DATASHEET

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
88-08-26
D. A. DiCENZO
Add case outlines, terminal connections and thermal resistance values for case
outlines 2 and 3. For device type 01, 02, and 03, add subgroup 3 to IIH and IIL
test, add RDS1 test, add VISO test, delete VCT test, change RL and CL test
A
conditions for tON(A) and tOFF(A) tests, change CL test condition for tON(EN)
and tOFF(EN) tests, change value of ID for RDS1 test, change value of ID and
VS for RDS2 test, add test condition circuits. Editorial changes throughout.
B
Add device types 07, 08, and 09. Table I changes. Editorial changes
throughout.
93-06-28
M. A. FRYE
C
Changes in accordance with NOR 5962-R061-95.
95-01-25
M. A. FRYE
D
Changes in accordance with NOR 5962-R032-96.
96-01-09
M. A. FRYE
E
Incorporate NOR’s and current requirements.
Editorial changes throughout. - drw
02-12-30
R. MONNIN
F
Make change to the tON(A) and tOFF(A) subgroup 9 test limit for devices 01, 02,
and 03 as specified under Table I. - ro
07-09-13
R. HEBER
REV
F
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SHEET
35
36
37
REV
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SHEET
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16
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18
19
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22
23
24
25
26
27
28
29
30
31
32
33
34
REV STATUS
REV
F
F
F
F
F
F
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OF SHEETS
SHEET
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PMIC N/A
PREPARED BY
MARCIA B. KELLEHER
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
CHECKED BY
RAY MONNIN
APPROVED BY
D. A. DiCENZO
MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER /
DEMULTIPLEXER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
86-06-30
REVISION LEVEL
F
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
1 OF
5962-85131
37
5962-E563-07
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-85131
01
E
A
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
03
04
05
06
07
08
09
Generic number
Circuit function
HI546
HI547
HI549
HI5116
HI5216
HI5208
HI506
HI507
HI509
Single 16-channel MUX/DEMUX with overvoltage protection
Differential 8-channel MUX/DEMUX with overvoltage protection
Differential 4-channel MUX/DEMUX with overvoltage protection
Single 16-channel MUX/DEMUX with overvoltage protection
Differential 8-channel MUX/DEMUX with overvoltage protection
Differential 4-channel MUX/DEMUX with overvoltage protection
Single 16-channel MUX/DEMUX
Differential 8-channel MUX/DEMUX
Differential 4-channel MUX/DEMUX
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
E
X
2
3
Descriptive designator
Terminals
GDIP-T16 or CDIP-T16
GDIP-T28 or CDIP-T28
CQCC1-N20
CQCC1-N28
16
28
20
28
Package style
Dual-in-line
Dual-in-line
Square leadless chip carrier
Square leadless chip carrier
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
2
1.3 Absolute maximum ratings.
Supply voltage between +V and -V ..............................................................
Supply voltage between +V and ground:
Device types 01-03, 07-09 .......................................................................
Device types 04-06 ..................................................................................
Supply voltage between -V and ground:
Device types 01-03, 07-09 .......................................................................
Device types 04-06 ..................................................................................
Digital input voltage range (VA, VEN):
Device types 01-03, 07-09 .......................................................................
+44 V
Continuous current, source or drain ............................................................
Peak current, source or drain, pulsed, 1 ms,
10 percent duty cycle max ...........................................................................
Storage temperature range .........................................................................
Maximum power dissipation (PD):
Case E .....................................................................................................
Case X .....................................................................................................
Case 2 .....................................................................................................
Case 3 .....................................................................................................
Derating factor:
Case E .....................................................................................................
20 mA
+22 V
+20 V
-25 V
-20 V
[ (-V) -4 V) to (+V) +4 V ]
or 20 mA whichever comes first
Device types 04-06 .................................................................................. -V to +V or 20 mA whichever comes first
Analog input voltage range (VS):
Device types 01-03 .................................................................................. [ (-V) -20 V) to (+V) +20 V ]
Device types 04-06 .................................................................................. [ (-V) -25 V) to (+V) +25 V ]
Device types 07-09 .................................................................................. [ (-V) -2 V) to (+V) +2 V ]
40 mA
-65°C to +150°C
1.25 W
2W
1.32 W
1.23 W
12.5 mW/°C above TA = +75°C
Case X ..................................................................................................... 20 mW/°C above TA = +75°C
Case 2 ..................................................................................................... 13.2 mW/°C above TA = +75°C
Case 3 ..................................................................................................... 12.3 mW/°C above TA = +75°C
Thermal resistance, junction-to-case (θJC):
Cases E, X, 2, and 3.................................................................................
Thermal resistance, junction-to-ambient (θJA):
Case E .....................................................................................................
Case X .....................................................................................................
Case 2 .....................................................................................................
Case 3 .....................................................................................................
Lead temperature (soldering, 10 seconds) ..................................................
Junction temperature (TJ) ...........................................................................
See MIL-STD-1835
80°C/W
50°C/W
76°C/W
81°C/W
+275°C
+175°C
1.4 Recommended operating conditions.
Supply voltage between +V and ground ...................................................... +15 V
Supply voltage between -V and ground ....................................................... -15 V
VREF (device types 01 and 02 only) ............................................................ open
VAL(max) ..................................................................................................... 0.8 V
VAH(min):
Device types 01-03 ..................................................................................
Device types 04-09 ..................................................................................
VEN:
Device types 01-03 ..................................................................................
Device types 04-09 ..................................................................................
Ambient operating temperature range (TA) .................................................
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
4.0 V
2.4 V
4.0 V
2.4 V
-55°C to +125°C
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for nonJAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MILPRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MILPRF-38535 is required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth tables. The truth tables shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
unless otherwise specified
Input leakage current 2/
IIH
Min
1, 2, 3
Measure inputs sequentially,
connect all unused inputs to
GND
1, 3
01, 02,
03, 04,
05, 07,
08, 09
06
2
1, 2, 3
IIL
1, 3
06
+IS(OFF)
VS = +10 V, VEN = 0.8 V,
VS = -10 V, VEN = 0.8 V,
all unused inputs = +10 V,
+ID(OFF)
VD = +10 V, VEN = 0.8 V,
all unused inputs = -10 V
1.0
-10.0
10.0
10.0
01, 02,
03, 07,
08, 09
-10
+10
04, 05,
06
-1
+1
2, 3
All
-50
+50
1
01, 02,
03, 07,
08, 09
-10
+10
04, 05,
06
-1
+1
2, 3
All
-50
+50
1
01, 02,
03, 07,
08, 09
-10
+10
04, 05
-2
+2
06
-1
+1
01, 04,
07
-300
+300
02, 08
-200
+200
03, 06,
09
-100
+100
05
-150
+150
2, 3
µA
1.0
-10.0
VD = +10 V
Leakage current into the
drain terminal of an
“OFF” switch
-1.0
1.0
VD = -10 V
-IS(OFF)
Max
-1.0
1
all unused inputs = -10 V,
Unit
1.0
01, 02,
03, 04,
05, 07,
08, 09
2
Leakage current into the
source terminal of an
“OFF” switch
Limits
nA
nA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
5
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
Min
Max
1
01, 02,
03, 07,
08, 09
-10
+10
04, 05
-2
+2
06
-1
+1
01, 04,
07
-300
+300
02, 08
-200
+200
03, 06,
09
-100
+100
05
-150
+150
01, 02,
03, 07,
08, 09
-10
+10
04, 05,
06
-2
+2
01, 04,
07
-300
+300
02, 08
-200
+200
03, 06,
09
-100
+100
05
-150
+150
01, 02,
03, 07,
08, 09
-10
+10
04, 05,
06
-2
+2
01, 04,
07
-300
+300
02, 08
-200
+200
03, 06,
09
-100
+100
05
-150
+150
unless otherwise specified
Leakage current into the
drain terminal of an
“OFF” switch
-ID(OFF)
VD = -10 V, VEN = 0.8 V,
all unused inputs = +10 V
2, 3
Leakage current from an
“ON” driver into the
switch (drain)
+ID(ON)
VD = +10 V, VS = +10 V,
1
all unused inputs = -10 V
2, 3
-ID(ON)
VD = -10 V, VS = -10 V,
1
all unused inputs = +10 V
2, 3
Limits
Unit
nA
nA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
6
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
unless otherwise specified
Overvoltage protected,
leakage current into
the drain terminal of
an “OFF” switch
+ID(OFF)
overvoltage
VS =+33 V, VD = 0 V,
VEN = 0.8 V, VS applied
VEN = 0.8 V, VS applied
-2.0
+2.0
1, 3
04, 05,
06
-2.0
+2.0
-5
+5
1, 2, 3
01, 02,
03,
-2.0
+2.0
1, 3
04, 05,
06
-2.0
+2.0
-5
+5
2
1, 2, 3
VA = 0 V, VEN = 4.0 V
VA = 0 V, VEN = 2.4 V
VA = 5 V, VEN = 2.4 V
Standby positive
supply current
Standby negative
supply current
-I
+ISBY
-ISBY
µA
at ≤ 25% duty cycle
VEN = 0.8 V
Negative supply current
Max
01, 02,
03,
VS =-33 V, VD = 0 V,
VS =-25 V, VD = 0 V,
+I
Min
1, 2, 3
2
VEN = 0.8 V
Positive supply current
Unit
at ≤ 25% duty cycle
VS =+25 V, VD = 0 V,
-ID(OFF)
overvoltage
Limits
01, 02,
03
2.0
04, 05
2.0
07, 08
3.0
09
2.4
06
2.0
01, 02,
03
-1.0
VA = 0 V, VEN = 2.4 V
04, 05,
07, 08,
09
-1.0
VA = 5 V, VEN = 2.4 V
06
-1.0
1, 2, 3
VA = 0 V, VEN = 4.0 V
1, 2, 3
VA = 0 V, VEN = 0 V
1, 2, 3
VA = 0 V, VEN = 0 V
mA
01, 02,
03, 04,
05, 06
2.0
07, 08
3.0
09
2.4
All
mA
mA
-1.0
mA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
7
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
1
01, 02,
03
unless otherwise specified
Switch “ON” resistance
+RDS1
Min
VS = +10 V, ID = -100 µA
2, 3
2, 3
2, 3
2, 3
2, 3
2, 3
+RDS2
3/
-RDS2
3/
Difference in switch
“ON” resistance
between channels
ΔRDS1
+V = +10 V, -V = -10 V,
1, 3
VS = +5.0 V, ID = +100 µA
04, 05,
06
04, 05,
06
2
(+RDS1 max) – (+RDS1 min) x
100 +RDS1 Ave, TA = +25°C
1
01. 02,
03
Address
1.5
Ω
300
2.2
kΩ
2.2
7
%
7
100 -RDS1 Ave, TA = +25°C
CA
kΩ
2.4
(-RDS1 max) – (-RDS1 min) x
Capacitance:
1.5
2.4
1, 3
VS = -5.0 V, ID = -100 µA
Ω
300
400
2
+V = +10 V, -V = -10 V,
1.5
2.0
07, 08,
09
1
VS = -10 V, ID = +1 mA
kΩ
1.8
04, 05,
06
1
VS = -10 V, ID = -100 µA
1.5
400
01, 02,
03
1
VS = -10 V, ID = +100 µA
Max
2.0
07, 08,
09
1
VS = +10 V, ID = -1 mA
Unit
1.8
04, 05,
06
1
VS = +10 V, ID = +100 µA
-RDS1
Limits
+V = -V = 0 V, f = 1 MHz,
4
TA = +25°C, see 4.3.1c
01, 02,
03
15
04, 05,
06 3/
10
07, 08
12
09
10
pF
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
8
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
4
01
85
02, 08
50
03, 09
25
04, 05,
06 3/
85
07
90
01, 02,
03
15
04, 05,
06 3/
10
07, 08,
09
12
7
All
10
mV
7
01, 02,
03, 07,
08, 09
-50
dB
7
04, 05,
06
-50
dB
7
04, 05,
06
-50
dB
9
01, 02,
03,
5
04, 05,
06 3/
5
07, 08,
09
25
unless otherwise specified
Capacitance:
COS
Output switch
Capacitance:
Min
+V = -V = 0 V, f = 1 MHz,
TA = +25°C, see 4.3.1c
CIS
Input switch
+V = -V = 0 V, f = 1 MHz,
4
TA = +25°C, see 4.3.1c
Charge transfer error
VCTE
VS = GND, TA = +25°C,
3/
VGEN = 0 V to 5 V
VEN = 0.8 V, VS = 7 Vrms,
VISO
Off isolation
RL = 1 kΩ, CL = 15 pF,
f = 100 kHz, TA = +25°C
3/
VEN = 0 V, VGEN = 1 Vp-p,
Single channel isolation
VISO
RL = 200 Ω, f = 200 kHz,
TA = +25°C
Crosstalk between
channels
VCT
Break-before-make
time delay
tD
Unit
Max
pF
pF
3/
VGEN = 1 Vp-p, f = 200 kHz,
TA = +25°C
Limits
3/
TA = +25°C, see figure 3
RL = 1 kΩ, CL = 50 pF,
TA = +25°C, see figure 3
ns
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
9
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
-V = -15 V, +V = +15 V
Group A
subgroups
Device
type
9
01, 02,
03
750
07,08,
09
500
10, 11
01, 02,
03, 07,
08, 09
1,000
9
04, 05,
06
1,000
unless otherwise specified
Propagation delay times:
Address inputs to I/O
channels times:
tON(A),
Min
RL = 10 kΩ, CL = 50 pF,
tOFF(A)
see figure 4
RL = 1 kΩ, CL = 100 pF,
see figure 4
Enable to I/O
tON(EN),
tOFF(EN)
10, 11
RL = 1 kΩ, CL = 50 pF,
see figure 4
RL = 1 kΩ, CL = 100 pF,
See figure 4
1/
Limits
Unit
Max
ns
1,500
9
01,02,
03, 07,
500
10, 11
08, 09
1,000
9
04, 05,
06
700
10, 11
ns
1,000
For device types 01 and 02, VREF = open. For device types 01, 02, and 03, VEN = 4.0 V unless otherwise specified. For
device types 04, 05, 06, 07, 08 and 09, VEN = 2.4 V unless otherwise specified. For device types 04, 05, and 06, current
flowing in either direction between any associated input and output terminals of the switch shall be 30 mA.
2/
Input current of one input mode.
3/
Guaranteed, if not tested, to the limits specified.
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
10
Case
outlines
Device
types
Terminal
number
1
E
X
X
X
X
2
3
3
3
3
03, 06,
09
01
02
04, 07
05, 08
03, 06,
09
01
02
07
08
V+
V+
V+
V+
Terminal symbol
A0
V+
V+
V+
V+
NC
2
Enable
NC
OUT B
NC
OUT B
A0
NC
OUT B
NC
OUT B
3
V-
NC
NC
NC
NC
Enable
NC
NC
NC
NC
4
IN 1A
IN 16
IN 8B
IN 16
IN 8B
V-
IN 16
IN 8B
IN 16
IN 8B
5
IN 2A
IN 15
IN 7B
IN 15
IN 7B
IN 1A
IN 15
IN 7B
IN 15
IN 7B
6
IN 3A
IN 14
IN 6B
IN 14
IN 6B
NC
IN 14
IN 6B
IN 14
IN 6B
7
IN 4A
IN 13
IN 5B
IN 13
IN 5B
IN 2A
IN 13
IN 5B
IN 13
IN 5B
8
OUT A
IN 12
IN 4B
IN 12
IN 4B
IN 3A
IN 12
IN 4B
IN 12
IN 4B
9
OUT B
IN 11
IN 3B
IN 11
IN 3B
IN 4A
IN 11
IN 3B
IN 11
IN 3B
10
IN 4B
IN 10
IN 2B
IN 10
IN 2B
OUT A
IN 10
IN 2B
IN 10
IN 2B
11
IN 3B
IN 9
IN 1B
IN 9
IN 1B
NC
IN 9
IN 1B
IN 9
IN 1B
12
IN 2B
GND
GND
GND
GND
OUT B
GND
GND
GND
GND
13
IN 1B
VREF
NC
NC
NC
IN 4B
NC
IN 3B
VREF
NC
NC
A3
VREF
A3
NC
A3
NC
A2
A2
A2
IN 2B
A2
A2
A2
A2
14
V+
VREF
A3
15
GND
A2
16
A1
A1
A1
A1
A1
NC
A1
A1
A1
A1
17
---
A0
A0
A0
A0
IN 1B
A0
A0
A0
A0
18
---
Enable
Enable
Enable
Enable
V+
Enable
Enable
Enable
Enable
19
---
IN 1
IN 1A
IN 1
IN 1A
GND
IN 1
IN 1A
IN 1
IN 1A
20
---
IN 2
IN 2A
IN 2
IN 2A
A1
IN 2
IN 2A
IN 2
IN 2A
21
---
IN 3
IN 3A
IN 3
IN 3A
---
IN 3
IN 3A
IN 3
IN 3A
22
---
IN 4
IN 4A
IN 4
IN 4A
---
IN 4
IN 4A
IN 4
IN 4A
23
---
IN 5
IN 5A
IN 5
IN 5A
---
IN 5
IN 5A
IN 5
IN 5A
24
---
IN 6
IN 6A
IN 6
IN 6A
---
IN 6
IN 6A
IN 6
IN 6A
25
---
IN 7
IN 7A
IN 7
IN 7A
---
IN 7
IN 7A
IN 7
IN 7A
26
---
IN 8
IN 8A
IN 8
IN 8A
---
IN 8
IN 8A
IN 8
IN 8A
27
---
V-
V-
V-
V-
---
V-
V-
V-
V-
28
---
OUT
OUT A
OUT
OUT A
---
OUT
OUT A
OUT
OUT A
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
11
Device types 01, 04, and 07
A3
A2
A1
A0
EN
X
X
X
X
L
Device types 02, 05, and 08
CHANNEL
SELECTED
NONE
A2
A1
A0
EN
X
X
X
L
CHANNEL
SELECTED
NONE
L
L
L
L
H
1
L
L
L
H
1A, 1B
L
L
L
H
H
2
L
L
H
H
2A, 2B
L
L
H
L
H
3
L
H
L
H
3A, 3B
L
L
H
H
H
4
L
H
H
H
4A, 4B
L
H
L
L
H
5
H
L
L
H
5A, 5B
L
H
L
H
H
6
H
L
H
H
6A, 6B
L
H
H
L
H
7
H
H
L
H
7A, 7B
L
H
H
H
H
8
H
H
H
H
8A, 8B
H
L
L
L
H
9
H
L
L
H
H
10
H
L
H
L
H
11
H
L
H
H
H
12
H
H
L
L
H
13
H
H
L
H
H
14
H
H
H
L
H
15
H
H
H
H
H
16
Device types 03, 06, and 09
A1
A0
X
X
L
CHANNEL
SELECTED
NONE
L
L
H
1A, 1B
EN
L
H
H
2A, 2B
H
L
H
3A, 3B
H
H
H
4A, 4B
FIGURE 2. Truth tables.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
12
FIGURE 3. Break-before-make test circuit and waveforms.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
13
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
14
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
15
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
16
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
17
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
18
FIGURE 3. Break-before-make test circuit and waveforms – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
19
FIGURE 4. Switching times test circuits.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
20
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
21
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
22
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
23
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
24
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
25
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
26
1
+15 V
2
3
4
100
pF
1k
5
GND
6
+10 V
7
-10 V
8
-10 V
9
+10 V
10
11
GND
12
13
14
+V
28
OUT A
27
-V
OUT B
NC
IN 8A
IN 8B
IN 7A
IN 7B
IN 6A
IN 6B
IN 5A
IN 5B
IN 4A
IN 4B
IN 3A
IN 3B
IN 2A
IN 2B
IN 1A
I/O
-15 V
100
pF
26
1k
25
24
GND
23
-10 V
22
+10 V
21
+10 V
20
-10 V
19
IN 1B
EN
GND
A0
NC
A1
NC
A2
.
GND
18
+5 V
17
PULSE GEN
16
15
(ADDRESS INPUTS TO I/O)
1
+15 V
2
3
4
100
pF
1k
5
6
+10 V
7
-10 V
8
9
GND
10
11
12
13
14
+V
28
OUT A
27
-V
OUT B
NC
IN 8A
IN 8B
IN 7A
IN 7B
IN 6A
IN 6B
IN 5A
IN 5B
IN 4A
IN 4B
IN 3A
IN 3B
IN 2A
IN 2B
IN 1A
I/O
-15 V
100
pF
26
1k
25
24
+10 V
23
-10 V
22
GND
21
20
19
IN 1B
EN
GND
A0
NC
A1
NC
A2
18
PULSE
GEN
17
16
15
+5 V
(ENABLE TO I/O)
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
27
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
28
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
29
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
30
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
31
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
32
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
33
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
34
FIGURE 4. Switching times test circuits – continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
35
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
c.
Subgroup 4 capacitance measurements shall be measured only for the initial test and after process or design changes
which may affect capacitance.
d.
Subgroups 7 shall include verification of the truth table.
4.3.2 Groups C and D inspections.
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2)
TA = +125°C, minimum.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
36
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters
(method 5005)
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
1
1*,2,3,9
1,2,3,4,7,9,10**,11**
1
* PDA applies to subgroup 1.
** Subgroups 10 and 11, if not tested, shall be guaranteed to the
specified limits in table I.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
(614) 692-0547.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MILHDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by
DSCC-VA.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-85131
A
REVISION LEVEL
F
SHEET
37
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 07-09-13
Approved sources of supply for SMD 5962-85131 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised
to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate
of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of
supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-85131013A
34371
HI4-546/883
5962-8513101XA
34371
HI1-546/883
5962-85131023A
34371
HI4-547/883
5962-8513102XA
34371
HI1-547/883
5962-85131032A
3/
HI4-549/883
5962-8513103EA
34371
HI1-549/883
M38510/19006BEA
5962-8513104XA
3/
IH5116MJI
M38510/19002BXA
5962-8513105XA
3/
IH5216MJI
M38510/19004BXA
5962-85131062C
1ES66
MAX359MLP/883B
1ES66
MAX359MJE/883B
3/
IH5208MJE
5962-85131073A
34371
HI4-506/883
5962-85131073C
1ES66
DG506AAZ/883B
5962-8513107XA
34371
HI1-506/883
5962-85131083A
3/
HI4-507/883
5962-85131083C
1ES66
DG507AAZ/883B
5962-8513108XA
3/
HI1-507/883
5962-85131092A
34371
HI4-509/883
5962-85131092C
1ES66
DG509AAZ/883B
5962-8513109EA
3/
HI1-509/883
5962-8513106EA
Reference
military specification
M38510/19002BXA
M38510/19004BXA
M38510/19006BEA
M38510/19001BXA
M38510/19003BXA
M38510/19008BEA
1/ The lead finish shown for each PIN representing a hermetic package is the
most readily available from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor to determine its availability.
2/ Caution. Do not use this number for item acquisition. Items acquired to this
number may not satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
1 of 2
STANDARD MICROCIRCUIT DRAWING BULLETIN - CONTINUED
Vendor CAGE
number
Vendor name
and address
34371
Intersil Corporation
1001 Murphy Ranch Road
Milpitas, CA 95035-6803
Point of contact:
1650 Robert J. Conlan Blvd.
Palm Bay, FL 32905
1ES66
Maxim Integrated Products
120 San Gabriel Drive
Sunnyvale, CA 94086-5125
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
2 of 2