capable of data communication or can be connected to a PC. In addition the energy efficiency of the AC-to-DC adapter will be improved. All these changes will reduce up to 51.000 tonnes of excess AC-to-DC adapters. 2.3 VBUS electrical characteristics Table 1. DC electrical characteristics Symbol Parameter Min Max Unit 4.45 5.25 V 4.0 - V Supply voltage Downstream connector bus supply voltage VBUS Upstream connector bus supply voltage VBUS Supply current ICCPRT high-power hub port (out) supply current 500/900 - mA ICCUPT low-power hub port (out) supply current 100/150 - mA ICCHPF high-power function (in) supply current - 500/900 mA ICCLPF low-power function (in) supply current - 100/150 mA ICCINIT unconfigured function/hub (in) supply current - 100/150 mA ICCSH suspended high-power device supply current - 2.5 mA 2.4 General USB requirements Depending on the communication speed of the USB interface, different prerequisites apply for protection devices that are placed at this interface. Table 2 lists limits for capacitive load on the differential data lines of the USB port. Table 2. USB differential data line requirements Interface speed maximum bit rate min max unit Low speed 1.5 MB/s 200[1] 450[1] pF pF Full speed 10 MB/s - 150[2] High speed 480 MB/s - 3[3] pF - 0.5[3] pF Super speed AN10910 Application note 5 GB/s [1] Total capacitance of cable and device on D+ or D lines [2] Total capacitance of a downstream facing port including cable connector and transceiver. [3] Approximate value. Not specified by the USB standard. All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 4 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 3. Charger interface and USB protection Whether a mobile device is charged via the USB port or via a discrete charger connector incorrect polarity or a too high voltage applied to this input poses a threat to the charger circuit and the Power Management Unit (PMU) of the mobile device. In addition to the danger of accidentally applying the wrong charging voltages, the USB/charger port can be subject to ElectroStatic Discharge (ESD) strikes. USB / charger connector PMU / charger control Reverse-polarity- , overvoltage-, E S Dprotec tion Charger / VB us DD+ V in GND ID USB transceiver GND DD+ ID GND E S D-protection Fig 1. Charger interface and USB protection block diagram As shown in Figure 1 a complete protection solution for the USB and charger port consists of two blocks. The first block protects the USB VBUS or charger interface against reverse polarity and overvoltage. The second block protects the USB data lines and the downstream components against damage from ESD. The subsequent sections illustrate the protection concepts of these blocks in more detail. 3.1 Reverse polarity protection In case the charger voltage is accidentally supplied in reverse polarity a PMU and any other downstream circuit needs to be properly protected in order to survive with no damage. A simple and yet effective concept providing this functionality is depicted in Figure 2. USB / charger connector Fuse Protection Diode Charger / VB us PMU / charger control V in GND GND Fig 2. Reverse polarity protection operation The positive voltage supplied to the GND input of the charger can pass through the forward biased protection diode and the protective fuse, back to the charger negative pole. In this concept the protection diode needs to be able to conduct high currents only until the fuse clears. Fast reacting fuses can clear in 100 ms. Section 3.4 describes protection diodes that are able to conduct up to 5 A for the necessary period of time. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 5 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies The transient negative voltage that can be observed behind a diode used as reverse polarity protection can be approximated below. (1) V diode = I R on + V f For a diode with Ron = 0,268 and Vf = 0.85 V that is operating forward biased in linear region at room temperature, the resulting voltage for a current of I = 5 A is Vdiode = 1.65 V. 3.2 Overvoltage protection Given the multitude of accessories that are available to replace originally supplied chargers, the threat of a voltage being accidentally applied that is too high is omnipresent. A simple solution means to limit the overvoltage is by adding a Zener diode with a breakdown voltage above the required working voltage. Figure 3 shows the operation principle of an overvoltage protection based on a Zener diode. A high voltage applied to the charger / VBUS terminal sets the diode into breakdown mode once the diode breakdown voltage is reached. Subsequently the voltage at the PMU / charger input is limited to the breakdown voltage of the diode. USB / charger connector Fuse Protection Diode Charger / VB us PMU / charger control V in GND GND Fig 3. Overvoltage protection operation If not already present for reverse polarity protection (see Section 3.1), a fuse or Positive Temperature Coefficient (PTC) element should be placed in the supply path. This limits the current if, for example, defective charger supplying the primary voltage is connected and the continuous current that passes via the Zener diode exceeds the limit imposed by the maximum power dissipation. 3.3 USB data ESD protection While for low speed and full speed USB the constraints for applying additional ESD protection on the differential data lines are relaxed, a high-speed USB port specifies additional capacitance to a much lower value. 3.3.1 Rail-to-rail concept for low capacitance ESD protection A common architecture utilized to build low capacitance ESD protection devices is the so-called ‘rail-to-rail’ diode concept, which shunts ESD transients from Input/Output (I/O) lines into the ground or power supply “rails.” While some implementations comprise simply of the rail-to-rail diodes themselves, the typical NXP Semiconductors’ solution also contains an additional Zener diode in parallel to the rail-to-rail diode string. This minimizes the clamping voltages by routing all ESD current (positive and negative strikes) back to ground and also to eliminate external components. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 6 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies The principle of operation of the rail-to-rail concept is illustrated in Figure 4 a. Discharge path of negative ESD pulse Fig 4. b. Discharge path of positive ESD pulse Rail-to-rail ESD protection concept With the rail-to-rail concept, a negative ESD strike on the I/O pin will cause one rail-to-rail diode (the lower diode at the flash sign in Figure 4, left side) to become forward biased, thereby transferring the ESD strike through the lower diode to ground. A positive discharge strike will cause the other rail-to-rail diode (the upper diode at the flash sign in Figure 4, right side) to become forward biased transferring the discharge to the cathode of the Zener diode that will clamp voltages exceeding its breakdown voltage by the ESD strike to ground. 3.3.2 USB data line ESD protection with rail-to-rail devices A common technique to provide such a low capacitive ESD protection, for example with a line capacitance below 1.5 pF, is the rail-to-rail ESD protection architecture. Figure 5 shows how a four-channel rail-to-rail ESD protection device can be used to protect all the lines of a USB On-The-Go (OTG) port. USB connector V B us V DD D- D- D+ D+ ID ID GND Fig 5. USB transceiver GND Four-channel rail-to-rail ESD protection The influence of a low capacitance rail-to-rail protection device on the data transmission can be very small. Figure 6 shows the eye diagram of a high-speed USB transmission captured on the D+/D lines with and without 1 pF rail-to-rail ESD protection applied. Comparing the two measurements illustrates that the influence of this kind of low capacitance ESD protection is negligible. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 7 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies f = 480 MHz, V= 400 mV (1) f = 480 MHz, V= 400 mV a. Without ESD protection Fig 6. b. With 1 pF rail-to-rail ESD protection High-speed USB eye diagrams 3.4 Protection devices NXP offers a wide range of protection devices in order to protect against ESD, overvoltage and reverse polarity at a charger interface. These products can be used to realize simple but effective protection concepts as described in the previous section. Table 5 in Section 7 lists a number of products that meet the special requirements of this application. One product in the comparison table that deserves special attention is IP4389CX4 as it offers a complete reverse polarity and overvoltage protection solution by integrating a fast reacting fuse. Products that are ideally suited to protecting USB data lines are listed in Table 4 of Section 7. Further information on USB data line protection can also be found in AN10753. 4. Li-Ion batteries Li-Ion batteries have some advantages compared to Ni-based batteries, like NiCd or NiMH batteries. • • • • High average operating cell voltage of 3.6 V, instead of 1.2 V (Ni-based batteries) High energy density - smaller and lighter batteries Lower self-discharge rates Little or no memory effect For these reasons Li-Ion batteries are widely used in mobile applications. On the other hand Li-Ion batteries must be protected against undervoltage, overvoltage, over current and over temperature. Therefore battery management and system monitoring are built into battery packs and most PMU also measure the battery temperature. Li-Ion batteries need a different charging algorithm compared to Ni-based batteries. This algorithm is called CC/CV (constant current/constant voltage)-algorithm. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 8 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies The CC/CV charging algorithm is shown in Figure 7. Constant Current region V, I Constant Voltage region VMAX VBAT Battery voltage ICC ICHG Charge current IMIN tCHARGE Fig 7. tMAX time Charging algorithm Li-Ion battery The value of VMAX and ICC depends on the type of battery that is used. The maximum charge rate in CC mode is 1C, where 1C indicates the capacity of the battery e.g. 1000 mAh. The value of VMAX is typically in the range of 4.1 to 4.2 volts. During the CV mode the voltage is constant and the charge current decreases as the battery is charged. There are two possibilities to terminate the charging process. First when the charge current drops below the IMIN. Alternatively, a fixed total charging time (tMAX) could be used to stop the charging process. For the CC/CV charging, there are different modes available, depending on the PMU: • Idle mode: No valid charger adapter is connected. Once a charger adapter is detected most PMUs will enter the qualification mode. The PMU will return to Idle mode when the end-of-charge condition is reached. • Qualification mode: This mode is used for qualifying a discharged battery. Most PMUs remain in qualification mode as long as the battery voltage is below the VVERYLOWBAT-level, typically 2.7 V. • Pre charge mode: After qualification mode the PMU will enter the pre charge mode. A low charge current is used. Normally the battery is charged until the battery level is higher than VLOWBAT and the fast charge mode will be activated. • Fast charge mode (CC/CV): The battery will be charged with ICC charging rate until the CV condition, VBAT > VMAX, is reached. CV mode will stop after the end-of-charge condition is reached (IMIN or tMAX). AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 9 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 5. Li-Ion battery charging topologies There are several different battery technologies available in the market. This application note highlights the battery chargers, that are using external pass elements. You can differ between two main paths: • Bipolar Junction Transistor (BJT) as pass element – BJT as current regulator – BJT as current regulator + MOSFET as control switch (load switch) • MOSFET as pass element – Single MOSFET-Schottky diode module – Double MOSFET in back-to-back configuration Often PMU with external bypass transistor are capable of driving a MOSFET. As an alternative a lower cost bipolar transistor can be used. NXP Semiconductors low VCEsat Breakthrough In Small Signal (BISS) transistor perform the same function as a MOSFET at a lower cost, as an advantage there is no need for a blocking diode. So a MOSFET-Schottky diode module or a double MOSFET can be replaced by a low VCEsat BISS transistor and a resistor, if the PMU is capable of direct biasing the low VCEsat BISS transistor. 5.1 Low VCEsat BISS transistors as pass element The Bipolar Junction Transistor (BJT) is a current-driven device, compared to the MOSFET which is a voltage-driven device. When designers want to use a BJT, as replacement of the MOSFET, they have to understand the current limitations of the PMU. To ensure the low VCEsat BISS transistor goes into saturation, the control pin of the PMU must be able to supply the base current (IB), otherwise an additional control transistor would be required. For example: • Charging current 1000 mA • Worst case current gain (hFE) of 100 The control pin must be able to provide 10 mA for the low VCEsat BISS transistor. Low VCEsat BISS transistors can be used in saturation mode and in linear mode. Both modes will be shown in the next two chapters. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 10 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 5.1.1 BJT as current regulator Fig 8. PMU with external low VCEsat (BISS) pass transistor In switched current sources the low VCEsat transistor is used in saturation mode, the minimum gain should be taken into account, at 1 A the gain of the PBSS304PX is 200. Therefore a minimum base current of 5 mA is needed, to ensure we will set the base current to 10 mA. The additional resistor R2 should limit the maximum current of the drive stage. (2) P tot = P T + P R (3) 2 P tot = I C V CEsat + I B R (4) 2 P tot = 1A 80mV + 10mA 200 = 100mW In linear mode the power dissipation of the low VCEsat BISS transistor increases due to higher voltage drops across the collector-emitter junction. In this case the PMU has to provide lower base currents compared to the switched mode. If the battery has to be charged via the USB interface the maximum supply voltage is 5.25 V. In worst case the minimum allowed battery voltage is 3.6 V, depends on the battery supplier specifications, for fast charge-mode. (5) P tot · = 1A 1 65V = 1 65W Therefore a package must be chosen that fits mechanically in the application and the charging current must be adopted to the thermal capability of the transistor package. AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 11 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 5.1.2 BJT - MOSFET as load switch Fig 9. PMU with external low VCEsat BISS pass transistor with additional small-signal MOS control transistor (6) P tot = P T + P R + P M (7) 2 P tot = I C V CEsat + I B R + 2 IB R DSon (8) P tot · = 1A 80mV + 10mA 200 + 10mA 390m = 100 04mW 2 2 5.2 MOSFETs as pass elements Due to the fact that MOSFETs are voltage-driven, most PMUs will drive the MOSFET in a switched-mode. In addition to a MOSFET there is a need for a blocking diode in series connection to the MOSFET, because the body diode of each MOSFET conducts in reverse mode to prevent any reverse current from the battery. 5.2.1 MOSFET-Schottky diode module solution Fig 10. PMU with external pass MOSFET-Schottky diode module AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 12 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies The typical power dissipation through the MOSFET-Schottky diode module can be calculated as follows: (9) P tot = P T + P D (10) 2 P tot = I D R DSon + I D V F (11) 2 P tot = 1A 65m + 1A 325mV = 390mW 5.2.2 Double FET solution Fig 11. PMU with external double MOSFET as pass element By connecting the MOSFET in this configuration, the Schottky diode has been eliminated. If both gates can be controlled independently, the PMU can control the charging current and also the discharging current if the USB port has to supply power. It is a superior solution compared to using a MOSFET-Schottky diode module, but it does cost more. The typical power dissipation through the double MOSFET can be calculated as follows: (12) P tot = 2 P T (13) 2 P tot = 2 I D R DSon (14) 2 P tot = 2 1A 65m = 130mW AN10910 Application note All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 13 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 6. Conclusion NXP Semiconductors offers a wide variety of low VCEsat BISS transistor, small signal Trench MOSFET and Maximum Efficiency General Application (MEGA) Schottky rectifier for Li-Ion battery charging applications in mobile device, as cellular phones, navigation systems and low power mobile computing. Every solution has it own advantage and disadvantage, so every proposal is specific to customer’s requirements and often other products can fit in a given customer’s application. The usage of a low VCEsat BISS transistor or a MOSFET / MOSFET-Schottky diode module depends initially on the technology of the PMU. But with an extra small-signal MOS, to control the base current, any MOSFET / MOSFET-Schottky diode module can be replaced by low VCEsat BISS transistor. NXP Semiconductors’ low VCEsat BISS is less sensitive to ESD damage compared to the MOSFET without internal ESD protection. It has a lower turn on voltage (typical VBE = 0.7 V) compared to a MOSFET (VGS = 1.8 V to 10 V). These advantages are very attractive for low voltage, battery-driven devices like cell phones. Because of the blocking voltages in both directions, the low VCEsat BISS transistors eliminate the need for a blocking diode which is required when using a MOSFET, included in a MOSFET-Schottky diode module. The IP428x family is designed for the tough requirements of reverse polarity and over-voltage protection. These products enable a simple and very effective protection concept for mobile device charger inputs. A further simplified solution with even higher integration density can be found in the IP4389CX4 which integrates a fast reacting fuse. 7. Appendix Table 3. Transistor product portfolio Name Description Dimension [mm] Package Release PBSS304PD PNP low VCEsat, VCEO = 80 V, IC = 3 A 2.9 x 1.5 x 1.0 SOT457 Released PBSS304PX PNP low VCEsat, VCEO = 60 V, IC = 4.2 A 4.5 x 2.5 x 1.5 SOT89 Released PMV65XP P-ch. MOSFET-Schottky, VDS = 20 V, RDSon= 65 m 2.9 x 1.3 x 1.0 SOT23 Released PMN50XP P-ch. MOSFET-Schottky, VDS = 20 V, RDSon = 48 m 2.9 x 1.5 x 1.0 SOT457 Released PMZ390UN N-ch. MOSFET, VDS = 30 V, RDSon = 390 m 1.0 x 0.6 x 0.5 SOT883 Released PMFPB6545UP P-ch. MOSFET-Schottky, VDS = 20 V, RDSon = 65 m, VF = 455 mV 2.0 x 2.0 x 0.65 SOT1118 Released PMFPB6532UP P-ch. MOSFET-Schottky, VDS = 20 V, RDSon = 65 m, VF = 325 mV 2.0 x 2.0 x 0.65 SOT1118 Released PBSS5330X PNP low VCEsat, VCEO = 30 V, IC = 3 A 4.5 x 2.5 x 1.5 SOT89 PBSS5330PA PNP low VCEsat, VCEO = 30 V, IC = 3 A 2.0 x 2.0 x 0.65 SOT1061 Released Released PMR400UN N-ch. MOSFET, VDS = 30 V, RDSon = 400 m 1.6 x 0.8 x 0.77 SOT416 PMDPB70XP Double P-ch. MOSFET, VDS = 30 V, RDSon = 70 m 2.0 x 2.0 x 0.65 SOT1118 Dec. 2011 Released PBSM5240PF PNP low VCEsat, VCEO = 40 V, IC = 2 A 2.0 x 2.0 x 0.65 SOT1118 Released 2.0 x 2.0 x 0.65 SOT1118 Released N-ch. MOSFET, VDS = 30 V, RDSon=400 m PMDPB65UP AN10910 Application note Double P-ch. MOSFET, VDS = 20 V, RDSon = 65 m All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 14 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies Table 4. ESD protection product portfolio Name Description Dimension [mm] Package Release IP4221CZ6-S VRWM = 5.5 V, Cd = 1.0 pF, VESD(max) = 8 kV, quad 1.45 x 1.0 x 0.5 Released IP4221CZ6-XS VRWM = 5.5 V, Cd = 1.0 pF, VESD(max) = 8 kV, quad 1.0 x 1.0 x 0.5 SOT891 Released IP4282CZ6 VRWM = 5.5 V, Cd = 0.7 pF, VESD(max) = 8 kV, dual 1.45 x 1.0 x 0.5 SOT886 Released IP4284CZ10-TB VRWM = 5.5 V, Cch = 0.5 pF, VESD(max) = 8 kV, quad 2.5 x 1.0 x 0.5 SOT1059 Released IP4059CX5 VRWM = 5.5 V, Cd = 3.0 pF, VESD(max) = 15 kV, triple 0.96 x 1.34 x 0.65 WLCSP5 Released IP4359CX4/LF VRWM = 5.5 V, Cd = 1.3 pF, VESD(max) = 15 kV, dual 0.91 x 0.91 x 0.65 WLCSP4 Released PESD5V0F1BL VRWM = 5.5 V, Cd = 0.4 pF, VESD(max) = 10 kV, single 1.0 x 0.6 x 0.5 SOD882 Released PESD5V0X1BL VRWM = 5 V, Cd = 0.9 pF, VESD(max) = 9 kV, single 1.0 x 0.6 x 0.5 SOD882 Released PRTR5V0U2F VRWM = 5 V, CL = 1.0 pF, VESD(max) = 8 kV, dual 1.45 x 1.0 x 0.5 SOT886 Released Table 5. SOT886 Reverse polarity and overvoltage protection product portfolio Name Description Dimension [mm] Package Release IP4085CX4/LF VRWM = 14 V, IPP(min) = 60 A, Ptot = 1 W, VESD(max) = 30 kV 0.91 x 0.91 x 0.65 WLCSP4 Released IP4385CX4 VRWM = 5.5 V, IPP(min) = 33 A, Ptot = 0.7 W, VESD(max) = 30 kV 0.76 x 0.75 x 0.61 WLCSP4 Released IP4386CX4 VRWM = 14 V, IPP(min) = 28 A, Ptot = 0.7 W, VESD(max) = 30 kV 0.76 x 0.75 x 0.61 WLCSP4 Released IP4387CX4 VRWM = 8 V, IPP(min) = 33 A, Ptot = 0,7 W, VESD(max) = 30 kV 0.76 x 0.75 x 0.61 WLCSP4 Released IP4389CX4 VRWM = 8 V, IPP(min) = 24 A, Ptot = 0.7 W, VESD(max) = 30 kV, 0.76 x 0.75 x 0.61 Ifuse(M) = 2 A, tfuse(max) = 100 ms WLCSP4 Released For further information, please visit the following web site: www.nxp.com/applications/portable/cellular_phone_mms/index.html 8. References [1] AN10910 Application note “PCF50603 Application Note” — Charging a Li-Ion battery with PCF50603, Philips Semiconductors BL Power Management All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 15 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 9. Legal information 9.1 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. 9.2 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. 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NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Evaluation products — This product is provided on an “as is” and “with all faults” basis for evaluation purposes only. NXP Semiconductors, its affiliates and their suppliers expressly disclaim all warranties, whether express, implied or statutory, including but not limited to the implied warranties of non-infringement, merchantability and fitness for a particular purpose. The entire risk as to the quality, or arising out of the use or performance, of this product remains with customer. In no event shall NXP Semiconductors, its affiliates or their suppliers be liable to customer for any special, indirect, consequential, punitive or incidental damages (including without limitation damages for loss of business, business interruption, loss of use, loss of data or information, and the like) arising out the use of or inability to use the product, whether or not based on tort (including negligence), strict liability, breach of contract, breach of warranty or any other theory, even if advised of the possibility of such damages. Notwithstanding any damages that customer might incur for any reason whatsoever (including without limitation, all damages referenced above and all direct or general damages), the entire liability of NXP Semiconductors, its affiliates and their suppliers and customer’s exclusive remedy for all of the foregoing shall be limited to actual damages incurred by customer based on reasonable reliance up to the greater of the amount actually paid by customer for the product or five dollars (US$5.00). The foregoing limitations, exclusions and disclaimers shall apply to the maximum extent permitted by applicable law, even if any remedy fails of its essential purpose. 9.3 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. All information provided in this document is subject to legal disclaimers. Rev. 2 — 23 June 2011 © NXP B.V. 2011. All rights reserved. 16 of 17 AN10910 NXP Semiconductors Protecting charger interfaces and typical battery charging topologies 10. Contents 1 2 2.1 2.1.1 2.2 2.3 2.4 3 3.1 3.2 3.3 3.3.1 3.3.2 3.4 4 5 5.1 5.1.1 5.1.2 5.2 5.2.1 5.2.2 6 7 8 9 9.1 9.2 9.3 10 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Battery charging via USB interface . . . . . . . . . 3 Chinese battery charging standard (YDT1591-2006) . . . . . . . . . . . . . . . . . . . . . . . . 3 PC USB port . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Micro-USB connector in smart phone. . . . . . . . 3 VBUS electrical characteristics. . . . . . . . . . . . . . 4 General USB requirements. . . . . . . . . . . . . . . . 4 Charger interface and USB protection. . . . . . . 5 Reverse polarity protection . . . . . . . . . . . . . . . . 5 Overvoltage protection . . . . . . . . . . . . . . . . . . . 6 USB data ESD protection . . . . . . . . . . . . . . . . . 6 Rail-to-rail concept for low capacitance ESD protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 USB data line ESD protection with rail-to-rail devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Protection devices . . . . . . . . . . . . . . . . . . . . . . 8 Li-Ion batteries . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Li-Ion battery charging topologies. . . . . . . . . 10 Low VCEsat BISS transistors as pass element 10 BJT as current regulator . . . . . . . . . . . . . . . . . 11 BJT - MOSFET as load switch . . . . . . . . . . . . 12 MOSFETs as pass elements . . . . . . . . . . . . . 12 MOSFET-Schottky diode module solution . . . 12 Double FET solution . . . . . . . . . . . . . . . . . . . . 13 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Appendix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 16 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2011. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 23 June 2011 Document identifier: AN10910