UT16MX110/111/112 Mux (9/12)

Standard Products
UT16MX110/111/112 Analog Multiplexer
Data Sheet
September 7, 2012
www.aeroflex.com/MUX
FEATURES
INTRODUCTION
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The UT16MX110/111/112 are low voltage analog multiplexers
with a convenient LVCMOS (3.3V) digital interface. The
analog muxes have Break-Before-Make architecture with a low
channel resistance. The muxes support rail-to-rail input signal
levels. The multiplexer supports serial (SPI™), or parallel
(asynchronous or synchronous) interface.
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16-to-1 Analog Mux
100Signal paths (typical)
5V single supply
Rail-to-Rail signal handling
Asynchronous RESET input
SPI™/QSPI™ and MICROWIRE™ compatible serial
interface (UT16MX112)
Asynchronous parallel input Interface (UT16MX110)
Synchronous parallel input Interface (UT16MX111)
LVCMOS/LVTTL compatible inputs (provided by internal
voltage regulator)
2kV ESD Protection (per MIL-STD-883, Method 3015.7)
Operational environment:
- Total ionizing dose: 300 krad(Si)
The UT16MX110/111/112 operates with a single 5V(+10%)
power supply. The voltage used for the digital circuitry and the
digital I/O is generated internally from the positive analog
supply voltage. Therefore, no external digital voltage supply is
required.
- SEL immune to a LET of 110 MeV-cm2/mg
- SEU immune to a LET of 62.3 MeV-cm2/mg
 Packaging: 28-Lead Ceramic Flatpack
 Standard Microcircuit Number 5962-10233
- QML Q, QML V
Digital Interface Inputs
Digital Interface Logic
Break-Before-Make
Architecture
4
S[0]
S[1]
S[2]
UT16MX110
UT16MX111
UT16MX112
COM
...
S[15]
Figure 1. UT16MX110/111/112 Block Diagram
1
FUNCTIONAL DESCRIPTION
All mux decoding (whether for the UT16MX110,
UT16MX111, or UT16MX112 device) operation utilizes a
Break-Before-Make process to prevent shorting between analog inputs during address transitions.
The 3V_OUT pin provides a regulated voltage of 3.3V. This
voltage is derived from the AVDD supply and is used internally as the positive supply voltage for the digital logic and digital
I/O circuitry. The 3V_OUT pin requires a load capacitor of
0.1uF for proper operation.
UT16MX110:
The UT16MX110 utilizes a parallel interface which operates in
asynchronous mode much like discrete logic switches. During
operation, the connection between COM and the S[15:0] pins
are steered, asynchronously, based on the binary decoding of
the A[3:0] static logic levels. The address pins A[3:0] are required to hold static levels for proper mux operation. Any
change in A[3:0] pins directs the COM connection to the appropriate S[x] input after approximately 100ns propagation delay (including the Break-Before-Make delay). All bits (A[3:0])
of any address change should be received by the UT16MX110
within 18 ns of the first bit change for proper operation. The
asynchronous parallel interface mode requires CS to be low for
accepting a change on the address pins A[3:0]. When CS is
high, the UT16MX110 disables the address pins A[3:0], as
well as holding the last valid address state, thereby mitigating
against any single-event upsets or transients on the address bus.
UT16MX111:
The UT16MX111 utilizes a parallel interface which operates in
a synchronous mode which utilizes the PLATCH input as the
latching clock. Upon rising edge of PLATCH, logic level at the
A[3:0] pins will be registered and retained internally to decode
the mux. Based on the values of the A[3:0] pins, COM is connected to the appropriate S[x] input after approximately 100ns
propagation delay (including the Break-Before-Make delay).
UT16MX112:
The UT16MX112 utilizes a serial interface that supports the
standard that is compatible with MICROWIRE™, SPI™, and
QSPI™. The UT16MX112 SPI™ interface can be depicted as
an 8-bit serial shift register controlled by SS, clocked by the rising edge of SCLK. The 8-bit shift register is for compatibility
purposes, even though this UT16MX112 serial address setting
requires only 4 bits. The four LSB of the 8-bit shift register are
the four bits decoding the mux address. When shifting data into
the part, the MSB enters the part first. The four MSB may be
set to zeroes, e.g., the 8-bit command "00001001" would set
the mux to connect COM to S[9].
The UT16MX112 is considered a slave SPI™ device with
MOSI (Master Out Slave In) as the data input pin to the device.
The data is shifted with D7 as the first bit into the shift register,
and also the first bit out to the MISO (Master In Slave Out) output pin after eight clock cycles of SCLK. The signal on the SS
pin defines the window when the address bits are shifted into
the device. This occurs when signal on SS is low. Only when
SS is high at the close of the shifting window, does the mux decoding get updated and COM is directed to the decoded S[x]
input (after Break-Before-Make delay).
SPI™ Operations:
The SPI™ (Serial Peripheral Interface) is implemented as a
synchronous 8-bit serial shift register controlled by four pins:
MOSI, MISO, SCLK, and SS. This is compatible with the
SPI™/QSPI™ standard as defined by Motorola on the
MC68HCxx line of microcontrollers. This SPI™ also conforms to the MICROWIRE™ interface, an SPI™ subset interface, as defined by National Semiconductor.
The UT16MX112 SPI™ is always a slave device, where MOSI, SCLK, and SS are controlled by a master device. MISO output is used as receiving slave data or to daisy chain several
SPI™ devices in appropriate applications.
The MUX select functionality is controlled by the four LSB of
the 8-bit SPI™ shift registers. When shifting, the first SCLK
rising edge clocks in the MSB first. The first falling edge of the
SCLK clocks out the 6th bit of the current values in the SPI™
registers, since the 7th bit already appears at the MISO at the
start of a serial transmission before the first SCLK (Figures 7
and 8).
Reset Function (UT16MX111/112 Only):
The RESET pin is used to reset all internal logic circuits. RESET held low also keeps all COM and S[15:0] analog I/Os in a
high impedance state. This is the recommended condition at
system power-up.
Asserting RESET (active low) resets all of the internal address
decoding registers to 0, thus steering the COM to connect to
S[0] while in the high impedance state. When RESET is de-asserted (high), both COM and S[0] will come out of the high impedance state and COM will be driven by S[0].
2
Table 1: UT16MX110 Pin Description
Pin No.
Name
I/O
Type
Description
1
AVDD
--
Power
Analog Positive Supply
2
NC
--
--
No Connection
3
NC
--
--
No Connection
4-11
S[15:8]
Input
Analog
Muxed Inputs
12
GND
--
Power
Digital Ground
13
3V_OUT
Output
Power
Digital Power Bypass Connection1
14
A3
Input
Digital
Parallel A3
15
A2
Input
Digital
Parallel A2
16
A1
Input
Digital
Parallel A1
17
A0
Input
Digital
Parallel A0
18
CS
Input
Digital
Active Low Parallel Chip Select with Internal
Pull-up
19-26
S[0:7]
Input
Analog
Muxed Inputs
27
AVSS
--
Power
Analog Negative Supply
28
COM
Output
Analog
Muxed Output2
Notes:
1. Bypass capacitor of 0.1 F required for proper operation (See Figure 11)
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
AVDD
1
28
COM
NC
2
27
AVSS
NC
3
26
S7
S15
4
25
S6
S14
5
24
S5
S13
6
23
S4
S12
7
22
S3
S11
8
21
S2
S10
9
20
S1
S9
10
19
S0
S8
11
18
CS
GND
12
17
A0
3V_OUT
13
16
A1
A3
14
15
A2
UT16MX110
Figure 2. UT16MX110 Pinout
3
Table 2: UT16MX111 Pin Description
Pin No.
Name
I/O
Type
Description
1
AVDD
--
Power
Analog Positive Supply
2
RESET
Input
Digital
Active Low Reset with Internal Pull-up
3
PLATCH
Input
Digital
Parallel Latch with Internal Pull-down
4-11
S[15:8]
Input
Analog
Muxed Inputs
12
GND
--
Power
Digital Ground
13
3V_OUT
Output
Power
Digital Power Bypass Connection1
14
A3
Input
Digital
Parallel A3
15
A2
Input
Digital
Parallel A2
16
A1
Input
Digital
Parallel A1
17
A0
Input
Digital
Parallel A0
18
NC
--
--
No Connection
19-26
S[0:7]
Input
Analog
Muxed Inputs
27
AVSS
--
Power
Analog Negative Supply
28
COM
Output
Analog
Muxed Output2
Notes:
1. Bypass capacitor of 0.1 F required for proper operation. (See Figure 11)
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
AVDD
1
28
COM
RESET
2
27
AVSS
PLATCH
3
26
S7
S15
4
25
S6
S14
5
24
S5
S13
6
23
S4
S12
7
22
S3
S11
8
21
S2
S10
9
20
S1
S9
10
19
S0
S8
11
18
NC
UT16MX111
GND
12
17
A0
3V_OUT
13
16
A1
A3
14
15
A2
Figure 3. UT16MX111 Pinout
4
Table 3: UT16MX112 Pin Description
Pin No.
Name
I/O
Type
Description
1
AVDD
--
Power
Analog Positive Supply
2
RESET
Input
Digital
Active Low Reset with Internal Pull-up
3
NC
--
--
No Connection
4-11
S[15:8]
Input
Analog
Muxed Inputs
12
GND
--
Power
Digital Ground
13
3V_OUT
Output
Power
Digital Power Bypass Connection1
14
NC
--
--
No Connection
15
SCLK
Input
Digital
SPI™ Clock
16
MOSI
Input
Digital
Master-out-Slave-in (Din)
17
MISO
Output
Digital
Master-in-Slave-out (Dout)
18
SS
Input
Digital
SPI™ Shift Control with Internal Pull-up
19-26
S[0:7]
Input
Analog
Muxed Inputs
27
AVSS
--
Power
Analog Negative Supply
28
COM
Output
Analog
Muxed Output2
Notes:
1. Bypass capacitor of 0.1 F required for proper operation. (See Figure 11)
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
AVDD
1
28
COM
RESET
2
27
AVSS
NC
3
26
S7
S15
4
25
S6
S14
5
24
S5
S13
6
23
S4
S12
7
22
S3
S11
8
21
S2
S10
9
20
S1
S9
10
19
S0
S8
11
18
SS
GND
12
17
MISO
3V_OUT
13
16
MOSI
NC
14
15
SCLK
UT16MX112
Figure 4. UT16MX112 Pinout
5
Table 4: UT16MX110 Truth Table
CS
A3
A2
A1
A0
COM
1
X
X
X
X
Previous Decide State
0
0
0
0
0
S0
0
0
0
0
1
S1
0
0
0
1
0
S2
0
0
0
1
1
S3
0
0
1
0
0
S4
0
0
1
0
1
S5
0
0
1
1
0
S6
0
0
1
1
1
S7
0
1
0
0
0
S8
0
1
0
0
1
S9
0
1
0
1
0
S10
0
1
0
1
1
S11
0
1
1
0
0
S12
0
1
1
0
1
S13
0
1
1
1
0
S14
0
1
1
1
1
S15
6
Table 5: UT16MX111 Truth Table
RESET
PLATCH
A3
A2
A1
A0
COM
0
X
X
X
X
X
Tri-State
(S[15:0] and COM)
1
Rising Edge
0
0
0
0
S0
1
Rising Edge
0
0
0
1
S1
1
Rising Edge
0
0
1
0
S2
1
Rising Edge
0
0
1
1
S3
1
Rising Edge
0
1
0
0
S4
1
Rising Edge
0
1
0
1
S5
1
Rising Edge
0
1
1
0
S6
1
Rising Edge
0
1
1
1
S7
1
Rising Edge
1
0
0
0
S8
1
Rising Edge
1
0
0
1
S9
1
Rising Edge
1
0
1
0
S10
1
Rising Edge
1
0
1
1
S11
1
Rising Edge
1
1
0
0
S12
1
Rising Edge
1
1
0
1
S13
1
Rising Edge
1
1
1
0
S14
1
Rising Edge
1
1
1
1
S15
7
OPERATIONAL ENVIRONMENT
PARAMETER
LIMIT
UNITS
Total Ionizing Dose (TID)
300
krad(Si)
Single Event Latchup (SEL)
>110
MeV-cm2/mg
Single Event Upset Threshold (SEU)
>62.3
MeV-cm2/mg
PARAMETER
LIMITS
ABSOLUTE MAXIMUM RATINGS1
SYMBOL
AVDD
Analog Positive Supply Voltage
7.5V
AVSS
Analog Negative Supply Voltage
-0.3V
PD
Static Power Dissipation
TJ
Junction Temperature
-55oC to +130oC
TSTG
Storage Temperature
-65oC to +150oC
ESDHBM
Electrostatic Discharge using Human
Body Model
150 mW
2kV
Notes:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, and functional operation of the device
at these or any other conditions beyond limits indicated in the operational sections of this specification is not recommended. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability and performance.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
AVDD
Analog Positive Supply Voltage
4.5V to 5.5V
AVSS
Analog Negative Supply Voltage
0.0V
VI
Analog Switch Input Voltage
TC
Case Operating Temperature Range
-55oC to +125oC
TJ
Junction Operating Temperature1
-55oC to +130oC
Notes:
1. Thermal resistance, JC, of junction-to-case is 4.8o C/W.
8
AVSS to AVDD
DC ELECTRICAL CHARACTERISTICS 1
(AVDD=5.0V + 0.5V, GND=0V; -55C < TC < +125C)
SYMBOL
PARAMETER
CONDITION
MIN
TYP
MAX
UNIT
VIL
Digital input low
-0.3
0.8
V
VIH
Digital input high
2.0
3.6
V
VOL
Digital output low
(UT16MX112)
IOL = 100A
0.2
V
IOL = 2mA
0.4
V
Digital output high
(UT16MX112)
IOH = -100A
2.8
V
IOH = -2mA
2.4
V
RON
On resistance
VI N= AVSS to AVDD
VCOM = VIN - 0.3V
40
IOFF
Analog I/O leakage current
AVDD = 5.5V
VIN = AVSS or AVDD
-1.6
VOH
(switch off)
IIL
2
Digital input current low
300

1.6
A
AVDD = 5.5V
VIL = GND



-1.0
-380
-5.0
LVCMOS / CMOS inputs
Inputs with a pull-up
Inputs with a pull-down
IIH
145
AVDD = 4.5V
VIH = 3.6V
Digital input current high
LVCMOS / CMOS inputs
Inputs with a pull-up3
Inputs with a pull-down
300
300
200



1.0
100



3.0
mA
AVDD = 5.5V
Digital input current high
VIH = 3.0V
LVCMOS / CMOS inputs
-50
3
Inputs with a pull-up
Inputs with a pull-down
QIDD
Quiescent analog supply current
AVDD = 5.5V
VIH = 3.3V
VIL = GND
Notes:
1. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25oC per MIL-STD-883 Method 1019,
Condition A up to the maximum TID level procured (see ordering information).
2. This parameter cannot be tested on COM for the UT16MX110 device because the pin is continuously on.
3. This parameter tested with PLATCH held low on the UT16MX111 device.
9
AC ELECTRICAL CHARACTERISTICS 1,2
(AVDD=5.0V + 0.5V, GND=0V; -55C < TC < +125C)
SYMBOL
PARAMETER
CONDITION
MIN
TYP
MAX
UNIT
Input capacitance (switch off)3
FIN = 1MHz @ 0V
40
50
pF
Input digital capacitance3
FIN = 1MHz @ 0V
46
55
pF
COUT
Output capacitance at COM3
FIN = 1MHz @ 0V
68
80
pF
OISO
Off isolation4
RL = 600
CL = 50pF
FIN = 1kHz sine wave
-80
dB
BW
Bandwidth4
RSOURCE = 50
RL = 2.2M
CL = 12pF
VIN = 1Vp-p
CIN
CIN_DIGITAL
XTALK2
Cross talk
4
(Between any 2 Channels)
tS
THD
RL = 1k
CL = 50pF
FIN = 1kHz sine wave
Settling time of output at COM
RL = 100k
4
within 1% of final output voltage CL = 50pF
Total Harmonic Distortion4
RL = 1k
CL = 50pF
FIN = 1MHz sine wave
VIN = 5Vp-p
51
MHz
-80
dB
120
ns
5.0
%
Notes:
1. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25oC per MIL-STD-883 Method 1019,
Condition A up to the maximum TID level procured (see ordering information).
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
3. Parameters guaranteed by characterization.
4. Parameters guaranteed by design.
10
TIMING CHARACTERISTICS (UT16MX110)1,2
(AVDD=5.0V + 0.5V, GND = 0V; -55C < TC < +125C)
SYMBOL
PARAMETER
tPROP_S
Propagation delay of analog input
(S[x]) to analog output (COM)
measured at 50%
RT = 50
Propagation delay of any changes
in the digital inputs (A[3:0], CS,
PLATCH, SS) affecting the analog
output (COM)
RT = 50
Mux decoding time
RT = 50
tPROP_D
tMUX
CONDITION
MIN
TYP
MAX
UNIT
25
ns
140
ns
50
ns
90
ns
CL = 50pF
See Figures 10 & 13
25
CL = 50pF
See Figures 5 & 13
CL = 50pF
See Figures 5 & 13
tBBM
Break-Before-Make-Delay
RT = 50
15
CL = 50pF
See Figures 5 & 13
tAS1
The minimum amount of time
required for the address signals
(A[3:0]) to be stable before the
falling edge of CS3
See Figure 5
3.0
ns
tAS2
The minimum amount of time
required for the address signals
(A[3:0]) to be stable after the
rising edge of CS3
See Figure 5
5.0
ns
Notes:
1. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25oC per MIL-STD-883 Method 1019,
Condition A up to the maximum TID level procured (see ordering information).
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
3. Parameters guaranteed by design.
11
TIMING CHARACTERISTICS (UT16MX111)1,2
(AVDD=5.0V + 0.5V, GND=0V; -55C < TC < +125C)
SYMBOL
PARAMETER
tPROP_S
Propagation delay of analog input
(S[x]) to analog output (COM)
measured at 50%
RT = 50
Propagation delay of any changes
in the digital inputs (A[3:0], CS,
PLATCH, SS) affecting the analog
output (COM)
RT = 50
Mux decoding time
RT = 50
tPROP_D
tMUX
CONDITION
MIN
TYP
MAX
UNIT
25
ns
140
ns
50
ns
90
ns
90
ns
55
ns
CL = 50pF
See Figures 10& 13
25
CL = 50pF
See Figures 6 & 13
CL = 50pF
See Figures 6 & 13
tBBM
Break-Before-Make-Delay
RT = 50
15
CL = 50pF
See Figures 6 & 13
tPZLH
tPLHZ
tLSU
tLHD
Output enable time from HiZ to
low or high once RESET is pulled
high
RT = 50
Output disable time from low or
high to HiZ once RESET is pulled
low
RT = 50
Address setup time wrt rising edge
PLATCH
RT = 50
Address hold time wrt rising edge
PLATCH
RT = 50
CL = 50pF
See Figures 9 & 13
CL = 50pF
See Figures 9 & 13
5.0
ns
10
ns
CL = 50pF
See Figures 6 & 13
CL = 50pF
See Figures 6 & 13
Notes:
1. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25oC per MIL-STD-883 Method 1019,
Condition A up to the maximum TID level procured (see ordering information)
2. Continuous operation with low load resistance is not recommended. (See Figure 12)
12
TIMING CHARACTERISTICS (UT16MX112)1,2
(AVDD=5.0V + 0.5V, GND = 0V; -55C < TC < +125C)
SYMBOL
PARAMETER
tPROP_S
Propagation delay of analog input
(S[x]) to analog output (COM)
measured at 50%
RT = 50
Propagation delay of any changes
in the digital inputs (A[3:0], CS,
PLATCH, SS) affecting the analog
output (COM)
RT = 50
Mux decoding time
RT = 50
tPROP_D
tMUX
CONDITION
MIN
TYP
MAX
UNIT
25
ns
140
ns
50
ns
90
ns
90
ns
55
ns
2.0
MHz
CL = 50pF
See Figures 10 & 13
25
CL = 50pF
See Figures 7 & 13
CL = 50pF
See Figures 7 & 13
tBBM
Break-Before-Make-Delay
RT = 50
15
CL = 50pF
See Figures 7 & 13
tPZLH
Output enable time from HiZ to
low or high once RESET is pulled
high
RT = 50
Output disable time from low or
high to HiZ once RESET is pulled
low
RT = 50
fSCLK
SCLK frequency
See Figure 7
tH
SCLK high time
See Figure 7
190
ns
tL
SCLK low time
See Figure 7
190
ns
tSSU
First SCLK setup time (for
shifting window)
See Figure 7
6.0
ns
tSSH
Last SCLK hold time (for shifting
window)
See Figure 7
10
ns
tSU
Data in (MOSI) setup time wrt
rising edge SCLK
See Figure 7
3.0
ns
tHD
Data in (MOSI) hold time wrt
rising edge SCLK
See Figure 7
5.0
ns
tDO
Data out (MISO) valid (after
falling edge of SCLK)
CL = 50pF
See Figure 7
43
ns
tDR
Data out (MISO) rise time
10-90% of 3V_OUT
CL = 50pF
30
ns
tDF
Data out (MISO) fall time
10-90% of 3V_OUT
CL = 50pF
20
ns
tPLHZ
CL = 50pF
See Figures 9 & 13
CL = 50pF
See Figures 9 & 13
Notes:
1. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25oC per MIL-STD-883 Method 1019,
Condition A up to the maximum TID level procured (see ordering information).
2. Continuous operation with low load resistance is not recommended. (See Figure 12).
13
Timing Diagrams
Multiplexer Asynchronous Parallel Timing (UT16MX110)
tAS1
tAS2
tAS1
3V_OUT
50%
GND
CS
A[3:0]
Am Valid
AnValid
3V_OUT
50%
GND
ApValid
tCYCLE
tCYCLE
S[x] = Analog Inputs
tPROP_D
tMUX
tPROP_D
tMUX
tBBM
COM
(Previous)
HiZ
COM = S[Am Valid]
tPROP_D
tMUX
tBBM
HiZ
tBBM
HiZ
COM = S[An Valid]
COM = S[Ap Valid]
Note:
1. CS may be held in a continuous low state, holding CS high provides protection for false address change.
2. tCYCLE is the minimum cycle time between the falling edges of CS and/or any address changes. If tCYCLE is shorter than tPROP_D, an addressing error may occur.
3. All bits (A[3:0]) of any address change should be received by the MUX within 18ns of the first bit change for proper operation.
Figure 5. UT16MX110 Timing Diagram
Multiplexer Synchronous Parallel Timing (UT16MX111)
tCYCLE
3V_OUT
50%
PLATCH
tLHD
GND
tLHD
tLSU
tLSU
Am Valid
An Valid
3V_OUT
A[3:0]
50%
GND
S[x] = Analog Inputs
tPROP_D
tMUX
COM(Previous)
tPROP_D
tMUX
tBBM
HiZ
tBBM
HiZ
COM = S[Am Valid]
Note:
1. When PLATCH is in a high or low state, it provides protection for false address change.
2. tCYCLE must not be less than the maximum value of tPROP_D.
Figure 6. UT16MX111 Timing Diagram
14
COM = S[An Valid]
Multiplexer Serial Timing (UT16MX112)
tSSU
3V_OUT
50%
GND
SS
tH
tL
3V_OUT
50%
GND
SCLK
tHD
tSU
Bit 7
MSB
MOSI
Bit 6
Bit 1
Bit 0
LSB
S[x] = Analog Inputs
tPROP_D
tMUX
MISO
(MOSI previous)
HiZ
COM
(Previous)
COM
(Previous)
COM
Bit 7
MSB
Bit 6
Bit 1
tBBM
Bit 0
LSB
COM
(MOSI[3:0])
3V_OUT
50%
GND
Bit 7
(MOSI Current)
tDO
Figure 7. UT16MX112 Timing Diagram
SPI™ Protocol (UT16MX112)
Start of serial
transmission
End of serial
transmission
SS
SCLK
MOSI
(input)
MISO
(MOSI previous)
Bit 7 In
MSB
Bit 7
Out
Bit 6 In
Bit 6
Out
Bit 5 In
Bit 5
Out
Bit 4 In
Bit 4
Out
Bit 3 In
Bit 3
Out
Bit 2 In
Bit 2
Out
Bit 0 In
LSB
Bit 1 In
Bit 1
Out
Bit 0
Out
Bit 7 Out
(MOSI current)
SPI register applies, MUX
switches after TMUX delay
S[x]
COM
(Previous)
COM
Note:
1. See FIGURE 7, Multiplexer Serial Timing (UT16MX112), for detailed timing.
Figure 8. SPI™ Protocol Timing
15
COM
(MOSI[3:0])
Multiplexer RESET Enable/Disable (UT16MX111/112)
3V_OUT
50%
RESET
GND
tPZLH
tPLHZ
HiZ
COM, S[x]
HiZ
COM, S[0]
Note:
1. S[x] represents the analog signal channel connected to COM prior to the falling edge of RESET.
Figure 9. RESET Timing Diagram (Used for UT16MX111/112 only)
Multiplexer Analog Timing (UT16MX110/111/112)
AVDD
50%
S[x]
AVSS
tPROP_S
tPROP_S
AVDD
COM
50%
AVSS
Note:
1. S[x] represents the analog signal channel connected to COM while in active mode of all device types with the address already set and all digital inputs held constant.
Figure 10. Analog Timing Diagram (Used for UT16MX110/111/112
16
Power Supply Requirements Schematic (UT16MX110/111/112)
AVDD
AVSS
27
1
UT16MX110
UT16MX111
UT16MX112
GND
3V_OUT
13
12
0.1 µF
Note:
1. Bypass capacitor of 0.1µF required on 3V_OUT for proper operation.
Figure 11. Power Supply Requirements
Minimum Multiplexer Total Path Resistance (UT16MX110/111/112)
Address/SPI TM
Pins
4
R0
R1
R2
S[0]
S[1]
S[2]
UT16MX110
UT16MX111
UT16MX112
•
•
•
R13
R14
R15
COM
S[13]
S[14]
S[15]
L
O
A
D
RL
Ri + RL > 500
(0 < i < 15)
Note:
1. Continuous DC operation on any single channel where Ri + RL < 500
will degrade device reliability and performance.
Figure 12. Minimum Total Path Resistance for Continuous DC Operation on Any Single Channel
17
Multiplexer Load Conditions for Test (UT16MX110/111/112)
Address/SPI TM
Pins
4
S[0]
S[1]
S[2]
.
.
.
UT16MX110
UT16MX111
UT16MX112
RT = 50 
Test
Point
COM
CL = 50 pF
S[13]
S[14]
S[15]
Figure 13. UT16MX110/111/112 Test Circuit
18
PACKAGING
Figure 14. 28-Lead Ceramic Flat Package
19
TRADEMARKS:
SPI™ /QSPI™ are trademarks of Motorola, Inc.
MICROWIRE™ is a trademark of National Semiconductor
20
ORDERING INFORMATION
UT16MX110/111/112 ANALOG MULTIPLEXER
UT ***** **
*
* * *
Lead Finish: (Note 1)
(C) = Gold
Screening Level: (Note 2 and 3)
(P) = Prototype Flow
(C) = HiRel Flow
Case Outline:
(X) = 28-pin CFP ceramic flatpack
TID Tolerance:
(-) = None
Device Type:
(10) = Asynchronous Parallel
(11) = Synchronous Parallel
(12) = Serial (SPI™)
Generic Part Number:
(16MX1) = 16:1 MUX
Notes:
1. Lead finish is "C" (Gold) only.
2. Prototype flow per Aeroflex Manufacturing Flows Document. Devices are tested at 25C only. Lead finish is Gold "C" only. Radiation neither tested nor
guaranteed.
3. HiRel flow per Aeroflex Manufacturing Flows Document.
21
UT16MX110/111/112 ANALOG MULTIPLEXER: SMD
5962
* 10233 ** * *
*
Lead Finish (Note 1):
(C) = Gold
Case Outline:
(X) = 28-pin CFP ceramic flatpack
Class Designator:
(Q) = QML Class Q
(V) = QML Class V
Device Type:
(01) = Asynchronous Parallel
(03) = Synchronous Parallel
(04) = Serial (SPITM)
Drawing Number:10233
Total Dose:
(R) = 100 krad(Si)
(F) = 300 krad(Si)
Federal Stock Class Designator: No options
Notes:
1. Lead finish is "C" (Gold) only.
22
Aeroflex Colorado Springs - Datasheet Definition
Advanced Datasheet - Product In Development
Preliminary Datasheet - Shipping Prototype
Datasheet - Shipping QML & Reduced Hi-Rel
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Aeroflex Colorado Springs, Inc., reserves the right to make
changes to any products and services herein at any time
without notice. Consult Aeroflex or an authorized sales
representative to verify that the information in this data sheet
is current before using this product. Aeroflex does not assume
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