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INITIAL PRODUCT/PROCESS CHANGE NOTIFICATION
Generic Copy
08-MAR-2004
SUBJECT: ON Semiconductor Initial Product/Process Change Notification #13335
TITLE: Dual Source Assembly/Test for Case-77 Thyristors at Mingxin
EFFECTIVE DATE: 09-Jul-2004
AFFECTED CHANGE CATEGORY:
Subcontractor Assembly/Test Site
AFFECTED PRODUCT DIVISION: Discretes Products
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Dave Culbertson <[email protected]>
NOTIFICATION TYPE:
Initial Product/Process Change Notification (IPCN)
First change notification sent to customers. IPCNs are issued at least 120 days prior to implementation
of the change. An IPCN is advance notification about an upcoming change and contains general
information regarding the change details and devices affected. It also contains the preliminary
reliability qualification plan.
The completed qualification and characterization data will be included in the Final Product/Process
Change Notification (FPCN).
This IPCN notification will be followed by a Final Product/Process Change Notification (FPCN) at
least 60 days prior to implementation of the change.
DESCRIPTION AND PURPOSE:
This is the Initial Notification announcing ON Semiconductor is qualifying MingXin Microelectronics
in Ningbo, China as an additional site for the assembly and test of the Case-77 (T0-225AA Type)
Thyristor products. MingXin Microelectronics is an ISO9002 certified site and currently assembles
and tests Bipolar products for ON Semiconductor.
QUALIFICATION PLAN:
Lot 1, 2N6073B
Lot 2,3: C106M
High Humidity High Temperature Reverse Bias: Ta=85C, RH=85%,
Bias (V=80%rated or 100V max) for 1008hrs (Sample size: 80 units/lot)
High Temperature Reverse Bias: Ta=150C, Bias(V=80%rated) for 1008hrs (Sample size: 80 units/lot)
Intermittent Operating Life: Ta = 25C, Ton/Toff=3.5 min,
delta Tj = 100C, 8572 cycles (Sample size: 80 units/lot)
Issue Date: 08 Mar, 2004
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Initial Product/Process Change Notification #13335
Temp Cycle: Ta=-65C/150C, Air to air, Dwell>=10min for 1000 cycles
(Sample size: 80 units/lot)
Autoclave: Ta=121C, P=15psig, RH=100% for 96hrs (Sample size: 80 units/lot)
Electical Characterization at -40C, +25C, and +150C cycles (Sample size: 25 units/lot)
AFFECTED DEVICE LIST (WITHOUT SPECIALS):
PART
2N6070A
2N6071A
2N6071B
2N6071BT
2N6073A
2N6073B
2N6075A
2N6075B
C106B
C106D
C106D1
C106M
C106M1
MCR106-006
MCR106-008
T2322B
TPA0234
Issue Date: 08 Mar, 2004
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