REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED 10-10-19 C. SAFFLE Delete the word “DIGITAL” from the title block. Under paragraph 1.3, Voltage range, Enables or Y limit, delete “-1 V to +6 V” and substitute A “-0.5 V to VCC + 4 V”. - ro REV SHEET REV A A A A A SHEET 15 16 17 18 19 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RAJESH PITHADIA STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil CHECKED BY RAJESH PITHADIA APPROVED BY THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A ROBERT M. HEBER DRAWING APPROVAL DATE 08-06-02 REVISION LEVEL A MICROCIRCUIT, LINEAR, QUADRUPLE, DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 5962-07248 1 OF 19 5962-E486-10 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - Federal stock class designator \ RHA designator (see 1.2.1) 01 Q F A Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) 07248 / \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 01 Generic number Circuit function SN55LVDS33-SP Quad, differential line receiver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device requirements documentation Device class M Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter F Descriptive designator Terminals GDFP2-F16 or CDFP3-F16 16 Package style Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 2 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) ....................................................................................... Voltage range : Enables or Y .......................................................................................................... A or B .................................................................................................................... Lead temperature , 1.6 mm from case for 10 seconds .............................................. Junction temperature (TJ) .......................................................................................... -0.5 V to +4 V 2/ -0.5 V to VCC +4 V -5 V to +6 V +260C +150C Storage temperature range (TSTG) ........................................................................... -65C to +150C Thermal resistance, junction to case (JC) ................................................................ 12.0C/W 1.4 Recommended operating conditions. Supply voltage range (VCC) ...................................................................................... +3 V to +3.6 V High level input voltage (VIH) range, Enables ........................................................... +2 V to +5 V Low level input voltage (VIL) range, Enables ............................................................. 0 V to +0.8 V Magnitude of differential input voltage range, ІVIDІ ................................................... +0.1 V to +3 V Voltage range at any bus terminal (separately or common-mode) ............................ -4 V to +5 V Operating temperature range (TJ) ............................................................................. -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _____ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 3 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 4 TABLE I. Electrical performance characteristics. Test Conditions -55C TA +125C Symbol Group A subgroups 3.0 V VCC 3.6 V Device type unless otherwise specified Limits Min Unit Max 1, 2, 3 01 1, 2, 3 01 -50 See figures 5 and 6 1, 2, 3 01 -32 VOH IOH = -4 mA 1, 2, 3 01 2.4 Low level output voltage VOL IOL = 4 mA 1, 2, 3 01 0.4 V Supply current ICC G at VCC, no load, 1, 2, 3 01 25 mA Positive going differential 1/ input voltage threshold VIT1 Negative going differential input voltage threshold VIT2 Differential input failsafe 1/ voltage threshold VIT3 High level output voltage VIB = -4 V or 5 V, 50 mV see figure 4 VIB = -4 V or 5 V, mV see figure 4 -100 mV V steady state Input current (A or B inputs) Differential input current II IIO (IIA – IIB) G at GND 1, 2, 3 6 VI = 0 V, other input open 1, 2, 3 VI = 2.4 V, other input open 1, 2, 3 25 VI = -4 V, other input open 1, 2, 3 80 VI = 5 V, other input open 1, 2, 3 45 VID = 100 mV, 1, 2, 3 01 5 A 1, 2, 3 01 25 A 25 01 A VIC = -4 V or 5 V Power off input current (A or B inputs) II(OFF) VA or VB = 0 V or 2.4 V, VCC = 0 V 60 1, 2, 3 VA or VB = -4 V or 5 V, VCC = 0 V High level input current (Enables) IIH VIH = 2 V 1, 2, 3 01 12 A Low level input current (Enables) IIL VIL = 0.8 V 1, 2, 3 01 12 A High impedance output current IOZ 1, 2, 3 01 12 A 7, 8 01 Functional tests See 4.4.1c -10 Propagation delay, low to high level output tPLH(1) See figure 7 9, 10, 11 01 1.8 8 ns Propagation delay, high to low level output tPHL(1) See figure 7 9, 10, 11 01 1.8 8 ns See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 5 TABLE I. Electrical performance characteristics – Continued. Test Conditions -55C TA +125C Symbol Group A subgroups 3.0 V VCC 3.6 V Device type unless otherwise specified Delay time, failsafe deactivate time Min td1 CL = 10 pF, see figures 6 and 7 9, 10, 11 01 td2 CL = 10 pF, see figures 6 and 7 9, 10, 11 01 Part-to-part skew 2/ tsk(pp) See figure 7 9, 10, 11 Propagation delay, high level to high impedance output tPHZ See figure 8 Propagation delay, low level to high impedance output tPLZ Propagation delay, high impedance to high level output Propagation delay, high impedance to low level output Delay time, failsafe activate time 1/ 1/ Limits Unit Max 11 ns 2 s 01 1.2 ns 9, 10, 11 01 12 ns See figure 8 9, 10, 11 01 12 ns tPZH See figure 8 9, 10, 11 01 12 ns tPZL See figure 8 9, 10, 11 01 12 ns 0.2 1/ If not tested, shall be guaranteed to the limits specified in table I herein. 2/ tsk(pp) is the magnitude of the time difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 6 Device type 01 Case outline F Terminal number Terminal symbol 1 1B 2 1A 3 1Y 4 G 5 2Y 6 2A 7 2B 8 GND 9 3B 10 3A 11 3Y 12 G 13 4Y 14 4A 15 4B 16 VCC FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 7 Differential input Enables Output VID = VA -VB G G Y VID -32 mV H X H X L H H X ? X L ? H X L X L L X L H Z Open H X H X L H -100 mV VID -32 mV VID -100 mV H = High voltage level L = Low voltage level ? = Indeterminate X = Irrelevant Z = high impedance (off) FIGURE 2. Truth table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 8 FIGURE 3. Logic diagram. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 9 NOTE: Input signal of 3 Mpps, duration of 167 ns, and transition time of 1 ns. VIC = common mode voltage, VID = Differential input voltage, and VIT = input voltage threshold. FIGURE 4. VIT1 and VIT2 input voltage threshold test circuit and waveforms. ___________________________________________________ STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 10 Resultant inputs Applied voltages 1/ VIA (mV) VIB (mV) VID (mV) VIC (mV) 2/ Output -4000 -3900 -100 -3950 L -4000 -3968 -32 -3984 H 4900 5000 -100 4950 L 4968 5000 -32 4984 H 1/ These voltages are applied for a minimum of 1.5 s. 2/ Actual common mode value = VIC = ( VIA + VIB ) / 2 FIGURE 5. Receiver minimum and maximum VIT3 input threshold test voltages. _______________________________________________________ STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 11 FIGURE 6. VIT3 failsafe threshold test. _____________________ STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 12 FIGURE 6. Failsafe activate and deactivate waveforms - continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 13 NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 50 Mpps, pulse width = 10 0.2 ns. CL includes instrumentation and fixture capacitance within 0.06 mm of the device under test (D.U.T). FIGURE 7. Timing test circuit and waveforms. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 14 NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf 1 ns, pulse repetition rate (PRR) = 0.5 Mpps, pulse width = 500 10 ns. CL includes instrumentation and fixture capacitance within 0.06 mm of the device under test (D.U.T). FIGURE 8. Enable/Disable time test circuit and waveforms. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 15 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V, subgroups 7 and 8 shall include verifying the functionality of the device. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 16 TABLE IIA. Electrical test requirements. Test requirements Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) 1/ 2/ 3/ Subgroups (in accordance with MIL-PRF-38535, table III) Subgroups (in accordance with MIL-STD-883, method 5005, table I) Device class M 1 1 1 1,2,3,9 1/ 1,2,3,9 1/ 1,2,3,9 1/ 2/ 1,2,3,9,10,11 1,2,3,9,10,11 1,2,3 1,2,3 1,2,3, 3/ 9,10,11 1,2,3 2/ 1,2,3 1,2,3 1,2,3 Device class Q ---- Device class V ---- ---- PDA applies to subgroup 1. Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be computed with reference to the zero hour electrical parameters. Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. TABLE IIB. Burn-in and operating life test delta parameters at +25C. Parameter 1/ Symbol Conditions Delta limit Output voltage high level VOH IOH = -4 mA, VCC = 3 V 0.18 V IOH = -4 mA, VCC = 3.6 V 0.18 V IOH = -4 mA, VCC = 3 V 40 mV IOL = 4 mA, VCC = 3.6 V 40 mV Output voltage low level VOL Supply current disabled ICCZ 0.6 mA High level supply current ICCH 2.5 mA Low level supply current ICCL 2.5 mA 1/ These parameters shall be recorded before and after the required burn-in and life test to determine delta limits. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 17 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. 6.1.2 Substitutability. Device class Q devices will replace device class M devices. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0547. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 18 6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0540. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime -VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DLA Land and Maritime -VA. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07248 A REVISION LEVEL A SHEET 19 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 10-10-19 Approved sources of supply for SMD 5962-07248 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-0724801VFA 01295 SN55LVDS33-SP 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 01295 Vendor name and address Texas Instruments, Inc. Semiconductor Group 8505 Forest Lane P.O. Box 660199 Dallas, TX 75243 Point of contact: U.S. Highway 75 South P.O. Box 84, M/S 853 Sherman, TX 75090-9493 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.