Data Sheet

Freescale Semiconductor
Technical Data
Document Number: MMRF1007H
Rev. 0, 12/2013
RF Power Field Effect Transistors
N--Channel Enhancement--Mode Lateral MOSFETs
MMRF1007HR5
MMRF1007HSR5
RF power transistors designed for applications operating at frequencies
from 900 to 1215 MHz. These devices are suitable for use in defense and
commercial pulse applications, such as IFF and DME.
 Typical Pulse Performance: VDD = 50 Vdc, IDQ = 150 mA, Pout =
1000 W Peak (100 W Avg.), f = 1030 MHz, Pulse Width = 128 sec, Duty
Cycle = 10%
Power Gain — 20 dB
Drain Efficiency — 56%
 Capable of Handling 5:1 VSWR, @ 50 Vdc, 1030 MHz, 1000 W Peak Power
Features
965--1215 MHz, 1000 W, 50 V
LATERAL N--CHANNEL
BROADBAND
RF POWER MOSFETs
 Characterized with Series Equivalent Large--Signal Impedance Parameters
Internally Matched for Ease of Use
Qualified Up to a Maximum of 50 VDD Operation
Integrated ESD Protection
Designed for Push--Pull Operation
Greater Negative Gate--Source Voltage Range for Improved Class C
Operation
 In Tape and Reel. R5 Suffix = 50 Units, 56 mm Tape Width, 13--inch Reel.





NI--1230H--4S
MMRF1007HR5
NI--1230S--4S
MMRF1007HSR5
PARTS ARE PUSH--PULL
RFinA/VGSA 3
1 RFoutA/VDSA
RFinB/VGSB 4
2 RFoutB/VDSB
(Top View)
Figure 1. Pin Connections
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain--Source Voltage
VDSS
--0.5, +110
Vdc
Gate--Source Voltage
VGS
--6.0, +10
Vdc
Storage Temperature Range
Tstg
-- 65 to +150
C
TC
150
C
TJ
225
C
Case Operating Temperature
Operating Junction Temperature
(1)
1. Continuous use at maximum temperature will affect MTTF.
 Freescale Semiconductor, Inc., 2013. All rights reserved.
RF Device Data
Freescale Semiconductor, Inc.
MMRF1007HR5 MMRF1007HSR5
1
Table 2. Thermal Characteristics
Characteristic
Value (1)
Symbol
Thermal Resistance, Junction to Case
Case Temperature 67C, 1000 W Peak, 128 sec Pulse Width, 10% Duty Cycle,
50 Vdc, IDQ = 150 mA
Case Temperature 62C, Mode--S Pulse Train, 80 Pulses of 32 sec On, 18 sec
Off, Repeated Every 40 msec, 6.4% Overall Duty Cycle, 50 Vdc, IDQ = 150 mA
ZJC
Unit
C/W
0.02
0.07
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22--A114)
1B
Machine Model (per EIA/JESD22--A115)
B
Charge Device Model (per JESD22--C101)
IV
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted)
Symbol
Min
Typ
Max
Unit
IGSS
—
—
10
Adc
V(BR)DSS
110
—
—
Vdc
Zero Gate Voltage Drain Leakage Current
(VDS = 50 Vdc, VGS = 0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS = 0 Vdc)
IDSS
—
—
100
Adc
Gate Threshold Voltage (2)
(VDS = 10 Vdc, ID = 1000 Adc)
VGS(th)
0.9
1.6
2.4
Vdc
Gate Quiescent Voltage (3)
(VDD = 50 Vdc, ID = 150 mAdc, Measured in Functional Test)
VGS(Q)
1.5
2.2
3
Vdc
Drain--Source On--Voltage (2)
(VGS = 10 Vdc, ID = 2.7 Adc)
VDS(on)
—
0.15
—
Vdc
Reverse Transfer Capacitance
(VDS = 50 Vdc  30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
1.27
—
pF
Output Capacitance
(VDS = 50 Vdc  30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
86.7
—
pF
Input Capacitance
(VDS = 50 Vdc, VGS = 0 Vdc  30 mV(rms)ac @ 1 MHz)
Ciss
—
539
—
pF
Characteristic
Off Characteristics
(2)
Gate--Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
Drain--Source Breakdown Voltage
(VGS = 0 Vdc, ID = 165 mA)
On Characteristics
Dynamic Characteristics (2)
Functional Tests (3) (In Freescale Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ = 150 mA, Pout = 1000 W Peak (100 W Avg.),
f = 1030 MHz, 128 sec Pulse Width, 10% Duty Cycle
Power Gain
Gps
19
20
22
dB
Drain Efficiency
D
54
56
—
%
Input Return Loss
IRL
—
--23
--9
dB
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
2. Each side of device measured separately.
3. Measurement made with device in push--pull configuration.
(continued)
MMRF1007HR5 MMRF1007HSR5
2
RF Device Data
Freescale Semiconductor, Inc.
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Typical Performance — 1030 MHz (In Freescale 1030 MHz Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ = 150 mA, Pout = 1000 W Peak
(100 W Avg.), f = 1030 MHz, Mode--S Pulse Train, 80 Pulses of 32 sec On, 18 sec Off, Repeated Every 40 msec, 6.4% Overall Duty Cycle
Power Gain
Gps
—
19.8
—
dB
Drain Efficiency
D
—
59.0
—
%
BDrp
—
0.21
—
dB
Burst Droop
Typical Performance — 1090 MHz (In Freescale 1090 MHz Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ = 150 mA, Pout = 1000 W Peak
(100 W Avg.), f = 1090 MHz, 128 sec Pulse Width, 10% Duty Cycle
Power Gain
Gps
—
21.4
—
dB
Drain Efficiency
D
—
56.3
—
%
Input Return Loss
IRL
—
--25.3
—
dB
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
3
VBIAS
+
C1
C2
C3
C4
C21
C22
+
+
C23
C24
VSUPPLY
L1
BALUN 1
Z3
RF
INPUT Z1
C13
R1
Z5
Z7
Z11
Z13
Z15
Z17
C17
Z19 Z21
C18
Z9
RF
Z23 OUTPUT
C10
Z2
Z4
C9
Z6
Z8
C12
Z10
DUT
C11
Z12
C15
C16
Z16
Z18
Z14
Z20 Z22
R2
C19
C14
VBIAS
L2
+
C5
C6
C7
C20
C8
C25
Z1
Z2
Z3, Z4
Z5, Z6
Z7, Z8
Z9, Z10
Z11, Z12
BALUN 2
0.140 x 0.083
0.300 x 0.083
0.746 x 0.220
0.075 x 0.631
0.329 x 0.631
0.326 x 0.631
0.240 x 0.631
Z13, Z14
Z15, Z16
Z17, Z18
Z19, Z20
Z21, Z22
Z23
PCB
C26
+
+
C27
C28
VSUPPLY
0.143 x 0.631
0.135 x 0.631
0.102 x 0.632
0.130 x 0.631
0.736 x 0.215
0.410 x 0.083
Arlon CuClad 250GX--0300--55--22, 0.030, r = 2.55
Figure 2. MMRF1007HR5(HSR5) Test Circuit Schematic
Table 5. MMRF1007HR5(HSR5) Test Circuit Component Designations and Values
Part
Description
Manufacturer
Part Number
Balun 1, 2
Balun Anaren
3A412
Anaren
C1, C5
22 F, 25 V Tantalum Capacitors
TPSD226M025R
AVX
C2, C6
2.2 F, 50 V Chip Capacitors
C1825C225J5RAC
Kemet
C3, C7
0.22 F, 100 V Chip Capacitors
C1210C224K1RAC
Kemet
C4, C8, C17, C18, C19,
C20, C21, C25
36 pF Chip Capacitors
ATC100B360JT500XT
ATC
C9
1.0 pF Chip Capacitor
ATC100B1R0CT500XT
ATC
C12, C16
0.8--8.0 pF Variable Capacitors
27291SL
Johanson
C10, C11, C13, C14, C15
5.1 pF Chip Capacitors
ATC100B5R1CT500XT
ATC
C22, C26
0.022 F, 100 V Chip Capacitors
C1825C223K1GAC
Kemet
C23, C24, C27, C28
470 F, 63 V Electrolytic Capacitors
MCGPR63V477M13X26--RH
Multicomp
L1, L2
Inductors 3 Turn
GA3094--AL
Coilcraft
R1, R2
1000 , 1/3 W Chip Resistors
CRCW12101001FKEA
Vishay
MMRF1007HR5 MMRF1007HSR5
4
RF Device Data
Freescale Semiconductor, Inc.
C24
C23
C1
C3
C2
BALUN 1
C21
C4
C13
R1
C12
C11
C9
R2
C6
C5
C8
C7
C15
CUT OUT AREA
C10
--
C22
BALUN 2
L1
C17
C18
C16
C19
C20
C14
L2
C25
C26
C27
--
C28
Figure 3. MMRF1007HR5(HSR5) Test Circuit Component Layout
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
5
TYPICAL CHARACTERISTICS
22
21
Coss
100
Measured with 30 mV(rms)ac @ 1 MHz
VGS = 0 Vdc
Crss
10
Gps, POWER GAIN (dB)
C, CAPACITANCE (pF)
Ciss
60
VDD = 50 Vdc
IDQ = 150 mA
f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
20
50
Gps
40
30
19
18
20
D
10
17
16
1
0
10
20
40
30
50
1
10
VDS, DRAIN--SOURCE VOLTAGE (VOLTS)
Pout, OUTPUT POWER (WATTS) PEAK
Note: Each side of device measured separately.
Figure 5. Power Gain and Drain Efficiency
versus Output Power
Figure 4. Capacitance versus Drain--Source Voltage
22
24
Gps, POWER GAIN (dB)
P1dB = 1065 W (60.3 dBm)
20
P3dB = 1182 W (60.7 dBm)
19.5
19
18.5
18
500
23
VDD = 50 Vdc
IDQ = 150 mA
f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
600
700
Actual
900
1000
1100
1200
1300
20
1500 mA
19
750 mA
18
375 mA
17
150 mA
VDD = 50 Vdc
f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
10
1
1000
100
10000
Pout, OUTPUT POWER (WATTS) PEAK
Figure 6. Power Gain versus Output Power
Figure 7. Power Gain versus Output Power
65
20
19
18
VDD = 30 V
17
0
3000 mA
21
Pout, OUTPUT POWER (WATTS) PEAK
21
16
22
16
800
IDQ = 150 mA, f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
22
IDQ = 6000 mA
23
21
Pout, OUTPUT POWER (dBm)
Gps, POWER GAIN (dB)
21.5
Gps, POWER GAIN (dB)
25
Ideal
20.5
0
10000
1000
100
200
400
D, DRAIN EFFICIENCY (%)
1000
35 V
40 V
45 V
50 V
600
800
1000
1200
1400
60
55
TC = --30_C
50
45
40
20
25_C
VDD = 50 Vdc
IDQ = 150 mA
f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
85_C
25
30
35
40
Pout, OUTPUT POWER (WATTS) PEAK
Pin, INPUT POWER (dBm) PEAK
Figure 8. Power Gain versus Output Power
Figure 9. Output Power versus Input Power
45
MMRF1007HR5 MMRF1007HSR5
6
RF Device Data
Freescale Semiconductor, Inc.
TYPICAL CHARACTERISTICS
22
Gps, POWER GAIN (dB)
70
VDD = 50 Vdc
IDQ = 150 mA
f = 1030 MHz
Pulse Width = 128 sec
Duty Cycle = 10%
21
60
Gps
50
20
40
TC = --30_C
19
18
25_C
17
16
30
20
D
10
85_C
10
1
D, DRAIN EFFICIENCY (%)
23
0
10000
1000
100
Pout, OUTPUT POWER (WATTS) PEAK
109
109
108
108
MTTF (HOURS)
MTTF (HOURS)
Figure 10. Power Gain and Drain Efficiency
versus Output Power
107
106
105
107
106
105
104
104
90
110
130
150
170
190
210
230
250
TJ, JUNCTION TEMPERATURE (C)
90
110
130
150
170
190
210
230
250
TJ, JUNCTION TEMPERATURE (C)
This above graph displays calculated MTTF in hours when the device
is operated at VDD = 50 Vdc, Pout = 1000 W Peak, Pulse Width = 128 sec,
Duty Cycle = 10%, and D = 56%.
This above graph displays calculated MTTF in hours when the device
is operated at VDD = 50 Vdc, Pout = 1000 W Peak, Mode--S Pulse Train,
Pulse Width = 32 sec, Duty Cycle = 6.4%, and D = 59%.
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
Figure 11. MTTF versus Junction Temperature -128 sec, 10% Duty Cycle
Figure 12. MTTF versus Junction Temperature -Mode--S
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
7
Zo = 5 
f = 1030 MHz
Zload
f = 1030 MHz
Zsource
VDD = 50 Vdc, IDQ = 150 mA, Pout = 1000 W Peak
f
MHz
Zsource

Zload

1030
3.93 + j0.09
1.54 + j1.42
Zsource = Test circuit impedance as measured from
gate to gate, balanced configuration.
Zload
= Test circuit impedance as measured from
drain to drain, balanced configuration.
Input
Matching
Network
+
Device
Under
Test
--
-Z
source
Output
Matching
Network
+
Z
load
Figure 13. Series Equivalent Source and Load Impedance
MMRF1007HR5 MMRF1007HSR5
8
RF Device Data
Freescale Semiconductor, Inc.
C24
-C23
C1
C3
C21
C4
BALUN 1
C13
R1
C29
C12
C11
C9
R2
C8
C6
C15
CUT OUT AREA
C10
--
C22
BALUN 2
L1
C16
C17
C18
C19
C20
C14
L2
C25 C26
C7
C5
--
C2
C27
C28
Figure 14. MMRF1007HR5(HSR5) Test Circuit Component Layout — 1090 MHz
Table 6. MMRF1007HR5(HSR5) Test Circuit Component Designations and Values — 1090 MHz
Part
Description
Manufacturer
Part Number
Balun 1, 2
Balun Anaren
3A412
Anaren
C1, C5
22 F, 25 V Tantalum Capacitors
TPSD226M025R0200
AVX
C2, C6
2.2 F, 50 V 1825 Chip Capacitors
C1825C225J5RAC--TU
Kemet
C3, C7
0.22 F, 100 V Chip Capacitors
C1210C224K1RAC--TU
Kemet
C4, C8, C17, C18, C19,
C20, C21, C25
36 pF Chip Capacitors
ATC100B360JT500XT
ATC
C9
1.0 pF Chip Capacitor
ATC100B1R0BT500XT
ATC
C12, C16
0.8--8.0 pF Variable Capacitors
27291SL
Johanson
C10, C11, C13, C14, C15,
C29
5.1 pF Chip Capacitors
ATC100B5R1CT500XT
ATC
C22, C26
0.022 F, 100 V Chip Capacitors
C1825C223K1GAC
Kemet
C23, C24, C27, C28
470 F, 63 V Electrolytic Capacitors
MCGPR63V477M13X26--RH
Multicomp
L1, L2
Inductors 3 Turn
GA3094--ALC
Coilcraft
R1, R2
1000 , 1/4 W Chip Resistors
CRCW12061K00FKEA
Vishay
PCB
CuClad, 0.030, r = 2.55
250GX--0300--55--22
Arlon
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
9
TYPICAL CHARACTERISTICS — 1090 MHZ
60
VDD = 50 Vdc
I = 150 mA
21 DQ
f = 1090 MHz
Pulse Width = 128 sec
20 Duty Cycle = 10%
50
40
Gps
19
30
D
18
20
17
10
16
10
100
1000
D, DRAIN EFFICIENCY (%)
Gps, POWER GAIN (dB)
22
0
3000
Pout, OUTPUT POWER (WATTS) PEAK
Figure 15. Power Gain and Drain Efficiency
versus Output Power
MMRF1007HR5 MMRF1007HSR5
10
RF Device Data
Freescale Semiconductor, Inc.
Zo = 5 
f = 1090 MHz
f = 1090 MHz
Zsource
Zload
VDD = 50 Vdc, IDQ = 150 mA, Pout = 1000 W Peak
f
MHz
Zsource

Zload

1090
2.98 + j3.68
1.51 + j2.02
Zsource = Test circuit impedance as measured from
gate to gate, balanced configuration.
Zload
= Test circuit impedance as measured from
drain to drain, balanced configuration.
Input
Matching
Network
+
Device
Under
Test
--
-Z
source
Output
Matching
Network
+
Z
load
Figure 16. Series Equivalent Source and Load Impedance — 1090 MHz
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
11
PACKAGE DIMENSIONS
MMRF1007HR5 MMRF1007HSR5
12
RF Device Data
Freescale Semiconductor, Inc.
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
13
MMRF1007HR5 MMRF1007HSR5
14
RF Device Data
Freescale Semiconductor, Inc.
MMRF1007HR5 MMRF1007HSR5
RF Device Data
Freescale Semiconductor, Inc.
15
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
 AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
 EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
0
Dec. 2013
Description
 Initial Release of Data Sheet
MMRF1007HR5 MMRF1007HSR5
16
RF Device Data
Freescale Semiconductor, Inc.
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E 2013 Freescale Semiconductor, Inc.
MMRF1007HR5 MMRF1007HSR5
Document
Number:Data
MMRF1007H
RF Device
Rev. 0,
12/2013
Freescale
Semiconductor,
Inc.
17