R448 Reliability Data

RELIABILITY DATA
LTC1966
1/20/2009
• OPERATING LIFE TEST
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
SOIC/SOT/MSOP
SSOP/TSSOP
NEWEST
DATE CODE
231
0201
77
0318
308
• HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
0318
0318
NEWEST
DATE CODE
231.00
77.00
308.00
K DEVICE
(4)
HOURS
AT +85°C
0
• PRESSURE COOKER TEST AT 15 PSIG, +121°C
PACKAGE
TYPE
SAMPLE
SIZE
SOIC/SOT/MSOP
1,166
1,166
• TEMP CYCLE FROM -65°C to +150°C
PACKAGE
TYPE
SAMPLE
SIZE
NEWEST
DATE CODE
0221
0450
OLDEST
DATE CODE
NEWEST
DATE CODE
363
0221
420
0243
783
• THERMAL SHOCK FROM -65°C to +150°C
PACKAGE
TYPE
SOIC/SOT/MSOP
SSOP/TSSOP
SAMPLE
SIZE
OLDEST
DATE CODE
K DEVICE
HOURS
329.38
329.38
K DEVICE
CYCLES
0746
0524
NEWEST
DATE CODE
207.89
243.74
451.63
K DEVICE
CYCLES
350
0226
0824
254
0243
0524
604
(1) Assumes Activation Energy = 0.7 Electron Volts
(2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 38.43 FITS
(3) Mean Time Between Failures in Years = 2,968
(4) Assumes 20X Acceleration from 85°C to +131°C
Note: 1 FIT = 1 Failure in One Billion Hours.
Form: 00-03-6209B. R448
0
0
0
NUMBER
OF
FAILURES
0.00
OLDEST
DATE CODE
SOIC/SOT/MSOP
SSOP/TSSOP
NUMBER
OF (2)
FAILURES
K DEVICE
HOURS (1)
AT +125°C
223.40
209.90
433.30
0
NUMBER
OF
FAILURES
0
0
NUMBER
OF
FAILURES
0
0
0
NUMBER
OF
FAILURES
0
0
0
Rev 8