HEF4049B-Q100 Hex inverting buffers Rev. 3 — 17 June 2016 Product data sheet 1. General description The HEF4049B-Q100 provides six inverting buffers with high current output capability suitable for driving TTL or high capacitive loads. Since input voltages in excess of the supply voltage of the buffers are permitted, the buffers may also be used to convert logic levels of up to 15 V to standard TTL levels. Their guaranteed fan-out into common bipolar logic elements is shown in Table 3. It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS (usually ground). Unused inputs must be connected to VDD, VSS, or another input. This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 3) and is suitable for use in automotive applications. 2. Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 3) Specified from 40 C to +85 C Accepts input voltages in excess of the supply voltage Fully static operation 5 V, 10 V, and 15 V parametric ratings Standardized symmetrical output characteristics ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 ) Complies with JEDEC standard JESD 13-B 3. Applications Industrial LOCMOS (Local Oxidation CMOS) to DTL/TTL converter HIGH sink current for driving two TTL loads HIGH-to-LOW level logic conversion HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 4. Ordering information Table 1. Ordering information All types operate from 40 C to +85 C. Type number Package Name HEF4049BT-Q100 SO16 Description Version plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 5. Functional diagram $ $ $ $ $ $ < < < < < LQSXW < < $ DDL Fig 1. Logic symbol 966 DDH PQD Fig 2. Logic diagram for one gate Fig 3. Input protection circuit 6. Pinning information 6.1 Pinning +()%4 9'' QF < < $ $ < QF $ < < $ $ < 966 $ DDD Fig 4. Pin configuration HEF4049B_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 2 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 6.2 Pin description Table 2. Pin description Symbol Pin Description VDD 1 supply voltage 1Y to 6Y 2, 4, 6, 10, 12, 15 output 1A to 6A 3, 5, 7, 9, 11, 14 input VSS 8 ground supply voltage n.c. 13, 16 not connected 7. Functional description Table 3. Guaranteed fan-out Driven element Guaranteed fan-out Standard TTL 2 74 LS 9 74 L 16 8. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter VDD supply voltage IIK input clamping current VI input voltage IOK output clamping current II/O input/output current IDD supply current Tstg storage temperature Tamb ambient temperature Conditions VI < 0.5 V Max 0.5 +18 Tamb 40 C to +85 C P power dissipation per output V 10 +18 V - 10 mA - 10 mA 50 mA - total power dissipation Unit 0.5 VO < 0.5 V or VO > VDD + 0.5 V Ptot [1] Min mA 65 +150 C 40 +85 C - 500 mW - 100 mW [1] For SO16 package: Ptot derates linearly with 8 mW/K above 70 C. 9. Recommended operating conditions Table 5. Recommended operating conditions Symbol Parameter Min Typ Max VDD supply voltage 3 - 15 V VI input voltage 0 - 15 V Tamb ambient temperature 40 - +85 C HEF4049B_Q100 Product data sheet Conditions in free air All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 Unit © NXP Semiconductors N.V. 2016. All rights reserved. 3 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers Table 5. Recommended operating conditions …continued Symbol Parameter Conditions Min Typ Max Unit t/V input transition rise and fall rate VDD = 5 V - - 3.75 s/V VDD = 10 V - - 0.5 s/V VDD = 15 V - - 0.08 s/V 10. Static characteristics Table 6. Static characteristics VSS = 0 V; VI = VSS or VDD unless otherwise specified. Symbol Parameter VIH VIL VOH VOL IOH IOL HIGH-level input voltage LOW-level input voltage HIGH-level output voltage LOW-level output voltage HIGH-level output current LOW-level output current Conditions IO < 1 A IO < 1 A IO < 1 A Tamb = 25 C Tamb = 85 C Min Max Min Max Min Max 5V 3.5 - 3.5 - 3.5 - V 10 V 7.0 - 7.0 - 7.0 - V VDD Tamb = 40 C Unit 15 V 11.0 - 11.0 - 11.0 - V 5V - 1.5 - 1.5 - 1.5 V 10 V - 3.0 - 3.0 - 3.0 V 15 V - 4.0 - 4.0 - 4.0 V 5V 4.95 - 4.95 - 4.95 - V 10 V 9.95 - 9.95 - 9.95 - V 15 V 14.95 - 14.95 - 14.95 - V 5V - 0.05 - 0.05 - 0.05 V 10 V - 0.05 - 0.05 - 0.05 V 15 V - 0.05 - 0.05 - 0.05 V VO = 2.5 V 5V 1.7 - 1.4 - 1.1 - mA VO = 4.6 V 5V 0.52 - 0.44 - 0.36 - mA VO = 9.5 V 10 V 1.3 - 1.1 - 0.9 - mA VO = 13.5 V 15 V 3.6 - 3.0 - 2.4 - mA VO = 0.4 V 4.75 V 3.5 - 2.9 - 2.3 - mA VO = 0.5 V 10 V 12.0 - 10.0 - 8.0 - mA IO < 1 A VO = 1.5 V 15 V 24.0 - 20.0 - 16.0 - mA II input leakage current VDD = 15 V 15 V - 0.3 - 0.3 - 1.0 A IDD supply current IO = 0 A 5V - 4.0 - 4.0 - 30 A 10 V - 8.0 - 8.0 - 60 A 15 V - 16.0 - 16.0 - 120 A - - - 7.5 - - pF CI input capacitance HEF4049B_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 4 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 11. Dynamic characteristics Table 7. Dynamic characteristics VSS = 0 V; CL = 50 pF; tr = tf 20 ns; Tamb = 25 C; unless otherwise specified. Symbol Parameter Conditions HIGH to LOW propagation delay tPHL tPLH nA to nY; see Figure 5 LOW to HIGH propagation delay nA to nY; see Figure 5 HIGH to LOW output transition time see Figure 5 VDD Extrapolation formula Min Typ Max 26 ns + (0.18 ns/pF)CL - 35 70 ns 10 V 11 ns + (0.08 ns/pF)CL - 15 30 ns 15 V 9 ns + (0.05 ns/pF)CL - 12 25 ns 23 ns + (0.55 ns/pF)CL - 50 100 ns 14 ns + (0.23 ns/pF)CL - 25 50 ns 12 ns + (0.16 ns/pF)CL - 20 40 ns 3 ns + (0.35 ns/pF)CL - 20 40 ns 3 ns + (0.14 ns/pF)CL - 10 20 ns 2 ns + (0.09 ns/pF)CL - 7 14 ns 5V 5V [1] [1] 10 V 15 V tTHL 5V [1] 10 V 15 V LOW to HIGH output transition time tTLH [1] see Figure 5 5V [1] Unit 10 ns + (1.00 ns/pF)CL - 60 120 ns 10 V 9 ns + (0.42 ns/pF)CL - 30 60 ns 15 V 6 ns + (0.28 ns/pF)CL - 20 40 ns The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF). Table 8. Dynamic power dissipation PD PD can be calculated from the formulas shown. VSS = 0 V; tr = tf 20 ns; Tamb = 25 C. Symbol PD Parameter dynamic power dissipation VDD Typical formula for PD (W) where: 5V PD = 2500 fi + (fo CL) VDD 10 V PD = 11000 fi + (fo CL) VDD2 fo = output frequency in MHz; 15 V PD = 35000 fi + (fo CL) CL = output load capacitance in pF; 2 VDD2 fi = input frequency in MHz; VDD = supply voltage in V; (fo CL) = sum of the outputs. HEF4049B_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 5 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 12. Waveforms WU 9, WI LQSXW 90 9 W3+/ 92+ W3/+ 90 RXWSXW 92/ W7+/ W7/+ DDL Measurement points are given in Table 9. VOL and VOH are typical output voltage levels that occur with the output load. Fig 5. Input (nA) to output (nY) propagation delays and transition times Table 9. Measurement points Input Output VM VI VM VX VY 0.5VDD 0 V to VDD 0.5VDD 0.1VDD 0.9VDD 9'' * 9, 92 '87 57 &/ DDJ Test data is given in Table 10. Definitions for test circuit: CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 6. Test circuit for measuring switching times Table 10. Test data Supply voltage 5 V to 15 V HEF4049B_Q100 Product data sheet Input Load VI VM tr, tf CL VDD 0.5VI 20 ns 50 pF All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 6 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 13. Package outline 62SODVWLFVPDOORXWOLQHSDFNDJHOHDGVERG\ZLGWKPP 627 ' ( $ ; F \ +( Y 0 $ = 4 $ $ $ $ SLQLQGH[ ș /S / H Z 0 ES GHWDLO; PP VFDOH ',0(16,216LQFKGLPHQVLRQVDUHGHULYHGIURPWKHRULJLQDOPPGLPHQVLRQV 81,7 $ PD[ $ $ $ ES F ' ( H +( / /S 4 Y Z \ = PP LQFKHV ș R R 1RWH 3ODVWLFRUPHWDOSURWUXVLRQVRIPPLQFKPD[LPXPSHUVLGHDUHQRWLQFOXGHG Fig 7. 5()(5(1&(6 287/,1( 9(56,21 ,(& -('(& 627 ( 06 -(,7$ (8523($1 352-(&7,21 ,668('$7( Package outline SOT109-1 (SO16) HEF4049B_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 7 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 14. Abbreviations Table 11. Abbreviations Acronym Description DTL Diode Transistor Logic LOCMOS Local Oxidation CMOS TTL Transistor Transistor Logic HBM Human Body Model ESD ElectroStatic Discharge MM Machine Model MIL Military 15. Revision history Table 12. Revision history Document ID Release date Data sheet status Change notice Supersedes HEF4049B_Q100 v.3 20160617 Product data sheet - HEF4049B_Q100 v.2 Modifications: HEF4049B_Q100 v.2 Modifications: HEF4049B_Q100 v.1 HEF4049B_Q100 Product data sheet • • Table 4: condition for input clamping current changed (typo corrected). Table 5: maximum value for input voltage changed (typo corrected). 20140910 • Product data sheet - HEF4049B_Q100 v.1 Section 2: ESD protection: MIL-STD-833 changed to MIL-STD883 20130228 Product data sheet - All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 - © NXP Semiconductors N.V. 2016. All rights reserved. 8 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers 16. Legal information 16.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 16.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 16.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP Semiconductors takes no responsibility for the content in this document if provided by an information source outside of NXP Semiconductors. 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This document supersedes and replaces all information supplied prior to the publication hereof. HEF4049B_Q100 Product data sheet Suitability for use in automotive applications — This NXP Semiconductors product has been qualified for use in automotive applications. Unless otherwise agreed in writing, the product is not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors and its suppliers accept no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 9 of 11 HEF4049B-Q100 NXP Semiconductors Hex inverting buffers No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Translations — A non-English (translated) version of a document is for reference only. The English version shall prevail in case of any discrepancy between the translated and English versions. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. 16.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 17. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] HEF4049B_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 17 June 2016 © NXP Semiconductors N.V. 2016. All rights reserved. 10 of 11 NXP Semiconductors HEF4049B-Q100 Hex inverting buffers 18. Contents 1 2 3 4 5 6 6.1 6.2 7 8 9 10 11 12 13 14 15 16 16.1 16.2 16.3 16.4 17 18 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 3 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3 Recommended operating conditions. . . . . . . . 3 Static characteristics. . . . . . . . . . . . . . . . . . . . . 4 Dynamic characteristics . . . . . . . . . . . . . . . . . . 5 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 7 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . 8 Legal information. . . . . . . . . . . . . . . . . . . . . . . . 9 Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 9 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Contact information. . . . . . . . . . . . . . . . . . . . . 10 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP Semiconductors N.V. 2016. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 17 June 2016 Document identifier: HEF4049B_Q100