Philips Semiconductors Products Product specification 13–input NAND Gate FAST 74F133 FAST Products PRODUCT SPECIFICATION TYPE TYPICAL PROPAGATION DELAY TYPICAL SUPPLY CURRENT (TOTAL) 74F133 4.0ns 2.0 mA ORDERING INFORMATION ORDER CODE COMMERCIAL RANGE INDUSTRIAL RANGE VCC = 5V ±10%, DESCRIPTION VCC = 5V ±10%, Tamb = 0°C to +70°C Tamb = –40°C to +85°C 16–pin plastic DIP N74F133N I74F133N 16–pin plastic SO N74F133D I74F133D INPUT AND OUTPUT LOADNG AND FAN OUT TABLE PINS DO - D12 74F (U.L.) HIGH/LOW DESCRIPTION Data inputs Q Data output Note to input and output loading and fan out table 1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state. PIN CONFIGURATION LOGIC SYMBOL D0 1 16 VCC D1 2 15 D12 D2 3 14 D11 D3 4 13 D10 D4 5 12 D9 D5 6 11 D8 D6 7 10 D7 GND 8 9 Q LOAD VALUE HIGH/LOW 1.0/1.0 20µA/0.6mA 50/33 1.0mA/20mA LOGIC SYMBOL (IEEE/IEC) 1 1 2 2 3 4 3 4 5 6 7 5 6 7 9 10 11 10 11 12 13 12 13 14 14 15 15 & VCC = Pin 16 GND = Pin 8 July 2, 1993 1 853-10219 Philips Semiconductors Products Product specification 13–input NAND Gate FAST 74F133 LOGIC DIAGRAM D0 1 D1 2 D2 3 D3 4 D4 5 D5 6 D6 D7 7 D8 D9 D10 D11 D12 10 11 12 13 14 15 9 VCC = Pin 16 GND = Pin 8 Q FUNCTION TABLE INPUTS OUTPUT DO D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D12 H H H H H H H H H H H H H Any one input = L July 2, 1993 2 Q L H Philips Semiconductors Products Product specification 13–input NAND Gate FAST 74F133 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in high output state –0.5 to VCC V IOUT Current applied to output in low output state 40 mA Tamb Operating free air temperature range Commercial range 0 to +70 °C Industrial range –40 to +85 °C –65 to +150 °C Tstg Storage temperature range RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT MIN NOM MAX VCC Supply voltage 4.5 5.0 5.5 VIH High–level input voltage 2.0 VIL Low–level input voltage 0.8 V IIk Input clamp current –18 mA IOH High–level output current –1 mA IOL Low–level output current 20 mA Tamb Operating free air temperature range V V Commercial range 0 +70 °C Industrial range –40 +85 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL TEST CONDITIONS1 PARAMETER LIMITS MIN VOH High-level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 VIH = MIN, IOH = MAX ±5%VCC 2.7 VCC = MIN, VIL = MAX ±10%VCC VIH = MIN, IOl = MAX ±5%VCC VOL Low-level output voltage VIK Input clamp voltage VCC = MIN, II = IIK II Input current at maximum input voltage IIH High–level input current IIL Low–level input current current3 IOS Short-circuit output ICC Supply current (total) UNIT MAX V 3.4 V 0.35 0.50 V 0.35 0.50 V -0.73 -1.2 V VCC = MAX, VI = 7.0V 100 µA VCC = MAX, VI = 2.7V 20 µA VCC = MAX, VI = 0.5V -0.6 mA -150 mA 2.0 mA VCC = MAX ICCH TYP2 -60 VCC = MAX 1.0 ICCL VCC = MAX 2.5 4.0 mA NOTES: 1.. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3.. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. July 2, 1993 3 Philips Semiconductors Products Product specification 13–input NAND Gate FAST 74F133 AC ELECTRICAL CHARACTERISTICS LIMITS Tamb = +25°C SYMBOL tPLH tPHL PARAMETER TEST CONDITION Propagation delay Dn to Qn Waveform 1 Tamb = 0°C to +70°C Tamb = –40°C to +85°C VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω VCC = +5.0V CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX MIN MAX 2.0 2.5 4.0 4.5 7.0 7.5 1.5 2.0 7.5 8.0 1.5 2.0 7.5 8.0 UNIT ns AC WAVEFORMS Dn VM VM tPHL tPLH VM Q VM Waveform 1. Propagation delay for data to output Note to AC Waveforms 1. For all waveforms, VM = 1.5V. TEST CIRCUIT AND WAVEFORMS VCC tw 90% VIN NEGATIVE PULSE VOUT PULSE GENERATOR 10% CL AMP (V) VM VM D.U.T. RT 90% 10% tTHL (tf ) tTLH (tr ) tTLH (tr ) tTHL (tf ) 0V RL AMP (V) 90% Test circuit for totem-pole outputs POSITIVE PULSE 90% VM VM 10% DEFINITIONS: RL = Load resistor; see AC electrical characteristics for value. CL = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. RT = Termination resistance should be equal to ZOUT of pulse generators. 0V Input pulse definition INPUT PULSE REQUIREMENTS family amplitude vM 74F July 2, 1993 10% tw 4 3.0V 1.5V rep. rate 1MHz tw tTLH 500ns 2.5ns tTHL 2.5ns