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FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20596A
Generic Copy
Issue Date: 9-Sep-2014
TITLE: Qualification of CZ4 Fab (Czech Republic) as an additional wafer source for N-Channel and
P-Channel JFET.
PROPOSED FIRST SHIP DATE: 10-Dec-2014
AFFECTED CHANGE CATEGORY(S): ON Semiconductor Fab Site
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact your local ON Semiconductor Sales Office or Farrah Omar <[email protected]>
SAMPLES: Contact your local ON Semiconductor Sales Office
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]>
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers.
implementation of the change.
FPCNs are issued at least 90 days prior to
ON Semiconductor will consider this change approved unless specific conditions of acceptance are
provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>.
DESCRIPTION AND PURPOSE:
This is the Final Notification by ON Semiconductor notifying customers of its plan to qualify CZ4 Fab
(Czech Republic) as an additional wafer source from current ISMF Fab (Malaysia) for N-Channel
and P-Channel JFET.
The CZ4 Fab facility is an ON Semiconductor owned wafer fab that has been producing products for
ON Semiconductor. Several existing technologies within ON Semiconductor’s product families are
currently sourced from CZ4 Fab. ON Semiconductor CZ4 Wafer Fab is an internal factory that is
TS16949, ISO-9001 and ISO-14000 certified.
Qualification tests are designed to show that the reliability of the devices will continue to meet or
exceed ON Semiconductor standards.
Issue Date: 9-Sep-2014
Rev. 06-Jan-2010
Page 1 of 2
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20596A
RELIABILITY DATA SUMMARY:
Package: SOT23
MMBFJ310LT1G
Test:
HTRB
HTGB
HAST+PC
Interval:
1008 hrs
1008 hrs
96 hrs
Results
0/84
0/84
0/84
UHAST+PC
Conditions:
TA=150C,80% Rated Voltage
Ta = 150C, 100% Vgss
Ta=130C RH=85%
bias=80% rated V or100V Max
Ta=130C RH=85%
96 hrs
0/84
TC+PC
Ta= -65 C to 150 C
1000 cyc
0/84
Interval:
1008 hrs
1008 hrs
96 hrs
Results
0/84
0/84
0/84
MMBFJ175LT1G
Test:
HTRB
HTGB
HAST+PC
UHAST+PC
Conditions:
TA=150C,80% Rated Voltage
Ta = 150C, 100% Vgss
Ta=130C RH=85%
bias=80% rated V or100V Max
Ta=130C RH=85%
TC+PC
Ta= -65 C to 150 C
96 hrs
0/84
1000 cyc
0/84
ELECTRICAL CHARACTERISTIC SUMMARY:
There are no changes in electrical characteristics and product performance meets data sheet
Specifications. Characterization data is available upon request.
CHANGED PART IDENTIFICATION:
Affected products from ON Semiconductor with date code 1450 representing WW50, 2014 and
greater may be sourced from either the CZ4 Fab (Czech Republic) or the ISMF Fab (Malaysia).
List of affected General Parts:
SMMBFJ175LT1G
SMMBFJ177LT1G
Issue Date: 9-Sep-2014
Rev. 06-Jan-2010
Page 2 of 2