INITIAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 08-MAR-2004 SUBJECT: ON Semiconductor Initial Product/Process Change Notification #13335 TITLE: Dual Source Assembly/Test for Case-77 Thyristors at Mingxin EFFECTIVE DATE: 09-Jul-2004 AFFECTED CHANGE CATEGORY: Subcontractor Assembly/Test Site AFFECTED PRODUCT DIVISION: Discretes Products FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Dave Culbertson <[email protected]> NOTIFICATION TYPE: Initial Product/Process Change Notification (IPCN) First change notification sent to customers. IPCNs are issued at least 120 days prior to implementation of the change. An IPCN is advance notification about an upcoming change and contains general information regarding the change details and devices affected. It also contains the preliminary reliability qualification plan. The completed qualification and characterization data will be included in the Final Product/Process Change Notification (FPCN). This IPCN notification will be followed by a Final Product/Process Change Notification (FPCN) at least 60 days prior to implementation of the change. DESCRIPTION AND PURPOSE: This is the Initial Notification announcing ON Semiconductor is qualifying MingXin Microelectronics in Ningbo, China as an additional site for the assembly and test of the Case-77 (T0-225AA Type) Thyristor products. MingXin Microelectronics is an ISO9002 certified site and currently assembles and tests Bipolar products for ON Semiconductor. QUALIFICATION PLAN: Lot 1, 2N6073B Lot 2,3: C106M High Humidity High Temperature Reverse Bias: Ta=85C, RH=85%, Bias (V=80%rated or 100V max) for 1008hrs (Sample size: 80 units/lot) High Temperature Reverse Bias: Ta=150C, Bias(V=80%rated) for 1008hrs (Sample size: 80 units/lot) Intermittent Operating Life: Ta = 25C, Ton/Toff=3.5 min, delta Tj = 100C, 8572 cycles (Sample size: 80 units/lot) Issue Date: 08 Mar, 2004 Page 1 of 2 Initial Product/Process Change Notification #13335 Temp Cycle: Ta=-65C/150C, Air to air, Dwell>=10min for 1000 cycles (Sample size: 80 units/lot) Autoclave: Ta=121C, P=15psig, RH=100% for 96hrs (Sample size: 80 units/lot) Electical Characterization at -40C, +25C, and +150C cycles (Sample size: 25 units/lot) AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2N6070A 2N6071A 2N6071B 2N6071BT 2N6073A 2N6073B 2N6075A 2N6075B C106B C106D C106D1 C106M C106M1 MCR106-006 MCR106-008 T2322B TPA0234 Issue Date: 08 Mar, 2004 Page 2 of 2