NCV4299A 150 mA Low-Dropout Voltage Regulator The NCV4299A is a family of precision micropower voltage regulators with an output current capability of 150 mA. It is available in 5.0 V or 3.3 V output voltage. The output voltage is accurate within "2% with a maximum dropout voltage of 0.5 V at 100 mA. Low Quiescent current is a feature drawing only 65 mA with a 100 mA load. This part is ideal for any and all battery operated microprocessor equipment. The device features microprocessor interfaces including an adjustable reset output and adjustable system monitor to provide shutdown early warning. An inhibit function is available. With inhibit active, the regulator turns off and the device consumes less than 1.0 mA of quiescent current. The part can withstand load dump transients making it suitable for use in automotive environments. Features • 14 SO−14 D SUFFIX CASE 751A 14 1 V4299AxxG AWLYWW 1 14 V429 9Axx ALYWG G TSSOP−14 EP PA SUFFIX CASE 948AW 14 1 65 mA (Typ) in the ON Mode ♦ t1.0 mA in the Off Mode Early Warning Reset Output Low Down to VQ = 1.0 V Adjustable Reset Threshold Wide Temperature Range Fault Protection ♦ 60 V Peak Transient Voltage ♦ −40 V Reverse Voltage ♦ Short Circuit ♦ Thermal Overload Internally Fused Leads Inhibit Function with mA Current Consumption in the Off Mode NCV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP Capable These are Pb−Free Devices ♦ • • • MARKING DIAGRAM 1 • 5.0 V, 3.3 V ±2%, 150 mA • Extremely Low Current Consumption • • • • • http://onsemi.com xx = 33 (3.3 V Version) = 50 (5.0 V Version) A = Assembly Location WL, L = Wafer Lot Y = Year WW, W = Work Week G or G = Pb−Free Package (Note: Microdot may be in either location) PIN CONNECTIONS RADJ D GND GND GND INH RO 1 14 SI I GND GND GND Q SO SOIC−14 RADJ NC D GND INH NC RO 1 14 EPAD SI I NC Q NC NC SO TSSOP−14 EP ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 18 of this data sheet. © Semiconductor Components Industries, LLC, 2013 December, 2013 − Rev. 3 1 Publication Order Number: NCV4299A/D NCV4299A Q I Bandgap Reference Current Limit and Saturation Sense + RSO RRO INH SO 1.36 V SI + − 8 mA + + - RADJ RO + 1.85 V D Figure 1. Simplified Block Diagram GND PIN FUNCTION DESCRIPTION Pin No. SOIC−14 Pin No. TSSOP−14 Symbol Description 1 1 RADJ Reset Adjust. Use resistor divider to Q to adjust reset threshold lower. Connect to GND if not used. 2 3 D 3 4 GND Ground 4 − GND Ground 5 − GND Ground 6 5 INH Inhibit. Connect to I if not needed. A high turns the regulator on. Use a low pass filter if transients with slew rate in excess of 10 V/ms may be present on this pin during operation. See Figure 33 for details. 7 7 RO Reset Output. NPN collector output with internal 20 kW pullup to Q. Notifies user of out of regulation condition. 8 8 SO Sense Output. NPN collector output with internal 20 kW pullup to Q. Can be used to provide early warning of an impending reset condition. 9 11 Q 10 − GND Ground 11 − GND Ground 12 − GND Ground 13 13 I 14 14 SI Sense Input. Can provide an early warning signal of an impending reset condition when used with SO. − 2,6,9,10,12 NC Not Connected − EPAD EPAD Reset Delay. Connect external capacitor to ground to set delay time. 5.0 V, 3.3 V, "2%, 150 mA output. Use 22 mF, ESR t 8.0 W to ground. Input. Battery Supply Input Voltage. Connect to Ground potential or leave unconnected. http://onsemi.com 2 NCV4299A MAXIMUM RATINGS Rating Symbol Min Max Unit Input Voltage to Regulator (DC) VI −40 45 V Input Peak Transient Voltage to Regulator wrt GND (Note 1) − − 60 V VINH −40 45 V Sense Input (SI) VSI −40 45 V Sense Input (SI) ISI −1.0 1.0 mA Reset Threshold (RADJ) VRADJ −0.3 7.0 V Reset Threshold (RADJ) IRADJ −10 10 mA VD −0.3 7.0 V Reset Output (RO) VRO −0.3 7.0 V Reset Output (RO) IRO −20 20 mA Sense Output (SO) VSO −0.3 7.0 V Output (Q) VQ −0.3 16 V Output (Q) IQ −5.0 − mA ESD Capability, Human Body Model (Note 2) ESDHB 2.0 − kV ESD Capability, Machine Model (Note 2) ESDMM 200 − V ESD Capability, Charged Device Model (Note 2) ESDCDM 1.0 − kV Junction Temperature TJ − 150 °C Storage Temperature Tstg −50 150 °C Inhibit (INH) Reset Delay (D) Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Evaluated according to ISO7637−2 test conditions. Load dump pulse test passed up to VI = 60 V, guaranteed value up to VI = 45 V. 2. This device series incorporates ESD protection and is tested by the following methods: ESD HBM tested per AEC−Q100−002 (JS−001−2010) ESD MM tested per AEC−Q100−003 (EIA/JESD22−A115) ESD CDM tested per AEC−Q100−011 (EIA/JESD22−C101). RECOMMENDED OPERATING RANGE Input Voltage 5.0 V Version 3.3 V Version Junction Temperature VI 5.5 4.4 45 45 V TJ −40 150 °C Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. LEAD TEMPERATURE SOLDERING REFLOW (Note 3) Reflow (SMD styles only), lead free 60 s−150 sec above 217, 40 sec max at peak TSLD Moisture Sensitivity Level MSL SO−14 TSSOP−14 EP − 265 Pk °C Level 1 Level 1 3. Per IPC / JEDEC J−STD−020C. THERMAL CHARACTERISTICS Test Conditions (Typical Value) Characteristic Note 4 Note 5 Note 6 Thermal Characteristics, SO−14 Junction−to−Lead (yJLx, qJLx) Junction−to−Ambient (RθJA, qJA) 20 114 22 90 21 70 Thermal Characteristics, TSSOP−14 EP Junction−to−Lead (yJLx, qJLx) Junction−to−Ambient (RθJA, qJA) 15 114 13 80 10 55 4. 2 oz Copper, 50 mm sq Copper area, 1.5 mm thick FR4. 5. 2 oz Copper, 150 mm sq Copper area, 1.5 mm thick FR4. 6. 2 oz Copper, 500 mm sq Copper area, 1.5 mm thick FR4. http://onsemi.com 3 Unit °C/W °C/W NCV4299A ELECTRICAL CHARACTERISTICS (−40°C < TJ < 150°C; VI = 13.5 V unless otherwise noted.) Characteristic Symbol Test Conditions Min Typ Max Unit Output Q Output Voltage (5.0 V Version) VQ 1.0 mA < IQ < 150 mA, 6.0 V < VI < 16 V 4.9 5.0 5.1 V Output Voltage (3.3 V Version) VQ 1.0 mA < IQ < 150 mA, 5.5 V < VI < 16 V 3.23 3.3 3.37 V Current Limit IQ VQ = 90% of VQnom 250 400 500 mA Quiescent Current (Iq = II – IQ) Iq INH ON, IQ < 100 mA, TJ = 25°C − 65 90 mA Quiescent Current (Iq = II – IQ) Iq INH ON, IQ < 100 mA, TJ ≤ 125°C − 65 95 mA Quiescent Current (Iq = II – IQ) Iq INH ON, IQ = 10 mA − 170 500 mA Quiescent Current (Iq = II – IQ) Iq INH ON, IQ = 50 mA − 0.7 2.0 mA Quiescent Current (Iq = II – IQ) Iq INH = 0 V, TJ = 25°C − − 1.0 mA IQ = 100 mA − 0.22 0.50 V Dropout Voltage (Note 7) Vdr Load Regulation DVQ IQ = 1.0 mA to 100 mA − 5.0 30 mV Line Regulation DVQ VI = 6.0 V to 28 V, IQ = 1.0 mA − 10 25 mV ƒr = 100 Hz, Vr = 1.0 Vpp, IQ = 100 mA − 66 − dB VQ < 0.1 V − − 0.8 V VQ > 4.9 V VQ > 3.23 V 3.5 3.5 − − − − − − 3.0 0.5 10 2.0 4.50 2.96 4.64 3.04 4.80 3.16 10 20 40 − − 0.17 0.17 0.40 0.40 5.6 − − kW Power Supply Ripple Rejection PSRR Inhibit (INH) Inhibit Off Voltage VINHOFF Inhibit On Voltage 5.0 V Version 3.3 V Version VINHON Input Current IINHON IINHOFF INH = 5 V INH = 0 V V mA Reset (RO) Switching Threshold 5.0 V Version 3.3 V Version VRT − Output Resistance RRO − Reset Output Low Voltage 5.0 V Version 3.3 V Version VRO Allowable External Reset Pullup Resistor VROext VQ = 4.5 V, Internal RRO, IRO = −1.0 mA VQ = 2.96 V, Internal RRO, IRO = −1.0 mA External Resistor to Q V kW V Delay Upper Threshold VUD − 1.5 1.85 2.2 V Delay Lower Threshold VLD − 0.4 0.5 0.6 V Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 7. Only for 5 V version. Measured when the output voltage VQ has dropped 100 mV from the nominal value obtained at VI = 13.5 V. http://onsemi.com 4 NCV4299A ELECTRICAL CHARACTERISTICS (continued) (−40°C < TJ < 150°C; VI = 13.5 V unless otherwise noted.) Characteristic Symbol Test Conditions Min Typ Max − − − 0.017 0.1 0.1 Unit Reset (RO) VD,sat Delay Output Low Voltage 5.0 V Version 3.3 V Version VQ = 4.5 V, Internal RRO VQ = 2.96 V, Internal RRO V Delay Charge Current ID VD = 1.0 V 4.0 7.1 12 mA Power On Reset Delay Time td CD = 100 nF 17 28 35 ms tRR CD = 100 nF 0.5 2.2 4.0 ms VQ = 3.5 V VQ = 2.3 V 1.26 1.26 1.36 1.36 1.44 1.44 Reset Reaction Time Reset Adjust Switching Threshold 5.0 V Version 3.3 V Version VRADJ,TH V Input Voltage Sense (SI and SO) Sense Input Threshold High VSI,High − 1.34 1.45 1.54 V Sense Input Threshold Low VSI,Low − 1.26 1.36 1.44 V 50 90 130 mV −1.0 0.1 1.0 mA 10 20 40 kW − 0.1 0.4 V 5.6 − − kW Sense Input Hysteresis − (Sense Threshold High) − (Sense Threshold Low) Sense Input Current ISI VSI = 1.2 V Sense Output Resistance RSO Sense Output Low Voltage VSO − VSI = 1.2 V, VI = 5.5 V, ISO = 0 mA Allowable External Sense Out Pullup Resistor RSOext − SI High to SO High Reaction Time tPSOLH RSOext = 5.6 kW − 1.3 8.0 ms SI Low to SO Low Reaction Time tPSOHL RSOext = 5.6 kW − 3.8 5.0 ms Min Typ Max Unit 150 − 200 °C THERMAL SHUTDOWN Characteristic Symbol Thermal Shutdown Temperature Test Conditions TSD Iout = 100 mA Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. II IQ VI IINH Q INH NCV4299A VINH I D CD 100 nF VRADJ VSI IRADJ ISI ID RADJ SI RO VRO SO VSO GND Iq Figure 2. Measurement Circuit http://onsemi.com 5 VQ NCV4299A TYPICAL PERFORMANCE CHARACTERISTICS − 5.0 V OPTION 6 VI = 13.5 V IQ = 100 mA VQ, OUTPUT VOLTAGE (V) VQ, OUTPUT VOLTAGE (V) 5.1 5.0 4.9 −40 −20 5 4 3 2 1 0 0 0 20 40 60 80 100 120 140 160 TJ, JUNCTION TEMPERATURE (°C) 500 Vdr, DROP VOLTAGE (mV) ID, CHARGE CURRENT (mA) 7.0 6.8 6.6 6.4 6.2 6.0 −40 −20 TJ = 25°C 300 TJ = −40°C 200 100 0 VRADJ,TH, RESET ADJUST SWITCHING THRESHOLD (V) VUD, VLD, SWITCHING VOLTAGE (V) 100 50 IQ, OUTPUT CURRENT (mA) 150 Figure 6. Drop Voltage vs. Output Current VI = 13.5 V 2.4 2.0 1.6 1.2 0.8 0.4 80 0 40 120 TJ, JUNCTION TEMPERATURE (°C) 14 12 400 0 0 20 40 60 80 100 120 140 160 TJ, JUNCTION TEMPERATURE (°C) 3.2 0.0 −40 10 4 6 8 VI, INPUT VOLTAGE (V) TJ = 150°C Figure 5. Charge Current vs. Junction Temperature 2.8 2 Figure 4. Output Voltage vs. Input Voltage Figure 3. Output Voltage vs. Junction Temperature VI = 13.5 V VD = 1 V IQ = 100 mA IQ = 100 mA TJ = 25°C 160 Figure 7. Switching Voltage vs. Junction Temperature 1.5 VI = 13.5 V 1.4 1.3 1.2 1.1 1.0 0.9 −40 0 40 120 80 TJ, JUNCTION TEMPERATURE (°C) 160 Figure 8. Reset Adjust Switching Threshold vs. Junction Temperature http://onsemi.com 6 NCV4299A 400 1.5 IQ, OUTPUT CURRENT (mA) VSI, SENSE THRESHOLD (V) 1.6 VSI,High 1.4 VSI,Low 1.3 1.2 1.1 1.0 −40 40 120 0 80 TJ, JUNCTION TEMPERATURE (°C) 350 TJ = 125°C 250 200 150 100 50 0 160 TJ = 25°C 300 VQ = 0 V 0 40 8.0 1000 VI = 13.5 V IQ = 100 mA Iq, CURRENT CONSUMPTION (mA) Iq, CURRENT CONSUMPTION (mA) 20 30 VI, INPUT VOLTAGE (V) Figure 10. Output Current Limit vs. Input Voltage Figure 9. Sense Threshold vs. Junction Temperature 100 10 1 −40 −20 0 20 40 60 80 6.0 5.0 4.0 3.0 2.0 1.0 0.0 100 120 140 160 VI = 13.5 V TJ = 25°C 7.0 0 TJ, JUNCTION TEMPERATURE (°C) Figure 11. Current Consumption vs. Junction Temperature 40 80 120 IQ, OUTPUT CURRENT (mA) 160 Figure 12. Current Consumption vs. Output Current 16 Iq, CURRENT CONSUMPTION (mA) 40 RRO, RSO, RESISTANCE (kW) 10 30 20 10 −40 0 40 80 120 12 10 IQ = 25 mA 8 6 IQ = 150 mA IQ = 50 mA IQ = 100 mA 4 2 0 160 TJ = 25°C 14 0 10 20 30 VI, INPUT VOLTAGE (V) TJ, JUNCTION TEMPERATURE (°C) Figure 13. RRO, RSO Resistance vs. Junction Temperature Figure 14. Current Consumption vs. Input Voltage http://onsemi.com 7 40 Iq, CURRENT CONSUMPTION (mA) 75 TJ = 25°C 70 IQ = 100 mA 65 60 55 6 8 10 12 14 16 18 20 VI, INPUT VOLTAGE (V) 22 24 6 TJ = 25°C 5 4 2 IQ = 50 mA 1 0 26 IQ = 100 mA 3 IQ = 10 mA 6 8 10 14 16 18 20 12 VI, INPUT VOLTAGE (V) 100 VI = 13.5 V TJ = 25°C Unstable Region 10 1 mF to 100 mF 1 0.1 0.01 Stable Region 0 20 40 22 24 Figure 16. Current Consumption vs. Input Voltage Figure 15. Current Consumption vs. Input Voltage OUTPUT CAPACITOR ESR (W) Iq, CURRENT CONSUMPTION (mA) NCV4299A 80 60 100 120 140 IQ, OUTPUT CURRENT (mA) Figure 17. Output Stability vs. Output Capacitor ESR http://onsemi.com 8 160 26 NCV4299A TYPICAL PERFORMANCE CHARACTERISTICS − 3.3 V OPTION 100 10 1 −40 −20 Iq, CURRENT CONSUMPTION (mA) Iq, CURRENT CONSUMPTION (mA) 8 VI = 13.5 V IQ = 100 mA 0 20 40 60 TJ = 25°C 5 4 TJ = −40°C 3 2 1 0 0 20 40 60 80 100 120 140 160 Figure 18. Current Consumption vs. Junction Temperature Figure 19. Current Consumption vs. Output Current 3.40 TJ = 25°C 8 7 6 5 4 IQ = 150 mA IQ = 25 mA IQ = 100 mA 3 IQ = 50 mA 0 10 20 30 VI = 13.5 V IQ = 100 mA 3.35 3.30 3.25 3.20 −40 −20 40 0 20 40 60 80 100 120 140 160 VI, INPUT VOLTAGE (V) TJ, JUNCTION TEMPERATURE (°C) Figure 20. Current Consumption vs. Input Voltage Figure 21. Output Voltage vs. Junction Temperature 400 6 TJ = 25°C IQ, OUTPUT CURRENT (mA) Iq, CURRENT CONSUMPTION (mA) TJ = 150°C 6 IQ, OUTPUT CURRENT (mA) 10 9 5 4 IQ = 100 mA 3 2 IQ = 50 mA 1 0 VI = 13.5 V TJ, JUNCTION TEMPERATURE (°C) 12 11 2 1 0 7 100 120 140 160 80 VQ, OUTPUT VOLTAGE (V) Iq, CURRENT CONSUMPTION (mA) 1000 IQ = 10 mA 6 8 10 12 14 16 18 20 22 24 350 300 TJ = 25°C 250 TJ = 125°C 200 150 100 0 26 VQ = 0 V 50 0 10 20 30 VI, INPUT VOLTAGE (V) VI, INPUT VOLTAGE (V) Figure 22. Current Consumption vs. Input Voltage Figure 23. Output Current vs. Input Voltage http://onsemi.com 9 40 NCV4299A TYPICAL PERFORMANCE CHARACTERISTICS − 3.3 V OPTION 75 3 2 1 0 2 4 6 8 10 12 70 IQ = 100 mA 65 60 6 8 10 12 14 16 18 20 22 26 24 VI, INPUT VOLTAGE (V) VI, INPUT VOLTAGE (V) Figure 24. Output Voltage vs. Input Voltage Figure 25. Current Consumption vs. Input Voltage 3.20 1.6 VI = 13.5 V 3.15 3.10 3.05 3.00 2.95 2.90 −40 −20 0 20 40 60 80 100 120 140 160 1.5 VSI,High 1.4 VSI,Low 1.3 1.2 VI = 13.5 V IQ = 100 mA 1.1 1.0 −40 0 40 80 120 TJ, JUNCTION TEMPERATURE (°C) TJ, JUNCTION TEMPERATURE (°C) Figure 26. Reset Trigger Threshold vs. Junction Temperature Figure 27. Sense Threshold vs. Junction Temperature 3.2 160 1.5 2.8 VI = 13.5 V 2.4 2.0 1.6 1.2 0.8 0.4 0 −40 TJ = 25°C 55 14 VSI, SENSE THRESHOLD (V) VRT, RESET TRIGGER THRESHOLD (V) Iq, CURRENT CONSUMPTION (mA) 4 0 VUD, VLD, SWITCHING VOLTAGE (V) IQ = 100 mA TJ = 25°C 5 0 40 80 120 VRADJ,TH, RESET ADJUST SWITCHING THRESHOLD (V) VQ, OUTPUT VOLTAGE (V) 6 160 VI = 13.5 V 1.4 1.3 1.2 1.1 1.0 0.9 −40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (°C) TJ, JUNCTION TEMPERATURE (°C) Figure 28. Switching Voltage vs. Junction Temperature Figure 29. Reset Adjust Switching Threshold vs. Junction Temperature http://onsemi.com 10 NCV4299A TYPICAL PERFORMANCE CHARACTERISTICS − 3.3 V OPTION ID, CHARGE CURRENT (mA) 7.0 30 20 10 −40 0 40 80 120 160 VI = 13.5 V VD = 1 V IQ = 100 mA 6.8 6.6 6.4 6.2 6.0 −40 −20 0 20 40 60 80 100 120 140 160 TJ, JUNCTION TEMPERATURE (°C) TJ, JUNCTION TEMPERATURE (°C) Figure 30. Resistance vs. Junction Temperature Figure 31. Charge Current vs. Junction Temperature 100 OUTPUT CAPACITOR ESR (W) RRO, RSO, RESISTANCE (kW) 40 VI = 13.5 V TJ = 25°C Unstable Region 10 1 1 mF to 100 mF 0.1 0.01 Stable Region 0 20 40 60 80 100 120 140 IQ, OUTPUT CURRENT (mA) Figure 32. Output Capacitor ESR vs. Output Current http://onsemi.com 11 160 NCV4299A APPLICATION DESCRIPTION NCV4299A Other features of the regulator include an undervoltage reset function and a sense circuit. The reset function has an adjustable time delay and an adjustable threshold level. The sense circuit trip level is adjustable and can be used as an early warning signal to the controller. An inhibit function that turns off the regulator and reduces the current consumption to less than 1.0 mA is a feature available in the 14 pin package. The NCV4299A is a family of precision micropower voltage regulators with an output current capability of 150 mA at 5.0 V and 3.3 V. The output voltage is accurate within "2% with a maximum dropout voltage of 0.5 V at 100 mA. Low quiescent current is a feature drawing only 65 mA with a 100 mA load. This part is ideal for any and all battery operated microprocessor equipment. Microprocessor control logic includes an active reset output RO (with delay), and a SI/SO monitor which can be used to provide an early warning signal to the microprocessor of a potential impending reset signal. The use of the SI/SO monitor allows the microprocessor to finish any signal processing before the reset shuts the microprocessor down. Internal output resistors on the RO and SO pins pulling up to the output pin Q reduce external component count. An inhibit function is available on the 14−lead part. With inhibit active, the regulator turns off and the device consumes less that 1.0 mA of quiescent current. The active reset circuit operates correctly at an output voltage as low as 1.0 V. The reset function is activated during the powerup sequence or during normal operation if the output voltage drops outside the regulation limits. The reset threshold voltage can be decreased by the connection of an external resistor divider to the RADJ lead. The regulator is protected against reverse battery, short circuit, and thermal overload conditions. The device can withstand load dump transients making it suitable for use in automotive environments. Output Regulator The output is controlled by a precision trimmed reference. The PNP output has saturation control for regulation while the input voltage is low, preventing oversaturation. Current limit and voltage monitors complement the regulator design to give safe operating signals to the processor and control circuits. Stability Considerations The input capacitor CI is necessary for compensating input line reactance. Possible oscillations caused by input inductance and input capacitance can be damped by using a resistor of approximately 1.0 W in series with CI. The output or compensation capacitor helps determine three main characteristics of a linear regulator: startup delay, load transient response and loop stability. The capacitor value and type should be based on cost, availability, size and temperature constraints. A tantalum or aluminum electrolytic capacitor is best, since a film or ceramic capacitor with almost zero ESR can cause instability. The aluminum electrolytic capacitor is the least expensive solution, but, if the circuit operates at low temperatures (−25°C to −40°C), both the value and ESR of the capacitor will vary considerably. The capacitor manufacturer’s data sheet usually provides this information. The value for the output capacitor CQ shown in Figure 33 should work for most applications, however, it is not necessarily the optimized solution. Stability is guaranteed at values CQ ≥ 22 mF and an ESR ≤ 8.0 W within the operating temperature range. Actual limits are shown in a graph in the typical performance characteristics section. NCV4299A Circuit Description The low dropout regulator in the NCV4299A uses a PNP pass transistor to give the lowest possible dropout voltage capability. The current is internally monitored to prevent oversaturation of the device and to limit current during over current conditions. Additional circuitry is provided to protect the device during overtemperature operation. The regulator provides an output regulated to 2%. http://onsemi.com 12 NCV4299A I CI* Q RRADJ1 0.1 mF SI RS12 INH RINH*** 51kW CINH*** 0.01 mF RRADJ2 NCV4299A CD CQ** 22 mF RADJ D RS11 VDD Microprocessor VBAT INH SO GND I/O RO I/O *CI required if regulator is located far from the power supply filter. **CQ required for stability. Cap must operate at minimum temperature expected. ***This RC filter is only required when transients with slew rate in excess of 10 V/ms may be present on the INH voltage source during operation. The filter is not required when INH is connected to a noise−free DC voltage. Figure 33. Test and Application Circuit Showing all Compensation and Sense Elements http://onsemi.com 13 NCV4299A Reset Output (RO) threshold voltage VRT. When the voltage of the delay timer (VD) drops below the lower threshold voltage VLD, the reset output voltage VRO is brought low to reset the processor. The reset output RO is an open collector NPN transistor, controlled by a low voltage detection circuit. The circuit is functionally independent of the rest of the IC, thereby guaranteeing that RO is valid for VQ as low as 1.0 V. A reset signal, Reset Output (RO, low voltage) is generated as the IC powers up. After the output voltage VQ increases above the reset threshold voltage VRT, the delay timer D is started. When the voltage on the delay timer VD passes VUD, the reset signal RO goes high. D pin voltage in steady state is typically 2.4 V. A discharge of the delay timer (VD) is started when VQ drops and stays below the reset VI t < tRR VQ VRT t dV I + D dt CD VD VUD VLD td t tRR VRO VRO,SAT Power−on−Reset t Thermal Shutdown Voltage Dip at Input Undervoltage Secondary Spike Overload at Output Figure 34. Reset Timing Diagram Reset Adjust (RADJ) Reset Delay (D) The reset threshold VRT can be decreased from a typical value of 4.64 V to as low as 3.5 V by using an external voltage divider connected from the Q lead to the pin RADJ, as shown in Figure 33. The resistor divider keeps the voltage above the VRADJ,TH, (typ. 1.36 V), for the desired input voltages and overrides the internal threshold detector. Adjust the voltage divider according to the following relationship: The reset delay circuit provides a delay (programmable by capacitor CD) on the reset output RO lead. The delay lead D provides charge current ID (typically 7.1 mA) to the external delay capacitor CD during the following times: 1. During Powerup (once the regulation threshold has been exceeded). 2. After a reset event has occurred and the device is back in regulation. The delay capacitor is set to discharge when the regulation (VRT, reset threshold voltage) has been violated. When the delay capacitor discharges to down to VLD, the reset signal RO pulls low. VTHRES + VRADJ, TH · (RADJ1 ) RADJ2)ńRADJ2 (eq. 1) If the reset adjust option is not needed, the RADJ−pin should be connected to GND causing the reset threshold to go to its default value (typ. 4.64 V). http://onsemi.com 14 NCV4299A VQ Setting the Delay Time The delay time is set by the delay capacitor CD and the charge current ID. The time is measured by the delay capacitor voltage charging from the low level of VD,sat to the higher level VUD. The time delay follows the equation: td + [CD (VUD−VD, sat)]ńID VSI VSI,Low (eq. 2) VRO Example: Using CD = 100 nF. Use the typical value for VD,sat = 0.1 V. Use the typical value for VUD = 1.85 V. Use the typical value for Delay Charge Current ID = 7.1 mA. td + [100 nF(1.85−0.1 V)]ń7.1 mA + 24.6 ms VSO TWARNING (eq. 3) When the output voltage VQ drops below the reset threshold voltage VRT, the voltage on the delay capacitor VD starts to drop. The time it takes to drop below the lower threshold voltage of VLD is the reset reaction time, tRR. This time is typically 2.2 ms for a delay capacitor of 0.1 mF. The reset reaction time can be estimated from the following relationship: tRR + 22 nsńnF CD Figure 35. SO Warning Timing Waveform Sense Input Voltage VSI,High (eq. 4) VSI,Low Sense Input (SI)/Sense Output (SO) Voltage Monitor An on−chip comparator is available to provide early warning to the microprocessor of a possible reset signal. The reset signal typically turns the microprocessor off instantaneously. This can cause unpredictable results with the microprocessor. The signal received from the SO pin will allow the microprocessor time to complete its present task before shutting down. This function is performed by a comparator referenced to the band gap voltage. The actual trip point can be programmed externally using a resistor divider to the input monitor (SI) (Figure 33). The typical threshold is 1.35 V on the SI Pin. Sense Output t tPSOLH tPSOHL High Low t Figure 36. Sense Timing Diagram Signal Output Calculating Power Dissipation in a Single Output Linear Regulator Figure 35 shows the SO Monitor waveforms as a result of the circuits depicted in Figure 33. As the output voltage VQ falls, the monitor threshold VSI,Low is crossed. This causes the voltage on the SO output to go low sending a warning signal to the microprocessor that a reset signal may occur in a short period of time. TWARNING is the time the microprocessor has to complete the function it is currently working on and get ready for the reset shutdown signal. When the voltage on the SO goes low and the RO stays high the current consumption is typically 350 mA. The maximum power dissipation for a single output regulator is: PD(max) + [VI(max)−VQ(min)] IQ(max) ) VI(max)Iq (eq. 5) where: VI(max) is the maximum input voltage, VQ(min) is the minimum output voltage, IQ(max) is the maximum output current for the application, and Iq is the quiescent current the regulator consumes at IQ(max). Once the value of PD(max) is known, the maximum permissible value of RqJA can be calculated: RqJA + (150° C−TA)ńPD http://onsemi.com 15 (eq. 6) NCV4299A Heatsinks The value of RqJA can then be compared with those in the package section of the data sheet. Those packages with RqJA’s less than the calculated value in Equation 6 will keep the die temperature below 150°C. In some cases, none of the packages will be sufficient to dissipate the heat generated by the IC, and an external heatsink will be required. Thermal Resistance RqJA vs. Copper Area is shown in Figure 37. A heatsink effectively increases the surface area of the package to improve the flow of heat away from the IC and into the surrounding air. Each material in the heat flow path between the IC and the outside environment will have a thermal resistance. Like series electrical resistances, these resistances are summed to determine the value of RqJA: THERMAL RESISTANCE, JUNCTION− TO−AMBIENT, RqJA, (°C/W) 140 RqJA + RqJC ) RqCS ) RqSA where: 120 1 oz SO−14 100 RqJC = the junction−to−case thermal resistance, RqCS = the case−to−heatsink thermal resistance, and RqSA = the heatsink−to−ambient thermal resistance. 2 oz SO−14 80 60 RqJC appears in the package section of the data sheet. Like RqJA, it too is a function of package type. RqCS and RqSA are functions of the package type, heatsink and the interface between them. These values appear in heatsink data sheets of heatsink manufacturers. Thermal, mounting, and heatsinking are discussed in the ON Semiconductor application note AN1040/D, available on the ON Semiconductor website. 2 oz TSSOP−14 EP 40 1 oz TSSOP−14 EP 20 0 (eq. 7) 0 100 200 300 400 500 600 COPPER HEAT SPREADER AREA (mm2) 700 Figure 37. Thermal Resistance RqJA vs. Copper Area http://onsemi.com 16 NCV4299A SOIC 14 LEAD 1000 Cu Area = 50 mm2, 1.0 oz R(t) (°C/W) 100 100 mm2, 1.0 oz 250 mm2, 1.0 oz 10 500 mm2, 1.0 oz 1 0.1 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 100 1000 Time (sec) Figure 38. Transient Thermal Response Simulation to a Single Pulse 1 oz (Log−Log) R(t) (°C/W) 1000 100 50% Duty Cycle 20% 10% 10 5% 2% 1 1% 0.1 Single Pulse (SOIC−14) 0.01 0.001 Psi LA (SOIC−14) 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 Pulse Time (sec) Figure 39. Transient Thermal Response Simulation to a Single Pulse with Duty Cycles Applied (Log−Log) (PCB = 50 mm2 1 oz) R(t) (°C/W) 100 50% Duty Cycle 20% 10 10% 5% 2% 1 1% 0.1 Single Pulse (SOIC−14) 0.01 0.001 Psi LA (SOIC−14) 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 Pulse Time (sec) Figure 40. Transient Thermal Response Simulation to a Single Pulse with Duty Cycles Applied (Log−Log) (PCB = 250 mm2 1 oz) http://onsemi.com 17 1000 NCV4299A TSSOP 14 LEAD R(t) (°C/W) 1000 100 50% Duty Cycle 20% 10% 10 5% 2% 1 1% 0.1 Single Pulse (TSSOP−14 EP) 0.01 0.001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 Pulse Time (sec) Figure 41. Transient Thermal Response Simulation to a Single Pulse with Duty Cycles Applied (Log−Log) (PCB = 50 mm2 1 oz) R(t) (°C/W) 100 50% Duty Cycle 20% 10 10% 5% 2% 1 1% 0.1 Single Pulse (TSSOP−14 EP) 0.01 0.001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 Pulse Time (sec) Figure 42. Transient Thermal Response Simulation to a Single Pulse with Duty Cycles Applied (Log−Log) (PCB = 250 mm2 1 oz) ORDERING INFORMATION Package Shipping† NCV4299AD233R2G SO−14 (Pb−Free) 2500 / Tape & Reel NCV4299AD250R2G SO−14 (Pb−Free) 2500 / Tape & Reel NCV4299APA50R2G TSSOP−14 EP (Pb−Free) 2500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 18 NCV4299A PACKAGE DIMENSIONS TSSOP−14 EP CASE 948AW ISSUE B B NOTE 6 14 b 8 ÉÉ ÇÇÇ ÇÇÇ ÉÉ b1 E1 c1 E NOTE 5 SECTION B−B c PIN 1 REFERENCE 1 7 e 2X 14 TIPS TOP VIEW NOTE 6 A 0.05 C 0.10 C 14X D A2 NOTE 4 A S A S DETAIL A B 14X b 0.10 C B NOTE 8 0.20 C B A C M SEATING PLANE c B NOTE 3 END VIEW SIDE VIEW D2 H E2 L2 A1 L NOTE 7 GAUGE PLANE C DETAIL A BOTTOM VIEW RECOMMENDED SOLDERING FOOTPRINT* 3.40 NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE PROTRUSION SHALL BE 0.07 mm MAX. AT MAXIMUM MATERIAL CONDITION. DAMBAR CANNOT BE LOCATED ON THE LOWER RADIUS OF THE FOOT. MINIMUM SPACE BETWEEN PROTRUSION AND ADJACENT LEAD IS 0.07. 4. DIMENSION D DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH, PROTRUSIONS OR GATE BURRS SHALL NOT EXCEED 0.15 mm PER SIDE. DIMENSION D IS DETERMINED AT DATUM H. 5. DIMENSION E1 DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSIONS. INTERLEAD FLASH OR PROTRUSIONS SHALL NOT EXCEED 0.25 mm PER SIDE. DIMENSION E1 IS DETERMINED AT DATUM H. 6. DATUMS A AND B ARE DETERMINED AT DATUM H. 7. A1 IS DEFINED AS THE VERTICAL DISTANCE FROM THE SEATING PLANE TO THE LOWEST POINT ON THE PACKAGE BODY. 8. SECTION B−B TO BE DETERMINED AT 0.10 TO 0.25 mm FROM THE LEAD TIP. DIM A A1 A2 b b1 c c1 D D2 E E1 E2 e L L2 M MILLIMETERS MIN MAX −−−− 1.20 0.05 0.15 0.80 1.05 0.19 0.30 0.19 0.25 0.09 0.20 0.09 0.16 4.90 5.10 3.09 3.35 6.40 BSC 4.30 4.50 2.49 3.00 0.65 BSC 0.45 0.75 0.25 BSC 0_ 8_ 14X 1.15 3.06 6.70 1 0.65 PITCH 14X 0.42 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 19 NCV4299A PACKAGE DIMENSIONS SOIC−14 CASE 751A−03 ISSUE H NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. −A− 14 8 −B− P 7 PL 0.25 (0.010) B M 7 1 G −T− D 14 PL 0.25 (0.010) T B S A DIM A B C D F G J K M P R J M K M F R X 45 _ C SEATING PLANE M S SOLDERING FOOTPRINT MILLIMETERS MIN MAX 8.55 8.75 3.80 4.00 1.35 1.75 0.35 0.49 0.40 1.25 1.27 BSC 0.19 0.25 0.10 0.25 0_ 7_ 5.80 6.20 0.25 0.50 INCHES MIN MAX 0.337 0.344 0.150 0.157 0.054 0.068 0.014 0.019 0.016 0.049 0.050 BSC 0.008 0.009 0.004 0.009 0_ 7_ 0.228 0.244 0.010 0.019 7X 7.04 14X 1.52 1 14X 0.58 1.27 PITCH DIMENSIONS: MILLIMETERS ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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