NTR5198NL Power MOSFET 60 V, 155 mW, Single N−Channel Logic Level, SOT−23 Features • Small Footprint Industry Standard Surface Mount SOT−23 Package • Low RDS(on) for Low Conduction Losses and Improved Efficiency • These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS http://onsemi.com V(BR)DSS RDS(on) TYP Compliant 155 mW @ 10 V 60 V Symbol Value Unit Drain−to−Source Voltage VDSS 60 V N−Channel Gate−to−Source Voltage VGS ±20 V D ID 2.2 A Continuous Drain Current RYJ−mb (Notes 1, 2, 3, and 4) Steady State TA = 100°C Power Dissipation RYJ−mb (Notes 1 and 3) Continuous Drain Current RqJA (Note 1, 2, 3, and 4) TA = 25°C TA = 25°C 1.6 PD TA = 100°C Steady State Power Dissipation RqJA (Notes 1 and 3) Pulsed Drain Current TA = 25°C ID W A 1.7 PD 0.9 S W 3 0.4 IDM 27 A TJ, Tstg −55 to 150 °C Source Current (Body Diode) IS 1.9 A Lead Temperature for Soldering Purposes (1/8” from case for 10 s) TL 260 °C Operating Junction and Storage Temperature G 1.2 TA = 100°C TA = 25°C, tp = 10 ms 1.5 0.6 TA = 100°C TA = 25°C 2.2 A 205 mW @ 4.5 V MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Parameter ID MAX MARKING DIAGRAM/ PIN ASSIGNMENT Drain 3 1 2 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. The entire application environment impacts the thermal resistance values shown, they are not constants and are only valid for the particular conditions noted. 2. Psi (Y) is used as required per JESD51−12 for packages in which substantially less than 100% of the heat flows to single case surface. 3. Surface−mounted on FR4 board using a 650 mm2, 2 oz. Cu pad. 4. Maximum current for pulses as long as 1 second is higher but is dependent on pulse duration and duty cycle. SOT−23 CASE 318 STYLE 21 AA6 M G AA6 M G G 1 Gate 2 Source = Device Code = Date Code* = Pb−Free Package (Note: Microdot may be in either location) *Date Code orientation may vary depending upon manufacturing location. ORDERING INFORMATION Package Shipping† NTR5198NLT1G SOT−23 (Pb−Free) 3000 / Tape & Reel NTR5198NLT3G SOT−23 (Pb−Free) 10000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. © Semiconductor Components Industries, LLC, 2014 August, 2014 − Rev. 1 1 Publication Order Number: NTR5198NL/D NTR5198NL THERMAL RESISTANCE RATINGS Symbol Max Unit Junction−to−Lead #3 − Drain (Notes 2 and 3) Parameter RYJ−mb 86 °C/W Junction−to−Ambient − Steady State (Note 3) RqJA 139 °C/W ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Parameter Symbol Test Conditions Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 60 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/TJ Reference to 25°C, ID = 250 mA Typ Max Unit OFF CHARACTERISTICS Zero Gate Voltage Drain Current Gate−to−Source Leakage Current IDSS IGSS VGS = 0 V, VDS = 60 V V 70 mV/°C TJ = 25°C 1.0 TJ = 125°C 10 VDS = 0 V, VGS = "20 V "100 mA nA ON CHARACTERISTICS (Note 5) Gate Threshold Voltage Threshold Temperature Coefficient Drain−to−Source On−Resistance VGS(TH) VGS = VDS, ID = 250 mA VGS(TH)/TJ Reference to 25°C, ID = 250 mA −6.5 RDS(on) VGS = 10 V, ID = 1 A 107 155 VGS = 4.5 V, ID = 1 A 142 205 VDS = 5.0 V, ID = 1 A 3 S 182 pF Forward Transconductance gFS 1.5 2.5 V mV/°C mW CHARGES, CAPACITANCES & GATE RESISTANCE Input Capacitance Ciss Output Capacitance Coss Reverse Transfer Capacitance Crss Total Gate Charge QG(TOT) VGS = 0 V, f = 1.0 MHz, VDS = 25 V 25 16 VDS = 48 V, ID = 1 A VGS = 4.5 V 2.8 VGS = 10 V 5.1 nC Threshold Gate Charge QG(TH) 0.3 Gate−to−Source Charge QGS Gate−to−Drain Charge QGD Plateau Voltage VGP 3.1 V Gate Resistance RG 8 W td(on) 5 ns VDS = 48 V, ID = 1 A VGS = 10 V 0.8 1.5 SWITCHING CHARACTERISTICS (Note 6) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time tr td(off) VDS = 30 V, VGS = 10 V, ID = 1 A, RG = 10 W tf 7 13 2 DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage VSD Reverse Recovery Time trr Charge Time ta Discharge Time tb Reverse Recovery Stored Charge VGS = 0 V, IS = 1 A TJ = 25°C 0.8 TJ = 125°C 0.6 12 IS = 1 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms QRR http://onsemi.com 2 V ns 9 3 6 5. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%. 6. Switching characteristics are independent of operating junction temperatures. 1.2 nC NTR5198NL VGS = 10 V VGS = 5.0 V VGS = 4.5 V VGS = 3.0 V VGS = 3.6 V VGS = 3.4 V VGS = 3.2 V 1 2 3 4 5 TJ = 25°C TJ = 150°C TJ = −55°C 2 1 3 5 4 Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics 0.45 ID = 1 A TJ = 25°C 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0.05 5 4 6 7 8 9 10 VGS, GATE VOLTAGE (V) 0.50 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) VGS = 4.5 V 0.40 0.35 0.30 0.25 VGS = 10 V 0.20 0.15 0.10 0.05 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 ID, DRAIN CURRENT (A) Figure 4. On−Resistance vs. Drain Current and Gate Voltage ID = 1 A VGS = 10 V −25 TJ = 25°C 0.45 Figure 3. On−Resistance vs. Gate−to−Source Voltage 2.0 1.9 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 −50 VDS = 5 V VGS, GATE−TO−SOURCE VOLTAGE (V) 0.50 3 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 VDS, DRAIN−TO−SOURCE VOLTAGE (V) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VGS = 4.0 V VGS = 3.8 V 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (Normalized) VGS = 6.0 V ID, DRAIN CURRENT (A) 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 150 BVDSS, NORMALIZED BREAKDOWN VOLTAGE ID, DRAIN CURRENT (A) TYPICAL CHARACTERISTICS 1.150 1.125 ID = 250 mA 1.100 1.075 1.050 1.025 1.000 0.975 0.950 0.925 0.900 −50 Figure 5. On−Resistance Variation with Temperature −25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) Figure 6. Breakdown Voltage Variation with Temperature http://onsemi.com 3 150 NTR5198NL 1.20 1.15 10,000 ID = 250 mA TJ = 150°C 1.10 1.05 IDSS, LEAKAGE (nA) 1.00 0.95 0.90 0.85 0.80 0.75 0.65 0.60 −50 100 TJ = 85°C 10 1 0 −25 25 50 75 100 125 150 10 15 20 25 30 35 40 45 50 55 60 Figure 7. Threshold Voltage Variation with Temperature Figure 8. Drain−to−Source Leakage Current vs. Voltage VGS, GATE−TO−SOURCE VOLTAGE (V) 12 11 10 9 TJ = 25°C f = 1 MHz VGS = 0 V CISS 175 150 125 100 75 COSS 50 5 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 225 200 0 TJ, JUNCTION TEMPERATURE (°C) 250 25 CRSS 0 0 5 10 15 20 25 30 35 40 45 50 55 60 55 50 45 QT 8 7 VDS 40 35 VGS 30 6 5 4 3 2 QGS 1 0 60 0 QGD VDS = 48 V ID = 1 A TJ = 25°C 25 20 15 10 5 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 VDS, DRAIN−TO−SOURCE VOLTAGE (V) QG, TOTAL GATE CHARGE (nC) Figure 9. Capacitance Variation Figure 10. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge 100 10 10 VDD = 30 V ID = 1 A VGS = 10 V IS, SOURCE CURRENT (A) td(off) t, TIME (ns) TJ = 125°C 0.70 275 C, CAPACITANCE (pF) 1000 tr td(on) tf 1 TJ = 150°C TJ = 125°C TJ = 100°C TJ = 85°C 1 TJ = 25°C TJ = −55°C 0.1 0.1 1 10 0.4 100 0.5 0.6 0.7 0.8 0.9 1.0 1.1 RG, GATE RESISTANCE (W) VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 11. Resistive Switching Time Variation vs. Gate Resistance Figure 12. Diode Forward Voltage vs. Current http://onsemi.com 4 VDS, DRAIN−TO−SOURCE VOLTAGE (V) VGS(th), NORMALIZED THRESHOLD VOLTAGE TYPICAL CHARACTERISTICS NTR5198NL TYPICAL CHARACTERISTICS ID, DRAIN CURRENT (A) 100 10 VGS ≤ 10 V Single Pulse TC = 25°C 100 mS 1 1 mS 10 mS 0.1 RDS(on) Limit Thermal Limit Package Limit 0.01 0.1 R(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (°C/W) 10 mS dc 1 10 100 VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 13. Maximum Rated Forward Biased Safe Operating Area 1000 100 50% Duty Cycle 20% 10% RqJA Steady State = 139°C/W 10 5% 2% 1% 1 0.000001 Single Pulse 0.00001 0.0001 0.001 0.01 0.1 1 t, TIME (sec) Figure 14. Thermal Impedance (Junction−to−Ambient) http://onsemi.com 5 10 100 1000 NTR5198NL PACKAGE DIMENSIONS SOT−23 (TO−236) CASE 318−08 ISSUE AP NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. 3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH THICKNESS. MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL. 4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. D SEE VIEW C 3 HE E DIM A A1 b c D E e L L1 HE q c 1 2 b 0.25 e q A L A1 MIN 0.89 0.01 0.37 0.09 2.80 1.20 1.78 0.10 0.35 2.10 0° MILLIMETERS NOM MAX 1.00 1.11 0.06 0.10 0.44 0.50 0.13 0.18 2.90 3.04 1.30 1.40 1.90 2.04 0.20 0.30 0.54 0.69 2.40 2.64 −−− 10 ° MIN 0.035 0.001 0.015 0.003 0.110 0.047 0.070 0.004 0.014 0.083 0° INCHES NOM 0.040 0.002 0.018 0.005 0.114 0.051 0.075 0.008 0.021 0.094 −−− MAX 0.044 0.004 0.020 0.007 0.120 0.055 0.081 0.012 0.029 0.104 10° STYLE 21: PIN 1. GATE 2. SOURCE 3. DRAIN L1 VIEW C SOLDERING FOOTPRINT* 0.95 0.037 0.95 0.037 2.0 0.079 0.9 0.035 SCALE 10:1 0.8 0.031 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: [email protected] N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 http://onsemi.com 6 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative NTR5198NL/D