PD - 95134B IRF7831PbF HEXFET® Power MOSFET Applications l High Frequency Point-of-Load Synchronous Buck Converter for Applications in Networking & Computing Systems. Benefits l Very Low RDS(on) at 4.5V VGS l Ultra-Low Gate Impedance l Fully Characterized Avalanche Voltage and Current l 100% Tested for RG l Lead-Free VDSS RDS(on) max Qg (typ.) 30V 3.6m:@VGS = 10V 40nC A A D S 1 8 S 2 7 D S 3 6 D G 4 5 D SO-8 Top View Absolute Maximum Ratings Max. Units VDS Drain-to-Source Voltage Parameter 30 V VGS Gate-to-Source Voltage ± 12 ID @ TA = 25°C Continuous Drain Current, VGS @ 10V 21 ID @ TA = 70°C Continuous Drain Current, VGS @ 10V 17 IDM Pulsed Drain Current 170 PD @TA = 25°C Power Dissipation PD @TA = 70°C Power Dissipation TJ Linear Derating Factor Operating Junction and TSTG Storage Temperature Range f f c A 2.5 W 1.6 0.02 -55 to + 150 W/°C °C Thermal Resistance Parameter RθJL RθJA Junction-to-Drain Lead Junction-to-Ambient f Typ. Max. Units ––– 20 °C/W ––– 50 Notes through are on page 10 www.irf.com 1 6/30/05 IRF7831PbF Static @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units V Conditions BVDSS Drain-to-Source Breakdown Voltage 30 ––– ––– ∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.025 ––– V/°C Reference to 25°C, ID = 1mA RDS(on) Static Drain-to-Source On-Resistance 2.5 3.1 3.6 mΩ 3.0 3.7 4.4 VGS(th) Gate Threshold Voltage 1.35 ––– 2.35 V Gate Threshold Voltage Coefficient ––– - 5.7 ––– mV/°C IDSS Drain-to-Source Leakage Current ––– ––– 1.0 µA ––– ––– 150 Gate-to-Source Forward Leakage ––– ––– 100 Gate-to-Source Reverse Leakage ––– ––– -100 VGS = 10V, ID = 20A VGS = 4.5V, ID = 16A ∆VGS(th) IGSS VGS = 0V, ID = 250µA e e VDS = VGS, ID = 250µA VDS = 24V, VGS = 0V VDS = 24V, VGS = 0V, TJ = 125°C nA VGS = 12V VGS = -12V gfs Forward Transconductance 97 ––– ––– Qg Total Gate Charge ––– 40 60 S Qgs1 Pre-Vth Gate-to-Source Charge ––– 12 ––– Qgs2 Post-Vth Gate-to-Source Charge ––– 3.1 ––– Qgd Gate-to-Drain Charge ––– 11 ––– ID = 16A Qgodr Gate Charge Overdrive ––– 14 ––– See Fig. 16 Qsw Switch Charge (Qgs2 + Qgd) ––– 14 ––– Qoss Output Charge ––– 22 ––– nC RG Gate Resistance ––– 1.4 2.5 Ω td(on) Turn-On Delay Time ––– 18 ––– VDD = 15V, VGS = 4.5V tr Rise Time ––– 10 ––– ID = 16A td(off) Turn-Off Delay Time ––– 17 ––– tf Fall Time ––– 5.3 ––– Ciss Input Capacitance ––– 6240 ––– Coss Output Capacitance ––– 980 ––– Crss Reverse Transfer Capacitance ––– 390 ––– VDS = 15V, ID = 16A VDS = 15V nC ns VGS = 4.5V VDS = 16V, VGS = 0V e Clamped Inductive Load VGS = 0V pF VDS = 15V ƒ = 1.0MHz Avalanche Characteristics EAS Parameter Single Pulse Avalanche Energy IAR Avalanche Current c d Typ. Max. Units ––– 100 mJ ––– 16 A Diode Characteristics Parameter IS Continuous Source Current Min. Typ. Max. Units ––– ––– 2.5 ––– ––– 170 (Body Diode) ISM A Pulsed Source Current (Body Diode) c Conditions MOSFET symbol showing the integral reverse VSD Diode Forward Voltage ––– ––– 1.2 V p-n junction diode. TJ = 25°C, IS = 16A, VGS = 0V trr Reverse Recovery Time ––– 42 62 ns TJ = 25°C, IF = 16A, VDD = 25V Qrr Reverse Recovery Charge ––– 31 47 nC di/dt = 100A/µs ton Forward Turn-On Time 2 e e Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) www.irf.com IRF7831PbF 1000 VGS 10V 5.0V 4.5V 3.5V 3.0V 2.7V 2.5V BOTTOM 2.25V 1000 VGS 10V 5.0V 4.5V 3.5V 3.0V 2.7V 2.5V BOTTOM 2.25V 100 10 1 0.1 TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 100 10 2.25V 1 20µs PULSE WIDTH 2.25V Tj = 25°C 0.01 0.1 0.1 1 10 100 0.1 VDS, Drain-to-Source Voltage (V) 1 10 100 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000.0 2.0 RDS(on) , Drain-to-Source On Resistance ID, Drain-to-Source Current (Α) 20µs PULSE WIDTH Tj = 150°C 100.0 (Normalized) T J = 150°C 10.0 T J = 25°C 1.0 VDS = 15V 20µs PULSE WIDTH 0.1 2.0 2.5 3.0 3.5 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com ID = 20A VGS = 10V 1.5 1.0 0.5 4.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 T J , Junction Temperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRF7831PbF 100000 12 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = C gd VGS, Gate-to-Source Voltage (V) ID= 12A C, Capacitance (pF) Coss = Cds + Cgd 10000 Ciss Coss 1000 Crss 10 8 6 4 2 0 100 1 10 0 100 40 60 80 100 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 1000.0 1000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 20 QG Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) 100.0 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 T J = 150°C 10.0 1.0 T J = 25°C 100µsec 10 1msec VGS = 0V 1 0.1 0.2 0.4 0.6 0.8 1.0 VSD, Source-toDrain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 VDS= 24V VDS= 15V 1.2 Tc = 25°C Tj = 150°C Single Pulse 0.1 1.0 10msec 10.0 100.0 1000.0 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF7831PbF 2.4 VGS(th) Gate threshold Voltage (V) 24 ID , Drain Current (A) 20 16 12 8 4 2.2 2.0 ID = 250µA 1.8 1.6 1.4 1.2 1.0 0 25 50 75 100 125 -75 150 -50 -25 0 25 50 75 100 125 150 T J , Temperature ( °C ) T J , Junction Temperature (°C) Fig 10. Threshold Voltage Vs. Temperature Fig 9. Maximum Drain Current Vs. Case Temperature Thermal Response ( Z thJA ) 100 10 D = 0.50 0.20 0.10 0.05 1 0.02 0.01 τJ 0.1 R1 R1 τJ τ1 R2 R2 R3 R3 R5 R5 τC τ2 τ1 τ3 τ2 τ3 Ci= τi/Ri C 0.01 R4 R4 τ4 τ5 τ4 τ5 τ Ri (°C/W) τi (sec) 0.514 2.445 20.64 17.80 8.604 0.000182 0.030949 0.36354 6.99 109 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthja + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient www.irf.com 5 IRF7831PbF D.U.T RG VGS 20V DRIVER L VDS + V - DD IAS A 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS EAS, Single Pulse Avalanche Energy (mJ) 500 15V ID 11A 13A BOTTOM 16A TOP 400 300 200 100 0 tp 25 50 75 100 125 150 Starting T J, Junction Temperature (°C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current LD I AS VDS Fig 12b. Unclamped Inductive Waveforms + VDD D.U.T VGS Current Regulator Same Type as D.U.T. Pulse Width < 1µs Duty Factor < 0.1% 50KΩ 12V Fig 14a. Switching Time Test Circuit .2µF .3µF D.U.T. + V - DS VDS 90% VGS 3mA 10% IG ID Current Sampling Resistors Fig 13. Gate Charge Test Circuit 6 VGS td(on) tr td(off) tf Fig 14b. Switching Time Waveforms www.irf.com IRF7831PbF D.U.T Driver Gate Drive + • • • • D.U.T. ISD Waveform Reverse Recovery Current + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test P.W. Period * RG D= VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer - - Period P.W. + VDD + - Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent ISD Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Id Vds Vgs Vgs(th) Qgs1 Qgs2 Qgd Qgodr Fig 16. Gate Charge Waveform www.irf.com 7 IRF7831PbF Power MOSFET Selection for Non-Isolated DC/DC Converters Control FET Synchronous FET Special attention has been given to the power losses in the switching elements of the circuit - Q1 and Q2. Power losses in the high side switch Q1, also called the Control FET, are impacted by the Rds(on) of the MOSFET, but these conduction losses are only about one half of the total losses. The power loss equation for Q2 is approximated by; * Ploss = Pconduction + Pdrive + Poutput ( 2 Ploss = Irms × Rds(on) ) Power losses in the control switch Q1 are given by; + (Qg × Vg × f ) Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput ⎛Q ⎞ + ⎜ oss × Vin × f + (Qrr × Vin × f ) ⎝ 2 ⎠ This can be expanded and approximated by; Ploss = (Irms × Rds(on ) ) 2 ⎛ ⎞ ⎛ Qgs 2 ⎞ Qgd +⎜I × × Vin × f ⎟ + ⎜ I × × Vin × f ⎟ ig ig ⎝ ⎠ ⎝ ⎠ + (Qg × Vg × f ) + ⎛ Qoss × Vin × f ⎞ ⎝ 2 ⎠ This simplified loss equation includes the terms Qgs2 and Qoss which are new to Power MOSFET data sheets. Qgs2 is a sub element of traditional gate-source charge that is included in all MOSFET data sheets. The importance of splitting this gate-source charge into two sub elements, Qgs1 and Qgs2, can be seen from Fig 16. Qgs2 indicates the charge that must be supplied by the gate driver between the time that the threshold voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Qgs2 is a critical factor in reducing switching losses in Q1. Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the parallel combination of the voltage dependant (nonlinear) capacitances Cds and Cdg when multiplied by the power supply input buss voltage. 8 *dissipated primarily in Q1. For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since it impacts three critical areas. Under light load the MOSFET must still be turned on and off by the control IC so the gate drive losses become much more significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that are transfered to Q1 and increase the dissipation in that device. Thirdly, gate charge will impact the MOSFETs’ susceptibility to Cdv/dt turn on. The drain of Q2 is connected to the switching node of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce a voltage spike on the gate that is sufficient to turn the MOSFET on, resulting in shoot-through current . The ratio of Qgd/Qgs1 must be minimized to reduce the potential for Cdv/dt turn on. Figure A: Qoss Characteristic www.irf.com IRF7831PbF SO-8 Package Outline D 5 A 8 6 7 6 5 H E 1 2 3 0.25 [.010] 4 A e e1 8X b 0.25 [.010] MIL LIME T E RS MIN MAX MIN A .0532 .0688 1.35 1.75 A1 .0040 .0098 0.10 0.25 b .013 .020 0.33 0.51 c .0075 .0098 0.19 0.25 D .189 .1968 4.80 5.00 E .1497 .1574 3.80 4.00 e .050 B AS IC 1.27 B AS IC e1 6X INCHE S DIM B MAX .025 B AS IC 0.635 B AS IC H .2284 .2440 5.80 6.20 K .0099 .0196 0.25 0.50 L .016 .050 0.40 1.27 y 0° 8° 0° 8° K x 45° A C y 0.10 [.004] A1 8X L 8X c 7 C A B F OOT PR INT NOT E S : 1. DIME NS IONING & T OL E R ANCING PE R AS ME Y14.5M-1994. 8X 0.72 [.028] 2. CONT R OL L ING DIME NS ION: MIL LIME T E R 3. DIME NS IONS AR E S HOWN IN MIL L IME T E R S [INCHE S ]. 4. OU T L INE CONF OR MS T O JE DE C OU T L INE MS -012AA. 5 DIME NS ION DOE S NOT INCL UDE MOL D PROT RU S IONS . MOL D PR OT RU S IONS NOT T O E XCE E D 0.15 [.006]. 6 DIME NS ION DOE S NOT INCL UDE MOL D PROT RU S IONS . MOL D PR OT RU S IONS NOT T O E XCE E D 0.25 [.010]. 6.46 [.255] 7 DIME NS ION IS T HE L E NGT H OF L E AD F OR S OL DE R ING T O A S UB S T R AT E . 3X 1.27 [.050] 8X 1.78 [.070] SO-8 Part Marking E XAMPLE : T HIS IS AN IRF 7101 (MOS F E T ) INT E R NAT IONAL R E CT IF IE R L OGO XXXX F 7101 DAT E CODE (YWW) P = DE S IGNAT E S L E AD-F RE E PRODU CT (OPT IONAL) Y = LAS T DIGIT OF T HE YE AR WW = WE E K A = AS S E MB LY S IT E CODE L OT CODE PART NU MB E R www.irf.com 9 IRF7831PbF SO-8 Tape and Reel TERMINAL NUMBER 1 12.3 ( .484 ) 11.7 ( .461 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES: 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 330.00 (12.992) MAX. 14.40 ( .566 ) 12.40 ( .488 ) NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. OUTLINE CONFORMS TO EIA-481 & EIA-541. Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 0.76mH RG = 25Ω, IAS = 16A. Pulse width ≤ 400µs; duty cycle ≤ 2%. When mounted on 1 inch square copper board Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market. Qualifications Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.6/05 10 www.irf.com