74ABT821 10-bit D-type flip-flop; positive-edge trigger; 3-state Rev. 03 — 25 February 2010 Product data sheet 1. General description The 74ABT821 high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive. The 74ABT821 bus interface register is designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider data/address paths of buses carrying parity. The 74ABT821 is a buffered 10-bit wide version of the 74ABT374A. The 74ABT821 is a 10-bit, edge-triggered register coupled to ten 3-state output buffers. The device is controlled by the clock (CP) and output enable (OE) control gates. The register is fully edge triggered. The state of each D input, one set-up time before the LOW-to-HIGH clock transition is transferred to the corresponding output Q of the flip-flop. The 3-state output buffers are designed to drive heavily loaded 3-state buses, MOS memories, or MOS microprocessors. The active LOW output enable (OE) controls all ten 3-state buffers independent of the register operation. When OE is LOW, the data in the register appears at the outputs. When OE is HIGH, the outputs are in high-impedance OFF-state, which means they will neither drive nor load the bus. 2. Features and benefits n High-speed parallel registers with positive-edge triggered D-type flip-flops n Ideal where high speed, light loading, or increased fan-in are required with MOS microprocessors n Output capability: +64 mA and −32 mA n Power-on 3-state n Power-on reset n Latch-up protection exceeds 500 mA per JESD78B class II level A n ESD protection: u HBM JESD22-A114F exceeds 2000 V u MM JESD22-A115-A exceeds 200 V 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 3. Ordering information Table 1. Ordering information Type number Package Temperature range Name Description Version 74ABT821D −40 °C to +85 °C SO24 plastic small outline package; 24 leads; body width 7.5 mm SOT137-1 74ABT821DB −40 °C to +85 °C SSOP24 plastic shrink small outline package; 24 leads; body width 5.3 mm SOT340-1 74ABT821PW −40 °C to +85 °C TSSOP24 plastic thin shrink small outline package; 24 leads; body width 4.4 mm SOT355-1 4. Functional diagram 1 EN 13 2 3 4 5 6 7 8 9 2 10 11 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 13 CP 1 OE Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 Q9 23 22 21 20 19 18 17 16 15 14 001aac734 C2 23 1 2D 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 001aac735 Fig 1. Logic symbol D0 2 CP Fig 2. IEC logic symbol D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 D7 9 D8 10 D9 11 D D D D D D D D D D CP Q CP Q CP Q CP Q CP Q CP Q CP Q CP Q CP Q CP Q 13 OE 1 23 Q0 22 Q1 21 Q2 20 Q3 19 Q4 18 Q5 17 Q6 16 Q7 15 Q8 14 Q9 001aac736 Fig 3. Logic diagram 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 2 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 5. Pinning information 5.1 Pinning 74ABT821 OE 1 24 VCC D0 2 23 Q0 D1 3 22 Q1 D2 4 21 Q2 D3 5 20 Q3 D4 6 19 Q4 D5 7 18 Q5 D6 8 17 Q6 D7 9 16 Q7 D8 10 15 Q8 D9 11 14 Q9 GND 12 13 CP 001aac733 Fig 4. Pin configuration 5.2 Pin description Table 2. Pin description Symbol Pin Description OE 1 output enable input (active LOW) D0 to D9 2, 3, 4, 5, 6, 7, 8, 9, 10, 11 data input GND 12 ground (0 V) CP 13 clock pulse input (active rising edge) Q0 to Q9 23, 22, 21, 20, 19, 18, 17, 16, 15, 14 data output VCC 24 supply voltage 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 3 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 6. Functional description 6.1 Function table Table 3. Function table[1] Input Internal register Output Operating mode OE CP D0 to D9 L ↑ l L L L ↑ h H H load and read register L NC X NC NC hold H NC X NC Z disable outputs H ↑ Dn Dn Z [1] Q0 to Q9 H = HIGH voltage level; h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition; L = LOW voltage level; I = LOW voltage level one set-up time prior to the LOW-to-HIGH clock transition; NC = no change; X = don’t care; Z = high-impedance OFF-state; ↑ = LOW-to-HIGH clock transition. 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 4 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 7. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter VCC supply voltage Conditions Min Max Unit −0.5 +7.0 V [1] −1.2 +7.0 V [1] −0.5 +5.5 V VI input voltage VO output voltage output in OFF-state or HIGH-state IIK input clamping current VI < 0 V −18 - mA IOK output clamping current VO < 0 V −50 - mA IO output current output in LOW-state Tj junction temperature Tstg storage temperature [2] - 128 mA - 150 °C −65 +150 °C [1] The input and output voltage ratings may be exceeded if the input and output current ratings are observed. [2] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C. 8. Recommended operating conditions Table 5. Recommended operating conditions Symbol Parameter VCC supply voltage Conditions Min Typ Max Unit 4.5 - 5.5 V VI input voltage 0 - VCC V VIH HIGH-level input voltage 2.0 - - V VIL LOW-level input voltage - - 0.8 V IOH HIGH-level output current −32 - - mA IOL LOW-level output current - - 64 mA ∆t/∆V input transition rise and fall rate 0 - 5 ns/V Tamb ambient temperature −40 - +85 °C 74ABT821_3 Product data sheet in free air All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 5 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 9. Static characteristics Table 6. Static characteristics Symbol Parameter 25 °C Conditions −40 °C to +85 °C Unit Min Typ Max Min Max −1.2 −0.9 - −1.2 - V VCC = 4.5 V; IOH = −3 mA 2.5 2.9 - 2.5 - V VCC = 5.0 V; IOH = −3 mA 3.0 3.4 - 3.0 - V VCC = 4.5 V; IOH = −32 mA 2.0 2.4 - 2.0 - V - 0.42 0.55 - 0.55 V - 0.13 0.55 - 0.55 V VIK input clamping voltage VCC = 4.5 V; IIK = −18 mA VOH HIGH-level output voltage VI = VIL or VIH VOL LOW-level output voltage VCC = 4.5 V; IOL = 64 mA; VI = VIL or VIH VOL(pu) power-up LOW-level output voltage VCC = 5.5 V; IO = 1 mA; VI = GND or VCC [1] II input leakage current VCC = 5.5 V; VI = GND or 5.5 V - ±0.01 ±1.0 - ±1.0 µA IOFF power-off leakage current VCC = 0 V; VI or VO ≤ 4.5 V - ±5.0 ±100 - ±100 µA IO(pu/pd) power-up/power-down output current VCC = 2.0 V; VO = 0.5 V; VI = GND or VCC; OEn HIGH - ±5.0 ±50 - ±50 µA IOZ OFF-state output current VCC = 5.5 V; VI = VIL or VIH VO = 2.7 V - 5.0 50 - 50 µA VO = 0.5 V - −5.0 −50 - −50 µA - 5.0 50 - 50 µA −180 −80 −50 −180 −50 mA outputs HIGH-state - 0.5 250 - 250 µA outputs LOW-state - 25 38 - 38 mA - 0.5 250 - 250 µA - 0.5 1.5 - 1.5 mA ILO output leakage current HIGH-state; VO = 5.5 V; VCC = 5.5 V; VI = GND or VCC IO output current VCC = 5.5 V; VO = 2.5 V ICC supply current VCC = 5.5 V; VI = GND or VCC [2] [3] outputs disabled ∆ICC additional supply current per input pin; VCC = 5.5 V; one input at 3.4 V; other inputs at VCC or GND CI input capacitance VI = 0 V or VCC - 4 - - - pF CO output capacitance outputs disabled; VO = 0 V or VCC - 7 - - - pF [4] [1] For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power. [2] This parameter is valid for any VCC between 0 V and 2.1 V with a transition time of up to 10 ms. For VCC = 2.1 V to VCC = 5 V ± 10 %, a transition time of up to 100 µs is permitted. [3] Not more than one output should be tested at a time, and the duration of the test should not exceed one second. [4] This is the increase in supply current for each input at 3.4 V. 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 6 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 10. Dynamic characteristics Table 7. Dynamic characteristics GND = 0 V; for test circuit, see Figure 8. Symbol Parameter 25 °C; VCC = 5.0 V Conditions −40 °C to +70 °C; Unit VCC = 5.0 V ± 0.5 V Min Typ Max Min Max tPLH LOW to HIGH propagation delay CP to Qn; see Figure 5 2.1 4.1 5.6 2.1 6.2 ns tPHL HIGH to LOW propagation delay CP to Qn; see Figure 5 2.8 4.6 6.2 2.8 6.7 ns tPZH OFF-state to HIGH propagation delay OEn to Qn; see Figure 6 1.0 3.0 4.5 1.0 5.3 ns tPZL OFF-state to LOW propagation delay OEn to Qn; see Figure 6 2.2 4.1 5.6 2.2 6.3 ns tPHZ HIGH to OFF-state propagation delay OEn to Qn; see Figure 6 2.7 4.7 6.2 2.7 6.7 ns tPLZ LOW to OFF-state propagation delay OEn to Qn; see Figure 6 2.3 4.6 6.1 2.3 6.5 ns tsu(H) set-up time HIGH Dn to CP; see Figure 7 2.1 0.5 - 2.1 - ns tsu(L) set-up time LOW Dn to CP; see Figure 7 2.1 0.3 - 2.1 - ns th(H) hold time HIGH Dn to CP; see Figure 7 1.3 0 - 1.3 - ns th(L) hold time LOW Dn to CP; see Figure 7 1.3 −0.3 - 1.3 - ns tWH pulse width HIGH CP; see Figure 5 2.9 1.8 - 2.9 - ns tWL pulse width LOW CP; see Figure 5 3.8 2.8 - 3.8 - ns fmax maximum frequency see Figure 5 125 185 - 125 - MHz 11. Waveforms 1/f max VI CP input VM GND t WH t WL t PHL t PLH VOH VM Qn output VOL 001aac445 VM = 1.5 V VOL and VOH are typical voltage output levels that occur with the output load. Fig 5. 74ABT821_3 Product data sheet Propagation delay clock input (CP) to output (Qn), clock pulse (CP) width and maximum clock (CP) frequency All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 7 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state VI OE input VM GND tPZL tPLZ 3.5 V output LOW-to-OFF OFF-to-LOW VM VOL + 0.3 V VOL tPHZ VOH tPZH VOH − 0.3 V output HIGH-to-OFF OFF-to-HIGH VM GND outputs enabled outputs enabled outputs disabled 001aal299 VM = 1.5 V. VOL and VOH are typical voltage output levels that occur with the output load. Fig 6. 3-state output (Qn) enable and disable times Vl VM Dn input VM VM VM GND t su(H) t h(H) t su(L) t h(L) Vl VM CP input GND VM 001aac738 VM = 1.5 V The shaded areas indicate when the input is permitted to change for predictable output performance. Fig 7. 74ABT821_3 Product data sheet Set-up and hold times data input (Dn) to clock (CP) All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 8 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state VI tW 90 % 90 % negative pulse VM 0V VCC 10 % tf tr tr tf VI 90 % positive pulse 0V VEXT VM 10 % VI DUT RT 90 % RL VO G CL RL VM VM 10 % 10 % mna616 tW 001aai298 a. Input pulse definition b. Test circuit Test data and VEXT levels are given in Table 8. RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = Test voltage for switching times. Fig 8. Table 8. Test circuit for measuring switching times Test data Input Load VEXT VI fI tW tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 3.0 V 1 MHz 500 ns ≤ 2.5 ns 50 pF 500 Ω open open 7.0 V 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 9 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 12. Package outline SO24: plastic small outline package; 24 leads; body width 7.5 mm SOT137-1 D E A X c HE y v M A Z 24 13 Q A2 A (A 3) A1 pin 1 index θ Lp L 1 12 e detail X w M bp 0 5 10 mm scale DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (1) e HE L Lp Q v w y mm 2.65 0.3 0.1 2.45 2.25 0.25 0.49 0.36 0.32 0.23 15.6 15.2 7.6 7.4 1.27 10.65 10.00 1.4 1.1 0.4 1.1 1.0 0.25 0.25 0.1 0.01 0.019 0.013 0.014 0.009 0.61 0.60 0.30 0.29 0.05 0.419 0.043 0.055 0.394 0.016 inches 0.1 0.012 0.096 0.004 0.089 0.043 0.039 0.01 0.01 Z (1) 0.9 0.4 0.035 0.004 0.016 θ o 8 o 0 Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. Fig 9. REFERENCES OUTLINE VERSION IEC JEDEC SOT137-1 075E05 MS-013 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Package outline SOT137-1 (SO24) 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 10 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state SSOP24: plastic shrink small outline package; 24 leads; body width 5.3 mm D SOT340-1 E A X c HE y v M A Z 24 13 Q A2 A (A 3) A1 pin 1 index θ Lp L 1 12 bp e detail X w M 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (1) e HE L Lp Q v w y Z (1) θ mm 2 0.21 0.05 1.80 1.65 0.25 0.38 0.25 0.20 0.09 8.4 8.0 5.4 5.2 0.65 7.9 7.6 1.25 1.03 0.63 0.9 0.7 0.2 0.13 0.1 0.8 0.4 8 o 0 o Note 1. Plastic or metal protrusions of 0.2 mm maximum per side are not included. OUTLINE VERSION SOT340-1 REFERENCES IEC JEDEC JEITA MO-150 EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 10. Package outline SOT340-1 (SSOP24) 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 11 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state TSSOP24: plastic thin shrink small outline package; 24 leads; body width 4.4 mm D SOT355-1 E A X c HE y v M A Z 13 24 Q A2 (A 3) A1 pin 1 index A θ Lp L 1 12 bp e detail X w M 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (2) e HE L Lp Q v w y Z (1) θ mm 1.1 0.15 0.05 0.95 0.80 0.25 0.30 0.19 0.2 0.1 7.9 7.7 4.5 4.3 0.65 6.6 6.2 1 0.75 0.50 0.4 0.3 0.2 0.13 0.1 0.5 0.2 8o 0o Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT355-1 REFERENCES IEC JEDEC JEITA MO-153 EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 11. Package outline SOT355-1 (TSSOP24) 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 12 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 13. Abbreviations Table 9. Abbreviations Acronym Description BiCMOS Bipolar Complementary Metal-Oxide Semiconductor DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model 14. Revision history Table 10. Revision history Document ID Release date Data sheet status Change notice Supersedes 74ABT821_3 20100225 Product data sheet - 74ABT821_2 Modifications: • The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. • • Legal texts have been adapted to the new company name where appropriate. DIP 24 (SOT222-1) package removed from Section 3 “Ordering information” and Section 12 “Package outline”. 74ABT821_2 20050412 Product specification - 74ABT821 74ABT821 19950906 Product specification - - 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 13 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 15. Legal information 15.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 15.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 15.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on a weakness or default in the customer application/use or the application/use of customer’s third party customer(s) (hereinafter both referred to as “Application”). It is customer’s sole responsibility to check whether the NXP Semiconductors product is suitable and fit for the Application planned. Customer has to do all necessary testing for the Application in order to avoid a default of the Application and the product. NXP Semiconductors does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Non-automotive qualified products — Unless the data sheet of an NXP Semiconductors product expressly states that the product is automotive qualified, the product is not suitable for automotive use. It is neither qualified nor tested in accordance with automotive testing or application requirements. NXP Semiconductors accepts no liability for inclusion and/or use of non-automotive qualified products in automotive equipment or applications. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors’ warranty of the 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 14 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond NXP Semiconductors’ specifications such use shall be solely at customer’s own risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors’ standard warranty and NXP Semiconductors’ product specifications. 15.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 16. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] 74ABT821_3 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 03 — 25 February 2010 © NXP B.V. 2010. All rights reserved. 15 of 16 74ABT821 NXP Semiconductors 10-bit D-type flip-flop; positive-edge trigger; 3-state 17. Contents 1 2 3 4 5 5.1 5.2 6 6.1 7 8 9 10 11 12 13 14 15 15.1 15.2 15.3 15.4 16 17 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 4 Function table . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5 Recommended operating conditions. . . . . . . . 5 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 10 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 13 Legal information. . . . . . . . . . . . . . . . . . . . . . . 14 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 14 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Contact information. . . . . . . . . . . . . . . . . . . . . 15 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2010. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 25 February 2010 Document identifier: 74ABT821_3