Standard Products UT54ACS163/UT54ACTS163 4-Bit Synchronous Counters Datasheet November 2010 www.aeroflex.com/logic PINOUTS FEATURES Internal look-ahead for fast counting Carry output for n-bit cascading Synchronous counting Synchronously programmable 1.2μ CMOS - Latchup immune High speed Low power consumption Single 5 volt supply Available QML Q or V processes Flexible package - 16-pin DIP - 16-lead flatpack UT54ACS163 - SMD 5962-96554 UT54ACTS163 - SMD 5962-96555 16-Pin DIP Top View 16 VDD 2 15 RCO 3 14 QA B C 4 5 13 12 QB D ENP 6 7 11 10 QD ENT VSS 8 9 CLR CLK A 1 QC LOAD 16-Lead Flatpack Top View DESCRIPTION The UT54ACS163 and the UT54ACTS163 are synchronous presettable 4-bit binary counters that feature internal carry lookahead logic for high-speed counting designs. Synchronous operation occurs by having all flip-flops clocked simultaneously so that the outputs change coincident with each other when instructed by the count-enable inputs and internal gating. A buffered clock input triggers the four flip-flops on the rising (positive-going) edge of the clock input waveform. The counters are fully programmable (i.e., they may be preset to any number between 0 and 15). Presetting is synchronous; applying a low level at the load input disables the counter and causes the outputs to agree with the load data after the next clock pulse. CLR 1 16 VDD CLK 2 15 RCO A 3 14 QA B 4 13 QB C 5 12 QC D 6 11 QD ENP VSS 7 8 10 9 ENT LOAD LOGIC SYMBOL (1) CLR (9) LOAD The clear function is synchronous and a low level at the clear input sets all four of the flip-flop outputs low after the next clock pulse. This synchronous clear allows the count length to be modified by decoding the Q outputs for the maximum count desired. ENT ENP CLK A The counters feature a fully independent clock circuit. Changes at control inputs (ENP, ENT, or LOAD) that modify the operating mode have no effect on the contents of the counter until clocking occurs. The function of the counter (whether enabled, disabled, loading, or counting) will be dictated solely by the conditions meeting the stable setup and hold times. B C D (10) (7) (2) (3) (4) (5) (6) CTRDIV 16 5CT=0 M1 M2 3CT = 15 G3 G4 (15) RCO C5/2,3,4+ 1,5D (1) (2) (4) (8) (14) (13) (12) (11) QA QB QC QD Note: 1. Logic symbol in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. The devices are characterized over full military temperature range of -55°C to +125°C. 1 FUNCTION TABLE Operating Mode CLR CLK ENP ENT LOAD DATA A,B,C,D QN RCO Reset (Clear) l ↑ X X X X L L Parallel Load h3 ↑ ↑ X X X X l l l h L H L h3 1 Count h3 ↑ h h h X Count 1 Inhibit h3 h3 X X l2 X X l2 h3 X X QN QN 1 h3 H = High voltage level h = High voltage level one setup time prior to the low-to-high clock transition L = Low voltage level l = Low voltage level one setup time prior to the low-to-high clock transition Notes: 1. The RCO output is high when ENT is high and the counter is at terminal count HHHH. 2. The high-to-low transition of ENP or ENT should only occur while CLK is high for conventional operations. 3. The low-to-high transition of LOAD or CLR should only occur while CLK is high for conventional operations. LOGIC DIAGRAM CLK CLR (2) (1) D (9) Q (14) QA C LOAD (7) ENP (10) ENT (3) DATA A Q D Q (13) QB C Q DATA B (4) D Q (12) QC C Q DATA C (5) D Q (11) Q D C DATA D (6) Q (15) 2 RCO L OPERATIONAL ENVIRONMENT1 PARAMETER LIMIT UNITS Total Dose 1.0E6 rads(Si) SEU Threshold 2 80 MeV-cm2/mg SEL Threshold 120 MeV-cm2/mg Neutron Fluence 1.0E14 n/cm2 Notes: 1. Logic will not latchup during radiation exposure within the limits defined in the table. 2. Device storage elements are immune to SEU affects. ABSOLUTE MAXIMUM RATINGS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage 0.3 to 7.0 V VI/O Voltage any pin -.3 to VDD +.3 V TSTG Storage Temperature range -65 to +150 °C TJ Maximum junction temperature +175 °C TLS Lead temperature (soldering 5 seconds) +300 °C ΘJC Thermal resistance junction to case 20 °C/W II DC input current ±10 mA PD Maximum power dissipation 1 W Note: 1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage 4.5 to 5.5 V VIN Input voltage any pin 0 to VDD V TC Temperature range -55 to + 125 °C 3 DC ELECTRICAL CHARACTERISTICS 7 (VDD = 5.0V ±10%; VSS = 0V 6, -55°C < TC < +125°C); Unless otherwise noted, Tc is per the temperature range ordered. SYMBOL VIL VIH IIN PARAMETER CONDITION MIN Low-level input voltage 1 ACTS ACS High-level input voltage 1 ACTS ACS MAX UNIT 0.8 .3VDD V .5VDD .7VDD V Input leakage current ACTS/ACS VIN = VDD or VSS Low-level output voltage 3 ACTS ACS IOL = 8.0mA IOL = 100μA High-level output voltage 3 ACTS ACS IOH = -8.0mA IOH = -100μA Short-circuit output current 2 ,4 ACTS/ACS VO = VDD and VSS -200 Output current10 VIN = VDD or VSS 8 mA (Sink) VOL = 0.4V Output current10 VIN = VDD or VSS -8 mA (Source) VOH = VDD - 0.4V Ptotal Power dissipation 2, 8, 9 CL = 50pF 1.9 mW/ MHz IDDQ Quiescent Supply Current VDD = 5.5V 10 μA Quiescent Supply Current Delta For input under test 1.6 mA VOL VOH IOS IOL IOH ΔIDDQ ACTS -1 1 μA 0.40 0.25 V .7VDD VDD - 0.25 V 200 mA VIN = VDD - 2.1V For all other inputs VIN = VDD or VSS VDD = 5.5V CIN COUT Input capacitance 5 ƒ = 1MHz @ 0V 15 pF Output capacitance 5 ƒ = 1MHz @ 0V 15 pF 4 Notes: 1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to VIH(min) and VIL(max). 2. Supplied as a design limit but not guaranteed or tested. 3. Per MIL-PRF-38535, for current density ≤ 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765 pF/MHz. 4. Not more than one output may be shorted at a time for maximum duration of one second. 5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at frequency of 1MHz and a signal amplitude of 50mV rms maximum. 6. Maximum allowable relative shift equals 50mV. 7. All specifications valid for radiation dose ≤1E6 rads(Si). 8. Power does not include power contribution of any TTL output sink current. 9. Power dissipation specified per switching output. 10. This value is guaranteed based on characterization data, but not tested. 5 AC ELECTRICAL CHARACTERISTICS 2 (VDD = 5.0V ±10%; VSS = 0V 1, -55°C < TC < +125°C); Unless otherwise noted, Tc is per the temperature range ordered. SYMBOL PARAMETER MINIMUM MAXIMUM UNIT tPHL CLK to Qn 4 24 ns tPLH CLK to Qn 4 22 ns tPHL CLK to RCO 4 22 ns tPLH CLK to RCO 4 24 ns tPHL ENT to RCO 1 13 ns tPLH ENT to RCO 1 14 ns fMAX Maximum clock frequency 77 MHz tSU1 A, B, C, D Setup time before CLK ↑ 6 ns tSU2 LOAD, ENP, ENT, CLR low or high Setup time before CLK↑ 6 ns tH13 Data hold time after CLK ↑ 1 ns tH2 All synchronous inputs hold time after CLK ↑ 1 ns tW Minimum pulse width CLR low CLK high CLK low 7 ns Notes: 1. Maximum allowable relative shift equals 50mV. 2. All specifications valid for radiation dose ≤ 1E6 rads(Si). 3. Based on characterization, hold time (tH1) of 0ns can be assumed if data setup time (tSU1) is >10ns. This is guaranteed, but not tested. 6 PACKAGING Side-Brazed Packages 7 FLATPACK PACKAGES 8 UT54ACS163/UT54ACTS163: SMD 5962 * ***** ** * * * Lead Finish: (Notes 1 & 2) A = Solder C = Gold X = Optional Package Type: X = 16-lead ceramic bottom-brazed dual-in-line Flatpack C = 16-lead ceramic side-brazed dip Class Designator: Q = QML Class Q V = QML Class V Device Type: 01 Drawing Number: 96554 = UT54ACS163 96555 = UT54ACTS163 Total Dose: (Notes 3 & 4) R = 1E5 rads(Si) F = 3E5 rads(Si) G = 5E5 rads(Si) H = 1E6 rads(Si) Notes: 1. Lead finish (A,C, or X) must be specified. 2. If an “X” is specified when ordering, part marking will match the lead finish and will be either “A” (solder) or “C” (gold). 3. Total dose radiation must be specified when ordering. QML Q and QML V not available without radiation hardening. For prototype inquiries, contact factory. 4. Device type 02 is only offered with a TID tolerance guarantee of 3E5 rads(Si) or 1E6 rads(Si) and is tested in accordance with MIL-STD-883 Test Method 1019 Condition A and section 3.11.2. Device type 03 is only offered with a TID tolerance guarantee of 1E5 rads(Si), 3E5 rads(Si), and 5E5 rads(Si), and is tested in accordance with MIL-STD-883 Test Method 1019 Condition A. 9 Aeroflex Colorado Springs - Datasheet Definition Advanced Datasheet - Product In Development Preliminary Datasheet - Shipping Prototype Datasheet - Shipping QML & Reduced Hi-Rel COLORADO Toll Free: 800-645-8862 Fax: 719-594-8468 INTERNATIONAL Tel: 805-778-9229 Fax: 805-778-1980 NORTHEAST Tel: 603-888-3975 Fax: 603-888-4585 SE AND MID-ATLANTIC Tel: 321-951-4164 Fax: 321-951-4254 WEST COAST Tel: 949-362-2260 Fax: 949-362-2266 CENTRAL Tel: 719-594-8017 Fax: 719-594-8468 www.aeroflex.com [email protected] Aeroflex UTMC Microelectronic Systems Inc. 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