PHILIPS PHP21N06LT

Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
FEATURES
PHP21N06LT, PHB21N06LT, PHD21N06LT
SYMBOL
• ’Trench’ technology
• Very low on-state resistance
• Fast switching
• Stable off-state characteristics
• High thermal cycling performance
• Low thermal resistance
QUICK REFERENCE DATA
VDSS = 55 V
d
ID = 21 A
RDS(ON) ≤ 75 mΩ (VGS = 5 V)
g
RDS(ON) ≤ 70 mΩ (VGS = 10 V)
s
GENERAL DESCRIPTION
N-channel enhancement mode, logic level, field-effect power transistor in a plastic envelope using ’trench’ technology.
The device has very low on-state resistance. It is intended for use in dc to dc converters and general purpose switching
applications.
The PHP21N06LT is supplied in the SOT78 (TO220AB) conventional leaded package.
The PHB21N06LT is supplied in the SOT404 surface mounting package.
The PHD21N06LT is supplied in the SOT428 surface mounting package.
PINNING
PIN
SOT78 (TO220AB)
SOT404
SOT428
DESCRIPTION
tab
tab
tab
1
gate
2
drain1
3
source
2
2
tab
drain
1
1 23
1
3
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDSS
VDGR
VGS
ID
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Continuous drain current
Tj = 25 ˚C to 175˚C
Tj = 25 ˚C to 175˚C; RGS = 20 kΩ
IDM
PD
Tj, Tstg
Pulsed drain current
Total power dissipation
Operating junction and
storage temperature
- 55
55
55
± 13
21
14.7
84
69
175
V
V
V
A
A
A
W
˚C
Tmb = 25 ˚C
Tmb = 100 ˚C
Tmb = 25 ˚C
Tmb = 25 ˚C
1 It is not possible to make connection to pin 2 of the SOT428 or SOT404 packages.
September 1998
1
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
THERMAL RESISTANCES
SYMBOL PARAMETER
Rth j-mb
Rth j-a
Thermal resistance junction
to mounting base
Thermal resistance junction
to ambient
CONDITIONS
SOT78 package, in free air
SOT428 and SOT404 package, pcb
mounted, minimum footprint
TYP.
MAX.
UNIT
-
2.18
K/W
60
50
-
K/W
K/W
MIN.
MAX.
UNIT
-
2
kV
ESD LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
VC
Human body model (100 pF, 1.5 kΩ)
Electrostatic discharge
capacitor voltage, all pins
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
V(BR)DSS
VGS = 0 V; ID = 0.25 mA;
V(BR)GSS
VGS(TO)
Drain-source breakdown
voltage
Gate-source breakdown
voltage
Gate threshold voltage
MIN.
Tj = -55˚C
IG = ±1 mA;
VDS = VGS; ID = 1 mA
Tj = 175˚C
Tj = -55˚C
VGS = 5 V; ID = 10 A
VGS = 10 V; ID = 10 A
TYP. MAX. UNIT
55
50
10
-
-
V
V
V
1.0
0.5
5
-
1.5
60
55
20
0.02
0.05
-
2.0
2.3
75
70
157
1
20
10
500
V
V
V
mΩ
mΩ
mΩ
S
µA
µA
µA
µA
RDS(ON)
Drain-source on-state
resistance
gfs
IGSS
Forward transconductance
VDS = 25 V; ID = 10 A
Gate source leakage current VGS = ±5 V; VDS = 0 V
IDSS
Zero gate voltage drain
current
VDS = 55 V; VGS = 0 V;
Qg(tot)
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain (Miller) charge
ID = 20 A; VDD = 44 V; VGS = 5 V
-
10.5
3
5
-
nC
nC
nC
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 30 V; ID = 25 A;
VGS = 5 V; RG = 10 Ω
Resistive load
-
10
47
28
33
15
70
40
45
ns
ns
ns
ns
Ld
Ld
Internal drain inductance
Internal drain inductance
-
3.5
4.5
-
nH
nH
Ls
Internal source inductance
Measured from tab to centre of die
Measured from drain lead to centre of die
(SOT78 package only)
Measured from source lead to source
bond pad
-
7.5
-
nH
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
500
110
60
650
135
85
pF
pF
pF
Tj = 175˚C
Tj = 175˚C
September 1998
Tj = 175˚C
2
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
VSD
Continuous source current
(body diode)
Pulsed source current (body
diode)
Diode forward voltage
trr
Qrr
Reverse recovery time
Reverse recovery charge
IS
ISM
MIN.
TYP. MAX. UNIT
-
-
21
A
-
-
84
A
IF = 19.7 A; VGS = 0 V
-
0.95
1.2
V
IF = 19.7 A; -dIF/dt = 100 A/µs;
VGS = -10 V; VR = 30 V
-
32
0.12
-
ns
µC
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
Drain-source non-repetitive ID = 10 A; VDD ≤ 25 V; VGS = 5 V;
unclamped inductive turn-off RGS = 50 Ω; Tmb = 25 ˚C
energy
WDSS
120
Normalised Power Derating
PD%
120
110
110
100
100
90
90
80
80
70
70
60
60
50
50
40
40
30
30
20
20
10
10
0
0
20
40
60
80 100
Tmb / C
120
140
160
MAX.
UNIT
-
30
mJ
Normalised Current Derating
ID%
0
180
0
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
September 1998
MIN.
20
40
60
80 100
Tmb / C
120
140
160
180
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 5 V
3
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
100
90
RDS(ON)/mOhm
tp =
ID/A
VGS/V =
85
1 us
4
RDS(ON) = VDS/ID
80
10us
4.2
4.4
5
4.6
4.8
75
10
100 us
70
DC
65
1 ms
1
60
10ms
100ms
1
10
55
100
VDS/V
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
10
5
10
15
ID/A
20
25
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID); parameter VGS
Zth/ (K/W)
25
ID/A
20
1
0.5
15
0.2
0.1
PD
0.05
0.1
tp
D=
0.02
tp
T
10
t
T
5
0
Tj/C =
0.01
1.0E-06
0.0001
t/s
0.01
1
0
100
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
50
10.0
8.0
1
25
2
VGS/V
3
4
5
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
15
VGS/V =
ID/A
Transconductance, gfs (S)
14
40
30
20
10
0
0
175
0
2
4
VDS/V 6
8
6.0
5.4
5.0
4.8
4.6
4.4
4.2
4.0
3.8
3.6
3.4
3.2
3.0
2.8
2.6
2.4
2.2
10 2.0
13
12
11
10
9
8
7
6
5
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS); parameter VGS
September 1998
0
5
10
15
Drain current, ID (A)
20
25
Fig.8. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID); conditions: VDS = 25 V
4
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
BUK959-60
a
2.5
PHP21N06LT, PHB21N06LT, PHD21N06LT
1
Rds(on) normlised to 25degC
.9
.8
Thousands pF
2
1.5
.7
.6
.5
Ciss
.4
.3
1
.2
.1
0.5
-100
-50
0
50
Tmb / degC
100
150
0
0.01
200
Fig.9. Normalised drain-source on-state resistance.
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 10 A; VGS = 5 V
2.5
0.1
1
10
VDS/V
100
Fig.12. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
6
BUK959-60
VGS(TO) / V
Coss
Crss
VGS/V
max.
5
typ.
4
2
VDS = 14V
VDS = 44V
1.5
3
min.
1
2
0.5
1
0
-100
-50
0
50
Tj / C
100
150
0
200
Fig.10. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
2
4
6
QG/nC
8
10
12
Fig.13. Typical turn-on gate-charge characteristics.
VGS = f(QG); conditions: ID = 20 A; parameter VDS
100
Sub-Threshold Conduction
1E-01
0
IF/A
80
1E-02
2%
1E-03
typ
60
98%
Tj/C =
25
40
1E-04
20
1E-05
1E-05
175
0
0
0.5
1
1.5
2
2.5
3
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
September 1998
0
0.5
VSDS/V
1
1.5
Fig.14. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
5
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
120
PHP21N06LT, PHB21N06LT, PHD21N06LT
WDSS%
VDD
+
110
100
L
90
80
VDS
-
70
VGS
60
-ID/100
50
T.U.T.
0
40
30
20
RGS
10
R 01
shunt
0
20
40
60
80
100
120
Tmb / C
140
160
180
Fig.16. Avalanche energy test circuit.
WDSS = 0.5 ⋅ LID2 ⋅ BVDSS /(BVDSS − VDD )
Fig.15. Normalised avalanche energy rating.
WDSS% = f(Tmb); conditions: ID = 10 A
September 1998
6
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
MECHANICAL DATA
Dimensions in mm
4,5
max
Net Mass: 2 g
10,3
max
1,3
3,7
2,8
5,9
min
15,8
max
3,0 max
not tinned
3,0
13,5
min
1,3
max 1 2 3
(2x)
0,9 max (3x)
2,54 2,54
0,6
2,4
Fig.17. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
September 1998
7
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
MECHANICAL DATA
Dimensions in mm
4.5 max
1.4 max
10.3 max
Net Mass: 1.4 g
11 max
15.4
2.5
0.85 max
(x2)
0.5
2.54 (x2)
Fig.18. SOT404 : centre pin connected to mounting base.
MOUNTING INSTRUCTIONS
Dimensions in mm
11.5
9.0
17.5
2.0
3.8
5.08
Fig.19. SOT404 : soldering pattern for surface mounting.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
September 1998
8
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
MECHANICAL DATA
Dimensions in mm : Net Mass: 1.4 g
seating plane
6.73 max
1.1
tab
2.38 max
0.93 max
5.4
4 min
6.22 max
10.4 max
4.6
2
1
0.5
0.5 min
3
0.3
0.5
0.8 max
(x2)
2.285 (x2)
Fig.20. SOT428 : centre pin connected to mounting base.
MOUNTING INSTRUCTIONS
Dimensions in mm
7.0
7.0
2.15
1.5
2.5
4.57
Fig.21. SOT428 : soldering pattern for surface mounting.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
September 1998
9
Rev 1.400
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP21N06LT, PHB21N06LT, PHD21N06LT
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
September 1998
10
Rev 1.400