REVISIONS LTR DESCRIPTION A DATE (YR-MO-DA) APPROVED 16-05-27 C. SAFFLE Add device type 02 and delete paragraph 3.2.3 block diagram. - ro REV SHEET REV A A A A A A A A A SHEET 15 16 17 18 19 20 21 22 23 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Rajesh Pithadia STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.landandmaritime.dla.mil CHECKED BY Rajesh Pithadia APPROVED BY THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A Charles F. Saffle DRAWING APPROVAL DATE 15-06-01 REVISION LEVEL A MICROCIRCUIT, LINEAR, MICROPOWER, OVERVOLTAGE PROTECTION, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 5962-14206 1 OF 23 5962-E383-16 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 14206 Federal stock class designator \ RHA designator (see 1.2.1) 01 V X A Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) / \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ADA4096-2 Radiation hardened, dual, 30 V, micropower, overvoltage protection, operational amplifier 02 ADA4096-2 Radiation hardened, dual, 30 V, micropower, overvoltage protection, operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter X Descriptive designator Terminals Package style CDFP3-F10 10 Bottom brazed flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 2 1.3 Absolute maximum ratings. 1/ Supply voltage (+VSY to –VSY) ........................................................................................... 36 V Input voltage (VIN): Operating .......................................................................................................................... -VSY to +VSY Overvoltage condition 2/ .................................................................................................. -VSY – 32 V to + VSY + 32 V Differential input voltage 3/ .................................................................................................. Input current ......................................................................................................................... Output short circuit duration to GND ..................................................................................... Storage temperature range .................................................................................................. Maximum junction temperature (TJ) ..................................................................................... Lead temperature (soldering, 60 seconds) ........................................................................... Thermal resistance, junction-to-case (JC) .................................................................... ±VSY ±5 mA Indefinite -65C to +150C +150C +300C 17C/W 4/ Thermal resistance, junction-to-ambient (JA) ............................................................... 27C/W 4/ 1.4 Recommended operating conditions. Supply voltage (±VSY) .......................................................................................................... ±1.8 V to ±15.0 V Ambient operating temperature range (TA) .......................................................................... -55C to +125C 1.4.1 Operating performance characteristics. 5/ Input capacitance: Differential (CDM) VSY = ±15 V .................................................................................... 2.5 pF Common mode (CCM) VSY = ±15 V ............................................................................. 7.0 pF Settling time (ts) to 0.1%, 10 V step, VSY = ±15 V ............................................................ 23.4 s Closed loop impedance (ZOUT f = 100 kHz, AV = 1): VSY = ±1.5 V ............................................................................................................... 102 VSY = ±5 V .................................................................................................................. 71 VSY = ±15 V ................................................................................................................ 40 Unity gain crossover (VIN = 5 mVP-P, RL = 10 k, AV = 1): VSY = ±1.5 V ............................................................................................................... 465 kHz VSY = ±5 V .................................................................................................................. 550 kHz VSY = ±15 V ................................................................................................................ 800 kHz Phase margin: VSY = ±1.5 V ............................................................................................................... 51 VSY = ±5 V .................................................................................................................. 52 VSY = ±15 V ................................................................................................................ 60 ________ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Performance not guaranteed during overvoltage conditions. 3/ Limit the input current to ±5 mA. 4/ Measurement taken under absolute worst case condition and represents data taken with thermal camera for highest power density location. See MIL-STD-1835 for base line values of JC. 5/ Unless otherwise specified, TA = 25C and VCM = 0 V. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 3 1.4.1 Operating performance characteristics - continued. 5/ -3 dB closed loop bandwidth (VIN = 5 mVP-P, AV = 1): VSY = ±1.5 V ......................................................................................................................... 672 kHz VSY = ±5 V ............................................................................................................................ 783 kHz VSY = ±15 V .......................................................................................................................... 1029 kHz Noise performance (VSY = ±1.5 V, VSY = ±5 V, VSY = ±15 V): Voltage noise (enP-P, 0.1 Hz to 10 Hz) ................................................................................. 0.7 VP-P Voltage noise density (en, f = 1 kHz) .................................................................................... 27 nV/ Hz Current noise density (in, f = 1 kHz) ...................................................................................... 0.2 pA/ Hz Channel separation (VSY = ±15 V)......................................................................................... 100 dB 1.5 Radiation features. Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) : Device type 01 ...................................................................................................................... 100 krads(Si) 6/ Maximum total dose available (dose rate ≤ 10 mrads(Si)/s): Device type 02 ...................................................................................................................... 50 krads(Si) 7/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) ______ 6/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Device type 01 radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 7/ For device type 02, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 4 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 5 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ VSY = ±1.65 V, VCM = 0 V Group A subgroups Device type -55C TA +125C unless otherwise specified Limits Unit Min Max -300 300 -500 500 Input characteristics Offset voltage 1 VOS 01, 02 2, 3 Offset voltage matching M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 1 01, 02 -300 300 -500 500 VOSA VOSB 2, 3 Offset voltage drift ΔVOS / ΔT 4/ 5/ Input bias current IB 6/ Input offset current µV µV M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 2, 3 01, 02 -3 2 µV/C 1 01, 02 -25 0 nA 2 -30 5 3 -35 0 M, D, P, L, R 1 01 -25 0 M, D, P, L 1 02 -25 0 VCM = +VSY 1 01, 02 0 25 6/ 2 -10 35 3 0 45 M, D, P, L, R 1 01 0 25 M, D, P, L 1 02 0 25 VCM = -VSY 1 01, 02 -45 -15 6/ 2 -50 5 3 -65 10 M, D, P, L, R 1 01 -45 -15 M, D, P, L 1 02 -45 -15 1, 2 01, 02 -1.5 1.5 -3 3 IOS 3 M, D, P, L, R 1 01 -1.5 1.5 M, D, P, L 1 02 -1.5 1.5 nA See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 6 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ 3/ VSY = ±1.65 V, VCM = 0 V Group A subgroups Device type Limits -55C TA +125C unless otherwise specified Unit Min Max Input characteristics – continued. Input voltage range Common-mode rejection ratio Large signal voltage gain IVR CMRR 1, 2, 3 01, 02 -VSY +VSY M, D, P, L, R 1 01 -VSY +VSY M, D, P, L 1 02 -VSY +VSY 1 01, 02 61 VCM = - VSY to +VSY 2, 3 AVO 1 01 61 M, D, P, L 1 02 61 1 01, 02 91 2, 3 to +VSY – 0.1 V 1 01 91 M, D, P, L 1 02 91 1 01, 02 86 2, 3 to +VSY – 0.2 V dB 84 M, D, P, L, R RL = 2 k, VO = -VSY + 0.2 V dB 58 M, D, P, L, R RL = 10 k, VO = -VSY + 0.1 V V 77 M, D, P, L, R 1 01 86 M, D, P, L 1 02 86 Output characteristics. Output voltage high VOH 1 RL = 10 k to GND 01, 02 +VSY V - 0.02 2, 3 +VSY - 0.05 M, D, P, L, R 1 01 +VSY - 0.02 M, D, P, L 1 02 +VSY - 0.02 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 7 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ 3/ VSY = ±1.65 V, VCM = 0 V Group A subgroups Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Output characteristics – continued. Output voltage high VOH 1 RL = 2 k to GND 01, 02 V +VSY - 0.05 2, 3 +VSY - 0.1 M, D, P, L, R 1 01 +VSY - 0.05 M, D, P, L 1 02 +VSY - 0.05 Output voltage low VOL 1 RL = 10 k to GND 01, 02 -VSY V + 0.02 2, 3 -VSY + 0.05 M, D, P, L, R 1 01 -VSY + 0.02 M, D, P, L 1 02 -VSY + 0.02 1 RL = 2 k to GND 01, 02 -VSY + 0.04 2, 3 -VSY + 0.1 M, D, P, L, R 1 01 -VSY + 0.04 M, D, P, L 1 02 -VSY + 0.04 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 8 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ 3/ VSY = ±1.65 V, VCM = 0 V Group A subgroups Device type -55C TA +125C unless otherwise specified Limits Unit Min Max Output characteristics – continued. Short circuit limit ISC+ ISC- Source 1, 2, 3 01, 02 -11 -1 M, D, P, L, R 1 01 -11 -1 M, D, P, L 1 02 -11 -1 1, 2, 3 01, 02 2 13 M, D, P, L, R 1 01 2 13 M, D, P, L 1 02 2 13 1 01, 02 100 Sink mA Power supply Power supply rejection ratio PSRR VSY = 3.3 V to 36 V 2, 3 Total supply current (both amplifiers) ISY 90 M, D, P, L, R 1 01 100 M, D, P, L 1 02 100 1 01, 02 VO = 0 V dB 100 2 140 3 130 M, D, P, L, R 1 01 100 M, D, P, L 1 02 100 RL = 10 k, CL = 100 pF 4 01, 02 4/ 7/ 8/ 5 0.25 6 0.09 µA Dynamic performance Slew rate SR Gain bandwidth product GBP 4, 5, 6 VIN = 5 mVP-P, RL = 10 k, 01, 02 0.15 V/µs 350 kHz AV = -100 4/ 7/ See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 9 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±5 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Unit Min Max -300 300 -500 500 Input characteristics Offset voltage 1 VOS 01, 02 2, 3 Offset voltage matching M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 1 01, 02 -300 300 -500 500 VOSA VOSB 2, 3 Offset voltage drift ΔVOS / ΔT 4/ 5/ Input bias current IB 6/ µV µV M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 2, 3 01, 02 -3 2 µV/C 1 01, 02 -25 0 nA 2 -25 10 3 -35 0 M, D, P, L, R 1 01 -25 0 M, D, P, L 1 02 -25 0 VCM = +VSY – 2.5 V 1 01, 02 -20 5 6/ 2 -30 15 3 -35 10 M, D, P, L, R 1 01 -20 5 M, D, P, L 1 02 -20 5 VCM = -VSY + 2.5 V 1 01, 02 -30 0 6/ 2 -35 10 3 -40 5 M, D, P, L, R 1 01 -25 0 M, D, P, L 1 02 -25 0 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 10 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±5 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Unit Min Max 0 25 Input characteristics – continued. Input bias current Input offset current IB VCM = +VSY 1 01, 02 6/ 2 -10 35 3 0 45 M, D, P, L, R 1 01 10 35 M, D, P, L 1 02 10 35 VCM = -VSY 1 01, 02 -45 -15 6/ 2 -50 5 3 -70 -15 M, D, P, L, R 1 01 -40 -15 M, D, P, L 1 02 -40 -15 1 01, 02 -2 2 -3 3 IOS 2, 3 Input voltage range Common-mode rejection ratio M, D, P, L, R 1 01 -2 2 M, D, P, L 1 02 -2 2 1, 2, 3 01, 02 -VSY +VSY M, D, P, L, R 1 01 -VSY +VSY M, D, P, L 1 02 -VSY +VSY 1 01, 02 72 IVR CMRR VCM = - VSY to +VSY 2, 3 nA V dB 68 M, D, P, L, R 1 01 72 M, D, P, L 1 02 72 1 01, 02 91 VCM = - VSY + 2 V to +VSY – 2 V nA 2, 3 85 M, D, P, L, R 1 01 91 M, D, P, L 1 02 91 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 11 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±5 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Input characteristics – continued. Large signal voltage gain AVO RL = 10 k, VO = -VSY + 0.2 V 1 01, 02 2, 3 to +VSY – 0.2 V 102 99 M, D, P, L, R 1 01 102 M, D, P, L 1 02 102 1 01, 02 93 RL = 2 k, VO = -VSY + 0.3 V dB to +VSY – 0.3 V RL = 2 k, VO = -VSY + 0.3 V 2 88 3 88 to +VSY – 0.3 V RL = 2 kΩ, VO = -VSY + 0.4 V to +VSY – 0.4 V M, D, P, L, R 1 01 93 M, D, P, L 1 02 93 1 01, 02 +VSY Output characteristics Output voltage high VOH RL = 10 k to GND V - 0.04 2, 3 +VSY - 0.05 M, D, P, L, R 1 01 +VSY - 0.04 M, D, P, L 1 02 +VSY - 0.04 1 RL = 2 k to GND 01, 02 +VSY - 0.2 2, 3 +VSY - 0.3 M, D, P, L, R 1 01 +VSY - 0.2 M, D, P, L 1 02 +VSY - 0.2 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 12 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±5 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Output characteristics – continued. Output voltage low VOL 1 RL = 10 k to GND 01, 02 -VSY V + 0.03 2, 3 -VSY + 0.05 M, D, P, L, R 1 01 -VSY + 0.03 M, D, P, L 1 02 -VSY + 0.03 1 RL = 2 k to GND 01, 02 -VSY + 0.2 2, 3 -VSY + 0.25 M, D, P, L, R 1 01 -VSY + 0.2 M, D, P, L 1 02 -VSY + 0.2 Short circuit limit ISC+ Source 1, 2 01, 02 3 ISC- -18 -6 -14 -2 M, D, P, L, R 1 01 -18 -6 M, D, P, L 1 02 -18 -6 1, 2, 3 01, 02 3 16 M, D, P, L, R 1 01 3 16 M, D, P, L 1 02 3 16 Sink mA See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 13 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±5 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Power supply Total supply current (both amplifiers) ISY 1 VO = 0 V 01, 02 110 2, 3 µA 150 M, D, P, L, R 1 01 110 M, D, P, L 1 02 110 RL = 10 k, CL = 100 pF 4 01, 02 4/ 7/ 8/ 5 0.3 6 0.12 Dynamic performance Slew rate SR Gain bandwidth product GBP 4, 5, 6 VIN = 5 mVP-P, RL = 10 k, AV = -100 01, 02 0.2 V/s 450 kHz 4/ 7/ See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 14 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±15 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Unit Min Max -300 300 -500 500 Input characteristics Offset voltage 1 VOS 01, 02 2, 3 Offset voltage matching M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 1 01, 02 -300 300 -500 500 VOSA VOSB 2, 3 Offset voltage drift ΔVOS / ΔT 4/ 5/ Input bias current IB 6/ V V M, D, P, L, R 1 01 -300 300 M, D, P, L 1 02 -300 300 2, 3 01, 02 -3 2 V/C 1 01, 02 -20 5 nA -25 10 2, 3 M, D, P, L, R 1 01 -20 5 M, D, P, L 1 02 -20 5 1 01, 02 -10 15 -20 25 VCM = +VSY – 2.5 V 6/ 2, 3 M, D, P, L, R 1 01 -10 15 M, D, P, L 1 02 -10 15 VCM = -VSY + 2.5 V 1 01, 02 -35 -5 6/ 2 -40 5 3 -50 -5 M, D, P, L, R 1 01 -35 -5 M, D, P, L 1 02 -35 -5 VCM = +VSY 1 01, 02 10 35 6/ 2 -5 40 3 10 55 M, D, P, L, R 1 01 10 35 M, D, P, L 1 02 10 35 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 15 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±15 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Unit Min Max -55 -25 Input characteristics – continued. Input bias current Input offset current IB VCM = -VSY 1 6/ 2 -55 0 3 -80 -25 01, 02 M, D, P, L, R 1 01 -55 -25 M, D, P, L 1 02 -55 -25 1, 2 01, 02 -1.5 1.5 -3 3 IOS 3 Input voltage range Common-mode rejection ratio M, D, P, L, R 1 01 -1.5 1.5 M, D, P, L 1 02 -1.5 1.5 1, 2, 3 01, 02 -VSY +VSY M, D, P, L, R 1 01 -VSY +VSY M, D, P, L 1 02 -VSY +VSY 1 01, 02 81 IVR CMRR VCM = - VSY to +VSY 2, 3 nA V dB 75 M, D, P, L, R 1 01 81 M, D, P, L 1 02 81 1 01, 02 95 VCM = - VSY + 2 V to +VSY – 2 V nA 2, 3 89 M, D, P, L, R 1 01 95 M, D, P, L 1 02 95 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 16 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±15 V, VCM = 0 V Device type Limits -55C TA +125C unless otherwise specified Min Unit Max Input characteristics – continued. Large signal voltage gain AVO RL = 10 k, VO = -VSY + 0.3 V 1 01, 02 109 2, 3 to +VSY – 0.3 V dB 105 M, D, P, L, R 1 01 109 M, D, P, L 1 02 109 RL = 2 k, VO = -VSY + 4 V 1 01, 02 99 to +VSY – 4 V RL = 2 k, VO = -VSY + 4 V 2 90 3 90 to +VSY – 4 V RL = 2 k, VO = -VSY + 5 V to +VSY – 5 V M, D, P, L, R 1 01 99 M, D, P, L 1 02 99 Output characteristics. Output voltage high VOH 1 RL = 10 k to GND 01, 02 +VSY V - 0.08 2, 3 +VSY - 0.25 M, D, P, L, R 1 01 +VSY - 0.08 M, D, P, L 1 02 +VSY - 0.08 1, 2 RL = 2 k to GND 01, 02 +VSY -1 3 +VSY -6 M, D, P, L, R 1 01 +VSY -1 M, D, P, L 1 02 +VSY -1 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 17 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±15 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Output characteristics – continued. Output voltage low VOL 1 RL = 10 k to GND 01, 02 -VSY V + 0.08 2, 3 -VSY + 0.25 M, D, P, L, R 1 01 -VSY + 0.08 M, D, P, L 1 02 -VSY + 0.08 1 RL = 2 k to GND 01, 02 - VSY + 0.75 2 -VSY + 1.5 3 M, D, P, L, R 1 -VSY + 3 01 -VSY + 0.75 M, D, P, L 1 02 -VSY + 0.75 Short circuit limit ISC+ ISC- Source 1 01, 02 -28 -17 2 -34 -20 3 -28 -6 M, D, P, L, R 1 01 -28 -17 M, D, P, L 1 02 -28 -17 1, 2, 3 01, 02 8 18 M, D, P, L, R 1 01 8 18 M, D, P, L 1 02 8 18 Sink mA See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 18 TABLE I. Electrical performance characteristics – Continued. Test Symbol Group A subgroups Conditions 1/ 2/ VSY = ±15 V, VCM = 0 V Device type -55C TA +125C unless otherwise specified Limits Min Unit Max Power supply Total supply current (both amplifiers) ISY 1 VO = 0 V, VSY = ±15 V and 01, 02 150 2, 3 VSY = ±16.5 V A 200 M, D, P, L, R 1 01 150 M, D, P, L 1 02 150 RL = 10 k, CL = 100 pF 4 01, 02 4/ 7/ 8/ 5 0.4 6 0.2 Dynamic performance Slew rate SR Gain bandwidth product GBP 4, 5, 6 VIN = 5 mVP-P, RL = 10 k, AV = -100 01, 02 0.3 V/s 600 kHz 4/ 7/ 1/ Device type 01 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device type 02 supplied to this drawing has been characterized through all levels M, D, P, L of irradiation. However, device type 01 is only tested at the “R” level and device type 02 only tested at the “L” level. Pre and post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurement for any RHA level, TA = +25C. 2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device type 01 and condition D for device type 02. Device type 02 has been tested at low dose rate. 3/ VSY = ±1.8 V recommended operating condition guaranteed by 100% production test at VSY = ±1.65 V minimum recommended operating condition. 4/ Parameter is not tested post radiation. 5/ Calculated from 25C to -55C, 25C to 125C, and -55C to 125C 6/ Input bias current depends on ±VS, VCM, and temperature. Refer to the input bias current versus VCM and temperature graphs for various ±VS in the manufacturer’s datasheet. 7/ Parameter is part of device initial characterization which is only repeated after design and process changes or with subsequent wafer lots. 8/ Measured from 10% to 90% and 90% to 10% of rail to rail output swing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 19 Device types 01 and 02 Case outline X Terminal number Terminal symbol Type Description 1 OUT A Analog output Operational amplifier output, Amplifier A 2 -IN A Analog input Operational amplifier negative input, Amplifier A 3 NC/GND N/A 4 +IN A Analog input 5 -VS Power 6 +IN B Analog input Operational amplifier positive input, Amplifier B 7 -IN B Analog input Operational amplifier negative input, Amplifier B 8 NC/GND N/A 9 OUT B Analog output 10 +VS Power No connection or ground this terminal Operational amplifier positive input, Amplifier A Negative power supply No connection or ground this terminal Operational amplifier output, Amplifier B Positive power supply FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 20 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 21 TABLE IIA. Electrical test requirements. Test requirements Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) 1 Subgroups (in accordance with MIL-PRF-38535, table III) Device Device class Q class V 1 1,2,3, 1/ 2/ 4,5,6 1,2,3, 2/ 4,5,6 1,2,3, 2/ 4,5,6 1,2,3, 2/ 3/ 4,5,6 1 1,2,3, 4,5,6 1,2,3, 4,5,6 1,2,3, 4,5,6 1,2,3, 4,5,6 1 2/ 3/ 2/ 2/ 3/ 2/ 3/ 1/ PDA applies to subgroup 1 only. Deltas are not excluded from PDA 2/ Parameters marked with footnote 5/ in Table I are part of device initial characterization which is only repeated after design and process changes or with subsequent wafer lots. 3/ Delta limits as specified in Table IIB shall be required where specified, and the delta limits shall be computed with reference to the zero hour electrical parameters (see table I). TABLE IIB. Burn-in and operating life test delta parameters. 1/ Parameter Device types Symbol Limits Units Min Max Offset voltage 01, 02 VOS -50 +50 µV Input bias current, VCM = 0 V 01, 02 IB -1.6 +1.6 nA Supply current 01, 02 ISY -4 +4 µA 1/ 240 hour burn-in and group C end point electrical parameters. Deltas are performed at TA = +25C. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 22 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A for device type 01, condition D for device type 02, and as specified herein. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108. 6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0540. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in MIL-HDBK-103 and QML-38535. The vendors listed in MIL-HDBK-103 and QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and have agreed to this drawing. 6.7 General Description. The device’s dual operational amplifier features micropower operation and rail-to-rail input and output ranges. The extremely low power requirements and guaranteed operation from 3 V to 30 V make these amplifiers perfectly suited to monitor battery usage and to control battery charging. Their dynamic performance, including 27 nV/ Hz voltage noise density, recommends them for low power applications. Capacitive loads to 200 pF are handled without oscillation. The device has overvoltage protection inputs and diodes that allow the voltage input to extend 32 V above and below the supply rails, making this device ideal for robust applications. The device features a unique input stage that allows the input voltage to exceed either supply safely without any phase reversal or latch-up. This is called input overvoltage protection, or OVP. See manufacturer’s datasheet for application information. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-14206 A REVISION LEVEL A SHEET 23 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 16-05-27 Approved sources of supply for SMD 5962-14206 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962R1420601VXA 24355 ADA4096-2AF/QMLR 5962L1420602VXA 24355 ADA4096-2AF/QMLL 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 24355 Vendor name and address Analog Devices Rt 1 Industrial Park PO Box 9106 Norwood, MA 02062 Point of contact: 7910 Triad Center Drive Greensboro, NC 27409-9605 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.