Ultra-Reliable MCUs Why Ultra-Reliable Processors Matter Freescale’s portfolio of ultra-reliable processors is the broadest in the industry and is ideal for challenging environments found in industrial, infrastructure, automation, communications, transportation and medical applications. It offers best-in-class quality, reliability and safety for applications that need to perform in the harshest environments. Why Safety Matters • Eliminate risks due to hazards caused by malfunctioning of electronic systems • Avoid random failures, main impairment to safety Latent Failure Common Cause Failure Danger with second fault Annul redundancy-based measures MCU LF INPUT MCU WRONG OUTPUT INPUT MCU CORRECT OUTPUT INPUT MCU Freescale Solution Freescale Solution Freescale Solution • Structure redundancy [Core, DMA] • Hardware self test [memory, logic] • Delayed checker core • Information redundancy [E2E, ECC, EDC] • 90% stuck-at-fault • Clock, temp, power monitor • Independent safety clock Comparator Single Point Failure Immediate potential for hazard OK What Makes an MCU Ultra-Reliable? Features Ultra-Reliable Consumer Traditional Industrial Reliable Dielectric Lifetime (TDDB) • < 1ppm • < 1000 ppm • < 1000 ppm • < 10 ppm • Auto-specific model • Standard model • Auto-specific model • Voltage limit checking • Subset voltage limit checking • Industrial model / standard model Transistor Aging (HCI, BTI) • Circuit use-profile • Limited margining • Voltage limit checking • Subset voltage limit checking • Limited margining • Custom-aged model • Circuit use-profile • Custom-aged model Metalization Reliability (Electromigration) • < 1 ppm • < 1000 ppm • < 1000 ppm • < 10 ppm • Current mode/ profile specific • Current mode/ profile specific • Current mode/ profile specific • Current mode/ profile specific Metalization Reliability (Stress Migration) • Zero failure in stress • Zero failure in stress • Zero failure in stress • Zero failure in stress • Geometry specific design rules • Geometry specific design rules • Geometry specific design rules • Geometry specific design rules Metalization Dielectric Lifetime (TDDB) • < 1 ppm • < 1000 ppm • < 1000 ppm • < 10 ppm • Auto-specific model • Standard model • Auto-specific model • Geometry / use condition design rules • Subset voltage limit checking • Industrial model /standard model • SER: < 1 FIT • SER: < 100000 FIT • SER: < 1000 FIT • SER: < 1000 FIT • SEL: < 0.1 FIT • SEL: < 1000 FIT • SEL: < 10 FIT • SEL: < 10 FIT Radiation Immunity (SER / SEL) • Subset voltage limit checking • Geometry / use condition design rules For more information, visit freescale.com/UltraReliableMCUs Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. All other product or service names are the property of their respective owners. All rights reserved. © 2015 Freescale Semiconductor, Inc.