PHILIPS PHX14NQ20T

Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
FEATURES
PHX14NQ20T , PHF14NQ20T
SYMBOL
QUICK REFERENCE DATA
• ’Trench’ technology
• Low on-state resistance
• Fast switching
d
VDSS = 200 V
ID = 7.6 A
g
RDS(ON) ≤ 230 mΩ
s
GENERAL DESCRIPTION
N-channel enhancement mode field-effect power transistor in a plastic full pack envelope using ’trench’ technology.
The device has very low on-state resistance. It is intended for use in dc to dc converters and general purpose switching
applications.
The PHX14NQ20T is supplied in the SOT186A (FPAK) conventional leaded package.
PINNING
SOT186A (FPAK)
PIN
SOT186 (FPAK)
DESCRIPTION
case
case
1
gate
2
drain
3
source
case
isolated
1 2 3
1 2 3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDSS
VDGR
VGS
ID
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Continuous drain current
Tj = 25 ˚C to 150˚C
Tj = 25 ˚C to 150˚C; RGS = 20 kΩ
IDM
PD
Tj, Tstg
Pulsed drain current
Total power dissipation
Operating junction and
storage temperature
- 55
200
200
± 20
7.6
4.8
30
30
150
V
V
V
A
A
A
W
˚C
November 2000
Ths = 25 ˚C; VGS = 10 V
Ths = 100 ˚C; VGS = 10 V
Ths = 25 ˚C
Ths = 25 ˚C
1
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
AVALANCHE ENERGY LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
EAS
Non-repetitive avalanche
energy
IAS
Peak non-repetitive
avalanche current
CONDITIONS
MIN.
MAX.
UNIT
-
70
mJ
-
14
A
Unclamped inductive load, IAS = 14 A;
tp = 38 µs; Tj prior to avalanche = 25˚C;
VDD ≤ 25 V; RGS = 50 Ω; VGS = 10 V; refer
to fig 15
THERMAL RESISTANCES
SYMBOL PARAMETER
Rth j-hs
Rth j-a
Thermal resistance junction
to mounting base
Thermal resistance junction
to ambient
CONDITIONS
MIN.
SOT186A package, in free air
TYP. MAX. UNIT
-
-
4.17
K/W
-
55
-
K/W
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
V(BR)DSS
VGS(TO)
Drain-source breakdown
voltage
Gate threshold voltage
CONDITIONS
VGS = 0 V; ID = 0.25 mA;
Tj = -55˚C
VDS = VGS; ID = 1 mA
Tj = 150˚C
Tj = -55˚C
RDS(ON)
MIN.
TYP. MAX. UNIT
200
178
2
1
6
-
3
150
12.1
10
0.05
-
4
6
230
540
100
10
500
V
V
V
V
V
mΩ
mΩ
S
nA
µA
µA
Drain-source on-state
resistance
Forward transconductance
Gate source leakage current
Zero gate voltage drain
current
VGS = 10 V; ID = 7 A
VGS = 10 V; ID = 7 A; Tj = 150˚C
VDS = 25 V; ID = 7 A
VGS = ± 10 V; VDS = 0 V
VDS = 200 V; VGS = 0 V
Tj = 150˚C
Qg(tot)
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain (Miller) charge
ID = 14 A; VDD = 160 V; VGS = 10 V
-
38
4
13.3
-
nC
nC
nC
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 100 V; RD = 10 Ω;
VGS = 10 V; RG = 5.6 Ω
Resistive load
-
25
40
83
31
-
ns
ns
ns
ns
Ld
Ls
Internal drain inductance
Internal source inductance
Measured from drain lead to centre of die
Measured from source lead to source
bond pad
-
4.5
7.5
-
nH
nH
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
1500
128
60
-
pF
pF
pF
gfs
IGSS
IDSS
November 2000
2
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
VSD
Continuous source current
(body diode)
Pulsed source current (body
diode)
Diode forward voltage
trr
Qrr
Reverse recovery time
Reverse recovery charge
IS
ISM
CONDITIONS
MIN.
TYP. MAX. UNIT
-
-
14
A
-
-
56
A
IF = 14 A; VGS = 0 V
-
1.0
1.5
V
IF = 14 A; -dIF/dt = 100 A/µs;
VGS = 0 V; VR = 30 V
-
135
690
-
ns
nC
ISOLATION LIMITING VALUE & CHARACTERISTIC
Ths = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
Visol
R.M.S. isolation voltage from all
three terminals to external
heatsink
SOT186A package; f = 50-60 Hz;
sinusoidal waveform; R.H. ≤ 65%;
clean and dustfree
Visol
Repetitive peak voltage from all
three terminals to external
heatsink
Cisol
Capacitance from pin 2 to
external heatsink
November 2000
MAX.
UNIT
-
2500
V
SOT186 package; R.H. ≤ 65%;
clean and dustfree
-
1500
V
f = 1 MHz
-
-
pF
3
MIN.
TYP.
10
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
Normalised Power Derating
PD%
120
PHX14NQ20T , PHF14NQ20T
Transient thermal impedance, Zth j-a (K/W)
10
with heatsink compound
110
D = 0.5
100
90
0.2
1
80
70
0.1
60
0.05
50
0.02
0.1
40
single pulse
30
20
10
0.01
1E-06
0
0
20
40
60
80
Ths / C
100
120
140
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
120
1E-04
1E-03 1E-02 1E-01
Pulse width, tp (s)
10V
15V
25
100
6.5V
90
6V
20
80
70
15
60
50
5.5
10
40
5V
30
5
VGS=4.5
20
10
0
0
0
20
40
60
80
Ths / C
100
120
0
140
1
2
3
4
5
6
7
8
9
10
Drain-Source Voltage, VDS (V)
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 10 V
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS); parameter VGS
Drain-Source On Resistance, RDS(on) (Ohms)
Peak Pulsed Drain Current, IDM (A)
1000
1E+01
Drain Current, ID (A)
30
with heatsink compound
110
1E+00
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
Normalised Current Derating
ID%
1E-05
0.8
4.5V
0.7
100
5V
0.6
RDS(on) = VDS/ ID
5.5V
0.5
tp = 10 us
0.4
10
100us
6V
6.5V
10V
0.3
1 ms
D.C.
1
0.2
10 ms
VGS =20 V
0.1
100 ms
0
0.1
1
10
100
Drain-Source Voltage, VDS (V)
0
1000
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
November 2000
10
Drain Current, ID (A)
20
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID); parameter VGS
4
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
Drain current, ID (A)
5
28
VGS(TO) / V
4.5
24
4
20
3.5
max
typ
3
16
min
2.5
150 C
12
2
Tj = 25 C
1.5
8
1
4
0.5
0
0
2
4
6
Gate-source voltage, VGS (V)
8
0
-100
10
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
20
-50
0
Tj / C
50
100
150
Fig.10. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Transconductance, gfs (S)
Sub-Threshold Conduction
1E-01
1E-02
15
2%
1E-03
10
typ
98%
1E-04
5
1E-05
0
0
4
8
12
16
ID / (A)
20
24
28
1E-06
Fig.8. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID); conditions: VDS = 25 V
2.5
a
0
1
2
3
4
5
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
Rds(on) normalised to 25 deg C
Capacitances, Ciss, Coss, Crss (pF)
10000
Ciss
2
1000
Coss
1.5
100
Crss
1
10
0.5
-70
-20
30
80
Ths / deg C
0
130
20
30
40
Drain-Source Voltage, VDS (V)
Fig.9. Normalised drain-source on-state resistance.
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 7 A; VGS = 10 V
November 2000
10
Fig.12. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
5
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
Gate-source voltage, VGS (V)
Maximum Avalanche Current, IAS (A)
100
14
12
VDD = 40 V
10
25 C
10
8
6
VDD = 160 V
1
Tj prior to avalanche = 150 C
4
2
0.1
0.001
0
0
10
20
30
40
Gate charge, QG (nC)
Fig.13. Typical turn-on gate-charge characteristics.
VGS = f(QG); conditions: ID = 14 A; parameter VDS
0.01
0.1
Avalanche time, tAV (ms)
1
10
Fig.15. Maximum permissible non-repetitive
avalanche current (IAS) versus avalanche time (tAV);
unclamped inductive load
Source-Drain Diode Current, IF (A)
30
VGS = 0 V
20
150 C
Tj = 25 C
10
0
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
Source-Drain Voltage, VSDS (V)
Fig.14. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
November 2000
6
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
MECHANICAL DATA
Dimensions in mm
Plastic single-ended package; isolated heatsink mounted; 1 mounting hole; 3 lead TO-220
SOT186A
Net Mass: 2 g
E
A
A1
P
q
D1
T
D
j
L2
L1
K
Q
b1
L
b2
1
2
3
b
c
w M
e
e1
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
(1)
UNIT
A
A1
b
b1
b2
c
D
D1
E
mm
4.6
4.0
2.9
2.5
0.9
0.7
1.1
0.9
1.4
1.2
0.7
0.4
15.8
15.2
6.5
6.3
10.3
9.7
e
2.54
e1
j
K
5.08
2.7
2.3
0.6
0.4
L
L1
14.4 3.30
13.5 2.79
L2
max.
P
Q
q
3
3.2
3.0
2.6
2.3
3.0
2.6
T
(2)
2.5
w
0.4
Notes
1. Terminal dimensions within this zone are uncontrolled. Terminals in this zone are not tinned.
2. Both recesses are ∅ 2.5 × 0.8 max. depth
OUTLINE
VERSION
SOT186A
REFERENCES
IEC
JEDEC
TO-220
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-06-11
Fig.16. SOT186A; The seating plane is electrically isolated from all terminals.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for F-pack envelopes.
3. Epoxy meets UL94 V0 at 1/8".
November 2000
7
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
MECHANICAL DATA
Dimensions in mm
Plastic single-ended package; isolated heatsink mounted;
1 mounting hole; 3 lead TO-220 exposed tabs
SOT186
Net Mass: 2 g
E
E1
A
P
A1
m
q
D1
D
L1
Q
b1
L
L2
1
2
3
b
c
w M
e
e1
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
A1
b
b1
c
D
D1
E
E1
mm
4.4
4.0
2.9
2.5
0.9
0.7
1.5
1.3
0.55
0.38
17.0
16.4
7.9
7.5
10.2
9.6
5.7
5.3
e
2.54
e1
L
L1(1)
5.08
14.3
13.5
4.8
4.0
L2
m
P
Q
q
w
10
0.9
0.5
3.2
3.0
1.4
1.2
4.4
4.0
0.4
Note
1. Terminal dimensions within this zone are uncontrolled. Terminals in this zone are not tinned.
OUTLINE
VERSION
SOT186
REFERENCES
IEC
JEDEC
TO-220
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-06-11
Fig.17. SOT186; The seating plane is electrically isolated from all terminals.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for F-pack envelopes.
3. Epoxy meets UL94 V0 at 1/8".
November 2000
8
Rev 1.100
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX14NQ20T , PHF14NQ20T
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 2000
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
November 2000
9
Rev 1.100