Application Note 1961 Single Event Effects (SEE) Testing of the ISL70244SEH, Dual 40V Radiation Hardened Precision Operational Amplifier Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects in electronic circuitry, including single event upset (SEU), single event transient (SET), single event functional Interrupt (SEFI), and single event burnout (SEB). SEE can lead to system-level performance issues including disruption, degradation and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the ISL70244SEH dual operational amplifier. Testing was performed at the Texas A&M University (TAMU) Cyclotron Institute heavy ion facility. This facility is coupled to a K500 super-conducting cyclotron, which is capable of generating a wide range of particle beams with the various energy, flux, and fluence levels needed for advanced radiation testing. Throughout this document, reference is made to linear energy transfer (LET) and the units of this parameter is always understood to be MeV•cm2/mg. Product Description The ISL70244SEH is a dual version of the ISL70444SEH quad operational amplifier and is fabricated in Intersil’s PR40 precision bipolar analog process. The die has only two operational amplifiers on it and is not the same die as the ISL70444SEH, but the amplifier design is the same. Product Documentation For more information about the ISL70244SEH, refer to the Related Documents shown below. Related Documents • ISL70444SEH Datasheet SEE Test Set-up SEE testing is carried out with the sample in an active mode configuration. A schematic of the ISL70244SEH SEE test fixture is shown in Figure 1. Four ISL70244SEH were mounted on a board so as to allow simultaneous heavy ion irradiation of all four units. For SEB, the sum of the four ISL70244SEH supply currents were monitored before, during and after each irradiation to look for changes in supply current indicating damage. In addition, the two outputs were summed through a non-irradiated amplifier and the result was monitored before and after irradiation for SEB. For SET, the two summed outputs of each ISL70244SEH were used to provide a trigger signal for an oscilloscope that captured and stored both individual ISL70244SEH amplifier outputs. In this way, four oscilloscopes were able to monitor and capture SET in all eight channels of the four dual operational amplifiers under test. Four copies of the schematic in Figure 1 were placed on one board with the ISL70244SEH parts to allow all four to be irradiated at one time in the beam. The extra amplifier (out of beam) in the upper right of the schematic, sums the dual amplifier outputs of the ISL70244SEH to produce a trigger signal for the oscilloscope so any SET on the part would be captured. • ISL70244SEH Radiation Test Report • ISL70244SEH SMD 5962-13248 • ISL70244SEH Datasheet • AN1888, “ISL70244SEH Evaluation Board User’s Guide” • AN1824 “ISL70444SEH Evaluation Board User’s Guide” • AN1838, “Single Event Effects Testing of the ISL70444SEH, Quad 40V Radiation Hard Precision Operational Amplifiers” SEE Test Objectives The ISL70244SEH was tested to determine its susceptibility to single event burnout (SEB, destructive ion effects) and to characterize its single event transient (SET) behavior over different operating conditions and at several LET levels. August 29, 2014 AN1961.0 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2014. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. Submit Document Feedback TP14 TP13 TP12 TP11 TP9 TP10 SUMV+_U1 TP21 C13 0.1UF TP22 VREF_U1 V+_U1 OUTA1 R25 0.01UF 10K R29 10K 0 OUTB1 R26 7 R14 0 R10 V-_U1 C14 UNNAMED_1_ISL28127_I210_NIN 2 D1 4 C15 0.1UF 1UF 3 2 C3 TP19 U5 C4 BAS40-04 C2 1UF V- SUM_U1 6 V+ 3 2 1 10K ISL28127FBZ C16 C6 0.1UF 0.01UF 0.1UF C5 SUMV-_U1 C7 UNNAMED_1_SMCAP_I102_B TP20 UNNAMED_1_SMCAP_I101_A 0.01UF 0.01UF C3 AND C5 CLOSE TO PART C8 10K 100K 10K 100 5 2 9 3 8 4 7 5 6 R20 DNP UNNAMED_1_SMCAP_I127_A OUT B C9 OUTB1 9 TP15 OPEN 8 7 R24 R18 6 DNP 4 DNP 10 R28 3 UNNAMED_1_SMRES_I12_B 10K U1 C12 2 1 OPEN OPEN UNNAMED_1_SMRES_I12_A C10 UNNAMED_1_SMCAP_I127_B 10 0 DUAL OP AMP 1 R6 R2 TP2 R21 UNNAMED_1_SMRES_I111_B OPEN 100K TP1 R17 R22 R5 UNNAMED_1_SMCAP_I133_B R4 IN+ A TP18 OUTA1 C1 DNP DNP R23 100K DNP 0 R1 TP6 TP17 UNNAMED_1_SMRES_I120_B R27 R12 C11 R9 OPEN OPEN R3 UNNAMED_1_SMRES_I120_A TP5 OUT A OUTA1 UNNAMED_1_SMCAP_I29_B Application Note 1961 C6 AND C7 CLOSE TO PART IN- A TP16 100 100K K10.A R19 UNNAMED_1_SMRES_I129_A 10K IN- B TP3 R7 UNNAMED_1_SMRES_I123_A TP4 DNP VREF_U1 DRAWN BY: DATE: TIM KLEMANN IN+ B TP7 ENGINEER: R11 R13 R15 R16 RELEASED BY: DATE: DNP 100K 100K DNP UPDATED BY: DATE: TITLE: ISL70244 SEE TEST BOARD R8 UNNAMED_1_SMRES_I124_A DON'T USE VREF FOR NORMAL INPUT TP8 DNP DA KIRAN BERNARD 04/17/2014 FOUR-IN-ONE TESTER $CDS_IMAGE|intersil_color_sm.jpg|1194|282 MASK# FILENAME: ~\ISL70244\ISL70244SEH_SEE1A FIGURE 1. ISL70244SEH SEE TEST CIRCUITS BOARD SCHEMATIC HRDWR ID SHEET AN1961.0 August 29, 2014 Application Note 1961 SEB Testing of the ISL70244SEH Dual Operational Amplifier Four units on a single board were irradiated at once with the summed supply currents and the summed dual outputs of each unit were monitored pre and post irradiation. Significant changes in output or supply current were deemed indications of permanent damage caused by the combination of voltage stress and ion impact. The supply voltage was varied to identify the limit when combined with ions of LET = 86 MeV•cm2/mg. As reported in Table 1, the four parts survived ±19V and three failed at ±20V under irradiation. event counts to the fluence only a lower bound on the effective cross section represented by the device. Post processing the data for SET that exceeded ±100mV deviation and selecting the largest event counts out of the four units tested for each LET and dividing by the beam fluence yielded the lower bounds for ±100mV SET cross sections as depicted in Figure 2. Since the post process to ±100mV captures were done on each amplifier separately, Figure 2 represents cross sections per amplifier. As can be seen, there is considerable noise in the data and it should be taken only as indicator of cross section, not an accurate measurement. For SET, the parts were tested four at a time as in the SEB testing. The dual amplifiers of each device were summed through another (non-irradiated) amplifier to provide an oscilloscope trigger signal if either operational amplifier under irradiation experienced an SET. The individual channels were captured on two other oscilloscope channels. The scope traces were captured and stored for later post processing. Table 2 summarizes the SET testing done on the ISL70244SEH. Each irradiation was done to a fluence of 4x106 ion/cm2 at a flux of 2x104 ion/(cm2s). Irradiation was done in the sequence from high LET to lowest and the same four devices were used throughout the testing. Oscilloscope triggering was at ±20mV except for entries marked with an asterisk (*, ±50mV) or double asterisk (**, ±100mV). SET testing was carried out at ambient temperature, approximately +25°C. ±100mV SET CROSS SECTION LOWER BOUND (cm2) 6.0E-04 SET Testing of the ISL70244SEH Dual Operational Amplifier 5.0E-04 4.0E-04 3.0E-04 2.0E-04 1.0E-04 0.0E+00 0 10 20 30 40 50 60 70 LET (MeV.cm2/mg) FIGURE 2. CROSS SECTION LOWER BOUND OF ±100mV DEVIATION SET vs LET PER AMPLIFIER The marked disparity in captures reflects differences in the oscilloscope trigger levels and times. This makes the ratio of the TABLE 1. SUMMARY OF SEB TESTING OF THE ISL70244SEH. Au (LET = 86 MeV•cm2/mg) WAS USED TO 5x106 ion/cm2 FOR EACH IRRADIATION WITH TCASE = +125ºC FOR EACH RUN RUN DUT 1 801 2 3 4 1 802 2 3 4 GAIN VIN (V) VS± (V) SUM ICC+ (mA) PRE SUM ICC+ (mA) POST SUM ICC(mA) PRE SUM ICC(mA) POST 1 0.1 ±19 18.502 18.501 17.991 17.993 10 1 0.1 10 Submit Document Feedback 3 ±20 20.618 >100 19.743 >100 VOUT SUM (V) PRE VOUT SUM (V) POST 0.19741 0.19762 0.19823 0.19824 2.1858 2.1857 2.1983 2.198 0.19744 0.19743 0.19825 3 2.1857 13 2.1984 13 AN1961.0 August 29, 2014 Application Note 1961 TABLE 2. SUMMARY OF THE SET TESTING RUN DUT ION SPECIES AND ANGLE EFFECTIVE LET MeV*cm2/mg 1 401 60.0 Pr15° 1 1 18 0 0 ±1.5 1 8.5 Ar0° 0 0 ±18 10 4 1 1 2 8.5 Ne0° 0 0 ±1.5 10 4 1 1 2 3 0 10 1 102 0 8.5 Ar0° 2 3 ±1.5 1 4 101 0 10 2 3 0 28.0 Kr0° 1 202 ±18 1 2 3 0 10 4 201 0 28.0 Kr0° 1 3 ±1.5 1 4 302 0 10 2 3 0 60.0 Pr15° 4 301 Vs (V) 1 2 3 VOUT (V) 10 4 402 VIN (V) 1 2 3 GAIN SETTING 8.5 Ne0° 0 10 4 0 ±18 ±20mV A+B CAPTURES EVENTS/ FLUENCE (cm2) 5390 1.3E-03 4655 1.2E-03 1426 3.6E-04 1982 5.0E-04 4636 1.2E-03 3840 9.6E-04 1006 2.5E-04 1654 4.1E-04 42** 1.1E-05 2677 6.7E-04 1130 2.8E-04 2378 5.9E-04 1140** 2.9E-04 2790* 7.0E-04 1098** 2.7E-04 2327** 5.8E-04 20** 5.0E-06 2147 5.4E-04 1008 2.5E-04 2009 5.0E-04 94** 2.4E-05 1479 3.7E-04 1787 4.5E-04 3188 8.0E-04 8** 2.0E-06 112 2.8E-05 471 1.2E-04 938 2.3E-04 5** 1.3E-06 109 2.7E-05 475 1.2E-04 899 2.2E-04 NOTE: 1. Oscilloscope triggering was at ±20mV except for entries marked with an asterisk (*, ±50mV) or double asterisk (**, ±100mV). Submit Document Feedback 4 AN1961.0 August 29, 2014 Application Note 1961 Figure 3 shows a plot of the SET duration outside ±100mV vs the extreme deviation for the case of G = 1, VS = ±1.5V, and LET = 60. This provides a quick way of categorizing the SET by magnitude and duration. All SET captured in Figure 3 had durations of less than 3µs outside of the ±100mV window centered on the nominal amplifier output. The deviations are constrained by the supply rails of ±1.5V for this rail-to-rail amplifier. The SET’s group into distinct types as can be seen in the plot. The longest events appear in the upper center of Figure 3 and have deviations in the +300mV range and duration of approximately 2µs outside the ±100mV window. This particular type of SET (17 out of 1960 in 4x106 ions/cm2) is plotted as a composite in Figure 4. Although the total time outside the ±100mV window was approximately 2µs, the composite plot indicates the total SET durations were out to about 4µs before the output returned to its non-SET value. Figure 5 is a composite plot of the 30 next largest duration SETs captured for the part represented in Figure 3. These SETs appear at both left and right edges of Figure 3, indicating both positive and negative extreme deviations. The total durations of these events are all under 2µs except for three events, which appear related to the events of Figure 4. Figure 6 DUT1/Scope1 channel B run 402 (G = 1, LET = 60, VS = ±18V) SET of larger than ±100mV (1568 in 4x106 ions/cm2) plotted by extreme deviation on the abscissa and by total duration outside of ±100mV on the ordinate. 0.5 C3 = VOUT -B ±0.1V 1.5 SET DEVIATION (V) SET DURATION (µs) 2.0 C3 = VOUT -B ±0.1V 1.0 0 0.5 0 -1.5 -1.0 -0.5 0 0.5 1.0 1.5 -0.5 -5 0 SET EXTREME DEVIATION (V) 10 5 TIME (µs) FIGURE 3. DUT1/SCOPE1 CHANNEL B RUN 401 (G = 1, VS = ±1.5V, LET = 60) SET OF LARGER THAN ±100mV (1960 in 4x106 ions/cm2) PLOTTED BY EXTREME DEVIATION ON THE ABSCISSA AND BY TOTAL DURATION OUTSIDE OF ±100mV ON THE ORDINATE FIGURE 4. COMPOSITE SET PLOTS FOR THE 17 SET IN UPPER CENTER OF Figure 3 1.5 C3 = VOUT -B ±0.1V 1.2 1.0 SET DURATION (µs) SET DEVIATION (V) 1.0 0.5 0 -0.5 -1.0 C3 = VOUT -B ±0.1V 0.8 0.6 0.4 0.2 0 -1.5 -5 0 5 10 TIME (µs) FIGURE 5. THE 30 LONGEST SET FOR DUT1/SCOPE1 CHANNEL B RUN 401 (G = 1, VS = ±1.5, LET = 60) AFTER THOSE OF -2 0 2 4 6 8 SET EXTREME DEVIATION (V) FIGURE 6. DUT1/SCOPE1 CHANNEL B Figure 4 Submit Document Feedback 5 AN1961.0 August 29, 2014 Application Note 1961 When the supply rails are taken to ±18V, the SET are no longer constrained in deviation and exhibit a somewhat different pattern on the deviation versus duration plot as in Figure 6. The central grouping is no longer the longest SET type. A composite of the 30 longest SET events is shown in. Figure 7 all of these events, regardless of some large magnitudes, recover within 2µs. Ar ions. The 30 longest SET of those in Figure 8 are plotted in Figure 9. These start with spikes and then recover inside of 2µs. Dropping to LET = 2.7 (Ne) further reduces the SET’s in both deviation and duration as depicted in Figure 10. These SET are little more than spikes with 0.5µs or less duration outside ±100mV deviation. Dropping the LET results in smaller and shorter SET as is indicated in Figure 8 where the SET are resulting from LET = 8.5 8 C3 = VOUT -B ±0.1V 0.7 6 C2 = VOUT -A ±0.1V SET DEVIATION (V) SET DEVIATION (V) 0.6 4 2 0 0.5 0.4 0.3 0.2 -2 0.1 4 -2 0 2 TIME (µs) 4 0 6 -1.0 -0.5 0 0.5 1.0 TIME (µs) FIGURE 7. COMPOSITE TRACE PLOT OF THE 30 LONGEST DURATION EVENTS OUTSIDE OF ±100mV FOR DUT1/SCOPE1 RUN 402 (G = 1, VS = ±18V, LET = 60) FIGURE 8. DUT2/SCOPE2 CHANNEL A RUN 202 (G = 1, VS = ±18V, LET = 8.5) PLOT OF SET OUTSIDE OF ±100mV DEVIATION 1.5 0.5 C2 = VOUT -A ±0.1V 1.0 SET DURATION (µs) SET DEVIATION (V) 0.4 0.5 0 -0.5 0.3 C3 = VOUT -B ±0.1V 0.2 0.1 -1.0 0 -1.5 0 TIME (µs) -5 FIGURE 9. 30 LONGEST EVENTS RECORDED FOR DUT2/SCOPE2 CHANNEL A RUN 202 (G = 1, VS = ±18V, LET = 8.5) Submit Document Feedback 6 5 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 SET EXTREME DEVIATION (V) FIGURE 10. DUT1/SCOPE1 CHANNEL B RUN 102 (G = 1, VS = ±18V, LET = 2.7) EVENTS BEYOND ±100mV (37 IN 4x106 IONS/Cm2) AN1961.0 August 29, 2014 Application Note 1961 1.4 C3 = VOUT -B ±0.1V C3 = VOUT -B ±0.1V 10 1.0 SET DEVIATION (V) SET DURATION (µs) 1.2 0.8 0.6 0.4 0.2 5.0 0 -5.0 -10 0 -10 -5.0 0 5.0 SET EXTREME DEVIATION (V) 10 FIGURE 11. DUT3/SCOPE3 CHANNEL B RUN 402 (G = 10, LET = 60, VS = ±18V) for SET BEYOND THE ±100mV THRESHOLD (478 in 4x106 ions/cm2) -2 -1 0 1 2 TIME (µs) 3 4 5 FIGURE 12. THE 30 LONGEST SET TO ±100mv FOR DUT3/SCOPE3 CHANNEL B RUN 402 (G = 10, VS = ±18, LET = 60) Figure 10, Changing the amplifier gain from 1 to 10 has minor impact on the SET forms as can be seen in Figure 11, which can be compared to Figure 6. Again the SET durations beyond ±100mV are below 2µs while the deviations can go past ±10V. The 30 longest SET’s are depicted in Figure 12 and all of these SET’s are over in less than 2µs. Conclusions The ISL70244SEH dual operational amplifier has been shown to be free from permanent damage under irradiation by ions with LET of 86 MeV•cm2/mg (normal incidence) up to supply voltages of ±19V at +125°C case temperature. At ±20V damage was noted. SET testing at +25°C demonstrated that SET resulting from ions of up to LET = 60 are limited to under 5µs in duration. The deviation for these SET range from -12V to +12V from a nominal 0V output with supply voltages of ±18V. These magnitudes as well as the durations decrease with decreasing LET. At LET = 2.7V, the lowest tested, SET are bounded within ±0.4V and have durations of less than 1µs. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that the Application Note or Technical Brief is current before proceeding. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 7 AN1961.0 August 29, 2014