IRFD113, SiHFD113 Datasheet

IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• For Automatic Insertion
60
RDS(on) (Ω)
VGS = 10 V
• Compact Plastic Package
0.8
Qg (Max.) (nC)
7
• End Stackable
Qgs (nC)
2
• Fast Switching
Qgd (nC)
7
• Low Drive Current
Configuration
Single
• Easily Paralleled
• Excellent Temperature Stability
• Compliant to RoHS Directive 2002/95/EC
D
Note
* Pb containing terminations are not RoHS compliant, exemptions
may apply
HVMDIP
DESCRIPTION
G
S
The HVMDIP technology is the key to Vishay’s advanced
line of power MOSFET transistors. The efficient geometry
and unique processing of the HVMDIP design achieves
very low on-state resistance combined with high
transconductance and extreme device ruggedness.
HVMDIPs feature all of the established advantages of
MOSFETs such as voltage control, very fast switching, ease
of paralleling, and temperature stability of the electrical
parameters.
The HVMDIP 4 pin, dual-in-line package brings the
advantages of HVMDIPs to high volume applications where
automatic PC board insertion is desireable, such as circuit
boards for computers, printers, telecommunications
equipment, and consumer products. Their compatibility with
automatic insertion equipment, low-profile and end
stackable features represent the stat-of-the-art in power
device packaging.
G
S
D
N-Channel MOSFET
ORDERING INFORMATION
Package
HVMDIP
IRFD113PbF
SiHFD113-E3
Lead (Pb)-free
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltagea
VDS
60
Gate-Source Voltage
VGS
± 20
ID
0.8
IDM
6.4
Continuous Drain Current
Pulsed Drain
VGS at 10 V
TC = 25 °C
Currentb
Linear Derating Factor
UNIT
V
A
0.008
W/°C
Inductive Current, Clamped
L = 100 μH
ILM
6.4
A
Maximum Power Dissipation
TC = 25 °C
PD
1.0
W
TJ, Tstg
- 55 to + 150
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
for 10 s
300c
°C
Notes
a. TJ = 25 °C to 150 °C
b. Repetitive rating; pulse width limited by maximum junction temperature.
c. 1.6 mm from case.
S11-2479-Rev. A, 19-Dec-11
1
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
Maximum Junction-to-Ambient
SYMBOL
TYP.
MAX.
UNIT
RthJA
-
120
°C/W
SPECIFICATIONS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Currentb
Drain-Source On-State Resistanceb
Forward Transconductanceb
VDS
VGS = 0 V, ID = 250 μA
60
-
-
VGS(th)
VDS = VGS, ID = 250 μA
2.0
-
4.0
IGSS
IDSS
VGS = ± 20 V
-
-
± 500
VDS = max. rating, VGS = 0 V
-
-
250
VDS = max. rating x 0.8, VGS = 0 V, TC = 125 °C
-
-
1000
V
nA
μA
ID(on)
VGS = 10 V
VDS > ID(on) x RDS(on) max.
0.8
-
-
A
RDS(on)
VGS = 10 V
ID = 0.8 A
-
0.6
0.8
Ω
S
gfs
VDS > ID(on) x RDS(on) max., ID = 0.8 A
0.8
1.2
-
Input Capacitance
Ciss
135
200
Coss
-
80
100
Reverse Transfer Capacitance
Crss
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz
-
Output Capacitance
-
20
25
-
5
7
-
2
-
Dynamic
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Turn-On Delay Time
td(on)
Rise Time
Turn-Off Delay Time
tr
td(off)
Fall Time
tf
Internal Drain Inductance
LD
Internal Source Inductance
LS
VGS = 10 V
ID = 4 A,
VDS = 0.8 max. rating
VDD = 0.5 VDS , ID = 0.8 A,
Rg = 50 Ω
Between lead,
2 mm (0.08") from
package and center of
die contact
D
G
-
7
-
-
10
20
pF
nC
-
15
25
-
15
25
-
10
20
-
4.0
-
-
6.0
-
-
-
0.8
-
-
6.4
-
-
2
-
100
-
ns
-
0.2
-
μC
ns
nH
S
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulsed Diode Forward Current
Body Diode Voltagea
IS
ISM
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TA = 25 °C, IS = 0.8 A, VGS = 0 V
TJ = 150 °C, IF = 1.0 A, dI/dt = 100 A/μs
V
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 μs; duty cycle ≤ 2 %.
S11-2479-Rev. A, 19-Dec-11
2
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
Fig. 1 - Typical Output Characteristics
Fig. 3 - Typical Saturation Characteristics
Fig. 2 - Typical Transfer Characteristics
Fig. 4 - Maximum Safe Operatung Area
S11-2479-Rev. A, 19-Dec-11
3
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
Fig. 5 - Typical Transconductance vs. Drain Current
Fig. 7 - Breakdown Voltage vs. Temperature
Fig. 6 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Normalized On-Resistance vs. Temperature
S11-2479-Rev. A, 19-Dec-11
4
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
Fig. 9 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 11 - Typical On-Resistance vs. Darin Current
Fig. 10 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 12 - Maximum Darin Current vs. Case Temperature
S11-2479-Rev. A, 19-Dec-11
5
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
Fig. 17 - Gate Charge Test Circuit
Fig. 13 - Power vs. Temperature Derating
Fig. 14 - Clamped Inductive Test Circuit
EC
IP
VDS
Fig. 18 - Typical Time to Accumulated 1 % Gate Failure
IL
VDD
Fig. 15 - Clamped Inductive Waveforms
Fig. 16 - Switching Time Test Circuit
Fig. 19 - Typical High Temperature Reverse Bias (HTRB) Failure
Rate
S11-2479-Rev. A, 19-Dec-11
6
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
IRFD113, SiHFD113
www.vishay.com
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
Rg
•
•
•
•
+
dV/dt controlled by Rg
Driver same type as D.U.T.
ISD controlled by duty factor “D”
D.U.T. - device under test
+
-
VDD
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = 10 Va
D.U.T. lSD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Inductor current
VDD
Body diode forward drop
ISD
Ripple ≤ 5 %
Note
a. VGS = 5 V for logic level devices
Fig. 20 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?91487.
S11-2479-Rev. A, 19-Dec-11
7
Document Number: 91487
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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Revision: 02-Oct-12
1
Document Number: 91000