THIS SPEC IS OBSOLETE
Spec No: 002-06551
Spec Title: FR Family FR80 32-BIT Microcontroller
MB91625/MB91635A/MB91640A/MB91645A/MB
91660 Series A/D Converter Conversion Time
Setting
Replaced by: NONE
The following document contains information on Cypress products.
AN07-00235-1E
FR Family FR80
32-BIT MICROCONTROLLER
MB91625/MB91635A/MB91640A/MB91645A/MB91660 Series
A/D Converter Conversion Time Setting
AN07-00235-1E
All Rights Reserved.
The contents of this document are subject to change without notice. Customers are advised to consult with
FUJITSU sales representatives before ordering.
The information, such as descriptions of function and application circuit examples, in this document are
presented solely for the purpose of reference to show examples of operations and uses of Fujitsu
semiconductor device; Fujitsu does not warrant proper operation of the device with respect to use based on
such information. When you develop equipment incorporating the device based on such information, you
must assume any responsibility arising out of such use of the information. Fujitsu assumes no liability for
any damages whatsoever arising out of the use of the information.
Any information in this document, including descriptions of function and schematic diagrams, shall not be
construed as license of the use or exercise of any intellectual property right, such as patent right or
copyright, or any other right of Fujitsu or any third party or does Fujitsu warrant non-infringement of any
third-party’s intellectual property right or other right by using such information. Fujitsu assumes no liability
for any infringement of the intellectual property rights or other rights of third parties which would result from
the use of information contained herein.
The products described in this document are designed, developed and manufactured as contemplated for
general use, including without limitation, ordinary industrial use, general office use, personal use, and
household use, but are not designed, developed and manufactured as contemplated (1) for use
accompanying fatal risks or dangers that, unless extremely high safety is secured, could have a serious
effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss
(i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport
control, medical life support system, missile launch control in weapon system), or (2) for use requiring
extremely high reliability (i.e., submersible repeater and artificial satellite).
Please note that Fujitsu will not be liable against you and/or any third party for any claims or damages
arising in connection with above-mentioned uses of the products.
Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or
loss from such failures by incorporating safety design measures into your facility and equipment such as
redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions.
If any products described in this document represent goods or technologies subject to certain restrictions on
export under the Foreign Exchange and Foreign Trade Law of Japan, the prior authorization by Japanese
government will be required for export of those products from Japan.
The company names and brand names herein are the trademarks or registered trademarks of their
respective owners.
Copyright© 2010 FUJITSU SEMICONDUCTOR LIMITED all rights reserved
1
AN07-00235-1E
Revision History
Revision
Date
Description
1.0
October.30.2009
Initial release
2
AN07-00235-1E
Contents
Revision History...................................................................................................................... 2
Contents ................................................................................................................................. 3
1
Introduction...................................................................................................................... 4
2
Internal Block Architecture of A/D Converter .................................................................. 5
3
Register for Setting A/D Conversion Time ...................................................................... 6
3.1
Sampling Time Setting Register (ADSTx0, ADSTx0) .............................................. 6
3.2
Compare Time Setting Register (ADCTx) ............................................................... 7
4
Analog Input and External Circuit ................................................................................... 8
5
A/D Conversion Time (sampling time + compare time) Setting Precautions ................. 9
5.1
Sampling time setting precautions ........................................................................... 9
5.2
Compare time setting precautions ......................................................................... 10
3
AN07-00235-1E
1 Introduction
This application note explains important points on the functionality used in the A/D converter and
settings for the A/D conversion time for the FR Family
MB91625/MB91635A/MB91640A/MB91645A/ MB91660 Series 32-bit microcontrollers.
4
AN07-00235-1E
2
Internal Block Architecture of A/D Converter
The conversion for the A/D converter used in the MB91625/MB91635A/MB91640A/ MB91645A/
MB91660 Series utilizes a successive approximation conversion method with an RC-type
sample and hold circuit. The basic A/D converter specifications for each series are identical.
However, the number of units and channels for the A/D converter are different for each
microcontroller in the series. See the hardware manual of each microcontroller for individual
specifications.
This section covers the MB91635A Series, and Figure 2-1 shows the A/D converter block
diagram. The A/D converter for the MB91635A has built-in two 10-bit A/D converters capable of
assigning 31 channel analog inputs to each unit.
Figure 2-1 Block diagram of 10-bit A/D converter (MB91635A Series)
5
AN07-00235-1E
3
Register for Setting A/D Conversion Time
3.1
Sampling Time Setting Register (ADSTx0, ADSTx0)
The A/D conversion time is configured from the sampling and compare times. The sampling
time setting register is to set the sampling time. After A/D conversion is started, the input voltage
is sampled by the sample and hold (S/H) circuit. The sampling time setting register starts
sampling and sets the input voltage storage time. The bit configuration for the sampling time
setting register is shown in the chart below.
Chart 3-1 Bit configuration for the sampling time setting register (ADSTx0, ADSTx0)
● [bit15, bit14] / [bit7, bit6] : STXx1, STXx0 (Sampling time N-times setting bit)
The value set by STx5 to STx0 bit is multiplied N (x1, x4, x8, x16) times.
STXx1
STXx0
Description
0
0
Setting value x1
0
1
Setting value×4
1
0
Setting value×8
1
1
Setting value×16
● [bit13 to bit8] / [bit5 to bit0] : STx5 to STx0 (sampling time setting bit)
Sets the value to set the sampling time.
The sampling time set by this register is calculated with the following formula.
Sampling time = Peripheral clock (PCLK) cycle × (ST+1) × STX
6
AN07-00235-1E
3.2
Compare Time Setting Register (ADCTx)
A/D conversion time is configured from the sampling and compare times. The compare time
setting register is the register that sets this compare time. The size of the analog voltage
sampled by the sample and holder (S/H) circuit and the size of the DA converter are compared
by the comparator. The digital values for the DA converter are increased or decreased depending
on the results of comparison. The final corresponding digital value gives the converted digital
value and the conversion time is set in the compare time setting register. The bit configuration for
the compare time setting register is shown in the chart below.
Chart 3-2 Bit configuration for the compare time setting register (ADCTx)
● [bit2 to bit0] : CT2 to CT0 (compare time setting bit)
Determines the value to set the compare time.
The compare time is calculated using the following formula.
Compare time = {(CT+1)×10+4}× Peripheral clock (PCLK) cycle
7
AN07-00235-1E
4
Analog Input and External Circuit
The following figure shows an analog input pin in an equivalent circuit.
Figure 4-1 Analog input and external circuit
The functions of Rext, Rin, Cin of the equivalent circuit are defined as follows.
Rext: external by the user system impedance
Ｒin: analog switch ON resistor
Cin: capacitor for storing analog voltage
These values are required for sampling time setting and compare time setting. When the
external impedance is large, sampling the capacitor takes time. Also, if operating at a low-rate
during the comparing process, holding the sampling analog voltage may be impossible. Be sure
to take these points into consideration before setting the conversion time of the A/D converter.
8
AN07-00235-1E
5 A/D Conversion Time (sampling time + compare time) Setting Precautions
5.1
Sampling time setting precautions
When setting the A/D sampling time, be sure to consider the C and R-values that are used in the
sampling circuit. Also, the output impedance of the external circuit that is connected to the
analog input affects the A/D converter sampling time. Be sure to take this into consideration
before setting the sampling time.
The sampling time is calculated using the following formula.
Ts = (Rin + Rext) × Cin × 8
･････A)
Ts:
sampling time
Rin:
A/D input resistance
Cin:
A/D input capacitance
Rext:
external circuit impedance
”8”:
CR coefficient that suppresses error margin to within a range of 1LSB
(Ex.) External impedance (Rext)= sampling time (minimum value) at 3.7kΩ. If a value is assigned
to each variable in formula A),
Ts > (5.3kΩ + 3.7kΩ) × 8.5pF × 8 = 612ns
Therefore, in this example, the A/D converter sampling time must be adjusted to 612ns or
higher. Set the value that satisfies the minimum value of the sampling time for the sampling
time setting register.
If the A/D converter sampling time is insufficient, this insufficient voltage will become the error
margin. To guarantee the accuracy of the A/D converter, ensure there is a sufficient sampling
time.
9
AN07-00235-1E
5.2
Compare time setting precautions
Loss of the electric charge in the capacitor that was charged by the A/D sampling circuit
happens because of a slow leakage current during compare time. The error margin produced as
a result of this phenomenon affects the accuracy of A/D data. The effects can be substantial if the
A/D is operated at a low-rate. Therefore, pay close attention when setting the compare time.
Calculate the compare time by applying this phenomenon to the A/D converter for the
MB91625/MB91635A/MB91640A/ MB91645A/MB91660 Series. Each type of A/D converter
uses an intrinsic transistor in the internal sample and hold circuit. The intrinsic transistor has a
leakage current of 5nA (at highest temperature and lowest power).
i = 5[nA]
･････1)
The A/D input capacitance is
C = 8.5[pF]
･････2)
The voltage drop (⊿V) after time (⊿t) when the current (i) flows from capacitance (C) is given in
the following formula,
⊿t = C×⊿V/i ･････3)
When 1LSB (3mV) fall time of the A/D converter is entered into formula 3),
⊿t = 8.5[pF]×3[mV] / 5[nA]
= 5.1[μs]
The maximum value of the A/D compare time is given in the results above. If the A/D compare
time delays more than 5.1[μs], the A/D conversion error increases. Operating the A/D compare
time at 5.1μs or less is recommended so that the A/D conversion accuracy does not decrease.
The A/D compare time is calculated using the formula below, found in paragraph 3-2.
Compare time = [(CT+1)×10 + 4] ×PCLK cycle
･････B)
(CT : compare time setting bit)
When the compare time (max. value) and CT (min. value) are entered into formula B), the PCLK
cycle (max. value) can be calculated.
Compare time (max. value) = 5.1[μs]
CT (min. value) = 0
10
AN07-00235-1E
Enter these values into formula B).
5.1[μs] > {(0+1) ×10 + 4} ×PCLK cycle (max. value)
PCLK cycle (max. value) < 5.1[μs]/14 = 364[ns] (frequency notation of 2.75MHz)
Based on the above results, the PCLK cycle (max. value) equals 364[ns].
If the A/D compare is operated using a clock with more delay than the PCLK cycle (max. value),
the A/D converter accuracy decreases. If the A/D converter is used, operating the PCLK cycle at
a high-rate above 364[ns] is recommended so that the A/D converter accuracy does not
decrease.
Be sure to take the above-mentioned points into consideration before setting the conversion time
of the A/D converter.
11